{"id":"https://openalex.org/W2800859393","doi":"https://doi.org/10.1109/iscas.2018.8350929","title":"Duty Cycle Distortion in Half-rate Nyquist DACs with Limited Output Bandwidth","display_name":"Duty Cycle Distortion in Half-rate Nyquist DACs with Limited Output Bandwidth","publication_year":2018,"publication_date":"2018-01-01","ids":{"openalex":"https://openalex.org/W2800859393","doi":"https://doi.org/10.1109/iscas.2018.8350929","mag":"2800859393"},"language":"en","primary_location":{"id":"doi:10.1109/iscas.2018.8350929","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas.2018.8350929","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 IEEE International Symposium on Circuits and Systems (ISCAS)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101525540","display_name":"Bao Li","orcid":"https://orcid.org/0000-0002-4010-4678"},"institutions":[{"id":"https://openalex.org/I20231570","display_name":"Peking University","ror":"https://ror.org/02v51f717","country_code":"CN","type":"education","lineage":["https://openalex.org/I20231570"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Bao Li","raw_affiliation_strings":["School of Electronics Engineering and Computer Science, Peking University, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electronics Engineering and Computer Science, Peking University, Beijing, China","institution_ids":["https://openalex.org/I20231570"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101855662","display_name":"Long Zhao","orcid":"https://orcid.org/0000-0003-0590-2938"},"institutions":[{"id":"https://openalex.org/I20231570","display_name":"Peking University","ror":"https://ror.org/02v51f717","country_code":"CN","type":"education","lineage":["https://openalex.org/I20231570"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Long Zhao","raw_affiliation_strings":["School of Electronics Engineering and Computer Science, Peking University, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electronics Engineering and Computer Science, Peking University, Beijing, China","institution_ids":["https://openalex.org/I20231570"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102710667","display_name":"Jiangfeng Wu","orcid":"https://orcid.org/0000-0003-0910-0262"},"institutions":[{"id":"https://openalex.org/I116953780","display_name":"Tongji University","ror":"https://ror.org/03rc6as71","country_code":"CN","type":"education","lineage":["https://openalex.org/I116953780"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jiangfeng Wu","raw_affiliation_strings":["School of Electronic and Information Engineering, Tongji University, Shanghai, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electronic and Information Engineering, Tongji University, Shanghai, China","institution_ids":["https://openalex.org/I116953780"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5017416584","display_name":"Yuhua Cheng","orcid":"https://orcid.org/0000-0002-5580-2006"},"institutions":[{"id":"https://openalex.org/I20231570","display_name":"Peking University","ror":"https://ror.org/02v51f717","country_code":"CN","type":"education","lineage":["https://openalex.org/I20231570"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yuhua Cheng","raw_affiliation_strings":["School of Electronics Engineering and Computer Science, Peking University, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electronics Engineering and Computer Science, Peking University, Beijing, China","institution_ids":["https://openalex.org/I20231570"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.5183,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.54764649,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":95},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/duty-cycle","display_name":"Duty cycle","score":0.809273362159729},{"id":"https://openalex.org/keywords/bandwidth","display_name":"Bandwidth (computing)","score":0.7252128720283508},{"id":"https://openalex.org/keywords/nyquist\u2013shannon-sampling-theorem","display_name":"Nyquist\u2013Shannon sampling theorem","score":0.624133825302124},{"id":"https://openalex.org/keywords/nyquist-rate","display_name":"Nyquist rate","score":0.6001540422439575},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.533829391002655},{"id":"https://openalex.org/keywords/nyquist-frequency","display_name":"Nyquist frequency","score":0.5042840242385864},{"id":"https://openalex.org/keywords/wideband","display_name":"Wideband","score":0.4992671012878418},{"id":"https://openalex.org/keywords/nyquist-stability-criterion","display_name":"Nyquist stability criterion","score":0.49722030758857727},{"id":"https://openalex.org/keywords/linearity","display_name":"Linearity","score":0.4556042551994324},{"id":"https://openalex.org/keywords/control-theory","display_name":"Control theory (sociology)","score":0.4449458122253418},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.42364615201950073},{"id":"https://openalex.org/keywords/topology","display_name":"Topology (electrical circuits)","score":0.3317025303840637},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.2711551785469055},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.22098010778427124},{"id":"https://openalex.org/keywords/sampling","display_name":"Sampling (signal processing)","score":0.2193719446659088},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.1928848922252655},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.18145933747291565},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1738874614238739},{"id":"https://openalex.org/keywords/detector","display_name":"Detector","score":0.13485369086265564},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.08767619729042053}],"concepts":[{"id":"https://openalex.org/C199822604","wikidata":"https://www.wikidata.org/wiki/Q557120","display_name":"Duty cycle","level":3,"score":0.809273362159729},{"id":"https://openalex.org/C2776257435","wikidata":"https://www.wikidata.org/wiki/Q1576430","display_name":"Bandwidth (computing)","level":2,"score":0.7252128720283508},{"id":"https://openalex.org/C288623","wikidata":"https://www.wikidata.org/wiki/Q679800","display_name":"Nyquist\u2013Shannon sampling theorem","level":2,"score":0.624133825302124},{"id":"https://openalex.org/C65914096","wikidata":"https://www.wikidata.org/wiki/Q6273772","display_name":"Nyquist rate","level":4,"score":0.6001540422439575},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.533829391002655},{"id":"https://openalex.org/C98273374","wikidata":"https://www.wikidata.org/wiki/Q1501757","display_name":"Nyquist frequency","level":3,"score":0.5042840242385864},{"id":"https://openalex.org/C2780202535","wikidata":"https://www.wikidata.org/wiki/Q4524457","display_name":"Wideband","level":2,"score":0.4992671012878418},{"id":"https://openalex.org/C7630364","wikidata":"https://www.wikidata.org/wiki/Q1756793","display_name":"Nyquist stability criterion","level":3,"score":0.49722030758857727},{"id":"https://openalex.org/C77170095","wikidata":"https://www.wikidata.org/wiki/Q1753188","display_name":"Linearity","level":2,"score":0.4556042551994324},{"id":"https://openalex.org/C47446073","wikidata":"https://www.wikidata.org/wiki/Q5165890","display_name":"Control theory (sociology)","level":3,"score":0.4449458122253418},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.42364615201950073},{"id":"https://openalex.org/C184720557","wikidata":"https://www.wikidata.org/wiki/Q7825049","display_name":"Topology (electrical circuits)","level":2,"score":0.3317025303840637},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.2711551785469055},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.22098010778427124},{"id":"https://openalex.org/C140779682","wikidata":"https://www.wikidata.org/wiki/Q210868","display_name":"Sampling (signal processing)","level":3,"score":0.2193719446659088},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.1928848922252655},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.18145933747291565},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1738874614238739},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.13485369086265564},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.08767619729042053},{"id":"https://openalex.org/C2775924081","wikidata":"https://www.wikidata.org/wiki/Q55608371","display_name":"Control (management)","level":2,"score":0.0},{"id":"https://openalex.org/C117251300","wikidata":"https://www.wikidata.org/wiki/Q1849855","display_name":"Parametric statistics","level":2,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iscas.2018.8350929","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas.2018.8350929","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 IEEE International Symposium on Circuits and Systems (ISCAS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":7,"referenced_works":["https://openalex.org/W1857387746","https://openalex.org/W2021714653","https://openalex.org/W2089253234","https://openalex.org/W2138837269","https://openalex.org/W2142184691","https://openalex.org/W2219851764","https://openalex.org/W2584540664"],"related_works":["https://openalex.org/W2368043784","https://openalex.org/W1500996803","https://openalex.org/W2100446824","https://openalex.org/W2130723455","https://openalex.org/W1488455774","https://openalex.org/W2058893726","https://openalex.org/W2362083308","https://openalex.org/W2801332561","https://openalex.org/W3215214094","https://openalex.org/W3126099788"],"abstract_inverted_index":{"Nyquist":[0,102],"current-steering":[1],"DACs":[2,60],"often":[3],"employ":[4],"half-rate":[5,34,59],"interleaved":[6],"topology":[7],"to":[8,29],"obtain":[9],"ultra-high":[10],"sampling":[11],"rate":[12],"in":[13,33,58],"wideband":[14],"communication":[15],"systems.":[16],"As":[17],"a":[18,26,66],"deterministic":[19],"timing":[20],"error,":[21],"duty":[22,55,88],"cycle":[23,56,89],"error":[24,57,90],"is":[25,73],"main":[27],"factor":[28],"cause":[30],"performance":[31],"degradation":[32],"DACs.":[35],"The":[36,50,82],"limited":[37,79,108],"output":[38,80],"bandwidth":[39],"caused":[40],"by":[41],"large":[42],"parasitic":[43],"capacitance":[44],"further":[45],"restricts":[46],"the":[47,54,76,87,107],"dynamic":[48],"linearity.":[49],"paper":[51,83],"mathematically":[52],"analyzes":[53],"based":[61],"on":[62],"Heaviside":[63],"function":[64],"and":[65,97],"close-form":[67],"expression":[68],"of":[69,78,95,106],"signal-to-distortion":[70],"ratio":[71],"(SDR)":[72],"derived":[74],"under":[75,104],"influence":[77],"bandwidth.":[81,109],"theoretically":[84],"demonstrates":[85],"that":[86],"causes":[91],"distortion":[92],"at":[93],"frequency":[94,103],"fs/2-fin":[96],"it":[98],"gets":[99],"worse":[100],"near":[101],"impact":[105]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2020,"cited_by_count":1}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}