{"id":"https://openalex.org/W2801983995","doi":"https://doi.org/10.1109/iscas.2018.8351265","title":"A Capacitor-less LDO With Fast-transient Error Amplifier and Push-pull Differentiator","display_name":"A Capacitor-less LDO With Fast-transient Error Amplifier and Push-pull Differentiator","publication_year":2018,"publication_date":"2018-01-01","ids":{"openalex":"https://openalex.org/W2801983995","doi":"https://doi.org/10.1109/iscas.2018.8351265","mag":"2801983995"},"language":"en","primary_location":{"id":"doi:10.1109/iscas.2018.8351265","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas.2018.8351265","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 IEEE International Symposium on Circuits and Systems (ISCAS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5007973739","display_name":"Xin Ming","orcid":"https://orcid.org/0000-0002-9238-5950"},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]},{"id":"https://openalex.org/I4210124847","display_name":"National Engineering Research Center of Electromagnetic Radiation Control Materials","ror":"https://ror.org/02k4dcs46","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210124847"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Xin Ming","raw_affiliation_strings":["State key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, China"],"affiliations":[{"raw_affiliation_string":"State key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, China","institution_ids":["https://openalex.org/I4210124847","https://openalex.org/I150229711"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100445514","display_name":"Jiahao Zhang","orcid":"https://orcid.org/0009-0005-5146-4977"},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]},{"id":"https://openalex.org/I4210124847","display_name":"National Engineering Research Center of Electromagnetic Radiation Control Materials","ror":"https://ror.org/02k4dcs46","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210124847"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jia-hao Zhang","raw_affiliation_strings":["State key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, China"],"affiliations":[{"raw_affiliation_string":"State key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, China","institution_ids":["https://openalex.org/I4210124847","https://openalex.org/I150229711"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5030853315","display_name":"Chun-qi Zhang","orcid":null},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]},{"id":"https://openalex.org/I4210124847","display_name":"National Engineering Research Center of Electromagnetic Radiation Control Materials","ror":"https://ror.org/02k4dcs46","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210124847"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Chun-qi Zhang","raw_affiliation_strings":["State key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, China"],"affiliations":[{"raw_affiliation_string":"State key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, China","institution_ids":["https://openalex.org/I4210124847","https://openalex.org/I150229711"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102006245","display_name":"Li Hu","orcid":"https://orcid.org/0000-0002-2618-8932"},"institutions":[{"id":"https://openalex.org/I4210124847","display_name":"National Engineering Research Center of Electromagnetic Radiation Control Materials","ror":"https://ror.org/02k4dcs46","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210124847"]},{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Li Hu","raw_affiliation_strings":["State key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, China"],"affiliations":[{"raw_affiliation_string":"State key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, China","institution_ids":["https://openalex.org/I4210124847","https://openalex.org/I150229711"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5044487582","display_name":"Yao Qin","orcid":"https://orcid.org/0000-0003-2692-4917"},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]},{"id":"https://openalex.org/I4210124847","display_name":"National Engineering Research Center of Electromagnetic Radiation Control Materials","ror":"https://ror.org/02k4dcs46","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210124847"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yao Qin","raw_affiliation_strings":["State key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, China"],"affiliations":[{"raw_affiliation_string":"State key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, China","institution_ids":["https://openalex.org/I4210124847","https://openalex.org/I150229711"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5061074926","display_name":"Shaowei Zhen","orcid":null},"institutions":[{"id":"https://openalex.org/I4210124847","display_name":"National Engineering Research Center of Electromagnetic Radiation Control Materials","ror":"https://ror.org/02k4dcs46","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210124847"]},{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shao-wei Zhen","raw_affiliation_strings":["State key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, China"],"affiliations":[{"raw_affiliation_string":"State key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, China","institution_ids":["https://openalex.org/I4210124847","https://openalex.org/I150229711"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100320398","display_name":"Bo Zhang","orcid":"https://orcid.org/0000-0003-1288-1549"},"institutions":[{"id":"https://openalex.org/I4210124847","display_name":"National Engineering Research Center of Electromagnetic Radiation Control Materials","ror":"https://ror.org/02k4dcs46","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210124847"]},{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Bo Zhang","raw_affiliation_strings":["State key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, China"],"affiliations":[{"raw_affiliation_string":"State key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, China","institution_ids":["https://openalex.org/I4210124847","https://openalex.org/I150229711"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":7,"corresponding_author_ids":["https://openalex.org/A5007973739"],"corresponding_institution_ids":["https://openalex.org/I150229711","https://openalex.org/I4210124847"],"apc_list":null,"apc_paid":null,"fwci":0.2179,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.50659765,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"5"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/differentiator","display_name":"Differentiator","score":0.7347458004951477},{"id":"https://openalex.org/keywords/transient-response","display_name":"Transient response","score":0.6549373865127563},{"id":"https://openalex.org/keywords/low-dropout-regulator","display_name":"Low-dropout regulator","score":0.6440674662590027},{"id":"https://openalex.org/keywords/capacitor","display_name":"Capacitor","score":0.6132957935333252},{"id":"https://openalex.org/keywords/control-theory","display_name":"Control theory (sociology)","score":0.5306531190872192},{"id":"https://openalex.org/keywords/capacitance","display_name":"Capacitance","score":0.5188261866569519},{"id":"https://openalex.org/keywords/transient","display_name":"Transient (computer programming)","score":0.5000228881835938},{"id":"https://openalex.org/keywords/biasing","display_name":"Biasing","score":0.45875218510627747},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4467073082923889},{"id":"https://openalex.org/keywords/bandwidth","display_name":"Bandwidth (computing)","score":0.44532012939453125},{"id":"https://openalex.org/keywords/amplifier","display_name":"Amplifier","score":0.4411208927631378},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.42961329221725464},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.4219702482223511},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4070231020450592},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.39066562056541443},{"id":"https://openalex.org/keywords/voltage-regulator","display_name":"Voltage regulator","score":0.3335702419281006},{"id":"https://openalex.org/keywords/dropout-voltage","display_name":"Dropout voltage","score":0.3197649419307709},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.30354368686676025},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2717389166355133},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.22714844346046448},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.09672588109970093}],"concepts":[{"id":"https://openalex.org/C12112733","wikidata":"https://www.wikidata.org/wiki/Q2659948","display_name":"Differentiator","level":3,"score":0.7347458004951477},{"id":"https://openalex.org/C85761212","wikidata":"https://www.wikidata.org/wiki/Q1974593","display_name":"Transient response","level":2,"score":0.6549373865127563},{"id":"https://openalex.org/C140501009","wikidata":"https://www.wikidata.org/wiki/Q6692746","display_name":"Low-dropout regulator","level":5,"score":0.6440674662590027},{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.6132957935333252},{"id":"https://openalex.org/C47446073","wikidata":"https://www.wikidata.org/wiki/Q5165890","display_name":"Control theory (sociology)","level":3,"score":0.5306531190872192},{"id":"https://openalex.org/C30066665","wikidata":"https://www.wikidata.org/wiki/Q164399","display_name":"Capacitance","level":3,"score":0.5188261866569519},{"id":"https://openalex.org/C2780799671","wikidata":"https://www.wikidata.org/wiki/Q17087362","display_name":"Transient (computer programming)","level":2,"score":0.5000228881835938},{"id":"https://openalex.org/C20254490","wikidata":"https://www.wikidata.org/wiki/Q719550","display_name":"Biasing","level":3,"score":0.45875218510627747},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4467073082923889},{"id":"https://openalex.org/C2776257435","wikidata":"https://www.wikidata.org/wiki/Q1576430","display_name":"Bandwidth (computing)","level":2,"score":0.44532012939453125},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.4411208927631378},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.42961329221725464},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.4219702482223511},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4070231020450592},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.39066562056541443},{"id":"https://openalex.org/C110706871","wikidata":"https://www.wikidata.org/wiki/Q851210","display_name":"Voltage regulator","level":3,"score":0.3335702419281006},{"id":"https://openalex.org/C15032970","wikidata":"https://www.wikidata.org/wiki/Q851210","display_name":"Dropout voltage","level":4,"score":0.3197649419307709},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.30354368686676025},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2717389166355133},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.22714844346046448},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.09672588109970093},{"id":"https://openalex.org/C2775924081","wikidata":"https://www.wikidata.org/wiki/Q55608371","display_name":"Control (management)","level":2,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iscas.2018.8351265","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas.2018.8351265","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 IEEE International Symposium on Circuits and Systems (ISCAS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.8700000047683716,"display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":10,"referenced_works":["https://openalex.org/W1535573002","https://openalex.org/W2066956739","https://openalex.org/W2109665701","https://openalex.org/W2117615344","https://openalex.org/W2117965437","https://openalex.org/W2122790352","https://openalex.org/W2161857259","https://openalex.org/W2164530563","https://openalex.org/W2167017502","https://openalex.org/W2594853240"],"related_works":["https://openalex.org/W1982997428","https://openalex.org/W2044172536","https://openalex.org/W2371498377","https://openalex.org/W2370995213","https://openalex.org/W3185987145","https://openalex.org/W4366165321","https://openalex.org/W3081405802","https://openalex.org/W4287514677","https://openalex.org/W2737475872","https://openalex.org/W3093591532"],"abstract_inverted_index":{"This":[0],"paper":[1],"presents":[2],"a":[3,26,29,44,107,144],"fully-integrated":[4],"and":[5,15,31,43,66,96,111,153],"fast-transient":[6],"capacitor-less":[7],"low-dropout":[8],"regulator":[9,65],"(LDO)":[10],"with":[11,38,58],"high":[12],"loop":[13,75,94],"gain":[14,95],"bandwidth":[16,97],"in":[17,87,106],"full":[18],"load":[19,131,146],"range":[20],"for":[21],"SoC":[22],"application.":[23],"It":[24],"utilizes":[25],"combination":[27],"of":[28,51,63,93,117],"signal-":[30],"transient-current":[32],"boosting":[33],"(STCB)":[34],"error":[35],"amplifier":[36],"(EA)":[37],"transient":[39,79],"enhancement":[40],"circuit":[41,89],"(TEC)":[42],"push-pull":[45],"differentiator":[46,68],"to":[47,72,90],"drive":[48],"gate":[49],"capacitance":[50],"the":[52,64,67,74,88,141,160],"power":[53],"transistor.":[54],"The":[55,101,137],"STCB-based":[56],"EA":[57],"TEC":[59],"ensures":[60],"fast":[61],"response":[62,80],"is":[69,85,104,149,157],"also":[70],"adopted":[71],"enhance":[73],"stability":[76],"while":[77],"improving":[78],"simultaneously.":[81],"Moreover,":[82],"adaptive":[83],"biasing":[84],"implemented":[86],"compensate":[91],"decrease":[92],"at":[98,133,140,159],"heavy":[99],"load.":[100],"proposed":[102],"LDO":[103],"fabricated":[105],"0.5\u03bcm":[108],"CMOS":[109],"process":[110],"occupies":[112],"an":[113],"active":[114],"chip":[115],"area":[116],"0.077mm":[118],"<sup":[119],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[120],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">2</sup>":[121],".":[122],"Simulation":[123],"results":[124],"demonstrate":[125],"that":[126],"it":[127],"can":[128],"deliver":[129],"100mA":[130],"current":[132,147],"100mV":[134],"dropout":[135],"voltage.":[136],"voltage":[138],"spike":[139],"output,":[142],"undergoing":[143],"maximum":[145],"change,":[148],"controlled":[150],"below":[151],"300mV":[152],"good":[154],"line/load":[155],"regulation":[156],"achieved":[158],"same":[161],"time.":[162]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}