{"id":"https://openalex.org/W1607639185","doi":"https://doi.org/10.1109/iscas.2015.7168644","title":"A single-slope based low-noise ADC with input-signal-dependent multiple sampling scheme for CMOS image sensors","display_name":"A single-slope based low-noise ADC with input-signal-dependent multiple sampling scheme for CMOS image sensors","publication_year":2015,"publication_date":"2015-05-01","ids":{"openalex":"https://openalex.org/W1607639185","doi":"https://doi.org/10.1109/iscas.2015.7168644","mag":"1607639185"},"language":"en","primary_location":{"id":"doi:10.1109/iscas.2015.7168644","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas.2015.7168644","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE International Symposium on Circuits and Systems (ISCAS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5112260016","display_name":"Yasuhiro Shinozuka","orcid":null},"institutions":[{"id":"https://openalex.org/I1292669757","display_name":"Toshiba (Japan)","ror":"https://ror.org/0326v3z14","country_code":"JP","type":"company","lineage":["https://openalex.org/I1292669757"]}],"countries":["JP"],"is_corresponding":true,"raw_author_name":"Yasuhiro Shinozuka","raw_affiliation_strings":["Toshiba Corporation, Saiwai-ku, Kawasaki, Japan","Toshiba Corporation 1 Komukai Toshiba-cho Saiwai\u2010ku Kawasaki 212\u20108582 Japan"],"affiliations":[{"raw_affiliation_string":"Toshiba Corporation, Saiwai-ku, Kawasaki, Japan","institution_ids":["https://openalex.org/I1292669757"]},{"raw_affiliation_string":"Toshiba Corporation 1 Komukai Toshiba-cho Saiwai\u2010ku Kawasaki 212\u20108582 Japan","institution_ids":["https://openalex.org/I1292669757"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110479286","display_name":"Kei Shiraishi","orcid":null},"institutions":[{"id":"https://openalex.org/I1292669757","display_name":"Toshiba (Japan)","ror":"https://ror.org/0326v3z14","country_code":"JP","type":"company","lineage":["https://openalex.org/I1292669757"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Kei Shiraishi","raw_affiliation_strings":["Toshiba Corporation, Saiwai-ku, Kawasaki, Japan","Toshiba Corporation 1 Komukai Toshiba-cho Saiwai\u2010ku Kawasaki 212\u20108582 Japan"],"affiliations":[{"raw_affiliation_string":"Toshiba Corporation, Saiwai-ku, Kawasaki, Japan","institution_ids":["https://openalex.org/I1292669757"]},{"raw_affiliation_string":"Toshiba Corporation 1 Komukai Toshiba-cho Saiwai\u2010ku Kawasaki 212\u20108582 Japan","institution_ids":["https://openalex.org/I1292669757"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103289608","display_name":"Masanori Furuta","orcid":null},"institutions":[{"id":"https://openalex.org/I1292669757","display_name":"Toshiba (Japan)","ror":"https://ror.org/0326v3z14","country_code":"JP","type":"company","lineage":["https://openalex.org/I1292669757"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Masanori Furuta","raw_affiliation_strings":["Toshiba Corporation, Saiwai-ku, Kawasaki, Japan","Toshiba Corporation 1 Komukai Toshiba-cho Saiwai\u2010ku Kawasaki 212\u20108582 Japan"],"affiliations":[{"raw_affiliation_string":"Toshiba Corporation, Saiwai-ku, Kawasaki, Japan","institution_ids":["https://openalex.org/I1292669757"]},{"raw_affiliation_string":"Toshiba Corporation 1 Komukai Toshiba-cho Saiwai\u2010ku Kawasaki 212\u20108582 Japan","institution_ids":["https://openalex.org/I1292669757"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5031074574","display_name":"Tetsuro Itakura","orcid":null},"institutions":[{"id":"https://openalex.org/I1292669757","display_name":"Toshiba (Japan)","ror":"https://ror.org/0326v3z14","country_code":"JP","type":"company","lineage":["https://openalex.org/I1292669757"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Tetsuro Itakura","raw_affiliation_strings":["Toshiba Corporation, Saiwai-ku, Kawasaki, Japan","Toshiba Corporation 1 Komukai Toshiba-cho Saiwai\u2010ku Kawasaki 212\u20108582 Japan"],"affiliations":[{"raw_affiliation_string":"Toshiba Corporation, Saiwai-ku, Kawasaki, Japan","institution_ids":["https://openalex.org/I1292669757"]},{"raw_affiliation_string":"Toshiba Corporation 1 Komukai Toshiba-cho Saiwai\u2010ku Kawasaki 212\u20108582 Japan","institution_ids":["https://openalex.org/I1292669757"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5112260016"],"corresponding_institution_ids":["https://openalex.org/I1292669757"],"apc_list":null,"apc_paid":null,"fwci":0.2002,"has_fulltext":false,"cited_by_count":9,"citation_normalized_percentile":{"value":0.57038967,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"357","last_page":"360"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11601","display_name":"Neuroscience and Neural Engineering","score":0.9922999739646912,"subfield":{"id":"https://openalex.org/subfields/2804","display_name":"Cellular and Molecular Neuroscience"},"field":{"id":"https://openalex.org/fields/28","display_name":"Neuroscience"},"domain":{"id":"https://openalex.org/domains/1","display_name":"Life Sciences"}},{"id":"https://openalex.org/T12389","display_name":"Infrared Target Detection Methodologies","score":0.9890000224113464,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/correlated-double-sampling","display_name":"Correlated double sampling","score":0.8072181344032288},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.7618966102600098},{"id":"https://openalex.org/keywords/sampling","display_name":"Sampling (signal processing)","score":0.6765215992927551},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.6379436254501343},{"id":"https://openalex.org/keywords/signal","display_name":"SIGNAL (programming language)","score":0.5999860167503357},{"id":"https://openalex.org/keywords/image-sensor","display_name":"Image sensor","score":0.5970094203948975},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.567339301109314},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5341016054153442},{"id":"https://openalex.org/keywords/fixed-pattern-noise","display_name":"Fixed-pattern noise","score":0.5115200281143188},{"id":"https://openalex.org/keywords/noise-reduction","display_name":"Noise reduction","score":0.5029672980308533},{"id":"https://openalex.org/keywords/image-noise","display_name":"Image noise","score":0.4677470028400421},{"id":"https://openalex.org/keywords/signal-to-noise-ratio","display_name":"Signal-to-noise ratio (imaging)","score":0.46621304750442505},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.26625964045524597},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.24222871661186218},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.22849038243293762},{"id":"https://openalex.org/keywords/detector","display_name":"Detector","score":0.19541320204734802},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.10633775591850281}],"concepts":[{"id":"https://openalex.org/C118277053","wikidata":"https://www.wikidata.org/wiki/Q5172837","display_name":"Correlated double sampling","level":4,"score":0.8072181344032288},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.7618966102600098},{"id":"https://openalex.org/C140779682","wikidata":"https://www.wikidata.org/wiki/Q210868","display_name":"Sampling (signal processing)","level":3,"score":0.6765215992927551},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.6379436254501343},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.5999860167503357},{"id":"https://openalex.org/C76935873","wikidata":"https://www.wikidata.org/wiki/Q209121","display_name":"Image sensor","level":2,"score":0.5970094203948975},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.567339301109314},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5341016054153442},{"id":"https://openalex.org/C2778368474","wikidata":"https://www.wikidata.org/wiki/Q5456322","display_name":"Fixed-pattern noise","level":3,"score":0.5115200281143188},{"id":"https://openalex.org/C163294075","wikidata":"https://www.wikidata.org/wiki/Q581861","display_name":"Noise reduction","level":2,"score":0.5029672980308533},{"id":"https://openalex.org/C35772409","wikidata":"https://www.wikidata.org/wiki/Q1323086","display_name":"Image noise","level":3,"score":0.4677470028400421},{"id":"https://openalex.org/C13944312","wikidata":"https://www.wikidata.org/wiki/Q7512748","display_name":"Signal-to-noise ratio (imaging)","level":2,"score":0.46621304750442505},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.26625964045524597},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.24222871661186218},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.22849038243293762},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.19541320204734802},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.10633775591850281},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iscas.2015.7168644","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas.2015.7168644","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE International Symposium on Circuits and Systems (ISCAS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.4399999976158142,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":3,"referenced_works":["https://openalex.org/W1975545060","https://openalex.org/W2011593284","https://openalex.org/W2070247293"],"related_works":["https://openalex.org/W2118222030","https://openalex.org/W2064845363","https://openalex.org/W2533161893","https://openalex.org/W2331709517","https://openalex.org/W1937830528","https://openalex.org/W1981166869","https://openalex.org/W2921182627","https://openalex.org/W1985693990","https://openalex.org/W2050118972","https://openalex.org/W3111897341"],"abstract_inverted_index":{"This":[0],"paper":[1],"presents":[2],"a":[3,7,37,69],"multiple-sampling":[4],"technique":[5],"using":[6],"Single-Slope":[8],"ADC":[9],"(SSADC)":[10],"for":[11],"low-noise":[12],"CMOS":[13],"image":[14],"sensors.":[15],"In":[16],"the":[17,20,34,54,61,64],"proposed":[18],"technique,":[19],"number":[21,57],"of":[22,36,45,56,58,63,75],"sampling":[23,59],"is":[24,48,77],"controlled":[25],"depending":[26],"on":[27],"an":[28],"input":[29,71],"signal":[30],"to":[31],"effectively":[32],"reduce":[33],"noise":[35,67],"readout":[38,65],"circuit":[39,46,66],"at":[40,68],"dark-light":[41],"illumination.":[42],"An":[43],"example":[44],"implementation":[47],"illustrated.":[49],"The":[50,73],"simulation":[51],"results":[52],"show":[53],"increase":[55],"and":[60],"reduction":[62],"small":[70],"signal.":[72],"improvement":[74],"SNR":[76],"22.8dB.":[78]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":2},{"year":2020,"cited_by_count":1},{"year":2016,"cited_by_count":1}],"updated_date":"2026-03-20T23:20:44.827607","created_date":"2025-10-10T00:00:00"}