{"id":"https://openalex.org/W2759466145","doi":"https://doi.org/10.1109/iscas.2017.8050759","title":"Design methodology for area and energy efficient OxRAM-based non-volatile flip-flop","display_name":"Design methodology for area and energy efficient OxRAM-based non-volatile flip-flop","publication_year":2017,"publication_date":"2017-05-01","ids":{"openalex":"https://openalex.org/W2759466145","doi":"https://doi.org/10.1109/iscas.2017.8050759","mag":"2759466145"},"language":"en","primary_location":{"id":"doi:10.1109/iscas.2017.8050759","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas.2017.8050759","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 IEEE International Symposium on Circuits and Systems (ISCAS)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5054572234","display_name":"M. Nataraj","orcid":null},"institutions":[{"id":"https://openalex.org/I223532165","display_name":"University of Utah","ror":"https://ror.org/03r0ha626","country_code":"US","type":"education","lineage":["https://openalex.org/I223532165"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"M. Nataraj","raw_affiliation_strings":["ECE Department, The University of Utah, Salt Lake City, UT, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ECE Department, The University of Utah, Salt Lake City, UT, USA","institution_ids":["https://openalex.org/I223532165"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5090359025","display_name":"Alexandre Levisse","orcid":"https://orcid.org/0000-0002-8984-9793"},"institutions":[{"id":"https://openalex.org/I106785703","display_name":"Institut polytechnique de Grenoble","ror":"https://ror.org/05sbt2524","country_code":"FR","type":"education","lineage":["https://openalex.org/I106785703","https://openalex.org/I899635006"]},{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I21491767","display_name":"Aix-Marseille Universit\u00e9","ror":"https://ror.org/035xkbk20","country_code":"FR","type":"education","lineage":["https://openalex.org/I21491767"]},{"id":"https://openalex.org/I223532165","display_name":"University of Utah","ror":"https://ror.org/03r0ha626","country_code":"US","type":"education","lineage":["https://openalex.org/I223532165"]},{"id":"https://openalex.org/I2738703131","display_name":"Commissariat \u00e0 l'\u00c9nergie Atomique et aux \u00c9nergies Alternatives","ror":"https://ror.org/00jjx8s55","country_code":"FR","type":"government","lineage":["https://openalex.org/I2738703131"]},{"id":"https://openalex.org/I3020098449","display_name":"CEA Grenoble","ror":"https://ror.org/02mg6n827","country_code":"FR","type":"government","lineage":["https://openalex.org/I2738703131","https://openalex.org/I3020098449"]},{"id":"https://openalex.org/I4210112016","display_name":"Institut des Mat\u00e9riaux, de Micro\u00e9lectronique et des Nanosciences de Provence","ror":"https://ror.org/0238zyh04","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I143002897","https://openalex.org/I21491767","https://openalex.org/I3132279224","https://openalex.org/I4210098836","https://openalex.org/I4210112016"]},{"id":"https://openalex.org/I4210150049","display_name":"Laboratoire d'\u00c9lectronique des Technologies de l'Information","ror":"https://ror.org/04mf0wv34","country_code":"FR","type":"government","lineage":["https://openalex.org/I2738703131","https://openalex.org/I2738703131","https://openalex.org/I4210117989","https://openalex.org/I4210150049"]},{"id":"https://openalex.org/I899635006","display_name":"Universit\u00e9 Grenoble Alpes","ror":"https://ror.org/02rx3b187","country_code":"FR","type":"education","lineage":["https://openalex.org/I899635006"]}],"countries":["FR","US"],"is_corresponding":false,"raw_author_name":"A. Levisse","raw_affiliation_strings":["Aix-Marseille Universit\u00e9, IM2NP, CNRS UMR 7334, Marseille, France","ECE Department, The University of Utah, Salt Lake City, UT, USA","Univ. Grenoble Alpes, CEA, LETI, MINATEC Campus, Grenoble, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Aix-Marseille Universit\u00e9, IM2NP, CNRS UMR 7334, Marseille, France","institution_ids":["https://openalex.org/I1294671590","https://openalex.org/I21491767","https://openalex.org/I4210112016"]},{"raw_affiliation_string":"ECE Department, The University of Utah, Salt Lake City, UT, USA","institution_ids":["https://openalex.org/I223532165"]},{"raw_affiliation_string":"Univ. Grenoble Alpes, CEA, LETI, MINATEC Campus, Grenoble, France","institution_ids":["https://openalex.org/I106785703","https://openalex.org/I2738703131","https://openalex.org/I3020098449","https://openalex.org/I4210150049","https://openalex.org/I899635006"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5053227652","display_name":"Bastien Giraud","orcid":"https://orcid.org/0000-0002-1183-6685"},"institutions":[{"id":"https://openalex.org/I106785703","display_name":"Institut polytechnique de Grenoble","ror":"https://ror.org/05sbt2524","country_code":"FR","type":"education","lineage":["https://openalex.org/I106785703","https://openalex.org/I899635006"]},{"id":"https://openalex.org/I2738703131","display_name":"Commissariat \u00e0 l'\u00c9nergie Atomique et aux \u00c9nergies Alternatives","ror":"https://ror.org/00jjx8s55","country_code":"FR","type":"government","lineage":["https://openalex.org/I2738703131"]},{"id":"https://openalex.org/I3020098449","display_name":"CEA Grenoble","ror":"https://ror.org/02mg6n827","country_code":"FR","type":"government","lineage":["https://openalex.org/I2738703131","https://openalex.org/I3020098449"]},{"id":"https://openalex.org/I4210150049","display_name":"Laboratoire d'\u00c9lectronique des Technologies de l'Information","ror":"https://ror.org/04mf0wv34","country_code":"FR","type":"government","lineage":["https://openalex.org/I2738703131","https://openalex.org/I2738703131","https://openalex.org/I4210117989","https://openalex.org/I4210150049"]},{"id":"https://openalex.org/I899635006","display_name":"Universit\u00e9 Grenoble Alpes","ror":"https://ror.org/02rx3b187","country_code":"FR","type":"education","lineage":["https://openalex.org/I899635006"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"B. Giraud","raw_affiliation_strings":["Univ. Grenoble Alpes, CEA, LETI, MINATEC Campus, Grenoble, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Univ. Grenoble Alpes, CEA, LETI, MINATEC Campus, Grenoble, France","institution_ids":["https://openalex.org/I106785703","https://openalex.org/I2738703131","https://openalex.org/I3020098449","https://openalex.org/I4210150049","https://openalex.org/I899635006"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5072994868","display_name":"J.-P. No\u00ebl","orcid":null},"institutions":[{"id":"https://openalex.org/I106785703","display_name":"Institut polytechnique de Grenoble","ror":"https://ror.org/05sbt2524","country_code":"FR","type":"education","lineage":["https://openalex.org/I106785703","https://openalex.org/I899635006"]},{"id":"https://openalex.org/I2738703131","display_name":"Commissariat \u00e0 l'\u00c9nergie Atomique et aux \u00c9nergies Alternatives","ror":"https://ror.org/00jjx8s55","country_code":"FR","type":"government","lineage":["https://openalex.org/I2738703131"]},{"id":"https://openalex.org/I3020098449","display_name":"CEA Grenoble","ror":"https://ror.org/02mg6n827","country_code":"FR","type":"government","lineage":["https://openalex.org/I2738703131","https://openalex.org/I3020098449"]},{"id":"https://openalex.org/I4210150049","display_name":"Laboratoire d'\u00c9lectronique des Technologies de l'Information","ror":"https://ror.org/04mf0wv34","country_code":"FR","type":"government","lineage":["https://openalex.org/I2738703131","https://openalex.org/I2738703131","https://openalex.org/I4210117989","https://openalex.org/I4210150049"]},{"id":"https://openalex.org/I899635006","display_name":"Universit\u00e9 Grenoble Alpes","ror":"https://ror.org/02rx3b187","country_code":"FR","type":"education","lineage":["https://openalex.org/I899635006"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"J.-P. Noel","raw_affiliation_strings":["Univ. Grenoble Alpes, CEA, LETI, MINATEC Campus, Grenoble, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Univ. Grenoble Alpes, CEA, LETI, MINATEC Campus, Grenoble, France","institution_ids":["https://openalex.org/I106785703","https://openalex.org/I2738703131","https://openalex.org/I3020098449","https://openalex.org/I4210150049","https://openalex.org/I899635006"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5026324911","display_name":"Pascal Meinerzhagen","orcid":"https://orcid.org/0000-0002-5444-5772"},"institutions":[{"id":"https://openalex.org/I1343180700","display_name":"Intel (United States)","ror":"https://ror.org/01ek73717","country_code":"US","type":"company","lineage":["https://openalex.org/I1343180700"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"P. Meinerzhagen","raw_affiliation_strings":["Intel Circuit Research Lab, Hillsboro, OR"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Intel Circuit Research Lab, Hillsboro, OR","institution_ids":["https://openalex.org/I1343180700"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5032162752","display_name":"Jean\u2010Michel Portal","orcid":"https://orcid.org/0000-0002-6722-053X"},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I21491767","display_name":"Aix-Marseille Universit\u00e9","ror":"https://ror.org/035xkbk20","country_code":"FR","type":"education","lineage":["https://openalex.org/I21491767"]},{"id":"https://openalex.org/I4210112016","display_name":"Institut des Mat\u00e9riaux, de Micro\u00e9lectronique et des Nanosciences de Provence","ror":"https://ror.org/0238zyh04","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I143002897","https://openalex.org/I21491767","https://openalex.org/I3132279224","https://openalex.org/I4210098836","https://openalex.org/I4210112016"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"J.M. Portal","raw_affiliation_strings":["Aix-Marseille Universit\u00e9, IM2NP, CNRS UMR 7334, Marseille, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Aix-Marseille Universit\u00e9, IM2NP, CNRS UMR 7334, Marseille, France","institution_ids":["https://openalex.org/I1294671590","https://openalex.org/I21491767","https://openalex.org/I4210112016"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5110447770","display_name":"P.-E. Gaillardon","orcid":null},"institutions":[{"id":"https://openalex.org/I223532165","display_name":"University of Utah","ror":"https://ror.org/03r0ha626","country_code":"US","type":"education","lineage":["https://openalex.org/I223532165"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"P.-E. Gaillardon","raw_affiliation_strings":["ECE Department, The University of Utah, Salt Lake City, UT, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ECE Department, The University of Utah, Salt Lake City, UT, USA","institution_ids":["https://openalex.org/I223532165"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":10,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/resistive-random-access-memory","display_name":"Resistive random-access memory","score":0.9078025221824646},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.6222835779190063},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6119861006736755},{"id":"https://openalex.org/keywords/efficient-energy-use","display_name":"Efficient energy use","score":0.5782777070999146},{"id":"https://openalex.org/keywords/overhead","display_name":"Overhead (engineering)","score":0.5752646327018738},{"id":"https://openalex.org/keywords/flip-flop","display_name":"Flip-flop","score":0.5504572987556458},{"id":"https://openalex.org/keywords/energy-consumption","display_name":"Energy consumption","score":0.49924778938293457},{"id":"https://openalex.org/keywords/internet-of-things","display_name":"Internet of Things","score":0.45066654682159424},{"id":"https://openalex.org/keywords/leakage","display_name":"Leakage (economics)","score":0.42095381021499634},{"id":"https://openalex.org/keywords/non-volatile-memory","display_name":"Non-volatile memory","score":0.4112052917480469},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.40928930044174194},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3809802532196045},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.37100887298583984},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.26172930002212524},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.20474225282669067},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.14684811234474182}],"concepts":[{"id":"https://openalex.org/C182019814","wikidata":"https://www.wikidata.org/wiki/Q1143830","display_name":"Resistive random-access memory","level":3,"score":0.9078025221824646},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.6222835779190063},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6119861006736755},{"id":"https://openalex.org/C2742236","wikidata":"https://www.wikidata.org/wiki/Q924713","display_name":"Efficient energy use","level":2,"score":0.5782777070999146},{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.5752646327018738},{"id":"https://openalex.org/C2781007278","wikidata":"https://www.wikidata.org/wiki/Q183406","display_name":"Flip-flop","level":3,"score":0.5504572987556458},{"id":"https://openalex.org/C2780165032","wikidata":"https://www.wikidata.org/wiki/Q16869822","display_name":"Energy consumption","level":2,"score":0.49924778938293457},{"id":"https://openalex.org/C81860439","wikidata":"https://www.wikidata.org/wiki/Q251212","display_name":"Internet of Things","level":2,"score":0.45066654682159424},{"id":"https://openalex.org/C2777042071","wikidata":"https://www.wikidata.org/wiki/Q6509304","display_name":"Leakage (economics)","level":2,"score":0.42095381021499634},{"id":"https://openalex.org/C177950962","wikidata":"https://www.wikidata.org/wiki/Q10997658","display_name":"Non-volatile memory","level":2,"score":0.4112052917480469},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.40928930044174194},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3809802532196045},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.37100887298583984},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.26172930002212524},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.20474225282669067},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.14684811234474182},{"id":"https://openalex.org/C139719470","wikidata":"https://www.wikidata.org/wiki/Q39680","display_name":"Macroeconomics","level":1,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/iscas.2017.8050759","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas.2017.8050759","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 IEEE International Symposium on Circuits and Systems (ISCAS)","raw_type":"proceedings-article"},{"id":"pmh:oai:HAL:hal-01788146v1","is_oa":false,"landing_page_url":"https://hal.science/hal-01788146","pdf_url":null,"source":{"id":"https://openalex.org/S4306402512","display_name":"HAL (Le Centre pour la Communication Scientifique Directe)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1294671590","host_organization_name":"Centre National de la Recherche Scientifique","host_organization_lineage":["https://openalex.org/I1294671590"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"2017 IEEE International Symposium on Circuits and Systems (ISCAS), May 2017, Baltimore, United States. ⟨10.1109/ISCAS.2017.8050759⟩","raw_type":"info:eu-repo/semantics/conferenceObject"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.8999999761581421,"id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":17,"referenced_works":["https://openalex.org/W1993062803","https://openalex.org/W2004823737","https://openalex.org/W2009510324","https://openalex.org/W2021423215","https://openalex.org/W2051209243","https://openalex.org/W2086479490","https://openalex.org/W2086601842","https://openalex.org/W2105103777","https://openalex.org/W2141881829","https://openalex.org/W2150528147","https://openalex.org/W2526202524","https://openalex.org/W2584335437","https://openalex.org/W2940520525","https://openalex.org/W3100863146","https://openalex.org/W6680584036","https://openalex.org/W6762296674","https://openalex.org/W7075348695"],"related_works":["https://openalex.org/W2076211355","https://openalex.org/W2533127403","https://openalex.org/W2007070351","https://openalex.org/W2033811947","https://openalex.org/W2183989414","https://openalex.org/W1551399929","https://openalex.org/W2038212394","https://openalex.org/W2410132916","https://openalex.org/W2104937488","https://openalex.org/W2725431849"],"abstract_inverted_index":{"With":[0],"the":[1,4,76,80,88,94,113,118,126,128,156],"introduction":[2],"of":[3,6,79,93,117,184],"Internet":[5],"Things":[7],"(IoT),":[8],"power":[9,23],"consumption":[10],"became":[11],"a":[12,26,84,101],"major":[13],"design":[14,102,197],"issue":[15],"in":[16,46,149,182],"modern":[17],"system-on-chips.":[18],"In":[19,73,96],"advanced":[20],"technologies,":[21,58],"leakage":[22],"has":[24],"become":[25],"dominant":[27],"component,":[28],"especially":[29],"during":[30],"sleep":[31],"periods.":[32],"Leakage":[33],"mainly":[34],"comes":[35],"from":[36],"volatile":[37],"memory":[38,57,81],"elements,":[39],"e.g.,":[40],"flip-flops":[41],"that":[42,163],"cannot":[43],"be":[44,134],"power-gated":[45],"order":[47],"to":[48,69,172,193],"retain":[49],"their":[50],"states.":[51],"Non-Volatile":[52],"Flip-Flop":[53],"(NVFF)":[54],"using":[55,136,155],"emerging":[56],"such":[59],"as":[60],"Resistive":[61],"Random":[62],"Access":[63],"Memories":[64],"(RRAM),":[65],"are":[66],"popular":[67],"solutions":[68],"address":[70],"this":[71,97],"issue.":[72],"NVFF":[74,146,165],"design,":[75],"resistance":[77,120,169],"values":[78],"element":[82],"have":[83],"direct":[85],"impact":[86],"on":[87],"area":[89,105,140,189],"and":[90,106,130,141,176,188],"energy":[91,107,186],"overhead":[92,190],"structure.":[95],"paper,":[98],"we":[99],"present":[100],"methodology":[103,161],"for":[104,123],"efficient":[108],"RRAM-based":[109],"NVFF.":[110],"By":[111],"characterizing":[112],"optimal":[114,137],"lower":[115],"bound":[116],"RRAM":[119,177],"ratio":[121,170],"required":[122],"properly":[124],"restoring":[125],"FF,":[127],"store":[129,185],"restore":[131,168],"operations":[132],"can":[133],"performed":[135],"programming":[138],"circuit":[139],"energy.":[142],"Four":[143],"Transmission-Gate":[144],"(TG)":[145],"topologies":[147],"implemented":[148],"180nm":[150],"CMOS":[151,175],"technology":[152],"were":[153],"analyzed":[154],"proposed":[157],"methodology.":[158],"The":[159],"presented":[160],"shows":[162],"differential":[164],"provides":[166],"minimum":[167],"down":[171],"1.02":[173],"considering":[174],"variability.":[178],"This":[179],"enables":[180],"improvements":[181],"terms":[183],"(34%)":[187],"(40%)":[191],"compared":[192],"reported":[194],"state-of-the-art":[195],"NV-TGFFs":[196],"approaches.":[198]},"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":1}],"updated_date":"2026-07-22T07:51:19.307946","created_date":"2025-10-10T00:00:00"}