{"id":"https://openalex.org/W2118245345","doi":"https://doi.org/10.1109/iscas.2014.6865064","title":"An 1.61mW mixed-signal column processor for BRISK feature extraction in CMOS image sensor","display_name":"An 1.61mW mixed-signal column processor for BRISK feature extraction in CMOS image sensor","publication_year":2014,"publication_date":"2014-06-01","ids":{"openalex":"https://openalex.org/W2118245345","doi":"https://doi.org/10.1109/iscas.2014.6865064","mag":"2118245345"},"language":"en","primary_location":{"id":"doi:10.1109/iscas.2014.6865064","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas.2014.6865064","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 IEEE International Symposium on Circuits and Systems (ISCAS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5067752227","display_name":"Kyeongryeol Bong","orcid":"https://orcid.org/0000-0001-9176-3668"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Kyeongryeol Bong","raw_affiliation_strings":["Department of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, Republic of Korea","[Dept. of Electr. Eng., Korea Adv. Inst. of Sci. & Technol. (KAIST), Daejeon, South Korea]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, Republic of Korea","institution_ids":["https://openalex.org/I157485424"]},{"raw_affiliation_string":"[Dept. of Electr. Eng., Korea Adv. Inst. of Sci. & Technol. (KAIST), Daejeon, South Korea]","institution_ids":["https://openalex.org/I157485424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5008293784","display_name":"Gyeonghoon Kim","orcid":null},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Gyeonghoon Kim","raw_affiliation_strings":["Department of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, Republic of Korea","[Dept. of Electr. Eng., Korea Adv. Inst. of Sci. & Technol. (KAIST), Daejeon, South Korea]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, Republic of Korea","institution_ids":["https://openalex.org/I157485424"]},{"raw_affiliation_string":"[Dept. of Electr. Eng., Korea Adv. Inst. of Sci. & Technol. (KAIST), Daejeon, South Korea]","institution_ids":["https://openalex.org/I157485424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5004926900","display_name":"Injoon Hong","orcid":null},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Injoon Hong","raw_affiliation_strings":["Department of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, Republic of Korea","[Dept. of Electr. Eng., Korea Adv. Inst. of Sci. & Technol. (KAIST), Daejeon, South Korea]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, Republic of Korea","institution_ids":["https://openalex.org/I157485424"]},{"raw_affiliation_string":"[Dept. of Electr. Eng., Korea Adv. Inst. of Sci. & Technol. (KAIST), Daejeon, South Korea]","institution_ids":["https://openalex.org/I157485424"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5077896259","display_name":"Hoi\u2010Jun Yoo","orcid":"https://orcid.org/0000-0002-6661-4879"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Hoi-jun Yoo","raw_affiliation_strings":["Department of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, Republic of Korea","[Dept. of Electr. Eng., Korea Adv. Inst. of Sci. & Technol. (KAIST), Daejeon, South Korea]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, Republic of Korea","institution_ids":["https://openalex.org/I157485424"]},{"raw_affiliation_string":"[Dept. of Electr. Eng., Korea Adv. Inst. of Sci. & Technol. (KAIST), Daejeon, South Korea]","institution_ids":["https://openalex.org/I157485424"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.2776,"has_fulltext":false,"cited_by_count":7,"citation_normalized_percentile":{"value":0.83463929,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":"72","issue":null,"first_page":"57","last_page":"60"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10627","display_name":"Advanced Image and Video Retrieval Techniques","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13114","display_name":"Image Processing Techniques and Applications","score":0.998199999332428,"subfield":{"id":"https://openalex.org/subfields/2214","display_name":"Media Technology"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7272562384605408},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.5935319662094116},{"id":"https://openalex.org/keywords/feature-extraction","display_name":"Feature extraction","score":0.5725374221801758},{"id":"https://openalex.org/keywords/image-sensor","display_name":"Image sensor","score":0.5646237134933472},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.49983930587768555},{"id":"https://openalex.org/keywords/pixel","display_name":"Pixel","score":0.4905475974082947},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.3367062211036682}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7272562384605408},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.5935319662094116},{"id":"https://openalex.org/C52622490","wikidata":"https://www.wikidata.org/wiki/Q1026626","display_name":"Feature extraction","level":2,"score":0.5725374221801758},{"id":"https://openalex.org/C76935873","wikidata":"https://www.wikidata.org/wiki/Q209121","display_name":"Image sensor","level":2,"score":0.5646237134933472},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.49983930587768555},{"id":"https://openalex.org/C160633673","wikidata":"https://www.wikidata.org/wiki/Q355198","display_name":"Pixel","level":2,"score":0.4905475974082947},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.3367062211036682}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iscas.2014.6865064","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas.2014.6865064","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 IEEE International Symposium on Circuits and Systems (ISCAS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.8299999833106995,"display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":13,"referenced_works":["https://openalex.org/W1515523358","https://openalex.org/W1968431658","https://openalex.org/W1987601301","https://openalex.org/W2042243448","https://openalex.org/W2076496703","https://openalex.org/W2130467208","https://openalex.org/W2133362840","https://openalex.org/W2141584146","https://openalex.org/W3150009426","https://openalex.org/W6630868006","https://openalex.org/W6642447716","https://openalex.org/W6679908058","https://openalex.org/W6793364924"],"related_works":["https://openalex.org/W3135697610","https://openalex.org/W2085033728","https://openalex.org/W4285411112","https://openalex.org/W2171299904","https://openalex.org/W1647606319","https://openalex.org/W2944239605","https://openalex.org/W1873415836","https://openalex.org/W4200290804","https://openalex.org/W2139783875","https://openalex.org/W4312469487"],"abstract_inverted_index":{"In":[0,91,127,148],"mobile":[1],"object":[2,116],"recognition":[3,146],"(OR)":[4],"applications,":[5],"the":[6,37,79,153,170],"power":[7,30],"consumption":[8],"of":[9,39,53,78,88,96],"image":[10,16,43,64,81],"sensor":[11,17,44,65],"and":[12,18,99,121,141],"data":[13,40,89],"communication":[14],"between":[15],"digital":[19,25,46],"OR":[20,26,47],"processor":[21,27,72],"becomes":[22],"crucial":[23],"as":[24],"consumes":[28],"less":[29],"in":[31,62,85,115,123,134,160],"deep":[32],"sub-micron":[33],"process.":[34],"To":[35,112],"reduce":[36],"amount":[38],"transaction":[41],"from":[42],"to":[45,138],"processor,":[48],"digital/analog":[49],"mixed-signal":[50,94],"focal-plane":[51],"processing":[52,95,136],"Binary":[54],"Robust":[55],"Invariant":[56],"Scalable":[57],"Keypoints":[58],"(BRISK)":[59],"feature":[60,75,109],"extraction":[61],"CMOS":[63,163],"(CIS)":[66],"is":[67,119,132,166],"proposed.":[68],"The":[69],"proposed":[70,154],"CIS":[71],"sends":[73],"BRISK":[74,108],"vectors":[76],"instead":[77],"whole":[80],"pixel":[82],"data,":[83],"resulting":[84],"79%":[86],"reduction":[87,130],"communication.":[90],"this":[92],"work,":[93],"corner":[97],"detection":[98],"successive":[100],"approximation":[101],"register":[102],"(SAR)-based":[103],"scoring":[104],"are":[105],"implemented":[106],"for":[107],"point":[110],"detection.":[111],"achieve":[113],"scale-invariance":[114],"recognition,":[117],"scale-space":[118],"generated":[120],"stored":[122],"analog":[124],"line":[125],"memory.":[126],"addition,":[128],"noise":[129],"scheme":[131],"integrated":[133],"column":[135],"chain":[137],"remove":[139],"salt":[140],"pepper":[142],"noise,":[143],"which":[144,165],"degrades":[145],"accuracy.":[147],"a":[149,161],"post":[150],"layout":[151],"simulation,":[152],"system":[155],"achieves":[156],"0.70pW/pixel*frame*feature":[157],"at":[158],"30fps":[159],"130nm":[162],"technology,":[164],"13.6%":[167],"lower":[168],"than":[169],"state-of-the-art.":[171]},"counts_by_year":[{"year":2020,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":4}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}