{"id":"https://openalex.org/W2799975851","doi":"https://doi.org/10.1109/iscas.2018.8351329","title":"A 0.20-V to 0.25-V, Sub-nW, Rail-to-Rail, 10-bit SAR ADC for Self-Sustainable IoT Applications","display_name":"A 0.20-V to 0.25-V, Sub-nW, Rail-to-Rail, 10-bit SAR ADC for Self-Sustainable IoT Applications","publication_year":2018,"publication_date":"2018-05-01","ids":{"openalex":"https://openalex.org/W2799975851","doi":"https://doi.org/10.1109/iscas.2018.8351329","mag":"2799975851"},"language":"en","primary_location":{"id":"doi:10.1109/iscas.2018.8351329","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas.2018.8351329","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 IEEE International Symposium on Circuits and Systems (ISCAS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5108047268","display_name":"Hao-Chiao Hong","orcid":"https://orcid.org/0000-0003-0757-1001"},"institutions":[{"id":"https://openalex.org/I148366613","display_name":"National Yang Ming Chiao Tung University","ror":"https://ror.org/00se2k293","country_code":"TW","type":"education","lineage":["https://openalex.org/I148366613"]}],"countries":["TW"],"is_corresponding":true,"raw_author_name":"Hao-Chiao Hong","raw_affiliation_strings":["Department of Electrical and Computer Engineering, National Chiao Tung University, Hsinchu, Taiwan, R.O.C"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, National Chiao Tung University, Hsinchu, Taiwan, R.O.C","institution_ids":["https://openalex.org/I148366613"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5033965812","display_name":"Yi Chiu","orcid":"https://orcid.org/0000-0002-1149-9228"},"institutions":[{"id":"https://openalex.org/I148366613","display_name":"National Yang Ming Chiao Tung University","ror":"https://ror.org/00se2k293","country_code":"TW","type":"education","lineage":["https://openalex.org/I148366613"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Yi Chiu","raw_affiliation_strings":["Department of Electrical and Computer Engineering, National Chiao Tung University, Hsinchu, Taiwan, R.O.C"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, National Chiao Tung University, Hsinchu, Taiwan, R.O.C","institution_ids":["https://openalex.org/I148366613"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5108047268"],"corresponding_institution_ids":["https://openalex.org/I148366613"],"apc_list":null,"apc_paid":null,"fwci":0.109,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.42576753,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/comparator","display_name":"Comparator","score":0.9109989404678345},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.6880512237548828},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.5760438442230225},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.5717768669128418},{"id":"https://openalex.org/keywords/subthreshold-conduction","display_name":"Subthreshold conduction","score":0.5247939825057983},{"id":"https://openalex.org/keywords/biasing","display_name":"Biasing","score":0.48960500955581665},{"id":"https://openalex.org/keywords/successive-approximation-adc","display_name":"Successive approximation ADC","score":0.4707682132720947},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.44459328055381775},{"id":"https://openalex.org/keywords/leakage","display_name":"Leakage (economics)","score":0.4400210976600647},{"id":"https://openalex.org/keywords/internet-of-things","display_name":"Internet of Things","score":0.42663952708244324},{"id":"https://openalex.org/keywords/12-bit","display_name":"12-bit","score":0.42611053586006165},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.39431074261665344},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3896467983722687},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.3704802691936493},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2714153528213501},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.14907875657081604}],"concepts":[{"id":"https://openalex.org/C155745195","wikidata":"https://www.wikidata.org/wiki/Q1164179","display_name":"Comparator","level":3,"score":0.9109989404678345},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.6880512237548828},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.5760438442230225},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.5717768669128418},{"id":"https://openalex.org/C156465305","wikidata":"https://www.wikidata.org/wiki/Q1658601","display_name":"Subthreshold conduction","level":4,"score":0.5247939825057983},{"id":"https://openalex.org/C20254490","wikidata":"https://www.wikidata.org/wiki/Q719550","display_name":"Biasing","level":3,"score":0.48960500955581665},{"id":"https://openalex.org/C60154766","wikidata":"https://www.wikidata.org/wiki/Q2650458","display_name":"Successive approximation ADC","level":4,"score":0.4707682132720947},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.44459328055381775},{"id":"https://openalex.org/C2777042071","wikidata":"https://www.wikidata.org/wiki/Q6509304","display_name":"Leakage (economics)","level":2,"score":0.4400210976600647},{"id":"https://openalex.org/C81860439","wikidata":"https://www.wikidata.org/wiki/Q251212","display_name":"Internet of Things","level":2,"score":0.42663952708244324},{"id":"https://openalex.org/C2776310492","wikidata":"https://www.wikidata.org/wiki/Q3271420","display_name":"12-bit","level":3,"score":0.42611053586006165},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.39431074261665344},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3896467983722687},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.3704802691936493},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2714153528213501},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.14907875657081604},{"id":"https://openalex.org/C139719470","wikidata":"https://www.wikidata.org/wiki/Q39680","display_name":"Macroeconomics","level":1,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iscas.2018.8351329","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas.2018.8351329","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 IEEE International Symposium on Circuits and Systems (ISCAS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/12","score":0.41999998688697815,"display_name":"Responsible consumption and production"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":14,"referenced_works":["https://openalex.org/W1906827922","https://openalex.org/W1978557849","https://openalex.org/W1980893811","https://openalex.org/W2015111322","https://openalex.org/W2018896644","https://openalex.org/W2036861355","https://openalex.org/W2093290783","https://openalex.org/W2156180514","https://openalex.org/W2315613779","https://openalex.org/W2553804668","https://openalex.org/W2667213732","https://openalex.org/W2751861384","https://openalex.org/W4285719527","https://openalex.org/W6645096542"],"related_works":["https://openalex.org/W2278942241","https://openalex.org/W2737520138","https://openalex.org/W2467612263","https://openalex.org/W1977749038","https://openalex.org/W2082979872","https://openalex.org/W1641489184","https://openalex.org/W3004044036","https://openalex.org/W2792167570","https://openalex.org/W2290076986","https://openalex.org/W2368405386"],"abstract_inverted_index":{"This":[0],"paper":[1],"presents":[2],"a":[3,9,78,84],"10-bit":[4],"SAR":[5],"ADC":[6,117,168],"operating":[7,49],"at":[8,66,82,103,131,161,173],"supply":[10],"voltage":[11,80],"(vDD)":[12],"of":[13,46,63,74,185],"0.225":[14,174],"V":[15,20,175],"and":[16,135,140,164],"down":[17],"to":[18,41,68,97,182],"0.2":[19],"for":[21,34],"self-sustainable":[22],"IoT":[23],"applications.":[24],"We":[25],"propose":[26],"an":[27,183],"ultra-low":[28],"VDD":[29,67],"temperature-compensated":[30],"bias":[31,69],"current":[32],"generator":[33],"biasing":[35],"the":[36,43,47,51,56,59,64,70,75,99,133,144,154,177],"comparator":[37,65,76],"against":[38],"temperature":[39],"variation":[40],"address":[42,98],"temperature-dependent":[44],"issue":[45,102],"MOSFETs":[48],"in":[50,113,143],"subthreshold":[52],"region.":[53],"In":[54],"addition,":[55],"design":[57],"fixes":[58],"positive":[60],"input":[61,71,146,156],"terminal":[62],"transistor":[72],"pair":[73],"with":[77,89,153],"sufficient":[79],"headroom":[81],"such":[83],"low":[85,104],"VDD.":[86],"The":[87,116,149,166],"double-boosted":[88],"leakage":[90,101],"reduction":[91],"sampling":[92,105],"switch":[93],"is":[94,158],"also":[95],"proposed":[96],"severe":[100],"rates.":[106],"A":[107],"test":[108],"chip":[109],"has":[110],"been":[111],"fabricated":[112],"180-nm":[114],"CMOS.":[115],"core":[118],"occupies":[119],"only":[120],"0.024":[121],"mm":[122],"<sup":[123],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[124],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">2</sup>":[125],".":[126],"Measurement":[127],"results":[128],"show":[129],"that":[130],"0.225V,":[132],"DNL":[134],"INL":[136],"are":[137],"within":[138],"+1.04/-0.66":[139],"+0.97/-1.04":[141],"LSB":[142],"rail-to-rail":[145],"range,":[147],"respectively.":[148],"measured":[150],"peak":[151],"SNDR":[152],"Nyquist":[155],"frequency":[157],"49.8":[159],"dB":[160],"450":[162],"S/s":[163],"0.225V.":[165],"whole":[167],"totally":[169],"consumes":[170],"0.85":[171],"nW":[172],"including":[176],"circuit":[178],"leakages.":[179],"It":[180],"corresponds":[181],"FoM":[184],"8.0":[186],"fJ/conv.-step.":[187]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2018,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}