{"id":"https://openalex.org/W2943522575","doi":"https://doi.org/10.1109/iscas.2019.8702073","title":"HotAging \u2014 Impact of Power Dissipation on Hardware Degradation","display_name":"HotAging \u2014 Impact of Power Dissipation on Hardware Degradation","publication_year":2019,"publication_date":"2019-05-01","ids":{"openalex":"https://openalex.org/W2943522575","doi":"https://doi.org/10.1109/iscas.2019.8702073","mag":"2943522575"},"language":"en","primary_location":{"id":"doi:10.1109/iscas.2019.8702073","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas.2019.8702073","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 IEEE International Symposium on Circuits and Systems (ISCAS)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5056538809","display_name":"Frank Sill Torres","orcid":"https://orcid.org/0000-0002-4028-455X"},"institutions":[{"id":"https://openalex.org/I180437899","display_name":"University of Bremen","ror":"https://ror.org/04ers2y35","country_code":"DE","type":"education","lineage":["https://openalex.org/I180437899"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Frank Sill Torres","raw_affiliation_strings":["Group of Computer Architecture, University of Bremen, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Group of Computer Architecture, University of Bremen, Germany","institution_ids":["https://openalex.org/I180437899"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5050344559","display_name":"Alberto Garc\u00eda-Ortiz","orcid":"https://orcid.org/0000-0002-6461-3864"},"institutions":[{"id":"https://openalex.org/I180437899","display_name":"University of Bremen","ror":"https://ror.org/04ers2y35","country_code":"DE","type":"education","lineage":["https://openalex.org/I180437899"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Alberto Garcia Ortiz","raw_affiliation_strings":["Institute of Electrodynamics and Microelectronics, University of Bremen, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Electrodynamics and Microelectronics, University of Bremen, Germany","institution_ids":["https://openalex.org/I180437899"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5071742136","display_name":"Rolf Drechsler","orcid":"https://orcid.org/0000-0002-9872-1740"},"institutions":[{"id":"https://openalex.org/I180437899","display_name":"University of Bremen","ror":"https://ror.org/04ers2y35","country_code":"DE","type":"education","lineage":["https://openalex.org/I180437899"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Rolf Drechsler","raw_affiliation_strings":["Group of Computer Architecture, University of Bremen, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Group of Computer Architecture, University of Bremen, Germany","institution_ids":["https://openalex.org/I180437899"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I180437899"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.03359198,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"5"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9976000189781189,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.9973999857902527,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/dissipation","display_name":"Dissipation","score":0.761232852935791},{"id":"https://openalex.org/keywords/dependability","display_name":"Dependability","score":0.7251698970794678},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.6987881064414978},{"id":"https://openalex.org/keywords/degradation","display_name":"Degradation (telecommunications)","score":0.6227035522460938},{"id":"https://openalex.org/keywords/guard","display_name":"Guard (computer science)","score":0.6012229919433594},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5912469029426575},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.5100396275520325},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2210574448108673},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.13763427734375}],"concepts":[{"id":"https://openalex.org/C135402231","wikidata":"https://www.wikidata.org/wiki/Q898440","display_name":"Dissipation","level":2,"score":0.761232852935791},{"id":"https://openalex.org/C77019957","wikidata":"https://www.wikidata.org/wiki/Q2689057","display_name":"Dependability","level":2,"score":0.7251698970794678},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.6987881064414978},{"id":"https://openalex.org/C2779679103","wikidata":"https://www.wikidata.org/wiki/Q5251805","display_name":"Degradation (telecommunications)","level":2,"score":0.6227035522460938},{"id":"https://openalex.org/C141141315","wikidata":"https://www.wikidata.org/wiki/Q2379942","display_name":"Guard (computer science)","level":2,"score":0.6012229919433594},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5912469029426575},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.5100396275520325},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2210574448108673},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.13763427734375},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iscas.2019.8702073","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas.2019.8702073","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 IEEE International Symposium on Circuits and Systems (ISCAS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":24,"referenced_works":["https://openalex.org/W1518236483","https://openalex.org/W1592929868","https://openalex.org/W1966935108","https://openalex.org/W1970845025","https://openalex.org/W1975008353","https://openalex.org/W2020404011","https://openalex.org/W2036537371","https://openalex.org/W2069345435","https://openalex.org/W2105217850","https://openalex.org/W2106075707","https://openalex.org/W2121132326","https://openalex.org/W2126394324","https://openalex.org/W2144327418","https://openalex.org/W2178304595","https://openalex.org/W2242458479","https://openalex.org/W2396345169","https://openalex.org/W2510418978","https://openalex.org/W2765542845","https://openalex.org/W2782725035","https://openalex.org/W3023540311","https://openalex.org/W4250167030","https://openalex.org/W4251123232","https://openalex.org/W4254991892","https://openalex.org/W6642899326"],"related_works":["https://openalex.org/W4252527915","https://openalex.org/W2409287660","https://openalex.org/W2233357156","https://openalex.org/W1976489385","https://openalex.org/W4256317220","https://openalex.org/W1506225852","https://openalex.org/W2080951167","https://openalex.org/W1815542355","https://openalex.org/W2152540334","https://openalex.org/W4289655666"],"abstract_inverted_index":{"Safety":[0],"and":[1,24,35,89,104,109,148,170,212,219],"dependability":[2],"are":[3,101,116],"of":[4,41,48,86,107,140,158,195,208],"utmost":[5],"importance":[6,207],"for":[7],"many":[8],"integrated":[9],"systems.":[10],"Hence,":[11],"it":[12],"must":[13],"be":[14],"guaranteed":[15],"throughout":[16],"the":[17,29,39,83,110,206],"whole":[18],"system's":[19,30],"lifetime":[20],"that":[21,136,143,154],"no":[22],"ambient":[23],"internal":[25],"influences":[26],"can":[27,93,160,187],"affect":[28],"integrity.":[31],"Under":[32],"this":[33,74,76],"scope":[34],"having":[36],"in":[37,192],"mind":[38],"side-effects":[40],"today's":[42],"nanoscale":[43],"technologies,":[44],"hardware":[45],"degradation":[46,183],"is":[47,184],"rising":[49],"concern.":[50],"However,":[51],"related":[52],"studies":[53],"should":[54],"not":[55],"solely":[56],"focus":[57],"on":[58,81,112],"aging":[59,146,155,217,220],"effect":[60],"itself,":[61],"but":[62],"also":[63],"consider":[64],"its":[65,91],"relation":[66],"to":[67,120],"any":[68],"accelerating":[69],"factors,":[70],"especially":[71],"temperature.":[72],"Towards":[73],"end,":[75],"work":[77],"presents":[78],"a":[79,87,138,179,193],"study":[80,111],"how":[82,113],"power":[84,150,210],"dissipation":[85],"circuit,":[88],"thus,":[90],"temperature,":[92,214],"expedite":[94],"wear-out":[95],"effects.":[96],"Therefore,":[97],"three":[98],"different":[99],"analysis":[100,218],"performed-aging":[102],"without":[103],"with":[105],"consideration":[106,157],"temperature":[108,159],"guard-banding":[114],"strategies":[115],"affected.":[117],"In":[118],"order":[119],"distinguish":[121],"random":[122],"and,":[123],"maliciously":[124],"intended":[125],"or":[126,199],"accidentally":[127],"produced,":[128],"worst":[129],"case":[130],"scenarios,":[131],"we":[132],"implemented":[133],"an":[134],"algorithm":[135],"determines":[137],"combination":[139],"input":[141],"vectors":[142],"forces":[144],"high":[145,149],"states":[147,190],"dissipation.":[151],"Results":[152],"indicate":[153],"under":[156],"increase":[161],"circuit":[162],"delay":[163,182],"by":[164,171],"more":[165],"than":[166],"26%":[167],"(random":[168,201],"case)":[169,198],"nearly":[172],"40%":[173],"(worst":[174,197],"case).":[175,202],"That":[176],"means,":[177],"if":[178],"maximum":[180],"acceptable":[181],"defined,":[185],"designs":[186],"enter":[188],"malfunction":[189],"already":[191],"period":[194],"weeks":[196],"months":[200],"These":[203],"results":[204],"underline":[205],"considering":[209],"dissipation,":[211],"thus":[213],"when":[215],"doing":[216],"verification.":[221]},"counts_by_year":[{"year":2026,"cited_by_count":1}],"updated_date":"2026-08-12T21:12:35.861297","created_date":"2025-10-10T00:00:00"}