{"id":"https://openalex.org/W2757249827","doi":"https://doi.org/10.1109/iscas.2017.8050476","title":"Current mirror array: A novel lightweight strong PUF topology with enhanced reliability","display_name":"Current mirror array: A novel lightweight strong PUF topology with enhanced reliability","publication_year":2017,"publication_date":"2017-05-01","ids":{"openalex":"https://openalex.org/W2757249827","doi":"https://doi.org/10.1109/iscas.2017.8050476","mag":"2757249827"},"language":"en","primary_location":{"id":"doi:10.1109/iscas.2017.8050476","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas.2017.8050476","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 IEEE International Symposium on Circuits and Systems (ISCAS)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100401045","display_name":"Zheng Wang","orcid":"https://orcid.org/0000-0001-6157-0662"},"institutions":[{"id":"https://openalex.org/I4210145761","display_name":"Shenzhen Institutes of Advanced Technology","ror":"https://ror.org/04gh4er46","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210145761"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zheng Wang","raw_affiliation_strings":["Shenzhen Institutes of Advanced Technology, Chinese Academy of Science"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Shenzhen Institutes of Advanced Technology, Chinese Academy of Science","institution_ids":["https://openalex.org/I4210145761"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100419225","display_name":"Yi Chen","orcid":"https://orcid.org/0000-0001-8527-9415"},"institutions":[{"id":"https://openalex.org/I172675005","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302","country_code":"SG","type":"education","lineage":["https://openalex.org/I172675005"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Yi Chen","raw_affiliation_strings":["School of Electrical and Electronic Engineering, Nanyang Technological University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical and Electronic Engineering, Nanyang Technological University","institution_ids":["https://openalex.org/I172675005"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5055972536","display_name":"Aakash Patil","orcid":"https://orcid.org/0000-0002-2743-7814"},"institutions":[{"id":"https://openalex.org/I172675005","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302","country_code":"SG","type":"education","lineage":["https://openalex.org/I172675005"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Aakash Patil","raw_affiliation_strings":["School of Electrical and Electronic Engineering, Nanyang Technological University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical and Electronic Engineering, Nanyang Technological University","institution_ids":["https://openalex.org/I172675005"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5029335324","display_name":"Chip-Hong Chang","orcid":"https://orcid.org/0000-0002-8897-6176"},"institutions":[{"id":"https://openalex.org/I172675005","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302","country_code":"SG","type":"education","lineage":["https://openalex.org/I172675005"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Chip-Hong Chang","raw_affiliation_strings":["School of Electrical and Electronic Engineering, Nanyang Technological University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical and Electronic Engineering, Nanyang Technological University","institution_ids":["https://openalex.org/I172675005"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5002380437","display_name":"Arindam Basu","orcid":"https://orcid.org/0000-0003-1035-8770"},"institutions":[{"id":"https://openalex.org/I172675005","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302","country_code":"SG","type":"education","lineage":["https://openalex.org/I172675005"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Arindam Basu","raw_affiliation_strings":["School of Electrical and Electronic Engineering, Nanyang Technological University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical and Electronic Engineering, Nanyang Technological University","institution_ids":["https://openalex.org/I172675005"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.7608,"has_fulltext":false,"cited_by_count":9,"citation_normalized_percentile":{"value":0.68397593,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9986000061035156,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9973000288009644,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/physical-unclonable-function","display_name":"Physical unclonable function","score":0.8964266777038574},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.670400083065033},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6326284408569336},{"id":"https://openalex.org/keywords/randomness","display_name":"Randomness","score":0.5677723288536072},{"id":"https://openalex.org/keywords/topology","display_name":"Topology (electrical circuits)","score":0.5015177726745605},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.45433172583580017},{"id":"https://openalex.org/keywords/exploit","display_name":"Exploit","score":0.44523435831069946},{"id":"https://openalex.org/keywords/current","display_name":"Current (fluid)","score":0.4413764774799347},{"id":"https://openalex.org/keywords/bit-error-rate","display_name":"Bit error rate","score":0.43148547410964966},{"id":"https://openalex.org/keywords/thresholding","display_name":"Thresholding","score":0.4219532608985901},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.28443509340286255},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.19137120246887207},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.18178659677505493},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.17973166704177856},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.11916887760162354},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.10542869567871094},{"id":"https://openalex.org/keywords/cryptography","display_name":"Cryptography","score":0.10516357421875},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.1031307578086853}],"concepts":[{"id":"https://openalex.org/C8643368","wikidata":"https://www.wikidata.org/wiki/Q4046262","display_name":"Physical unclonable function","level":3,"score":0.8964266777038574},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.670400083065033},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6326284408569336},{"id":"https://openalex.org/C125112378","wikidata":"https://www.wikidata.org/wiki/Q176640","display_name":"Randomness","level":2,"score":0.5677723288536072},{"id":"https://openalex.org/C184720557","wikidata":"https://www.wikidata.org/wiki/Q7825049","display_name":"Topology (electrical circuits)","level":2,"score":0.5015177726745605},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.45433172583580017},{"id":"https://openalex.org/C165696696","wikidata":"https://www.wikidata.org/wiki/Q11287","display_name":"Exploit","level":2,"score":0.44523435831069946},{"id":"https://openalex.org/C148043351","wikidata":"https://www.wikidata.org/wiki/Q4456944","display_name":"Current (fluid)","level":2,"score":0.4413764774799347},{"id":"https://openalex.org/C56296756","wikidata":"https://www.wikidata.org/wiki/Q840922","display_name":"Bit error rate","level":3,"score":0.43148547410964966},{"id":"https://openalex.org/C191178318","wikidata":"https://www.wikidata.org/wiki/Q2256906","display_name":"Thresholding","level":3,"score":0.4219532608985901},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.28443509340286255},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.19137120246887207},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.18178659677505493},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.17973166704177856},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.11916887760162354},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.10542869567871094},{"id":"https://openalex.org/C178489894","wikidata":"https://www.wikidata.org/wiki/Q8789","display_name":"Cryptography","level":2,"score":0.10516357421875},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.1031307578086853},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C57273362","wikidata":"https://www.wikidata.org/wiki/Q576722","display_name":"Decoding methods","level":2,"score":0.0},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iscas.2017.8050476","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas.2017.8050476","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 IEEE International Symposium on Circuits and Systems (ISCAS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":14,"referenced_works":["https://openalex.org/W1517403092","https://openalex.org/W1940916716","https://openalex.org/W1967501125","https://openalex.org/W2001067488","https://openalex.org/W2044389004","https://openalex.org/W2057434929","https://openalex.org/W2116374153","https://openalex.org/W2120317475","https://openalex.org/W2135988418","https://openalex.org/W2185491959","https://openalex.org/W2301210480","https://openalex.org/W2502734849","https://openalex.org/W6650704792","https://openalex.org/W6676995458"],"related_works":["https://openalex.org/W17155033","https://openalex.org/W3207760230","https://openalex.org/W1496222301","https://openalex.org/W1590307681","https://openalex.org/W2536018345","https://openalex.org/W4312814274","https://openalex.org/W4285370786","https://openalex.org/W2296488620","https://openalex.org/W2358353312","https://openalex.org/W2353836703"],"abstract_inverted_index":{"In":[0],"this":[1],"work,":[2],"we":[3],"present":[4],"a":[5],"novel":[6],"design":[7],"of":[8,17,55,73,76,100,111],"physical":[9],"unclonable":[10],"function":[11],"(PUF)":[12],"based":[13],"on":[14,84],"the":[15,27,30,36,41,53,56,90],"topology":[16],"current":[18,31,43,48],"mirror":[19,32],"array":[20],"(CMA).":[21],"The":[22,64],"proposed":[23,57,65,91],"strong":[24],"PUF":[25,58,66,92],"exploits":[26],"randomness":[28],"in":[29,71],"transistors":[33],"and":[34,46,104],"generates":[35],"response":[37],"bit":[38,107],"by":[39],"comparing":[40],"accumulated":[42],"values.":[44],"Thresholding":[45],"reference":[47],"are":[49],"used":[50],"to":[51],"increase":[52],"reliability":[54],"without":[59],"requiring":[60],"additional":[61],"hardware":[62],"resources.":[63],"structure":[67],"is":[68],"also":[69],"analysed":[70],"terms":[72],"its":[74],"difficulty":[75],"model":[77],"building":[78],"for":[79],"measurement-prediction":[80],"attack.":[81],"Measurement":[82],"results":[83],"0.35\u03bcm":[85],"test":[86],"chips":[87],"demonstrate":[88],"that":[89],"outperforms":[93],"other":[94],"state-of-the-art":[95],"designs":[96],"with":[97],"smaller":[98],"area/bit":[99],"9":[101],"\u00d7":[102],"10\u221236\u03bcm2":[103],"lower":[105],"native":[106],"error":[108],"rate":[109],"(BER)":[110],"0.16%.":[112]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":2},{"year":2017,"cited_by_count":1}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}