{"id":"https://openalex.org/W2802841469","doi":"https://doi.org/10.1109/iscas.2018.8350993","title":"Time-effective Fault Diagnosis Algorithms for Analog and Mixed-signal Circuits Using Sparsity-aware Multi-class Relevance Vector Machine","display_name":"Time-effective Fault Diagnosis Algorithms for Analog and Mixed-signal Circuits Using Sparsity-aware Multi-class Relevance Vector Machine","publication_year":2018,"publication_date":"2018-05-01","ids":{"openalex":"https://openalex.org/W2802841469","doi":"https://doi.org/10.1109/iscas.2018.8350993","mag":"2802841469"},"language":"en","primary_location":{"id":"doi:10.1109/iscas.2018.8350993","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas.2018.8350993","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 IEEE International Symposium on Circuits and Systems (ISCAS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5064962247","display_name":"Qiwu Luo","orcid":"https://orcid.org/0000-0003-2822-5538"},"institutions":[{"id":"https://openalex.org/I16365422","display_name":"Hefei University of Technology","ror":"https://ror.org/02czkny70","country_code":"CN","type":"education","lineage":["https://openalex.org/I16365422"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Qiwu Luo","raw_affiliation_strings":["School of Electrical Engineering and Automation, Hefei University of Technology, Hefei, P. R. China"],"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering and Automation, Hefei University of Technology, Hefei, P. R. China","institution_ids":["https://openalex.org/I16365422"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101531153","display_name":"Yigang He","orcid":"https://orcid.org/0000-0002-9731-0501"},"institutions":[{"id":"https://openalex.org/I16365422","display_name":"Hefei University of Technology","ror":"https://ror.org/02czkny70","country_code":"CN","type":"education","lineage":["https://openalex.org/I16365422"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yigang He","raw_affiliation_strings":["School of Electrical Engineering and Automation, Hefei University of Technology, Hefei, P. R. China"],"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering and Automation, Hefei University of Technology, Hefei, P. R. China","institution_ids":["https://openalex.org/I16365422"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5020364531","display_name":"Yichuang Sun","orcid":"https://orcid.org/0000-0001-8352-2119"},"institutions":[{"id":"https://openalex.org/I141584323","display_name":"University of Hertfordshire","ror":"https://ror.org/0267vjk41","country_code":"GB","type":"education","lineage":["https://openalex.org/I141584323"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Yichuang Sun","raw_affiliation_strings":["School of Engineering and Technology, University of Hertfordshire, Hatfield, U.K"],"affiliations":[{"raw_affiliation_string":"School of Engineering and Technology, University of Hertfordshire, Hatfield, U.K","institution_ids":["https://openalex.org/I141584323"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100390892","display_name":"Lifen Yuan","orcid":"https://orcid.org/0000-0002-6460-1978"},"institutions":[{"id":"https://openalex.org/I16365422","display_name":"Hefei University of Technology","ror":"https://ror.org/02czkny70","country_code":"CN","type":"education","lineage":["https://openalex.org/I16365422"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Lifen Yuan","raw_affiliation_strings":["School of Electrical Engineering and Automation, Hefei University of Technology, Hefei, P. R. China"],"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering and Automation, Hefei University of Technology, Hefei, P. R. China","institution_ids":["https://openalex.org/I16365422"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5064962247"],"corresponding_institution_ids":["https://openalex.org/I16365422"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.04235031,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"25","issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9969000220298767,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9966999888420105,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/support-vector-machine","display_name":"Support vector machine","score":0.7138533592224121},{"id":"https://openalex.org/keywords/relevance-vector-machine","display_name":"Relevance vector machine","score":0.7067196369171143},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.658051073551178},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.5629507303237915},{"id":"https://openalex.org/keywords/generalization","display_name":"Generalization","score":0.524041473865509},{"id":"https://openalex.org/keywords/probabilistic-logic","display_name":"Probabilistic logic","score":0.5229604840278625},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.5180602073669434},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.5157649517059326},{"id":"https://openalex.org/keywords/entropy","display_name":"Entropy (arrow of time)","score":0.5113067626953125},{"id":"https://openalex.org/keywords/analogue-electronics","display_name":"Analogue electronics","score":0.4962201714515686},{"id":"https://openalex.org/keywords/relevance","display_name":"Relevance (law)","score":0.45337459444999695},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.427783727645874},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.3376843333244324},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.21373867988586426},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.15844300389289856}],"concepts":[{"id":"https://openalex.org/C12267149","wikidata":"https://www.wikidata.org/wiki/Q282453","display_name":"Support vector machine","level":2,"score":0.7138533592224121},{"id":"https://openalex.org/C14948415","wikidata":"https://www.wikidata.org/wiki/Q7310972","display_name":"Relevance vector machine","level":3,"score":0.7067196369171143},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.658051073551178},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.5629507303237915},{"id":"https://openalex.org/C177148314","wikidata":"https://www.wikidata.org/wiki/Q170084","display_name":"Generalization","level":2,"score":0.524041473865509},{"id":"https://openalex.org/C49937458","wikidata":"https://www.wikidata.org/wiki/Q2599292","display_name":"Probabilistic logic","level":2,"score":0.5229604840278625},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.5180602073669434},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.5157649517059326},{"id":"https://openalex.org/C106301342","wikidata":"https://www.wikidata.org/wiki/Q4117933","display_name":"Entropy (arrow of time)","level":2,"score":0.5113067626953125},{"id":"https://openalex.org/C29074008","wikidata":"https://www.wikidata.org/wiki/Q174925","display_name":"Analogue electronics","level":3,"score":0.4962201714515686},{"id":"https://openalex.org/C158154518","wikidata":"https://www.wikidata.org/wiki/Q7310970","display_name":"Relevance (law)","level":2,"score":0.45337459444999695},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.427783727645874},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.3376843333244324},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.21373867988586426},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.15844300389289856},{"id":"https://openalex.org/C17744445","wikidata":"https://www.wikidata.org/wiki/Q36442","display_name":"Political science","level":0,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0},{"id":"https://openalex.org/C199539241","wikidata":"https://www.wikidata.org/wiki/Q7748","display_name":"Law","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iscas.2018.8350993","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas.2018.8350993","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 IEEE International Symposium on Circuits and Systems (ISCAS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.7200000286102295,"display_name":"Peace, Justice and strong institutions","id":"https://metadata.un.org/sdg/16"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W185597681","https://openalex.org/W1901616594","https://openalex.org/W2040647667","https://openalex.org/W2086316624","https://openalex.org/W2095196047","https://openalex.org/W2099383324","https://openalex.org/W2099924611","https://openalex.org/W2156258820","https://openalex.org/W2343445595","https://openalex.org/W2415795929","https://openalex.org/W4285719527","https://openalex.org/W6675039405"],"related_works":["https://openalex.org/W2469829262","https://openalex.org/W2352800587","https://openalex.org/W2371138613","https://openalex.org/W2048963458","https://openalex.org/W43109613","https://openalex.org/W2359952343","https://openalex.org/W2080152487","https://openalex.org/W2051519930","https://openalex.org/W2019129831","https://openalex.org/W2375192119"],"abstract_inverted_index":{"Except":[0],"for":[1,47,105],"the":[2,80],"advantages":[3],"of":[4,13,22,111],"supporting":[5],"arbitrary":[6],"kernels,":[7],"probabilistic":[8],"predictions":[9],"and":[10,26,69,84,102,113],"automatic":[11],"estimation":[12],"hyper-parameters,":[14],"relevance":[15],"vector":[16],"machine":[17],"(RVM)":[18],"also":[19],"encounters":[20],"some":[21],"training":[23],"time":[24],"increase":[25],"classification":[27,49],"accuracy":[28],"recession,":[29],"compared":[30],"with":[31],"SVM.":[32],"In":[33],"order":[34],"to":[35,77],"suppress":[36],"such":[37],"`nuisance'":[38],"imperfections,":[39],"this":[40],"paper":[41],"proposed":[42,97],"a":[43,55],"sparsity-aware":[44],"RVM":[45],"model":[46],"multi-class":[48],"(denoted":[50],"as":[51],"Sa-MRVM)":[52],"by":[53],"developing":[54],"configurable":[56],"singular":[57],"entropy":[58],"decision":[59],"mechanism.":[60],"Multiple":[61],"driven":[62],"data":[63],"sets":[64],"captured":[65],"from":[66],"both":[67],"emulational":[68],"actual":[70],"circuits":[71],"under":[72],"test":[73],"(CUTs)":[74],"are":[75],"involved":[76],"further":[78],"improve":[79],"model's":[81],"generalization":[82],"ability":[83],"judging":[85],"confidence.":[86],"Experimental":[87],"results":[88],"carried":[89],"out":[90],"on":[91],"two":[92],"CUTs":[93],"indicate":[94],"that":[95],"our":[96],"learning":[98],"methodology":[99],"is":[100],"speedy":[101],"accurate":[103],"enough":[104],"real":[106],"world":[107],"fault":[108],"diagnosis":[109],"tasks":[110],"analog":[112],"mixed-signal":[114],"circuits.":[115]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}