{"id":"https://openalex.org/W1541518112","doi":"https://doi.org/10.1109/iscas.2015.7168659","title":"Fault tolerant mesh based Network-on-Chip architecture","display_name":"Fault tolerant mesh based Network-on-Chip architecture","publication_year":2015,"publication_date":"2015-05-01","ids":{"openalex":"https://openalex.org/W1541518112","doi":"https://doi.org/10.1109/iscas.2015.7168659","mag":"1541518112"},"language":"en","primary_location":{"id":"doi:10.1109/iscas.2015.7168659","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas.2015.7168659","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE International Symposium on Circuits and Systems (ISCAS)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5085560567","display_name":"Navonil Chatterjee","orcid":"https://orcid.org/0000-0002-8402-8195"},"institutions":[{"id":"https://openalex.org/I145894827","display_name":"Indian Institute of Technology Kharagpur","ror":"https://ror.org/03w5sq511","country_code":"IN","type":"education","lineage":["https://openalex.org/I145894827"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Navonil Chatterjee","raw_affiliation_strings":["Electronics & Electrical Communication Engineering, Indian Institute of Technology, Kharagpur Kharagpur, India","Electronics and Electrical Communication Engineering, Indian Institute of Technology Kharagpur, Kharagpur 721302, India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electronics & Electrical Communication Engineering, Indian Institute of Technology, Kharagpur Kharagpur, India","institution_ids":["https://openalex.org/I145894827"]},{"raw_affiliation_string":"Electronics and Electrical Communication Engineering, Indian Institute of Technology Kharagpur, Kharagpur 721302, India","institution_ids":["https://openalex.org/I145894827"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5077947010","display_name":"Santanu Chattopadhyay","orcid":"https://orcid.org/0000-0002-1227-0732"},"institutions":[{"id":"https://openalex.org/I145894827","display_name":"Indian Institute of Technology Kharagpur","ror":"https://ror.org/03w5sq511","country_code":"IN","type":"education","lineage":["https://openalex.org/I145894827"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Santanu Chattopadhyay","raw_affiliation_strings":["Electronics & Electrical Communication Engineering, Indian Institute of Technology, Kharagpur Kharagpur, India","Electronics and Electrical Communication Engineering, Indian Institute of Technology Kharagpur, Kharagpur 721302, India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electronics & Electrical Communication Engineering, Indian Institute of Technology, Kharagpur Kharagpur, India","institution_ids":["https://openalex.org/I145894827"]},{"raw_affiliation_string":"Electronics and Electrical Communication Engineering, Indian Institute of Technology Kharagpur, Kharagpur 721302, India","institution_ids":["https://openalex.org/I145894827"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I145894827"],"apc_list":null,"apc_paid":null,"fwci":1.587,"has_fulltext":false,"cited_by_count":13,"citation_normalized_percentile":{"value":0.82206096,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"417","last_page":"420"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10829","display_name":"Interconnection Networks and Systems","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10829","display_name":"Interconnection Networks and Systems","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10179","display_name":"Supercapacitor Materials and Fabrication","score":0.9933000206947327,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10772","display_name":"Distributed systems and fault tolerance","score":0.9750000238418579,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7369263768196106},{"id":"https://openalex.org/keywords/router","display_name":"Router","score":0.7307708263397217},{"id":"https://openalex.org/keywords/network-on-a-chip","display_name":"Network on a chip","score":0.6404547095298767},{"id":"https://openalex.org/keywords/mean-time-between-failures","display_name":"Mean time between failures","score":0.6098990440368652},{"id":"https://openalex.org/keywords/latency","display_name":"Latency (audio)","score":0.6090217232704163},{"id":"https://openalex.org/keywords/fault-tolerance","display_name":"Fault tolerance","score":0.6032004952430725},{"id":"https://openalex.org/keywords/mesh-networking","display_name":"Mesh networking","score":0.5766395330429077},{"id":"https://openalex.org/keywords/spare-part","display_name":"Spare part","score":0.5414043664932251},{"id":"https://openalex.org/keywords/network-topology","display_name":"Network topology","score":0.5029310584068298},{"id":"https://openalex.org/keywords/computer-network","display_name":"Computer network","score":0.5021734237670898},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.4111379086971283},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.40694645047187805},{"id":"https://openalex.org/keywords/distributed-computing","display_name":"Distributed computing","score":0.3766520023345947},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.33256077766418457},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.18137124180793762},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.14365285634994507},{"id":"https://openalex.org/keywords/failure-rate","display_name":"Failure rate","score":0.14153316617012024},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.11036089062690735}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7369263768196106},{"id":"https://openalex.org/C2775896111","wikidata":"https://www.wikidata.org/wiki/Q642560","display_name":"Router","level":2,"score":0.7307708263397217},{"id":"https://openalex.org/C128519102","wikidata":"https://www.wikidata.org/wiki/Q339554","display_name":"Network on a chip","level":2,"score":0.6404547095298767},{"id":"https://openalex.org/C44154001","wikidata":"https://www.wikidata.org/wiki/Q754940","display_name":"Mean time between failures","level":3,"score":0.6098990440368652},{"id":"https://openalex.org/C82876162","wikidata":"https://www.wikidata.org/wiki/Q17096504","display_name":"Latency (audio)","level":2,"score":0.6090217232704163},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.6032004952430725},{"id":"https://openalex.org/C123691950","wikidata":"https://www.wikidata.org/wiki/Q25552104","display_name":"Mesh networking","level":3,"score":0.5766395330429077},{"id":"https://openalex.org/C194648553","wikidata":"https://www.wikidata.org/wiki/Q1364774","display_name":"Spare part","level":2,"score":0.5414043664932251},{"id":"https://openalex.org/C199845137","wikidata":"https://www.wikidata.org/wiki/Q145490","display_name":"Network topology","level":2,"score":0.5029310584068298},{"id":"https://openalex.org/C31258907","wikidata":"https://www.wikidata.org/wiki/Q1301371","display_name":"Computer network","level":1,"score":0.5021734237670898},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.4111379086971283},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.40694645047187805},{"id":"https://openalex.org/C120314980","wikidata":"https://www.wikidata.org/wiki/Q180634","display_name":"Distributed computing","level":1,"score":0.3766520023345947},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.33256077766418457},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.18137124180793762},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.14365285634994507},{"id":"https://openalex.org/C163164238","wikidata":"https://www.wikidata.org/wiki/Q2737027","display_name":"Failure rate","level":2,"score":0.14153316617012024},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.11036089062690735},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C555944384","wikidata":"https://www.wikidata.org/wiki/Q249","display_name":"Wireless","level":2,"score":0.0},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iscas.2015.7168659","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas.2015.7168659","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE International Symposium on Circuits and Systems (ISCAS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W1656777224","https://openalex.org/W2005165451","https://openalex.org/W2038667932","https://openalex.org/W2048552075","https://openalex.org/W2070359319","https://openalex.org/W2080108977","https://openalex.org/W2091518118","https://openalex.org/W2100956485","https://openalex.org/W2141866432","https://openalex.org/W2160642395","https://openalex.org/W2165331565","https://openalex.org/W3139765438"],"related_works":["https://openalex.org/W2052816277","https://openalex.org/W2167988973","https://openalex.org/W2603824091","https://openalex.org/W2439487276","https://openalex.org/W2560886726","https://openalex.org/W2091258882","https://openalex.org/W2541438272","https://openalex.org/W3009907353","https://openalex.org/W3006485811","https://openalex.org/W2013729863"],"abstract_inverted_index":{"In":[0],"this":[1],"paper":[2],"we":[3],"present":[4],"a":[5,29,45],"fault":[6],"tolerant":[7],"Mesh":[8],"based":[9],"Network-on-Chip":[10],"design":[11],"that":[12,51],"helps":[13],"to":[14,27,31,58,78],"tolerate":[15],"router":[16],"faults":[17],"along":[18],"with":[19,82],"core":[20],"recovery":[21],"mechanism.":[22],"Spare":[23],"links":[24],"are":[25],"used":[26],"provide":[28],"connection":[30],"horizontal":[32],"and":[33,54,62,75,81,92],"vertical":[34],"routers":[35],"pivoting":[36],"the":[37,42],"failed":[38],"one.":[39],"To":[40],"compliment":[41],"modified":[43],"topology":[44],"routing":[46],"algorithm":[47],"has":[48,68,94],"been":[49,69,96],"developed":[50],"uses":[52],"minimal":[53,56],"non":[55],"paths":[57],"communicate":[59],"between":[60],"source":[61],"destination":[63],"IP":[64],"blocks.":[65],"The":[66,85],"system":[67],"compared":[70],"in":[71,88],"terms":[72,89],"of":[73,90],"reliability":[74],"mean":[76],"time":[77],"failure":[79],"(MTTF)":[80],"existing":[83],"works.":[84],"performance":[86],"evaluation":[87],"throughput":[91],"latency":[93],"also":[95],"reported.":[97]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":2},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":3},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":2}],"updated_date":"2026-08-12T21:12:35.861297","created_date":"2025-10-10T00:00:00"}