{"id":"https://openalex.org/W2518635392","doi":"https://doi.org/10.1109/iscas.2016.7527449","title":"Quantitative evaluation of reliability and performance for STT-MRAM","display_name":"Quantitative evaluation of reliability and performance for STT-MRAM","publication_year":2016,"publication_date":"2016-05-01","ids":{"openalex":"https://openalex.org/W2518635392","doi":"https://doi.org/10.1109/iscas.2016.7527449","mag":"2518635392"},"language":"en","primary_location":{"id":"doi:10.1109/iscas.2016.7527449","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas.2016.7527449","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 IEEE International Symposium on Circuits and Systems (ISCAS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://hal-lirmm.ccsd.cnrs.fr/lirmm-01446275","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101925068","display_name":"Liuyang Zhang","orcid":"https://orcid.org/0000-0002-0160-0636"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]},{"id":"https://openalex.org/I4210101743","display_name":"Laboratoire d'Informatique, de Robotique et de Micro\u00e9lectronique de Montpellier","ror":"https://ror.org/013yean28","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I1326498283","https://openalex.org/I151295451","https://openalex.org/I19894307","https://openalex.org/I4210101743","https://openalex.org/I4210159245","https://openalex.org/I4412460525"]},{"id":"https://openalex.org/I19894307","display_name":"Universit\u00e9 de Montpellier","ror":"https://ror.org/051escj72","country_code":"FR","type":"education","lineage":["https://openalex.org/I19894307"]}],"countries":["CN","FR"],"is_corresponding":true,"raw_author_name":"Liuyang Zhang","raw_affiliation_strings":["LIRMM, University of Montpellier, Montpellier, France","Spin Interdisciplinary Center, Beihang University, Beijing, China"],"affiliations":[{"raw_affiliation_string":"LIRMM, University of Montpellier, Montpellier, France","institution_ids":["https://openalex.org/I4210101743","https://openalex.org/I19894307"]},{"raw_affiliation_string":"Spin Interdisciplinary Center, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5022136174","display_name":"Aida Todri\u2010Sanial","orcid":"https://orcid.org/0000-0001-8573-2910"},"institutions":[{"id":"https://openalex.org/I19894307","display_name":"Universit\u00e9 de Montpellier","ror":"https://ror.org/051escj72","country_code":"FR","type":"education","lineage":["https://openalex.org/I19894307"]},{"id":"https://openalex.org/I4210101743","display_name":"Laboratoire d'Informatique, de Robotique et de Micro\u00e9lectronique de Montpellier","ror":"https://ror.org/013yean28","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I1326498283","https://openalex.org/I151295451","https://openalex.org/I19894307","https://openalex.org/I4210101743","https://openalex.org/I4210159245","https://openalex.org/I4412460525"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Aida Todri-Sanial","raw_affiliation_strings":["LIRMM, University of Montpellier, Montpellier, France"],"affiliations":[{"raw_affiliation_string":"LIRMM, University of Montpellier, Montpellier, France","institution_ids":["https://openalex.org/I4210101743","https://openalex.org/I19894307"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100381646","display_name":"Wang Kang","orcid":"https://orcid.org/0000-0002-3169-6034"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wang Kang","raw_affiliation_strings":["Spin Interdisciplinary Center, Beihang University, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Spin Interdisciplinary Center, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5018693228","display_name":"Youguang Zhang","orcid":"https://orcid.org/0009-0008-0928-4210"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Youguang Zhang","raw_affiliation_strings":["Spin Interdisciplinary Center, Beihang University, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Spin Interdisciplinary Center, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5029629432","display_name":"Lionel Torres","orcid":"https://orcid.org/0000-0001-5807-5070"},"institutions":[{"id":"https://openalex.org/I4210101743","display_name":"Laboratoire d'Informatique, de Robotique et de Micro\u00e9lectronique de Montpellier","ror":"https://ror.org/013yean28","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I1326498283","https://openalex.org/I151295451","https://openalex.org/I19894307","https://openalex.org/I4210101743","https://openalex.org/I4210159245","https://openalex.org/I4412460525"]},{"id":"https://openalex.org/I19894307","display_name":"Universit\u00e9 de Montpellier","ror":"https://ror.org/051escj72","country_code":"FR","type":"education","lineage":["https://openalex.org/I19894307"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Lionel Torres","raw_affiliation_strings":["LIRMM, University of Montpellier, Montpellier, France"],"affiliations":[{"raw_affiliation_string":"LIRMM, University of Montpellier, Montpellier, France","institution_ids":["https://openalex.org/I4210101743","https://openalex.org/I19894307"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5091884273","display_name":"Yuanqing Cheng","orcid":"https://orcid.org/0000-0003-2477-314X"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yuanqing Cheng","raw_affiliation_strings":["Spin Interdisciplinary Center, Beihang University, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Spin Interdisciplinary Center, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5066473925","display_name":"Weisheng Zhao","orcid":"https://orcid.org/0000-0001-8088-0404"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Weisheng Zhao","raw_affiliation_strings":["Spin Interdisciplinary Center, Beihang University, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Spin Interdisciplinary Center, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":7,"corresponding_author_ids":["https://openalex.org/A5101925068"],"corresponding_institution_ids":["https://openalex.org/I19894307","https://openalex.org/I4210101743","https://openalex.org/I82880672"],"apc_list":null,"apc_paid":null,"fwci":1.959,"has_fulltext":false,"cited_by_count":17,"citation_normalized_percentile":{"value":0.86903578,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":"18","issue":null,"first_page":"1150","last_page":"1153"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10049","display_name":"Magnetic properties of thin films","score":1.0,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10049","display_name":"Magnetic properties of thin films","score":1.0,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9958999752998352,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/magnetoresistive-random-access-memory","display_name":"Magnetoresistive random-access memory","score":0.908333957195282},{"id":"https://openalex.org/keywords/spin-transfer-torque","display_name":"Spin-transfer torque","score":0.6525405049324036},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.587171196937561},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4992547035217285},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4092620611190796},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3584846258163452},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3311309814453125},{"id":"https://openalex.org/keywords/random-access-memory","display_name":"Random access memory","score":0.266018807888031},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.26508304476737976},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.18715834617614746},{"id":"https://openalex.org/keywords/magnetization","display_name":"Magnetization","score":0.10236337780952454},{"id":"https://openalex.org/keywords/magnetic-field","display_name":"Magnetic field","score":0.0972331166267395},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.09131735563278198}],"concepts":[{"id":"https://openalex.org/C46891859","wikidata":"https://www.wikidata.org/wiki/Q1061546","display_name":"Magnetoresistive random-access memory","level":3,"score":0.908333957195282},{"id":"https://openalex.org/C609986","wikidata":"https://www.wikidata.org/wiki/Q844840","display_name":"Spin-transfer torque","level":4,"score":0.6525405049324036},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.587171196937561},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4992547035217285},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4092620611190796},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3584846258163452},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3311309814453125},{"id":"https://openalex.org/C2994168587","wikidata":"https://www.wikidata.org/wiki/Q5295","display_name":"Random access memory","level":2,"score":0.266018807888031},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.26508304476737976},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.18715834617614746},{"id":"https://openalex.org/C32546565","wikidata":"https://www.wikidata.org/wiki/Q856711","display_name":"Magnetization","level":3,"score":0.10236337780952454},{"id":"https://openalex.org/C115260700","wikidata":"https://www.wikidata.org/wiki/Q11408","display_name":"Magnetic field","level":2,"score":0.0972331166267395},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.09131735563278198},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/iscas.2016.7527449","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas.2016.7527449","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 IEEE International Symposium on Circuits and Systems (ISCAS)","raw_type":"proceedings-article"},{"id":"pmh:oai:HAL:lirmm-01446275v1","is_oa":true,"landing_page_url":"https://hal-lirmm.ccsd.cnrs.fr/lirmm-01446275","pdf_url":null,"source":{"id":"https://openalex.org/S4306402512","display_name":"HAL (Le Centre pour la Communication Scientifique Directe)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1294671590","host_organization_name":"Centre National de la Recherche Scientifique","host_organization_lineage":["https://openalex.org/I1294671590"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"ISCAS: International Symposium on Circuits and Systems, May 2016, Montr\u00e9al, QC, Canada. pp.1150-1153, ⟨10.1109/ISCAS.2016.7527449⟩","raw_type":"Conference papers"}],"best_oa_location":{"id":"pmh:oai:HAL:lirmm-01446275v1","is_oa":true,"landing_page_url":"https://hal-lirmm.ccsd.cnrs.fr/lirmm-01446275","pdf_url":null,"source":{"id":"https://openalex.org/S4306402512","display_name":"HAL (Le Centre pour la Communication Scientifique Directe)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1294671590","host_organization_name":"Centre National de la Recherche Scientifique","host_organization_lineage":["https://openalex.org/I1294671590"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"ISCAS: International Symposium on Circuits and Systems, May 2016, Montr\u00e9al, QC, Canada. pp.1150-1153, ⟨10.1109/ISCAS.2016.7527449⟩","raw_type":"Conference papers"},"sustainable_development_goals":[{"display_name":"Quality Education","score":0.550000011920929,"id":"https://metadata.un.org/sdg/4"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":21,"referenced_works":["https://openalex.org/W1964242651","https://openalex.org/W1964504828","https://openalex.org/W1969200114","https://openalex.org/W1977512304","https://openalex.org/W1985887979","https://openalex.org/W2003243790","https://openalex.org/W2009059573","https://openalex.org/W2014178805","https://openalex.org/W2025173691","https://openalex.org/W2030671441","https://openalex.org/W2081178176","https://openalex.org/W2096445739","https://openalex.org/W2110134128","https://openalex.org/W2112701476","https://openalex.org/W2119024974","https://openalex.org/W2138670105","https://openalex.org/W2188761345","https://openalex.org/W2237390331","https://openalex.org/W4247898341","https://openalex.org/W4285719527","https://openalex.org/W6687026183"],"related_works":["https://openalex.org/W4388285079","https://openalex.org/W2546997659","https://openalex.org/W2733919783","https://openalex.org/W2425808153","https://openalex.org/W2404332818","https://openalex.org/W4281561022","https://openalex.org/W2188761345","https://openalex.org/W3006384944","https://openalex.org/W393693633","https://openalex.org/W60430064"],"abstract_inverted_index":{"Due":[0],"to":[1],"its":[2,46,98],"non-volatility,":[3],"high":[4],"access":[5,130],"speed,":[6],"ultra":[7],"low":[8],"power":[9,127],"consumption":[10,128],"and":[11,61,69,72,80,101,129,149],"unlimited":[12],"writing/reading":[13,123],"cycles,":[14],"STT-MRAM":[15,42,83,95,117],"(Spin":[16],"Transfer":[17],"Torque":[18],"Magnetic":[19,153],"Random":[20],"Access":[21],"Memory)":[22],"has":[23],"emerged":[24],"as":[25],"the":[26,31,37,56,74,77,91,103,150,159],"most":[27],"promising":[28],"candidate":[29],"for":[30,144,171],"next":[32],"generation":[33],"universal":[34],"memory.":[35],"However,":[36],"process":[38],"of":[39,41,63,76,105,113,132,176],"commercialization":[40],"is":[43,84,138],"hampered":[44],"by":[45,55],"poor":[47,99],"reliability.":[48],"Generally,":[49],"these":[50],"reliability":[51,173],"issues":[52],"are":[53],"caused":[54],"PVT":[57,81,114],"(Process":[58],"Variations,":[59],"Voltage,":[60],"Temperature)":[62],"both":[64],"MTJ":[65,155],"(Magnetic":[66],"Tunneling":[67],"Junction)":[68],"transistor.":[70],"Mitigation":[71],"alleviating":[73],"impacts":[75],"intrinsic":[78],"properties":[79],"on":[82,116,141],"a":[85,110,133],"challenging":[86],"work.":[87],"This":[88,136],"paper":[89],"discusses":[90],"errors":[92],"occurring":[93],"in":[94,158],"resulting":[96],"from":[97,162],"reliability,":[100,118],"analyzes":[102],"causes":[104],"such":[106],"errors.":[107],"To":[108],"obtain":[109],"quantitative":[111,166],"assessment":[112],"impact":[115],"we":[119],"investigate":[120],"three":[121],"aspects:":[122],"operation":[124],"error":[125],"rate,":[126],"delay":[131],"single":[134],"cell.":[135],"study":[137],"carried":[139],"out":[140],"Cadence":[142],"platform":[143],"45":[145],"nm":[146],"technology":[147],"node":[148],"PMA":[151],"(Perpendicular":[152],"Anisotropy)":[154],"model":[156],"used":[157],"investigation":[160],"comes":[161],"SP":[163],"INLIB.":[164],"These":[165],"information":[167],"would":[168],"be":[169],"helpful":[170],"designing":[172],"enhancing":[174],"strategies":[175],"STT-MRAM.":[177]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":3},{"year":2019,"cited_by_count":4},{"year":2018,"cited_by_count":4},{"year":2017,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}