{"id":"https://openalex.org/W2757228622","doi":"https://doi.org/10.1109/iscas.2017.8050629","title":"Investigation of DRAM PUFs reliability under device accelerated aging effects","display_name":"Investigation of DRAM PUFs reliability under device accelerated aging effects","publication_year":2017,"publication_date":"2017-05-01","ids":{"openalex":"https://openalex.org/W2757228622","doi":"https://doi.org/10.1109/iscas.2017.8050629","mag":"2757228622"},"language":"en","primary_location":{"id":"doi:10.1109/iscas.2017.8050629","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas.2017.8050629","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 IEEE International Symposium on Circuits and Systems (ISCAS)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5103273702","display_name":"Fatemeh Tehranipoor","orcid":"https://orcid.org/0000-0002-5742-9954"},"institutions":[{"id":"https://openalex.org/I140172145","display_name":"University of Connecticut","ror":"https://ror.org/02der9h97","country_code":"US","type":"education","lineage":["https://openalex.org/I140172145"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Fatemeh Tehranipoor","raw_affiliation_strings":["ECE Department, University of Connecticut, Storrs, CT, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ECE Department, University of Connecticut, Storrs, CT, USA","institution_ids":["https://openalex.org/I140172145"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5014914538","display_name":"Nima Karimian","orcid":"https://orcid.org/0000-0002-4590-7170"},"institutions":[{"id":"https://openalex.org/I140172145","display_name":"University of Connecticut","ror":"https://ror.org/02der9h97","country_code":"US","type":"education","lineage":["https://openalex.org/I140172145"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Nima Karimian","raw_affiliation_strings":["ECE Department, University of Connecticut, Storrs, CT, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ECE Department, University of Connecticut, Storrs, CT, USA","institution_ids":["https://openalex.org/I140172145"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5050604451","display_name":"Wei Yan","orcid":"https://orcid.org/0000-0002-8059-6398"},"institutions":[{"id":"https://openalex.org/I140172145","display_name":"University of Connecticut","ror":"https://ror.org/02der9h97","country_code":"US","type":"education","lineage":["https://openalex.org/I140172145"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Wei Yan","raw_affiliation_strings":["ECE Department, University of Connecticut, Storrs, CT, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ECE Department, University of Connecticut, Storrs, CT, USA","institution_ids":["https://openalex.org/I140172145"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5082629462","display_name":"John A. Chandy","orcid":"https://orcid.org/0000-0003-3449-3205"},"institutions":[{"id":"https://openalex.org/I140172145","display_name":"University of Connecticut","ror":"https://ror.org/02der9h97","country_code":"US","type":"education","lineage":["https://openalex.org/I140172145"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"John A. Chandy","raw_affiliation_strings":["ECE Department, University of Connecticut, Storrs, CT, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ECE Department, University of Connecticut, Storrs, CT, USA","institution_ids":["https://openalex.org/I140172145"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I140172145"],"apc_list":null,"apc_paid":null,"fwci":3.6137,"has_fulltext":false,"cited_by_count":29,"citation_normalized_percentile":{"value":0.9507466,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.988099992275238,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9803000092506409,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/dram","display_name":"Dram","score":0.9142162203788757},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.7157917618751526},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.551313042640686},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5272055268287659},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5242484211921692},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.5016887187957764},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.4680813252925873},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.4437805116176605},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.42954036593437195},{"id":"https://openalex.org/keywords/circuit-reliability","display_name":"Circuit reliability","score":0.4131205677986145},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4010251462459564},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.25221529603004456},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.21015697717666626},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.1899813711643219},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.06531912088394165}],"concepts":[{"id":"https://openalex.org/C7366592","wikidata":"https://www.wikidata.org/wiki/Q1255620","display_name":"Dram","level":2,"score":0.9142162203788757},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.7157917618751526},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.551313042640686},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5272055268287659},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5242484211921692},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.5016887187957764},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.4680813252925873},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.4437805116176605},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.42954036593437195},{"id":"https://openalex.org/C2778309119","wikidata":"https://www.wikidata.org/wiki/Q5121614","display_name":"Circuit reliability","level":4,"score":0.4131205677986145},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4010251462459564},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.25221529603004456},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.21015697717666626},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.1899813711643219},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.06531912088394165},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iscas.2017.8050629","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas.2017.8050629","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 IEEE International Symposium on Circuits and Systems (ISCAS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.4000000059604645,"display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":14,"referenced_works":["https://openalex.org/W1989372524","https://openalex.org/W2046467839","https://openalex.org/W2051451212","https://openalex.org/W2062570749","https://openalex.org/W2085829174","https://openalex.org/W2108247912","https://openalex.org/W2116374153","https://openalex.org/W2149648080","https://openalex.org/W2167583372","https://openalex.org/W2429633288","https://openalex.org/W2525711947","https://openalex.org/W2562000701","https://openalex.org/W2599001773","https://openalex.org/W4235249758"],"related_works":["https://openalex.org/W2248394785","https://openalex.org/W2389800961","https://openalex.org/W1995389502","https://openalex.org/W2501578203","https://openalex.org/W2113108952","https://openalex.org/W3215142653","https://openalex.org/W2433923775","https://openalex.org/W1536420786","https://openalex.org/W1880950716","https://openalex.org/W2040773997"],"abstract_inverted_index":{"Physical":[0],"Unclonable":[1],"Functions":[2],"are":[3,12,19,40,54],"promising":[4],"candidates":[5],"for":[6],"lightweight":[7],"authentication":[8],"applications":[9,126],"as":[10,56,128],"they":[11],"hard":[13],"to":[14,96],"predict":[15],"and":[16,114],"clone.":[17],"PUFs":[18,108,121],"dependent":[20],"on":[21,77,99,104],"process":[22],"variations":[23],"that":[24],"occurs":[25],"during":[26],"silicon":[27],"chip":[28],"fabrication.":[29],"As":[30],"the":[31,47,64,73,78,117],"CMOS":[32],"technology":[33],"scales":[34],"down":[35],"towards":[36],"nanoscale":[37],"dimensions,":[38],"there":[39],"increasing":[41],"transistor":[42],"reliability":[43,79,111],"challenges":[44],"which":[45,59],"impact":[46],"lifetime":[48],"of":[49,63,66,75,80,119,125],"integrated":[50],"circuits.":[51,67],"These":[52],"issues":[53],"known":[55],"aging":[57,76,87],"effects,":[58],"result":[60],"in":[61,122],"degradation":[62],"performance":[65],"In":[68],"this":[69],"paper,":[70],"we":[71],"analyze":[72],"effects":[74],"intrinsic":[81],"DRAM":[82,101,107,120],"PUFs.":[83,102],"We":[84],"present":[85],"accelerated":[86],"experimental":[88],"results":[89],"over":[90,112],"18":[91],"months":[92],"(from":[93],"Sep.":[94],"2014":[95],"Feb.":[97],"2016)":[98],"3":[100],"Based":[103],"our":[105],"observations,":[106],"maintain":[109],"their":[110],"time,":[113],"thus,":[115],"validate":[116],"use":[118],"a":[123],"number":[124],"such":[127],"system":[129],"authentications.":[130]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":4},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":3},{"year":2019,"cited_by_count":11},{"year":2018,"cited_by_count":4},{"year":2017,"cited_by_count":1}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}