{"id":"https://openalex.org/W1982524426","doi":"https://doi.org/10.1109/iscas.2014.6865563","title":"Statistical modeling of program and read variability in resistive switching devices","display_name":"Statistical modeling of program and read variability in resistive switching devices","publication_year":2014,"publication_date":"2014-06-01","ids":{"openalex":"https://openalex.org/W1982524426","doi":"https://doi.org/10.1109/iscas.2014.6865563","mag":"1982524426"},"language":"en","primary_location":{"id":"doi:10.1109/iscas.2014.6865563","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas.2014.6865563","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 IEEE International Symposium on Circuits and Systems (ISCAS)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5028455655","display_name":"Stefano Ambrogio","orcid":"https://orcid.org/0000-0002-5475-4209"},"institutions":[{"id":"https://openalex.org/I93860229","display_name":"Politecnico di Milano","ror":"https://ror.org/01nffqt88","country_code":"IT","type":"education","lineage":["https://openalex.org/I93860229"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"S. Ambrogio","raw_affiliation_strings":["Dipartimento di Elettronica, Politecnico di Milano and IU.NET, Milano, Italy","Dipt. di Elettron., Inf. e Bioingegneria, Politec. di Milano, Milan, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Dipartimento di Elettronica, Politecnico di Milano and IU.NET, Milano, Italy","institution_ids":["https://openalex.org/I93860229"]},{"raw_affiliation_string":"Dipt. di Elettron., Inf. e Bioingegneria, Politec. di Milano, Milan, Italy","institution_ids":["https://openalex.org/I93860229"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5067285224","display_name":"Simone Balatti","orcid":null},"institutions":[{"id":"https://openalex.org/I93860229","display_name":"Politecnico di Milano","ror":"https://ror.org/01nffqt88","country_code":"IT","type":"education","lineage":["https://openalex.org/I93860229"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"S. Balatti","raw_affiliation_strings":["Dipartimento di Elettronica, Politecnico di Milano and IU.NET, Milano, Italy","Dipt. di Elettron., Inf. e Bioingegneria, Politec. di Milano, Milan, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Dipartimento di Elettronica, Politecnico di Milano and IU.NET, Milano, Italy","institution_ids":["https://openalex.org/I93860229"]},{"raw_affiliation_string":"Dipt. di Elettron., Inf. e Bioingegneria, Politec. di Milano, Milan, Italy","institution_ids":["https://openalex.org/I93860229"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5019646564","display_name":"Antonio Cubeta","orcid":null},"institutions":[{"id":"https://openalex.org/I93860229","display_name":"Politecnico di Milano","ror":"https://ror.org/01nffqt88","country_code":"IT","type":"education","lineage":["https://openalex.org/I93860229"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"A. Cubeta","raw_affiliation_strings":["Dipartimento di Elettronica, Politecnico di Milano and IU.NET, Milano, Italy","Dipt. di Elettron., Inf. e Bioingegneria, Politec. di Milano, Milan, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Dipartimento di Elettronica, Politecnico di Milano and IU.NET, Milano, Italy","institution_ids":["https://openalex.org/I93860229"]},{"raw_affiliation_string":"Dipt. di Elettron., Inf. e Bioingegneria, Politec. di Milano, Milan, Italy","institution_ids":["https://openalex.org/I93860229"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5054173368","display_name":"Daniele Ielmini","orcid":"https://orcid.org/0000-0002-1853-1614"},"institutions":[{"id":"https://openalex.org/I93860229","display_name":"Politecnico di Milano","ror":"https://ror.org/01nffqt88","country_code":"IT","type":"education","lineage":["https://openalex.org/I93860229"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"D. Ielmini","raw_affiliation_strings":["Dipartimento di Elettronica, Politecnico di Milano and IU.NET, Milano, Italy","Dipt. di Elettron., Inf. e Bioingegneria, Politec. di Milano, Milan, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Dipartimento di Elettronica, Politecnico di Milano and IU.NET, Milano, Italy","institution_ids":["https://openalex.org/I93860229"]},{"raw_affiliation_string":"Dipt. di Elettron., Inf. e Bioingegneria, Politec. di Milano, Milan, Italy","institution_ids":["https://openalex.org/I93860229"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I93860229"],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":"759","issue":null,"first_page":"2029","last_page":"2032"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.9965999722480774,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9937000274658203,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/resistive-random-access-memory","display_name":"Resistive random-access memory","score":0.9565752744674683},{"id":"https://openalex.org/keywords/scalability","display_name":"Scalability","score":0.676387369632721},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.6067619919776917},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5910618305206299},{"id":"https://openalex.org/keywords/flash-memory","display_name":"Flash memory","score":0.5685065984725952},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5109516978263855},{"id":"https://openalex.org/keywords/flash","display_name":"Flash (photography)","score":0.5029610991477966},{"id":"https://openalex.org/keywords/monte-carlo-method","display_name":"Monte Carlo method","score":0.5004379749298096},{"id":"https://openalex.org/keywords/node","display_name":"Node (physics)","score":0.4812735915184021},{"id":"https://openalex.org/keywords/data-retention","display_name":"Data retention","score":0.4664342701435089},{"id":"https://openalex.org/keywords/non-volatile-memory","display_name":"Non-volatile memory","score":0.4514538049697876},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.4490795135498047},{"id":"https://openalex.org/keywords/resistive-touchscreen","display_name":"Resistive touchscreen","score":0.4172399640083313},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.41157686710357666},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.32201170921325684},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.18419486284255981},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.15085071325302124},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.12387579679489136},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.10747116804122925},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.08452862501144409}],"concepts":[{"id":"https://openalex.org/C182019814","wikidata":"https://www.wikidata.org/wiki/Q1143830","display_name":"Resistive random-access memory","level":3,"score":0.9565752744674683},{"id":"https://openalex.org/C48044578","wikidata":"https://www.wikidata.org/wiki/Q727490","display_name":"Scalability","level":2,"score":0.676387369632721},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.6067619919776917},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5910618305206299},{"id":"https://openalex.org/C2776531357","wikidata":"https://www.wikidata.org/wiki/Q174077","display_name":"Flash memory","level":2,"score":0.5685065984725952},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5109516978263855},{"id":"https://openalex.org/C2777526259","wikidata":"https://www.wikidata.org/wiki/Q221836","display_name":"Flash (photography)","level":2,"score":0.5029610991477966},{"id":"https://openalex.org/C19499675","wikidata":"https://www.wikidata.org/wiki/Q232207","display_name":"Monte Carlo method","level":2,"score":0.5004379749298096},{"id":"https://openalex.org/C62611344","wikidata":"https://www.wikidata.org/wiki/Q1062658","display_name":"Node (physics)","level":2,"score":0.4812735915184021},{"id":"https://openalex.org/C2780866740","wikidata":"https://www.wikidata.org/wiki/Q5227345","display_name":"Data retention","level":2,"score":0.4664342701435089},{"id":"https://openalex.org/C177950962","wikidata":"https://www.wikidata.org/wiki/Q10997658","display_name":"Non-volatile memory","level":2,"score":0.4514538049697876},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.4490795135498047},{"id":"https://openalex.org/C6899612","wikidata":"https://www.wikidata.org/wiki/Q852911","display_name":"Resistive touchscreen","level":2,"score":0.4172399640083313},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.41157686710357666},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.32201170921325684},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.18419486284255981},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.15085071325302124},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.12387579679489136},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.10747116804122925},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.08452862501144409},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.0},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.0},{"id":"https://openalex.org/C66938386","wikidata":"https://www.wikidata.org/wiki/Q633538","display_name":"Structural engineering","level":1,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C77088390","wikidata":"https://www.wikidata.org/wiki/Q8513","display_name":"Database","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/iscas.2014.6865563","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas.2014.6865563","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 IEEE International Symposium on Circuits and Systems (ISCAS)","raw_type":"proceedings-article"},{"id":"pmh:oai:re.public.polimi.it:11311/964885","is_oa":false,"landing_page_url":"http://hdl.handle.net/11311/964885","pdf_url":null,"source":{"id":"https://openalex.org/S4306400312","display_name":"Virtual Community of Pathological Anatomy (University of Castilla La Mancha)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I79189158","host_organization_name":"University of Castilla-La Mancha","host_organization_lineage":["https://openalex.org/I79189158"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"info:eu-repo/semantics/conferenceObject"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320321499","display_name":"Fondazione Cariplo","ror":"https://ror.org/01gb56c55"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":11,"referenced_works":["https://openalex.org/W1982712919","https://openalex.org/W2047478832","https://openalex.org/W2051133151","https://openalex.org/W2058204393","https://openalex.org/W2067242107","https://openalex.org/W2072294905","https://openalex.org/W2073572292","https://openalex.org/W2093320793","https://openalex.org/W2129871911","https://openalex.org/W2141566011","https://openalex.org/W2143162195"],"related_works":["https://openalex.org/W2909760123","https://openalex.org/W2076211355","https://openalex.org/W3088669828","https://openalex.org/W2199653281","https://openalex.org/W2086074825","https://openalex.org/W2964871028","https://openalex.org/W2533127403","https://openalex.org/W2104937488","https://openalex.org/W2036350002","https://openalex.org/W2102924097"],"abstract_inverted_index":{"Resistive-switching":[0],"memory":[1],"(RRAM)":[2],"based":[3],"on":[4],"ion":[5],"migration":[6],"in":[7,29],"metal":[8],"oxide":[9],"layers":[10],"may":[11],"provide":[12],"a":[13,47,66],"scalable,":[14],"low-power":[15],"alternative":[16],"to":[17,34],"Flash":[18],"beyond":[19],"the":[20,51,76],"10":[21],"nm":[22],"technology":[23],"node.":[24],"However,":[25],"low":[26],"current":[27],"operation":[28,83],"scaled":[30],"RRAM":[31,49],"is":[32,90],"prone":[33],"switching":[35,72],"variability":[36,53],"and":[37,100],"read":[38],"noise,":[39],"e.g.,":[40],"random":[41],"telegraph":[42],"noise":[43],"(RTN).":[44],"To":[45],"develop":[46],"scalable":[48],"technology,":[50],"statistical":[52],"of":[54,78,94,97],"program/read":[55],"processes":[56],"must":[57],"be":[58],"thoroughly":[59],"addressed.":[60],"In":[61],"this":[62],"paper":[63],"we":[64],"propose":[65],"novel":[67],"Monte-Carlo":[68],"analytical":[69],"model":[70,87],"for":[71,75,88],"variability,":[73],"accounting":[74],"spread":[77],"programmed":[79],"resistance":[80],"at":[81],"variable":[82],"current.":[84],"A":[85],"numerical":[86],"RTN":[89,98],"then":[91],"presented,":[92],"capable":[93],"describing":[95],"size-dependence":[96],"amplitude":[99],"its":[101],"kinetics.":[102]},"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":1}],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}