{"id":"https://openalex.org/W1580893272","doi":"https://doi.org/10.1109/iscas.2015.7169019","title":"Simple and accurate single event charge collection macro modeling for circuit simulation","display_name":"Simple and accurate single event charge collection macro modeling for circuit simulation","publication_year":2015,"publication_date":"2015-05-01","ids":{"openalex":"https://openalex.org/W1580893272","doi":"https://doi.org/10.1109/iscas.2015.7169019","mag":"1580893272"},"language":"en","primary_location":{"id":"doi:10.1109/iscas.2015.7169019","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas.2015.7169019","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE International Symposium on Circuits and Systems (ISCAS)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5010195027","display_name":"A. Privat","orcid":"https://orcid.org/0000-0002-3161-7586"},"institutions":[{"id":"https://openalex.org/I55732556","display_name":"Arizona State University","ror":"https://ror.org/03efmqc40","country_code":"US","type":"education","lineage":["https://openalex.org/I55732556"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Aymeric Privat","raw_affiliation_strings":["School of Electrical, Computer and Energy Engineering, Arizona State University (ASU), Tempe, AZ","School of Electrical, Computer and Energy Engineering, Arizona State University (ASU), Tempe, AZ 85281"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical, Computer and Energy Engineering, Arizona State University (ASU), Tempe, AZ","institution_ids":["https://openalex.org/I55732556"]},{"raw_affiliation_string":"School of Electrical, Computer and Energy Engineering, Arizona State University (ASU), Tempe, AZ 85281","institution_ids":["https://openalex.org/I55732556"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5015329523","display_name":"Lawrence T. Clark","orcid":"https://orcid.org/0000-0001-7741-6512"},"institutions":[{"id":"https://openalex.org/I55732556","display_name":"Arizona State University","ror":"https://ror.org/03efmqc40","country_code":"US","type":"education","lineage":["https://openalex.org/I55732556"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Lawrence T. Clark","raw_affiliation_strings":["School of Electrical, Computer and Energy Engineering, Arizona State University (ASU), Tempe, AZ","School of Electrical, Computer and Energy Engineering, Arizona State University (ASU), Tempe, AZ 85281"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical, Computer and Energy Engineering, Arizona State University (ASU), Tempe, AZ","institution_ids":["https://openalex.org/I55732556"]},{"raw_affiliation_string":"School of Electrical, Computer and Energy Engineering, Arizona State University (ASU), Tempe, AZ 85281","institution_ids":["https://openalex.org/I55732556"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I55732556"],"apc_list":null,"apc_paid":null,"fwci":2.0588,"has_fulltext":false,"cited_by_count":15,"citation_normalized_percentile":{"value":0.8532237,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"1858","last_page":"1861"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/spice","display_name":"Spice","score":0.8440036177635193},{"id":"https://openalex.org/keywords/macro","display_name":"Macro","score":0.7744214534759521},{"id":"https://openalex.org/keywords/weibull-distribution","display_name":"Weibull distribution","score":0.6171233057975769},{"id":"https://openalex.org/keywords/semiconductor-device-modeling","display_name":"Semiconductor device modeling","score":0.5771020650863647},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5572795271873474},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.5569469928741455},{"id":"https://openalex.org/keywords/technology-cad","display_name":"Technology CAD","score":0.5099915266036987},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5057570934295654},{"id":"https://openalex.org/keywords/node","display_name":"Node (physics)","score":0.4765910804271698},{"id":"https://openalex.org/keywords/electronic-circuit-simulation","display_name":"Electronic circuit simulation","score":0.46877115964889526},{"id":"https://openalex.org/keywords/equivalent-circuit","display_name":"Equivalent circuit","score":0.4437550902366638},{"id":"https://openalex.org/keywords/upset","display_name":"Upset","score":0.4353099763393402},{"id":"https://openalex.org/keywords/simple","display_name":"Simple (philosophy)","score":0.41411030292510986},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.3252565860748291},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.30320850014686584},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2869124412536621},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.22853729128837585},{"id":"https://openalex.org/keywords/cad","display_name":"CAD","score":0.09456560015678406}],"concepts":[{"id":"https://openalex.org/C2780077345","wikidata":"https://www.wikidata.org/wiki/Q16891888","display_name":"Spice","level":2,"score":0.8440036177635193},{"id":"https://openalex.org/C166955791","wikidata":"https://www.wikidata.org/wiki/Q629579","display_name":"Macro","level":2,"score":0.7744214534759521},{"id":"https://openalex.org/C173291955","wikidata":"https://www.wikidata.org/wiki/Q732332","display_name":"Weibull distribution","level":2,"score":0.6171233057975769},{"id":"https://openalex.org/C4775677","wikidata":"https://www.wikidata.org/wiki/Q7449393","display_name":"Semiconductor device modeling","level":3,"score":0.5771020650863647},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5572795271873474},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.5569469928741455},{"id":"https://openalex.org/C34929307","wikidata":"https://www.wikidata.org/wiki/Q845636","display_name":"Technology CAD","level":3,"score":0.5099915266036987},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5057570934295654},{"id":"https://openalex.org/C62611344","wikidata":"https://www.wikidata.org/wiki/Q1062658","display_name":"Node (physics)","level":2,"score":0.4765910804271698},{"id":"https://openalex.org/C46205389","wikidata":"https://www.wikidata.org/wiki/Q1270401","display_name":"Electronic circuit simulation","level":3,"score":0.46877115964889526},{"id":"https://openalex.org/C23572009","wikidata":"https://www.wikidata.org/wiki/Q964981","display_name":"Equivalent circuit","level":3,"score":0.4437550902366638},{"id":"https://openalex.org/C2778002589","wikidata":"https://www.wikidata.org/wiki/Q2406791","display_name":"Upset","level":2,"score":0.4353099763393402},{"id":"https://openalex.org/C2780586882","wikidata":"https://www.wikidata.org/wiki/Q7520643","display_name":"Simple (philosophy)","level":2,"score":0.41411030292510986},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.3252565860748291},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.30320850014686584},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2869124412536621},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.22853729128837585},{"id":"https://openalex.org/C194789388","wikidata":"https://www.wikidata.org/wiki/Q17855283","display_name":"CAD","level":2,"score":0.09456560015678406},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C66938386","wikidata":"https://www.wikidata.org/wiki/Q633538","display_name":"Structural engineering","level":1,"score":0.0},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C199639397","wikidata":"https://www.wikidata.org/wiki/Q1788588","display_name":"Engineering drawing","level":1,"score":0.0},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iscas.2015.7169019","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas.2015.7169019","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE International Symposium on Circuits and Systems (ISCAS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.7300000190734863}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":9,"referenced_works":["https://openalex.org/W2098247453","https://openalex.org/W2110259720","https://openalex.org/W2112103432","https://openalex.org/W2115516668","https://openalex.org/W2132529273","https://openalex.org/W2138787243","https://openalex.org/W2154941994","https://openalex.org/W3172772885","https://openalex.org/W6797258325"],"related_works":["https://openalex.org/W1982409087","https://openalex.org/W2908026729","https://openalex.org/W1629312120","https://openalex.org/W2134827725","https://openalex.org/W2922342296","https://openalex.org/W2945285759","https://openalex.org/W3099527205","https://openalex.org/W1989032443","https://openalex.org/W1670079182","https://openalex.org/W2732667363"],"abstract_inverted_index":{"A":[0],"simple":[1],"macro-model":[2,14],"to":[3,72,91],"accurately":[4,16],"simulate":[5,17],"upset":[6],"error":[7],"on":[8,77],"CMOS":[9],"devices":[10],"is":[11,41],"presented.":[12],"This":[13],"can":[15],"the":[18,74,92],"typical":[19],"behavior":[20],"of":[21],"single":[22],"event":[23],"effect":[24],"(SEE)":[25],"caused":[26],"by":[27],"ionizing":[28],"radiation":[29],"charge":[30],"collection":[31],"at":[32],"N":[33],"type":[34,37],"and":[35,54,85],"P":[36],"diffusions.":[38],"The":[39,61,80],"model":[40,62,73,81],"calibrated":[42],"using":[43],"3-D":[44,93],"mixed":[45],"mode":[46],"technology":[47],"computer":[48],"aided":[49],"design":[50],"(TCAD)":[51],"device":[52],"simulations":[53],"implemented":[55],"as":[56],"a":[57,64,69],"SPICE":[58],"circuit":[59,78],"macro-model.":[60],"uses":[63],"dependent":[65],"current":[66,75],"source":[67],"with":[68],"Weibull":[70],"distribution":[71],"injection":[76],"node.":[79],"shows":[82],"physical":[83],"response":[84],"adjusting":[86],"parameters":[87],"allows":[88],"high":[89],"accuracy":[90],"TCAD":[94],"simulated":[95],"response.":[96]},"counts_by_year":[{"year":2025,"cited_by_count":3},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":3},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":2},{"year":2017,"cited_by_count":3}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}