{"id":"https://openalex.org/W2801224015","doi":"https://doi.org/10.1109/iscas.2018.8351180","title":"Analysis of the Effect of PFD Sampling on Charge-Pump PLL Stability","display_name":"Analysis of the Effect of PFD Sampling on Charge-Pump PLL Stability","publication_year":2018,"publication_date":"2018-05-01","ids":{"openalex":"https://openalex.org/W2801224015","doi":"https://doi.org/10.1109/iscas.2018.8351180","mag":"2801224015"},"language":"en","primary_location":{"id":"doi:10.1109/iscas.2018.8351180","is_oa":false,"landing_page_url":"http://doi.org/10.1109/iscas.2018.8351180","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 IEEE International Symposium on Circuits and Systems (ISCAS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5084786264","display_name":"Debashis Dhar","orcid":null},"institutions":[{"id":"https://openalex.org/I83019370","display_name":"Eindhoven University of Technology","ror":"https://ror.org/02c2kyt77","country_code":"NL","type":"education","lineage":["https://openalex.org/I83019370"]}],"countries":["NL"],"is_corresponding":true,"raw_author_name":"Debashis Dhar","raw_affiliation_strings":["Eindhoven University of Technology Department of Electrical Engineering Eindhoven The Netherlands"],"affiliations":[{"raw_affiliation_string":"Eindhoven University of Technology Department of Electrical Engineering Eindhoven The Netherlands","institution_ids":["https://openalex.org/I83019370"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5070696980","display_name":"P.T.M. van Zeijl","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"P. T. M. van Zeijl","raw_affiliation_strings":["Omniradar BV, Eindhoven,The Netherlands"],"affiliations":[{"raw_affiliation_string":"Omniradar BV, Eindhoven,The Netherlands","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5019316496","display_name":"Du\u0161an Milo\u0161evi\u0107","orcid":"https://orcid.org/0000-0003-2248-6809"},"institutions":[{"id":"https://openalex.org/I83019370","display_name":"Eindhoven University of Technology","ror":"https://ror.org/02c2kyt77","country_code":"NL","type":"education","lineage":["https://openalex.org/I83019370"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"D. Milosevic","raw_affiliation_strings":["Eindhoven University of Technology Department of Electrical Engineering Eindhoven The Netherlands"],"affiliations":[{"raw_affiliation_string":"Eindhoven University of Technology Department of Electrical Engineering Eindhoven The Netherlands","institution_ids":["https://openalex.org/I83019370"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5006604864","display_name":"Hao Gao","orcid":"https://orcid.org/0000-0002-7420-8213"},"institutions":[{"id":"https://openalex.org/I83019370","display_name":"Eindhoven University of Technology","ror":"https://ror.org/02c2kyt77","country_code":"NL","type":"education","lineage":["https://openalex.org/I83019370"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"H. Gao","raw_affiliation_strings":["Eindhoven University of Technology Department of Electrical Engineering Eindhoven The Netherlands"],"affiliations":[{"raw_affiliation_string":"Eindhoven University of Technology Department of Electrical Engineering Eindhoven The Netherlands","institution_ids":["https://openalex.org/I83019370"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5075889172","display_name":"Peter Baltus","orcid":"https://orcid.org/0000-0002-0897-1560"},"institutions":[{"id":"https://openalex.org/I83019370","display_name":"Eindhoven University of Technology","ror":"https://ror.org/02c2kyt77","country_code":"NL","type":"education","lineage":["https://openalex.org/I83019370"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"P. G. M. Baltus","raw_affiliation_strings":["Eindhoven University of Technology Department of Electrical Engineering Eindhoven The Netherlands"],"affiliations":[{"raw_affiliation_string":"Eindhoven University of Technology Department of Electrical Engineering Eindhoven The Netherlands","institution_ids":["https://openalex.org/I83019370"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5084786264"],"corresponding_institution_ids":["https://openalex.org/I83019370"],"apc_list":null,"apc_paid":null,"fwci":0.3924,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.62379244,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"5"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.9944999814033508,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9944999814033508,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/phase-locked-loop","display_name":"Phase-locked loop","score":0.8661288619041443},{"id":"https://openalex.org/keywords/sampling","display_name":"Sampling (signal processing)","score":0.7025710940361023},{"id":"https://openalex.org/keywords/control-theory","display_name":"Control theory (sociology)","score":0.6774712800979614},{"id":"https://openalex.org/keywords/stability","display_name":"Stability (learning theory)","score":0.6530990600585938},{"id":"https://openalex.org/keywords/phase-frequency-detector","display_name":"Phase frequency detector","score":0.5733875036239624},{"id":"https://openalex.org/keywords/charge-pump","display_name":"Charge pump","score":0.5691535472869873},{"id":"https://openalex.org/keywords/frequency-domain","display_name":"Frequency domain","score":0.4911486804485321},{"id":"https://openalex.org/keywords/boundary","display_name":"Boundary (topology)","score":0.46169862151145935},{"id":"https://openalex.org/keywords/detector","display_name":"Detector","score":0.446286141872406},{"id":"https://openalex.org/keywords/phase-detector","display_name":"Phase detector","score":0.4403038024902344},{"id":"https://openalex.org/keywords/domain","display_name":"Domain (mathematical analysis)","score":0.43958476185798645},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4278002977371216},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3187008798122406},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3084672689437866},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.3018365502357483},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.2526177167892456},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.12519535422325134},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.1100182831287384},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.08392533659934998},{"id":"https://openalex.org/keywords/mathematical-analysis","display_name":"Mathematical analysis","score":0.07712364196777344},{"id":"https://openalex.org/keywords/capacitor","display_name":"Capacitor","score":0.07018783688545227},{"id":"https://openalex.org/keywords/jitter","display_name":"Jitter","score":0.06885990500450134}],"concepts":[{"id":"https://openalex.org/C12707504","wikidata":"https://www.wikidata.org/wiki/Q52637","display_name":"Phase-locked loop","level":3,"score":0.8661288619041443},{"id":"https://openalex.org/C140779682","wikidata":"https://www.wikidata.org/wiki/Q210868","display_name":"Sampling (signal processing)","level":3,"score":0.7025710940361023},{"id":"https://openalex.org/C47446073","wikidata":"https://www.wikidata.org/wiki/Q5165890","display_name":"Control theory (sociology)","level":3,"score":0.6774712800979614},{"id":"https://openalex.org/C112972136","wikidata":"https://www.wikidata.org/wiki/Q7595718","display_name":"Stability (learning theory)","level":2,"score":0.6530990600585938},{"id":"https://openalex.org/C2776158855","wikidata":"https://www.wikidata.org/wiki/Q2085341","display_name":"Phase frequency detector","level":5,"score":0.5733875036239624},{"id":"https://openalex.org/C114825011","wikidata":"https://www.wikidata.org/wiki/Q440704","display_name":"Charge pump","level":4,"score":0.5691535472869873},{"id":"https://openalex.org/C19118579","wikidata":"https://www.wikidata.org/wiki/Q786423","display_name":"Frequency domain","level":2,"score":0.4911486804485321},{"id":"https://openalex.org/C62354387","wikidata":"https://www.wikidata.org/wiki/Q875399","display_name":"Boundary (topology)","level":2,"score":0.46169862151145935},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.446286141872406},{"id":"https://openalex.org/C110086884","wikidata":"https://www.wikidata.org/wiki/Q2085341","display_name":"Phase detector","level":3,"score":0.4403038024902344},{"id":"https://openalex.org/C36503486","wikidata":"https://www.wikidata.org/wiki/Q11235244","display_name":"Domain (mathematical analysis)","level":2,"score":0.43958476185798645},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4278002977371216},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3187008798122406},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3084672689437866},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.3018365502357483},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.2526177167892456},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.12519535422325134},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.1100182831287384},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.08392533659934998},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.07712364196777344},{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.07018783688545227},{"id":"https://openalex.org/C134652429","wikidata":"https://www.wikidata.org/wiki/Q1052698","display_name":"Jitter","level":2,"score":0.06885990500450134},{"id":"https://openalex.org/C2775924081","wikidata":"https://www.wikidata.org/wiki/Q55608371","display_name":"Control (management)","level":2,"score":0.0},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.0},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.0}],"mesh":[],"locations_count":6,"locations":[{"id":"doi:10.1109/iscas.2018.8351180","is_oa":false,"landing_page_url":"http://doi.org/10.1109/iscas.2018.8351180","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 IEEE International Symposium on Circuits and Systems (ISCAS)","raw_type":"proceedings-article"},{"id":"pmh:oai:pure.tue.nl:openaire_cris_publications/e374a608-3736-49b4-a5df-12946de660d8","is_oa":false,"landing_page_url":"https://research.tue.nl/en/publications/e374a608-3736-49b4-a5df-12946de660d8","pdf_url":null,"source":{"id":"https://openalex.org/S4406922641","display_name":"TU/e Research Portal","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Dhar, D, van Zeijl, P T M, Milosevic, D, Gao, H & Baltus, P G M 2018, Analysis of the effect of PFD sampling on charge-pump PLL stability. in 2018 IEEE International Symposium on Circuits and Systems, ISCAS 2018 - Proceedings., 8351180, Institute of Electrical and Electronics Engineers, Piscataway, pp. 1-5, 2018 IEEE International Symposium on Circuits and Systems (ISCAS 2018), Florence, Italy, 27/05/18. https://doi.org/10.1109/ISCAS.2018.8351180","raw_type":"info:eu-repo/semantics/publishedVersion"},{"id":"pmh:900456","is_oa":false,"landing_page_url":"http://library.tue.nl/csp/dare/LinkToRepository.csp?recordnumber=900456","pdf_url":null,"source":{"id":"https://openalex.org/S4406923046","display_name":"TU/e Research Portal (Eindhoven University of Technology)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":""},{"id":"pmh:oai:library.tue.nl:900456","is_oa":false,"landing_page_url":"http://repository.tue.nl/900456","pdf_url":null,"source":{"id":"https://openalex.org/S4406923046","display_name":"TU/e Research Portal (Eindhoven University of Technology)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":""},{"id":"pmh:oai:pure.tue.nl:publications/e374a608-3736-49b4-a5df-12946de660d8","is_oa":false,"landing_page_url":"http://www.scopus.com/inward/record.url?scp=85057133542&partnerID=8YFLogxK","pdf_url":null,"source":{"id":"https://openalex.org/S4406922641","display_name":"TU/e Research Portal","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Dhar, D, van Zeijl, P T M, Milosevic, D, Gao, H & Baltus, P G M 2018, Analysis of the effect of PFD sampling on charge-pump PLL stability. in 2018 IEEE International Symposium on Circuits and Systems, ISCAS 2018 - Proceedings., 8351180, Institute of Electrical and Electronics Engineers, Piscataway, pp. 1-5, 2018 IEEE International Symposium on Circuits and Systems (ISCAS 2018), Florence, Italy, 27/05/18. https://doi.org/10.1109/ISCAS.2018.8351180","raw_type":"info:eu-repo/semantics/publishedVersion"},{"id":"pmh:tue:oai:pure.tue.nl:publications/e374a608-3736-49b4-a5df-12946de660d8","is_oa":false,"landing_page_url":"https://research.tue.nl/nl/publications/e374a608-3736-49b4-a5df-12946de660d8","pdf_url":null,"source":{"id":"https://openalex.org/S4306401843","display_name":"Data Archiving and Networked Services (DANS)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1322597698","host_organization_name":"Royal Netherlands Academy of Arts and Sciences","host_organization_lineage":["https://openalex.org/I1322597698"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"2018 IEEE International Symposium on Circuits and Systems, ISCAS 2018 - Proceedings, 1 - 5","raw_type":"info:eu-repo/semantics/conferencepaper"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":13,"referenced_works":["https://openalex.org/W1123162562","https://openalex.org/W1536916258","https://openalex.org/W1977248117","https://openalex.org/W2058996386","https://openalex.org/W2104147443","https://openalex.org/W2127604288","https://openalex.org/W2130835617","https://openalex.org/W2153267648","https://openalex.org/W2406676249","https://openalex.org/W2527081555","https://openalex.org/W6627294732","https://openalex.org/W6630497829","https://openalex.org/W6633810265"],"related_works":["https://openalex.org/W2369807905","https://openalex.org/W4385624389","https://openalex.org/W2979324006","https://openalex.org/W2752021769","https://openalex.org/W3093724499","https://openalex.org/W2295601265","https://openalex.org/W4381745543","https://openalex.org/W2908219865","https://openalex.org/W2087564251","https://openalex.org/W3177439118"],"abstract_inverted_index":{"<p>The":[0],"sampling":[1,25,69],"nature":[2],"of":[3,11,22,67,89],"the":[4,9,12,20,23,27,43,51,87],"phase-frequency":[5],"detector":[6],"(PFD)":[7],"degrades":[8],"stability":[10,29,47],"charge-pump":[13],"phase-locked":[14],"loop":[15],"(CPPLL).":[16],"This":[17],"paper":[18],"analyzes":[19],"effect":[21],"PFD":[24,34],"on":[26],"CPPLL":[28],"by":[30,50,57],"using":[31,59],"z-transform.":[32],"The":[33,46],"is":[35,53,77],"modeled":[36],"as":[37],"a":[38,64],"zero-order":[39],"hold":[40],"to":[41],"perform":[42],"z-domain":[44],"analysis.":[45],"boundary":[48],"predicted":[49],"analysis":[52],"accurate":[54],"and":[55],"verified":[56],"simulations":[58],"Cadence":[60],"Spectre.":[61],"In":[62],"addition,":[63],"physical":[65],"interpretation":[66],"how":[68],"destabilizes":[70],"an":[71],"otherwise":[72],"stable":[73],"continuous":[74],"feedback":[75,91],"system":[76],"provided":[78],"in":[79],"time":[80],"domain,":[81],"which":[82],"brings":[83],"valuable":[84],"insight":[85],"into":[86],"operation":[88],"sampled":[90],"systems":[92],"like":[93],"CPPLL.</p>":[94]},"counts_by_year":[{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":1}],"updated_date":"2026-04-04T16:13:02.066488","created_date":"2025-10-10T00:00:00"}