{"id":"https://openalex.org/W2801707638","doi":"https://doi.org/10.1109/iscas.2018.8351214","title":"Error Probability Models to Facilitate Approximate Computing in TFET based Circuits","display_name":"Error Probability Models to Facilitate Approximate Computing in TFET based Circuits","publication_year":2018,"publication_date":"2018-05-01","ids":{"openalex":"https://openalex.org/W2801707638","doi":"https://doi.org/10.1109/iscas.2018.8351214","mag":"2801707638"},"language":"en","primary_location":{"id":"doi:10.1109/iscas.2018.8351214","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas.2018.8351214","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 IEEE International Symposium on Circuits and Systems (ISCAS)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5040915860","display_name":"Mallika Rathore","orcid":"https://orcid.org/0000-0002-3829-3887"},"institutions":[{"id":"https://openalex.org/I59553526","display_name":"Stony Brook University","ror":"https://ror.org/05qghxh33","country_code":"US","type":"education","lineage":["https://openalex.org/I59553526"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Mallika Rathore","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Stony Brook University (SUNY), New York, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Stony Brook University (SUNY), New York, USA","institution_ids":["https://openalex.org/I59553526"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5061262597","display_name":"Emre Salman","orcid":"https://orcid.org/0000-0001-6538-6803"},"institutions":[{"id":"https://openalex.org/I59553526","display_name":"Stony Brook University","ror":"https://ror.org/05qghxh33","country_code":"US","type":"education","lineage":["https://openalex.org/I59553526"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Emre Salman","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Stony Brook University (SUNY), New York, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Stony Brook University (SUNY), New York, USA","institution_ids":["https://openalex.org/I59553526"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I59553526"],"apc_list":null,"apc_paid":null,"fwci":0.3896,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.45069258,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"5"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.7508218884468079},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.6829888820648193},{"id":"https://openalex.org/keywords/probabilistic-logic","display_name":"Probabilistic logic","score":0.6690247058868408},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5958366394042969},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5899011492729187},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5495237708091736},{"id":"https://openalex.org/keywords/sensitivity","display_name":"Sensitivity (control systems)","score":0.49114057421684265},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.4788224995136261},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.4682142734527588},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.43942806124687195},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.436952143907547},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.39889228343963623},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2997809946537018},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.1354738473892212},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.07335087656974792}],"concepts":[{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.7508218884468079},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.6829888820648193},{"id":"https://openalex.org/C49937458","wikidata":"https://www.wikidata.org/wiki/Q2599292","display_name":"Probabilistic logic","level":2,"score":0.6690247058868408},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5958366394042969},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5899011492729187},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5495237708091736},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.49114057421684265},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.4788224995136261},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.4682142734527588},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.43942806124687195},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.436952143907547},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.39889228343963623},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2997809946537018},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.1354738473892212},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.07335087656974792},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iscas.2018.8351214","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas.2018.8351214","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 IEEE International Symposium on Circuits and Systems (ISCAS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.8999999761581421,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":14,"referenced_works":["https://openalex.org/W2032197740","https://openalex.org/W2040389404","https://openalex.org/W2062632887","https://openalex.org/W2092795393","https://openalex.org/W2100332326","https://openalex.org/W2107511992","https://openalex.org/W2110584581","https://openalex.org/W2116739712","https://openalex.org/W2161755113","https://openalex.org/W2247480952","https://openalex.org/W2486552647","https://openalex.org/W2516816469","https://openalex.org/W2629157711","https://openalex.org/W4285719527"],"related_works":["https://openalex.org/W3014521742","https://openalex.org/W2617868873","https://openalex.org/W2389800961","https://openalex.org/W1995389502","https://openalex.org/W2501578203","https://openalex.org/W2113108952","https://openalex.org/W2040773997","https://openalex.org/W3215142653","https://openalex.org/W1487051936","https://openalex.org/W194748710"],"abstract_inverted_index":{"A":[0,56],"probabilistic":[1],"approach":[2],"is":[3,36,71,92,102],"developed":[4],"to":[5,38,74,105],"evaluate":[6],"the":[7,15,41,76],"impact":[8],"of":[9,19,44],"power":[10],"supply":[11,31,80],"voltage":[12],"fluctuations":[13],"on":[14],"output":[16],"error":[17,42,84],"probability":[18,43,85],"tunnel":[20],"field-effect":[21],"transistor":[22],"(TFET)":[23],"based":[24,69,97],"integrated":[25],"circuits":[26,47,70,98],"(ICs)":[27],"operating":[28,108],"at":[29],"low":[30,107],"voltages.":[32,109],"The":[33],"proposed":[34],"model":[35],"used":[37],"better":[39],"understand":[40],"synchronous":[45],"digital":[46],"designed":[48],"with":[49,59],"22":[50,66],"nm":[51,63,67],"III-V":[52],"heterojunction":[53],"TFET":[54,96],"technology.":[55],"comparative":[57],"analysis":[58],"high":[60],"performance":[61],"20":[62],"FinFET":[64],"and":[65,83],"CMOS":[68],"also":[72],"provided":[73],"illustrate":[75],"related":[77],"tradeoffs":[78],"among":[79],"voltage,":[81],"frequency,":[82],"for":[86,94],"these":[87],"three":[88],"technologies.":[89],"This":[90],"investigation":[91],"important":[93],"energy-efficient":[95],"where":[99],"noise":[100],"sensitivity":[101],"higher":[103],"due":[104],"ultra":[106]},"counts_by_year":[{"year":2020,"cited_by_count":1}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}