{"id":"https://openalex.org/W2802885994","doi":"https://doi.org/10.1109/iscas.2018.8351236","title":"A Transient-Enhanced Fully-Integrated LDO Regulator for SoC Application","display_name":"A Transient-Enhanced Fully-Integrated LDO Regulator for SoC Application","publication_year":2018,"publication_date":"2018-01-01","ids":{"openalex":"https://openalex.org/W2802885994","doi":"https://doi.org/10.1109/iscas.2018.8351236","mag":"2802885994"},"language":"en","primary_location":{"id":"doi:10.1109/iscas.2018.8351236","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas.2018.8351236","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 IEEE International Symposium on Circuits and Systems (ISCAS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5068912004","display_name":"Nanqi Liu","orcid":"https://orcid.org/0000-0002-7794-1955"},"institutions":[{"id":"https://openalex.org/I173911158","display_name":"Iowa State University","ror":"https://ror.org/04rswrd78","country_code":"US","type":"education","lineage":["https://openalex.org/I173911158"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Nanqi Liu","raw_affiliation_strings":["Dept. of Electrical and Computer Engineering, Iowa State University, Ames, IA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Dept. of Electrical and Computer Engineering, Iowa State University, Ames, IA","institution_ids":["https://openalex.org/I173911158"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5020529252","display_name":"Brian Johnson","orcid":"https://orcid.org/0000-0001-9122-172X"},"institutions":[{"id":"https://openalex.org/I74760111","display_name":"Texas Instruments (United States)","ror":"https://ror.org/03vsmv677","country_code":"US","type":"company","lineage":["https://openalex.org/I74760111"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Brian Johnson","raw_affiliation_strings":["Texas Instruments Inc., Tucson, AZ"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Texas Instruments Inc., Tucson, AZ","institution_ids":["https://openalex.org/I74760111"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5024259112","display_name":"Vinay Nadig","orcid":null},"institutions":[{"id":"https://openalex.org/I74760111","display_name":"Texas Instruments (United States)","ror":"https://ror.org/03vsmv677","country_code":"US","type":"company","lineage":["https://openalex.org/I74760111"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Vinay Nadig","raw_affiliation_strings":["Texas Instruments Inc, Dallas, TX, US"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Texas Instruments Inc, Dallas, TX, US","institution_ids":["https://openalex.org/I74760111"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5101873076","display_name":"Degang Chen","orcid":"https://orcid.org/0000-0002-5938-6329"},"institutions":[{"id":"https://openalex.org/I173911158","display_name":"Iowa State University","ror":"https://ror.org/04rswrd78","country_code":"US","type":"education","lineage":["https://openalex.org/I173911158"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Degang Chen","raw_affiliation_strings":["Dept. of Electrical and Computer Engineering, Iowa State University, Ames, IA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Dept. of Electrical and Computer Engineering, Iowa State University, Ames, IA","institution_ids":["https://openalex.org/I173911158"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.5575,"has_fulltext":false,"cited_by_count":22,"citation_normalized_percentile":{"value":0.64409017,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"5"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/cascode","display_name":"Cascode","score":0.6948947906494141},{"id":"https://openalex.org/keywords/glitch","display_name":"Glitch","score":0.6653394103050232},{"id":"https://openalex.org/keywords/low-dropout-regulator","display_name":"Low-dropout regulator","score":0.639187216758728},{"id":"https://openalex.org/keywords/transient","display_name":"Transient (computer programming)","score":0.635706901550293},{"id":"https://openalex.org/keywords/nmos-logic","display_name":"NMOS logic","score":0.5998413562774658},{"id":"https://openalex.org/keywords/settling-time","display_name":"Settling time","score":0.5885069370269775},{"id":"https://openalex.org/keywords/transient-response","display_name":"Transient response","score":0.5657413601875305},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.5454221367835999},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.5128989219665527},{"id":"https://openalex.org/keywords/dropout-voltage","display_name":"Dropout voltage","score":0.5109450221061707},{"id":"https://openalex.org/keywords/pmos-logic","display_name":"PMOS logic","score":0.5071506500244141},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.48558372259140015},{"id":"https://openalex.org/keywords/overshoot","display_name":"Overshoot (microwave communication)","score":0.4589139223098755},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.43774300813674927},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.43535101413726807},{"id":"https://openalex.org/keywords/voltage-regulator","display_name":"Voltage regulator","score":0.370086669921875},{"id":"https://openalex.org/keywords/control-theory","display_name":"Control theory (sociology)","score":0.3523273468017578},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.32924556732177734},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3215397000312805},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.30726727843284607},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.27333301305770874},{"id":"https://openalex.org/keywords/step-response","display_name":"Step response","score":0.07324641942977905}],"concepts":[{"id":"https://openalex.org/C2775946640","wikidata":"https://www.wikidata.org/wiki/Q1735017","display_name":"Cascode","level":4,"score":0.6948947906494141},{"id":"https://openalex.org/C191287063","wikidata":"https://www.wikidata.org/wiki/Q543281","display_name":"Glitch","level":3,"score":0.6653394103050232},{"id":"https://openalex.org/C140501009","wikidata":"https://www.wikidata.org/wiki/Q6692746","display_name":"Low-dropout regulator","level":5,"score":0.639187216758728},{"id":"https://openalex.org/C2780799671","wikidata":"https://www.wikidata.org/wiki/Q17087362","display_name":"Transient (computer programming)","level":2,"score":0.635706901550293},{"id":"https://openalex.org/C197162436","wikidata":"https://www.wikidata.org/wiki/Q83908","display_name":"NMOS logic","level":4,"score":0.5998413562774658},{"id":"https://openalex.org/C14781684","wikidata":"https://www.wikidata.org/wiki/Q3983320","display_name":"Settling time","level":3,"score":0.5885069370269775},{"id":"https://openalex.org/C85761212","wikidata":"https://www.wikidata.org/wiki/Q1974593","display_name":"Transient response","level":2,"score":0.5657413601875305},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.5454221367835999},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5128989219665527},{"id":"https://openalex.org/C15032970","wikidata":"https://www.wikidata.org/wiki/Q851210","display_name":"Dropout voltage","level":4,"score":0.5109450221061707},{"id":"https://openalex.org/C27050352","wikidata":"https://www.wikidata.org/wiki/Q173605","display_name":"PMOS logic","level":4,"score":0.5071506500244141},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.48558372259140015},{"id":"https://openalex.org/C2780323453","wikidata":"https://www.wikidata.org/wiki/Q7113957","display_name":"Overshoot (microwave communication)","level":2,"score":0.4589139223098755},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.43774300813674927},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.43535101413726807},{"id":"https://openalex.org/C110706871","wikidata":"https://www.wikidata.org/wiki/Q851210","display_name":"Voltage regulator","level":3,"score":0.370086669921875},{"id":"https://openalex.org/C47446073","wikidata":"https://www.wikidata.org/wiki/Q5165890","display_name":"Control theory (sociology)","level":3,"score":0.3523273468017578},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.32924556732177734},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3215397000312805},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.30726727843284607},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.27333301305770874},{"id":"https://openalex.org/C160030872","wikidata":"https://www.wikidata.org/wiki/Q2142864","display_name":"Step response","level":2,"score":0.07324641942977905},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C2775924081","wikidata":"https://www.wikidata.org/wiki/Q55608371","display_name":"Control (management)","level":2,"score":0.0},{"id":"https://openalex.org/C133731056","wikidata":"https://www.wikidata.org/wiki/Q4917288","display_name":"Control engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iscas.2018.8351236","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas.2018.8351236","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 IEEE International Symposium on Circuits and Systems (ISCAS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","score":0.5899999737739563,"id":"https://metadata.un.org/sdg/9"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":15,"referenced_works":["https://openalex.org/W23887296","https://openalex.org/W1605127156","https://openalex.org/W1978760319","https://openalex.org/W2034126073","https://openalex.org/W2054989520","https://openalex.org/W2064956733","https://openalex.org/W2090683789","https://openalex.org/W2104391843","https://openalex.org/W2117615344","https://openalex.org/W2117965437","https://openalex.org/W2138264002","https://openalex.org/W2138536318","https://openalex.org/W2474815016","https://openalex.org/W2482574974","https://openalex.org/W6680237165"],"related_works":["https://openalex.org/W2371498377","https://openalex.org/W4366165321","https://openalex.org/W2370995213","https://openalex.org/W1982997428","https://openalex.org/W4282007662","https://openalex.org/W2044172536","https://openalex.org/W2329027418","https://openalex.org/W2359329396","https://openalex.org/W2045827107","https://openalex.org/W1849967185"],"abstract_inverted_index":{"A":[0,23],"fully":[1],"integrated":[2],"low-dropout":[3],"regulator":[4],"(LDO)":[5],"with":[6,91,126],"ultra-fast":[7],"transient":[8,49,71,104],"settling":[9,142],"is":[10,28,77,121],"proposed":[11,47],"to":[12,38,108,113],"provide":[13],"a":[14,54,80,132,140],"clean":[15],"supply":[16],"for":[17,43,57],"digital":[18],"circuits":[19],"in":[20,79],"nano-scale":[21],"technology.":[22],"super":[24],"source":[25],"follower":[26,35],"(SSF)":[27],"inserted":[29],"into":[30],"the":[31,40,69,116],"cascode":[32],"flipped":[33],"voltage":[34,73],"(FVF)":[36],"topology":[37],"drive":[39,53],"power":[41],"transistor":[42,56],"fast":[44,58],"turn-on.":[45],"The":[46,60,75],"positive":[48],"detection":[50],"(PTD)":[51],"circuit":[52],"NMOS":[55],"pull-down.":[59],"combined":[61],"effects":[62],"of":[63,105,136,145],"these":[64],"two":[65],"techniques":[66],"significantly":[67],"attenuate":[68],"load":[70,103],"induced":[72],"spikes.":[74],"LDO":[76],"designed":[78],"130":[81],"nm":[82],"CMOS":[83],"process":[84],"and":[85,96,111,119,139],"consumes":[86],"100":[87,106,114],"\u03bcA":[88,107],"quiescent":[89],"current":[90],"1.2":[92],"V":[93],"regulated":[94],"output":[95],"200":[97],"mV":[98,125],"dropout":[99],"voltage.":[100],"For":[101],"large":[102],"20":[109],"mA":[110],"back":[112],"\u03bcA,":[115],"simulated":[117],"undershoot":[118],"overshoot":[120],"less":[122],"than":[123],"95":[124],"150":[127],"ns":[128],"recovery":[129],"time,":[130],"demonstrating":[131],"glitch":[133,141],"peak":[134],"reduction":[135,144],"6":[137],"times":[138],"time":[143],"5":[146],"times.":[147]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":3},{"year":2024,"cited_by_count":6},{"year":2023,"cited_by_count":5},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":2},{"year":2019,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}