{"id":"https://openalex.org/W2511956875","doi":"https://doi.org/10.1109/iscas.2016.7539175","title":"A low store energy and robust ReRAM-based flip-flop for normally off microprocessors","display_name":"A low store energy and robust ReRAM-based flip-flop for normally off microprocessors","publication_year":2016,"publication_date":"2016-05-01","ids":{"openalex":"https://openalex.org/W2511956875","doi":"https://doi.org/10.1109/iscas.2016.7539175","mag":"2511956875"},"language":"en","primary_location":{"id":"doi:10.1109/iscas.2016.7539175","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas.2016.7539175","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 IEEE International Symposium on Circuits and Systems (ISCAS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5021078032","display_name":"Tsai-Kan Chien","orcid":"https://orcid.org/0000-0002-9864-5768"},"institutions":[{"id":"https://openalex.org/I4210148468","display_name":"Industrial Technology Research Institute","ror":"https://ror.org/05szzwt63","country_code":"TW","type":"nonprofit","lineage":["https://openalex.org/I4210148468"]},{"id":"https://openalex.org/I91807558","display_name":"National Cheng Kung University","ror":"https://ror.org/01b8kcc49","country_code":"TW","type":"education","lineage":["https://openalex.org/I91807558"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Tsai-Kan Chien","raw_affiliation_strings":["Department of Electrical Engineering, National Cheng Kung University, Taiwan","Electronics and Optoelectronics Research Laboratories (EOL), ITRI, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, National Cheng Kung University, Taiwan","institution_ids":["https://openalex.org/I91807558"]},{"raw_affiliation_string":"Electronics and Optoelectronics Research Laboratories (EOL), ITRI, Taiwan","institution_ids":["https://openalex.org/I4210148468"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5015109763","display_name":"Lih\u2010Yih Chiou","orcid":"https://orcid.org/0000-0002-4161-5787"},"institutions":[{"id":"https://openalex.org/I91807558","display_name":"National Cheng Kung University","ror":"https://ror.org/01b8kcc49","country_code":"TW","type":"education","lineage":["https://openalex.org/I91807558"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Lih-Yih Chiou","raw_affiliation_strings":["Department of Electrical Engineering, National Cheng Kung University, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, National Cheng Kung University, Taiwan","institution_ids":["https://openalex.org/I91807558"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5014807880","display_name":"Yao-Chun Chuang","orcid":null},"institutions":[{"id":"https://openalex.org/I91807558","display_name":"National Cheng Kung University","ror":"https://ror.org/01b8kcc49","country_code":"TW","type":"education","lineage":["https://openalex.org/I91807558"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Yao-Chun Chuang","raw_affiliation_strings":["Department of Electrical Engineering, National Cheng Kung University, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, National Cheng Kung University, Taiwan","institution_ids":["https://openalex.org/I91807558"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5112150802","display_name":"Shyh-Shyuan Sheu","orcid":null},"institutions":[{"id":"https://openalex.org/I4210148468","display_name":"Industrial Technology Research Institute","ror":"https://ror.org/05szzwt63","country_code":"TW","type":"nonprofit","lineage":["https://openalex.org/I4210148468"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Shyh-Shyuan Sheu","raw_affiliation_strings":["Electronics and Optoelectronics Research Laboratories (EOL), ITRI, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electronics and Optoelectronics Research Laboratories (EOL), ITRI, Taiwan","institution_ids":["https://openalex.org/I4210148468"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5076960605","display_name":"Hengyuan Li","orcid":"https://orcid.org/0000-0002-5913-1414"},"institutions":[{"id":"https://openalex.org/I4210148468","display_name":"Industrial Technology Research Institute","ror":"https://ror.org/05szzwt63","country_code":"TW","type":"nonprofit","lineage":["https://openalex.org/I4210148468"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Heng-Yuan Li","raw_affiliation_strings":["Electronics and Optoelectronics Research Laboratories (EOL), ITRI, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electronics and Optoelectronics Research Laboratories (EOL), ITRI, Taiwan","institution_ids":["https://openalex.org/I4210148468"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5055475468","display_name":"Peihua Wang","orcid":"https://orcid.org/0000-0002-6665-3384"},"institutions":[{"id":"https://openalex.org/I4210148468","display_name":"Industrial Technology Research Institute","ror":"https://ror.org/05szzwt63","country_code":"TW","type":"nonprofit","lineage":["https://openalex.org/I4210148468"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Pei-Hua Wang","raw_affiliation_strings":["Electronics and Optoelectronics Research Laboratories (EOL), ITRI, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electronics and Optoelectronics Research Laboratories (EOL), ITRI, Taiwan","institution_ids":["https://openalex.org/I4210148468"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5068496383","display_name":"Tzu-Kun Ku","orcid":null},"institutions":[{"id":"https://openalex.org/I4210148468","display_name":"Industrial Technology Research Institute","ror":"https://ror.org/05szzwt63","country_code":"TW","type":"nonprofit","lineage":["https://openalex.org/I4210148468"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Tzu-Kun Ku","raw_affiliation_strings":["Electronics and Optoelectronics Research Laboratories (EOL), ITRI, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electronics and Optoelectronics Research Laboratories (EOL), ITRI, Taiwan","institution_ids":["https://openalex.org/I4210148468"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108417335","display_name":"Ming\u2010Jinn Tsai","orcid":null},"institutions":[{"id":"https://openalex.org/I4210148468","display_name":"Industrial Technology Research Institute","ror":"https://ror.org/05szzwt63","country_code":"TW","type":"nonprofit","lineage":["https://openalex.org/I4210148468"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Ming-Jinn Tsai","raw_affiliation_strings":["Electronics and Optoelectronics Research Laboratories (EOL), ITRI, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electronics and Optoelectronics Research Laboratories (EOL), ITRI, Taiwan","institution_ids":["https://openalex.org/I4210148468"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5004605327","display_name":"Chih\u2010I Wu","orcid":"https://orcid.org/0000-0003-3613-7511"},"institutions":[{"id":"https://openalex.org/I4210148468","display_name":"Industrial Technology Research Institute","ror":"https://ror.org/05szzwt63","country_code":"TW","type":"nonprofit","lineage":["https://openalex.org/I4210148468"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Chih-I Wu","raw_affiliation_strings":["Electronics and Optoelectronics Research Laboratories (EOL), ITRI, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electronics and Optoelectronics Research Laboratories (EOL), ITRI, Taiwan","institution_ids":["https://openalex.org/I4210148468"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":9,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.3021,"has_fulltext":false,"cited_by_count":14,"citation_normalized_percentile":{"value":0.82658506,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":null,"issue":null,"first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/resistive-random-access-memory","display_name":"Resistive random-access memory","score":0.8370569944381714},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7157688736915588},{"id":"https://openalex.org/keywords/pipeline","display_name":"Pipeline (software)","score":0.5416136384010315},{"id":"https://openalex.org/keywords/microsystem","display_name":"Microsystem","score":0.5021600723266602},{"id":"https://openalex.org/keywords/energy-consumption","display_name":"Energy consumption","score":0.4994032382965088},{"id":"https://openalex.org/keywords/non-volatile-memory","display_name":"Non-volatile memory","score":0.4850384593009949},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.46503064036369324},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.46256503462791443},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.45845288038253784},{"id":"https://openalex.org/keywords/flip-flop","display_name":"Flip-flop","score":0.4377599060535431},{"id":"https://openalex.org/keywords/power-consumption","display_name":"Power consumption","score":0.43254274129867554},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3999084532260895},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.32608237862586975},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3133305311203003},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.3108753561973572},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.16023293137550354},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.12655189633369446}],"concepts":[{"id":"https://openalex.org/C182019814","wikidata":"https://www.wikidata.org/wiki/Q1143830","display_name":"Resistive random-access memory","level":3,"score":0.8370569944381714},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7157688736915588},{"id":"https://openalex.org/C43521106","wikidata":"https://www.wikidata.org/wiki/Q2165493","display_name":"Pipeline (software)","level":2,"score":0.5416136384010315},{"id":"https://openalex.org/C151054161","wikidata":"https://www.wikidata.org/wiki/Q379385","display_name":"Microsystem","level":2,"score":0.5021600723266602},{"id":"https://openalex.org/C2780165032","wikidata":"https://www.wikidata.org/wiki/Q16869822","display_name":"Energy consumption","level":2,"score":0.4994032382965088},{"id":"https://openalex.org/C177950962","wikidata":"https://www.wikidata.org/wiki/Q10997658","display_name":"Non-volatile memory","level":2,"score":0.4850384593009949},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.46503064036369324},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.46256503462791443},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.45845288038253784},{"id":"https://openalex.org/C2781007278","wikidata":"https://www.wikidata.org/wiki/Q183406","display_name":"Flip-flop","level":3,"score":0.4377599060535431},{"id":"https://openalex.org/C2984118289","wikidata":"https://www.wikidata.org/wiki/Q29954","display_name":"Power consumption","level":3,"score":0.43254274129867554},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3999084532260895},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.32608237862586975},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3133305311203003},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.3108753561973572},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.16023293137550354},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.12655189633369446},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iscas.2016.7539175","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas.2016.7539175","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 IEEE International Symposium on Circuits and Systems (ISCAS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.75,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":8,"referenced_works":["https://openalex.org/W1984800735","https://openalex.org/W2021797032","https://openalex.org/W2051108935","https://openalex.org/W2051736202","https://openalex.org/W2057386187","https://openalex.org/W2087011975","https://openalex.org/W2113825280","https://openalex.org/W2150528147"],"related_works":["https://openalex.org/W2160407400","https://openalex.org/W1831098733","https://openalex.org/W2139774918","https://openalex.org/W2022413894","https://openalex.org/W1561253851","https://openalex.org/W3022490167","https://openalex.org/W2084482805","https://openalex.org/W3101366632","https://openalex.org/W2511956875","https://openalex.org/W2784180246"],"abstract_inverted_index":{"Normally-off":[0],"computing":[1],"(NoC)":[2],"is":[3],"one":[4],"of":[5,53,85],"promising":[6],"techniques":[7],"that":[8],"benefits":[9],"microsystems":[10,29],"with":[11,66,95,133],"long":[12],"sleep":[13],"time.":[14],"Because":[15],"NoC":[16],"can":[17,27,100],"turn":[18],"off":[19],"power":[20,24],"to":[21,69,131],"achieve":[22],"zero":[23],"consumption":[25],"and":[26,49,75,110],"activate":[28],"instantly.":[30],"This":[31],"study":[32],"proposes":[33],"a":[34,63,86,134],"novel":[35],"resistive":[36],"random":[37],"access":[38],"memory":[39],"(ReRAM)-based":[40],"nonvolatile":[41],"flip-flop":[42],"(NVFF),":[43],"fabricated":[44],"using":[45],"90-nm":[46],"CMOS":[47],"technology":[48],"the":[50,54,79,96],"ReRAM":[51],"process":[52],"Industrial":[55],"Technology":[56],"Research":[57],"Institute.":[58],"The":[59,90,115],"proposed":[60,91,116],"NVFF":[61],"uses":[62],"complementary":[64,98],"structure":[65],"one-phase":[67],"store":[68,73,102],"mitigate":[70],"limitation":[71],"on":[72],"energy":[74,103],"was":[76,118],"verified":[77],"as":[78],"registers":[80],"in":[81,121],"three":[82],"pipeline":[83],"stages":[84],"NV":[87,136],"multiplier-and-accumulator":[88],"macro.":[89],"ReRAM-based":[92],"NVFF,":[93],"compared":[94,130],"state-of-the-art":[97],"design,":[99],"reduce":[101],"by":[104,108,113],"36.4%,":[105],"restore":[106],"time":[107],"64.2%,":[109],"circuit":[111],"area":[112],"42.8%.":[114],"design":[117],"also":[119],"superior":[120],"reducing":[122],"restoration":[123],"error":[124],"(by":[125],"9.44%)":[126],"under":[127],"hardship":[128],"condition":[129],"NVFFs":[132],"single":[135],"device.":[137]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":2},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":2},{"year":2017,"cited_by_count":3}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}