{"id":"https://openalex.org/W2759371734","doi":"https://doi.org/10.1109/iscas.2017.8051016","title":"Record fT, fmax, and GHz amplification in 2dimensional CVD MoS2 embedded gate fets","display_name":"Record fT, fmax, and GHz amplification in 2dimensional CVD MoS2 embedded gate fets","publication_year":2017,"publication_date":"2017-05-01","ids":{"openalex":"https://openalex.org/W2759371734","doi":"https://doi.org/10.1109/iscas.2017.8051016","mag":"2759371734"},"language":"en","primary_location":{"id":"doi:10.1109/iscas.2017.8051016","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas.2017.8051016","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 IEEE International Symposium on Circuits and Systems (ISCAS)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5051848206","display_name":"Atresh Sanne","orcid":null},"institutions":[{"id":"https://openalex.org/I86519309","display_name":"The University of Texas at Austin","ror":"https://ror.org/00hj54h04","country_code":"US","type":"education","lineage":["https://openalex.org/I86519309"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Atresh Sanne","raw_affiliation_strings":["Microelectronics Research Center, The University of Texas at Austin, Austin, TX, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Microelectronics Research Center, The University of Texas at Austin, Austin, TX, USA","institution_ids":["https://openalex.org/I86519309"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5056620352","display_name":"Saungeun Park","orcid":null},"institutions":[{"id":"https://openalex.org/I86519309","display_name":"The University of Texas at Austin","ror":"https://ror.org/00hj54h04","country_code":"US","type":"education","lineage":["https://openalex.org/I86519309"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Saungeun Park","raw_affiliation_strings":["Microelectronics Research Center, The University of Texas at Austin, Austin, TX, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Microelectronics Research Center, The University of Texas at Austin, Austin, TX, USA","institution_ids":["https://openalex.org/I86519309"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110005855","display_name":"Rudresh Ghosh","orcid":null},"institutions":[{"id":"https://openalex.org/I86519309","display_name":"The University of Texas at Austin","ror":"https://ror.org/00hj54h04","country_code":"US","type":"education","lineage":["https://openalex.org/I86519309"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Rudresh Ghosh","raw_affiliation_strings":["Microelectronics Research Center, The University of Texas at Austin, Austin, TX, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Microelectronics Research Center, The University of Texas at Austin, Austin, TX, USA","institution_ids":["https://openalex.org/I86519309"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5080452063","display_name":"Maruthi Nagavalli Yogeesh","orcid":"https://orcid.org/0000-0002-3109-5992"},"institutions":[{"id":"https://openalex.org/I86519309","display_name":"The University of Texas at Austin","ror":"https://ror.org/00hj54h04","country_code":"US","type":"education","lineage":["https://openalex.org/I86519309"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Maruthi Nagavalli Yogeesh","raw_affiliation_strings":["Microelectronics Research Center, The University of Texas at Austin, Austin, TX, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Microelectronics Research Center, The University of Texas at Austin, Austin, TX, USA","institution_ids":["https://openalex.org/I86519309"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5068571040","display_name":"Chison Liu","orcid":null},"institutions":[{"id":"https://openalex.org/I86519309","display_name":"The University of Texas at Austin","ror":"https://ror.org/00hj54h04","country_code":"US","type":"education","lineage":["https://openalex.org/I86519309"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Chison Liu","raw_affiliation_strings":["Microelectronics Research Center, The University of Texas at Austin, Austin, TX, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Microelectronics Research Center, The University of Texas at Austin, Austin, TX, USA","institution_ids":["https://openalex.org/I86519309"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5063313700","display_name":"Deji Akinwande","orcid":"https://orcid.org/0000-0001-7133-5586"},"institutions":[{"id":"https://openalex.org/I86519309","display_name":"The University of Texas at Austin","ror":"https://ror.org/00hj54h04","country_code":"US","type":"education","lineage":["https://openalex.org/I86519309"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Deji Akinwande","raw_affiliation_strings":["University of Texas at Austin, Austin, TX, US"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Texas at Austin, Austin, TX, US","institution_ids":["https://openalex.org/I86519309"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5081174674","display_name":"Sanjay K. Banerjee","orcid":"https://orcid.org/0000-0002-4478-7189"},"institutions":[{"id":"https://openalex.org/I86519309","display_name":"The University of Texas at Austin","ror":"https://ror.org/00hj54h04","country_code":"US","type":"education","lineage":["https://openalex.org/I86519309"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Sanjay Kumar Banerjee","raw_affiliation_strings":["Microelectronics Research Center, The University of Texas at Austin, Austin, TX, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Microelectronics Research Center, The University of Texas at Austin, Austin, TX, USA","institution_ids":["https://openalex.org/I86519309"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110558200","display_name":"L. Mathew","orcid":null},"institutions":[{"id":"https://openalex.org/I86519309","display_name":"The University of Texas at Austin","ror":"https://ror.org/00hj54h04","country_code":"US","type":"education","lineage":["https://openalex.org/I86519309"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Leo Mathew","raw_affiliation_strings":["Applied Novel Devices Inc., The University of Texas at Austin, Austin, TX, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Applied Novel Devices Inc., The University of Texas at Austin, Austin, TX, USA","institution_ids":["https://openalex.org/I86519309"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5078123764","display_name":"R. A. Rao","orcid":null},"institutions":[{"id":"https://openalex.org/I86519309","display_name":"The University of Texas at Austin","ror":"https://ror.org/00hj54h04","country_code":"US","type":"education","lineage":["https://openalex.org/I86519309"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Rajesh Rao","raw_affiliation_strings":["Applied Novel Devices Inc., The University of Texas at Austin, Austin, TX, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Applied Novel Devices Inc., The University of Texas at Austin, Austin, TX, USA","institution_ids":["https://openalex.org/I86519309"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I86519309"],"apc_list":null,"apc_paid":null,"fwci":0.7584,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.63957825,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.624660313129425},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.5873523950576782},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.4332404136657715},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3460316061973572},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.19347843527793884}],"concepts":[{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.624660313129425},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5873523950576782},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.4332404136657715},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3460316061973572},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.19347843527793884}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iscas.2017.8051016","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas.2017.8051016","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 IEEE International Symposium on Circuits and Systems (ISCAS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.8799999952316284}],"awards":[],"funders":[{"id":"https://openalex.org/F4320306076","display_name":"National Science Foundation","ror":"https://ror.org/021nxhr62"},{"id":"https://openalex.org/F4320308204","display_name":"Northrop Grumman","ror":"https://ror.org/05kewds18"},{"id":"https://openalex.org/F4320338281","display_name":"Army Research Office","ror":"https://ror.org/05epdh915"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":9,"referenced_works":["https://openalex.org/W1517680978","https://openalex.org/W1992837891","https://openalex.org/W2047443163","https://openalex.org/W2243948953","https://openalex.org/W2261852134","https://openalex.org/W2262952045","https://openalex.org/W2292506402","https://openalex.org/W2342876537","https://openalex.org/W3101419445"],"related_works":["https://openalex.org/W2748952813","https://openalex.org/W4246450666","https://openalex.org/W4388998267","https://openalex.org/W2898370298","https://openalex.org/W2137437058","https://openalex.org/W4390401159","https://openalex.org/W2744391499","https://openalex.org/W3120461830","https://openalex.org/W4230250635","https://openalex.org/W3041790586"],"abstract_inverted_index":{"We":[0],"report":[1],"on":[2],"chemical":[3],"vapor":[4],"deposited":[5],"(CVD)":[6],"MoS2radio":[7],"frequency":[8],"(RF)":[9],"transistors":[10],"with":[11],"a":[12,83],"record":[13],"fTof":[14],"20":[15],"GHz":[16,84],"and":[17,21,50,109],"fmaxof":[18],"11.4":[19],"GHz,":[20,98],"the":[22,51,80],"largest":[23],"high-field":[24],"saturation":[25],"velocity,":[26],"\u03bdsat=":[27],"1.88":[28],"\u00d7":[29],"106cm/s,":[30],"in":[31],"MoS2reported":[32],"so":[33],"far.":[34],"The":[35,59],"gate-first":[36],"approach,":[37],"facilitated":[38],"by":[39],"cm-scale":[40],"CVD":[41,72],"MoS2,":[42],"offers":[43],"enhancement":[44],"mode":[45],"operation,":[46],"ION/IOFFratio":[47],"of":[48,56,82,113],"108,":[49],"highest":[52],"reported":[53,70],"transconductance":[54],"(gm)":[55],"70":[57],"\u03bcS/\u03bcm.":[58],"intrinsic":[60],"fT(fmax)":[61],"obtained":[62],"here":[63],"is":[64],"3X":[65],"(2X)":[66],"greater":[67,92],"than":[68,93],"previously":[69],"top-gated":[71],"MoS2RF":[73],"FETs.":[74],"With":[75],"as-measured":[76],"S-parameters,":[77],"we":[78],"demonstrate":[79],"design":[81],"MoS2-based":[85],"RF":[86],"amplifier.":[87],"This":[88],"amplifier":[89],"has":[90],"gain":[91],"15":[94],"dB":[95],"at":[96],"1.2":[97],"input":[99],"return":[100],"loss":[101],">":[102,106],"10":[103],"dB,":[104],"bandwidth":[105],"200":[107],"MHz,":[108],"DC":[110],"power":[111],"consumption":[112],"~10":[114],"mW.":[115]},"counts_by_year":[{"year":2021,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":1}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}