{"id":"https://openalex.org/W2799923955","doi":"https://doi.org/10.1109/iscas.2018.8351703","title":"An Energy-Efficient 13-bit Zero-Crossing \u0394\u03a3 Capacitance-to-Digital Converter with 1 pF-to-10 nF Sensing Range","display_name":"An Energy-Efficient 13-bit Zero-Crossing \u0394\u03a3 Capacitance-to-Digital Converter with 1 pF-to-10 nF Sensing Range","publication_year":2018,"publication_date":"2018-05-01","ids":{"openalex":"https://openalex.org/W2799923955","doi":"https://doi.org/10.1109/iscas.2018.8351703","mag":"2799923955"},"language":"en","primary_location":{"id":"doi:10.1109/iscas.2018.8351703","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas.2018.8351703","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 IEEE International Symposium on Circuits and Systems (ISCAS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100451297","display_name":"Bing Li","orcid":"https://orcid.org/0000-0002-8951-6112"},"institutions":[{"id":"https://openalex.org/I180726961","display_name":"Shenzhen University","ror":"https://ror.org/01vy4gh70","country_code":"CN","type":"education","lineage":["https://openalex.org/I180726961"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Bing Li","raw_affiliation_strings":["College of Electronic Science and Technology, Shenzhen University, Shenzhen, P. R. China"],"affiliations":[{"raw_affiliation_string":"College of Electronic Science and Technology, Shenzhen University, Shenzhen, P. R. China","institution_ids":["https://openalex.org/I180726961"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100386715","display_name":"Chuang Li","orcid":"https://orcid.org/0000-0003-1890-2064"},"institutions":[{"id":"https://openalex.org/I180726961","display_name":"Shenzhen University","ror":"https://ror.org/01vy4gh70","country_code":"CN","type":"education","lineage":["https://openalex.org/I180726961"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Chuang Li","raw_affiliation_strings":["College of Electronic Science and Technology, Shenzhen University, Shenzhen, P. R. China"],"affiliations":[{"raw_affiliation_string":"College of Electronic Science and Technology, Shenzhen University, Shenzhen, P. R. China","institution_ids":["https://openalex.org/I180726961"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100392010","display_name":"Wei Wang","orcid":"https://orcid.org/0000-0002-5608-1319"},"institutions":[{"id":"https://openalex.org/I180726961","display_name":"Shenzhen University","ror":"https://ror.org/01vy4gh70","country_code":"CN","type":"education","lineage":["https://openalex.org/I180726961"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wei Wang","raw_affiliation_strings":["College of Electronic Science and Technology, Shenzhen University, Shenzhen, P. R. China"],"affiliations":[{"raw_affiliation_string":"College of Electronic Science and Technology, Shenzhen University, Shenzhen, P. R. China","institution_ids":["https://openalex.org/I180726961"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100409705","display_name":"Jia Liu","orcid":"https://orcid.org/0000-0002-5357-2163"},"institutions":[{"id":"https://openalex.org/I180726961","display_name":"Shenzhen University","ror":"https://ror.org/01vy4gh70","country_code":"CN","type":"education","lineage":["https://openalex.org/I180726961"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jia Liu","raw_affiliation_strings":["College of Electronic Science and Technology, Shenzhen University, Shenzhen, P. R. China"],"affiliations":[{"raw_affiliation_string":"College of Electronic Science and Technology, Shenzhen University, Shenzhen, P. R. China","institution_ids":["https://openalex.org/I180726961"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100380171","display_name":"Wenjun Liu","orcid":"https://orcid.org/0000-0001-8881-7039"},"institutions":[{"id":"https://openalex.org/I180726961","display_name":"Shenzhen University","ror":"https://ror.org/01vy4gh70","country_code":"CN","type":"education","lineage":["https://openalex.org/I180726961"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wen-Jun Liu","raw_affiliation_strings":["College of Electronic Science and Technology, Shenzhen University, Shenzhen, P. R. China"],"affiliations":[{"raw_affiliation_string":"College of Electronic Science and Technology, Shenzhen University, Shenzhen, P. R. China","institution_ids":["https://openalex.org/I180726961"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101559528","display_name":"Qian Yang","orcid":"https://orcid.org/0000-0002-5447-9884"},"institutions":[{"id":"https://openalex.org/I180726961","display_name":"Shenzhen University","ror":"https://ror.org/01vy4gh70","country_code":"CN","type":"education","lineage":["https://openalex.org/I180726961"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Qian Yang","raw_affiliation_strings":["College of Electronic Science and Technology, Shenzhen University, Shenzhen, P. R. China"],"affiliations":[{"raw_affiliation_string":"College of Electronic Science and Technology, Shenzhen University, Shenzhen, P. R. China","institution_ids":["https://openalex.org/I180726961"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5101960498","display_name":"Wenbin Ye","orcid":"https://orcid.org/0000-0001-6978-813X"},"institutions":[{"id":"https://openalex.org/I180726961","display_name":"Shenzhen University","ror":"https://ror.org/01vy4gh70","country_code":"CN","type":"education","lineage":["https://openalex.org/I180726961"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wen-Bin Ye","raw_affiliation_strings":["College of Electronic Science and Technology, Shenzhen University, Shenzhen, P. R. China"],"affiliations":[{"raw_affiliation_string":"College of Electronic Science and Technology, Shenzhen University, Shenzhen, P. R. China","institution_ids":["https://openalex.org/I180726961"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":7,"corresponding_author_ids":["https://openalex.org/A5100451297"],"corresponding_institution_ids":["https://openalex.org/I180726961"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.04036658,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"5"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.9986000061035156,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/jitter","display_name":"Jitter","score":0.6543673276901245},{"id":"https://openalex.org/keywords/capacitance","display_name":"Capacitance","score":0.6479981541633606},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.6096583008766174},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.559440016746521},{"id":"https://openalex.org/keywords/linearity","display_name":"Linearity","score":0.5574145317077637},{"id":"https://openalex.org/keywords/dynamic-range","display_name":"Dynamic range","score":0.5060920119285583},{"id":"https://openalex.org/keywords/figure-of-merit","display_name":"Figure of merit","score":0.49054473638534546},{"id":"https://openalex.org/keywords/capacitor","display_name":"Capacitor","score":0.4625498652458191},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4533294439315796},{"id":"https://openalex.org/keywords/capacitive-sensing","display_name":"Capacitive sensing","score":0.45317867398262024},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.44411787390708923},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4411824941635132},{"id":"https://openalex.org/keywords/sample-and-hold","display_name":"Sample and hold","score":0.43551862239837646},{"id":"https://openalex.org/keywords/amplifier","display_name":"Amplifier","score":0.43050551414489746},{"id":"https://openalex.org/keywords/calibration","display_name":"Calibration","score":0.4151614308357239},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.37994644045829773},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.27285629510879517},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2167029082775116},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.13079068064689636}],"concepts":[{"id":"https://openalex.org/C134652429","wikidata":"https://www.wikidata.org/wiki/Q1052698","display_name":"Jitter","level":2,"score":0.6543673276901245},{"id":"https://openalex.org/C30066665","wikidata":"https://www.wikidata.org/wiki/Q164399","display_name":"Capacitance","level":3,"score":0.6479981541633606},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.6096583008766174},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.559440016746521},{"id":"https://openalex.org/C77170095","wikidata":"https://www.wikidata.org/wiki/Q1753188","display_name":"Linearity","level":2,"score":0.5574145317077637},{"id":"https://openalex.org/C87133666","wikidata":"https://www.wikidata.org/wiki/Q1161699","display_name":"Dynamic range","level":2,"score":0.5060920119285583},{"id":"https://openalex.org/C130277099","wikidata":"https://www.wikidata.org/wiki/Q3676605","display_name":"Figure of merit","level":2,"score":0.49054473638534546},{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.4625498652458191},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4533294439315796},{"id":"https://openalex.org/C206755178","wikidata":"https://www.wikidata.org/wiki/Q1131271","display_name":"Capacitive sensing","level":2,"score":0.45317867398262024},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.44411787390708923},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4411824941635132},{"id":"https://openalex.org/C206565188","wikidata":"https://www.wikidata.org/wiki/Q836482","display_name":"Sample and hold","level":3,"score":0.43551862239837646},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.43050551414489746},{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.4151614308357239},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.37994644045829773},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.27285629510879517},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2167029082775116},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.13079068064689636},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.0},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iscas.2018.8351703","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas.2018.8351703","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 IEEE International Symposium on Circuits and Systems (ISCAS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.9100000262260437}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":7,"referenced_works":["https://openalex.org/W2058792612","https://openalex.org/W2092769912","https://openalex.org/W2124730281","https://openalex.org/W2146744785","https://openalex.org/W2169574687","https://openalex.org/W2552852934","https://openalex.org/W2608117326"],"related_works":["https://openalex.org/W2121182846","https://openalex.org/W2155789024","https://openalex.org/W2315668284","https://openalex.org/W3213608175","https://openalex.org/W2109491806","https://openalex.org/W3117675750","https://openalex.org/W2141743053","https://openalex.org/W2037276323","https://openalex.org/W2037702163","https://openalex.org/W1920180504"],"abstract_inverted_index":{"Conventional":[0],"capacitance-to-digital":[1],"converters":[2],"(CDCs)":[3],"suffer":[4],"limitations":[5],"either":[6],"on":[7],"narrow":[8],"capacitance":[9,143],"range":[10],"or":[11],"low":[12],"resolution":[13,111],"for":[14,78],"jitter-induced":[15],"noise":[16,109],"and":[17,70,118],"high":[18],"power":[19],"consumption.":[20],"In":[21,36],"order":[22],"to":[23,51,57,134],"overcome":[24],"these":[25],"limitations,":[26],"a":[27,72,94,106,113,119],"13-bit":[28,107],"1":[29,139],"pF-to-10":[30,140],"nF":[31,141],"generic":[32],"CDC":[33,39,104],"is":[34,76,90],"presented.":[35],"the":[37,41,45,53,64,68,103,129,138],"proposed":[38],"with":[40,112],"oversampled":[42],"\u0394\u03a3":[43],"modulation,":[44],"zero-crossing-based":[46],"circuits":[47],"(ZCBCs)":[48],"are":[49],"used":[50],"replace":[52],"operational":[54],"transconductance":[55],"amplifier":[56],"avoid":[58],"feedback":[59],"loop":[60],"stability":[61],"issues.":[62],"However,":[63],"ZCBCs":[65],"inevitably":[66],"incur":[67],"non-idealities":[69],"thus":[71],"novel":[73],"calibration":[74,126],"scheme":[75,127],"presented":[77],"efficient":[79],"non-ideality-error":[80],"cancellation.":[81],"A":[82],"prototype":[83],"fabricated":[84],"using":[85,93],"0.18":[86],"\u03bcm":[87],"CMOS":[88],"technology":[89],"experimentally":[91],"verified":[92],"MEMS":[95],"capacitive":[96],"humidity":[97],"sensor.":[98],"The":[99,125],"measurement":[100],"results":[101],"show":[102],"achieves":[105],"rms":[108],"equivalent":[110],"128":[114],"\u03bcs":[115],"conversion":[116],"time":[117],"230":[120],"fJ/conversion-step":[121],"figure":[122],"of":[123],"merit.":[124],"enhances":[128],"linearity":[130],"from":[131],"7":[132],"bits":[133,136],"11.4":[135],"in":[137],"compatible":[142],"range.":[144]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}