{"id":"https://openalex.org/W1973436185","doi":"https://doi.org/10.1109/iscas.2013.6571794","title":"A comparative study of STT-MTJ based non-volatile flip-flops","display_name":"A comparative study of STT-MTJ based non-volatile flip-flops","publication_year":2013,"publication_date":"2013-05-01","ids":{"openalex":"https://openalex.org/W1973436185","doi":"https://doi.org/10.1109/iscas.2013.6571794","mag":"1973436185"},"language":"en","primary_location":{"id":"doi:10.1109/iscas.2013.6571794","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas.2013.6571794","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 IEEE International Symposium on Circuits and Systems (ISCAS2013)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5089907396","display_name":"Taehui Na","orcid":"https://orcid.org/0000-0001-8823-0625"},"institutions":[{"id":"https://openalex.org/I193775966","display_name":"Yonsei University","ror":"https://ror.org/01wjejq96","country_code":"KR","type":"education","lineage":["https://openalex.org/I193775966"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Taehui Na","raw_affiliation_strings":["Department of Electrical and Electronic Engineering, Yonsei University, Seoul, South Korea","[Dept. of Electr. & Electron. Eng., Yonsei Univ., Seoul, South Korea]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Electronic Engineering, Yonsei University, Seoul, South Korea","institution_ids":["https://openalex.org/I193775966"]},{"raw_affiliation_string":"[Dept. of Electr. & Electron. Eng., Yonsei Univ., Seoul, South Korea]","institution_ids":["https://openalex.org/I193775966"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5084041151","display_name":"Kyungho Ryu","orcid":"https://orcid.org/0000-0002-0354-4797"},"institutions":[{"id":"https://openalex.org/I193775966","display_name":"Yonsei University","ror":"https://ror.org/01wjejq96","country_code":"KR","type":"education","lineage":["https://openalex.org/I193775966"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Kyungho Ryu","raw_affiliation_strings":["Department of Electrical and Electronic Engineering, Yonsei University, Seoul, South Korea","[Dept. of Electr. & Electron. Eng., Yonsei Univ., Seoul, South Korea]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Electronic Engineering, Yonsei University, Seoul, South Korea","institution_ids":["https://openalex.org/I193775966"]},{"raw_affiliation_string":"[Dept. of Electr. & Electron. Eng., Yonsei Univ., Seoul, South Korea]","institution_ids":["https://openalex.org/I193775966"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100451482","display_name":"Jisu Kim","orcid":"https://orcid.org/0009-0000-6910-5976"},"institutions":[{"id":"https://openalex.org/I193775966","display_name":"Yonsei University","ror":"https://ror.org/01wjejq96","country_code":"KR","type":"education","lineage":["https://openalex.org/I193775966"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jisu Kim","raw_affiliation_strings":["Department of Electrical and Electronic Engineering, Yonsei University, Seoul, South Korea","[Dept. of Electr. & Electron. Eng., Yonsei Univ., Seoul, South Korea]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Electronic Engineering, Yonsei University, Seoul, South Korea","institution_ids":["https://openalex.org/I193775966"]},{"raw_affiliation_string":"[Dept. of Electr. & Electron. Eng., Yonsei Univ., Seoul, South Korea]","institution_ids":["https://openalex.org/I193775966"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103061707","display_name":"Seung H. Kang","orcid":"https://orcid.org/0000-0003-4270-9918"},"institutions":[{"id":"https://openalex.org/I19268510","display_name":"Qualcomm (United Kingdom)","ror":"https://ror.org/04d3djg48","country_code":"GB","type":"company","lineage":["https://openalex.org/I19268510","https://openalex.org/I4210087596"]},{"id":"https://openalex.org/I4210087596","display_name":"Qualcomm (United States)","ror":"https://ror.org/002zrf773","country_code":"US","type":"company","lineage":["https://openalex.org/I4210087596"]},{"id":"https://openalex.org/I4210111675","display_name":"Market Matters","ror":"https://ror.org/021yan307","country_code":"US","type":"nonprofit","lineage":["https://openalex.org/I4210111675"]}],"countries":["GB","US"],"is_corresponding":false,"raw_author_name":"Seung H. Kang","raw_affiliation_strings":["Qualcomm Incorporated, San Diego, CA, USA","Qualcomm Inc.  San Diego CA USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Qualcomm Incorporated, San Diego, CA, USA","institution_ids":["https://openalex.org/I4210087596"]},{"raw_affiliation_string":"Qualcomm Inc.  San Diego CA USA","institution_ids":["https://openalex.org/I19268510","https://openalex.org/I4210111675"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5109424862","display_name":"Seong-Ook Jung","orcid":"https://orcid.org/0000-0002-5720-4149"},"institutions":[{"id":"https://openalex.org/I193775966","display_name":"Yonsei University","ror":"https://ror.org/01wjejq96","country_code":"KR","type":"education","lineage":["https://openalex.org/I193775966"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Seong-Ook Jung","raw_affiliation_strings":["Department of Electrical and Electronic Engineering, Yonsei University, Seoul, South Korea","[Dept. of Electr. & Electron. Eng., Yonsei Univ., Seoul, South Korea]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Electronic Engineering, Yonsei University, Seoul, South Korea","institution_ids":["https://openalex.org/I193775966"]},{"raw_affiliation_string":"[Dept. of Electr. & Electron. Eng., Yonsei Univ., Seoul, South Korea]","institution_ids":["https://openalex.org/I193775966"]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":5,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.6803,"has_fulltext":false,"cited_by_count":24,"citation_normalized_percentile":{"value":0.85064855,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"109","last_page":"112"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/flops","display_name":"FLOPS","score":0.7651950716972351},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.612449586391449},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5999013185501099},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5627894997596741},{"id":"https://openalex.org/keywords/inverter","display_name":"Inverter","score":0.48877736926078796},{"id":"https://openalex.org/keywords/flip-flop","display_name":"Flip-flop","score":0.46699774265289307},{"id":"https://openalex.org/keywords/equivalent-circuit","display_name":"Equivalent circuit","score":0.44989013671875},{"id":"https://openalex.org/keywords/spice","display_name":"Spice","score":0.44823402166366577},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.3591982126235962},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3447241187095642},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.16691207885742188},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.1308535933494568},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.05473017692565918}],"concepts":[{"id":"https://openalex.org/C3826847","wikidata":"https://www.wikidata.org/wiki/Q188768","display_name":"FLOPS","level":2,"score":0.7651950716972351},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.612449586391449},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5999013185501099},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5627894997596741},{"id":"https://openalex.org/C11190779","wikidata":"https://www.wikidata.org/wiki/Q664575","display_name":"Inverter","level":3,"score":0.48877736926078796},{"id":"https://openalex.org/C2781007278","wikidata":"https://www.wikidata.org/wiki/Q183406","display_name":"Flip-flop","level":3,"score":0.46699774265289307},{"id":"https://openalex.org/C23572009","wikidata":"https://www.wikidata.org/wiki/Q964981","display_name":"Equivalent circuit","level":3,"score":0.44989013671875},{"id":"https://openalex.org/C2780077345","wikidata":"https://www.wikidata.org/wiki/Q16891888","display_name":"Spice","level":2,"score":0.44823402166366577},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.3591982126235962},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3447241187095642},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.16691207885742188},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.1308535933494568},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.05473017692565918}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iscas.2013.6571794","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas.2013.6571794","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 IEEE International Symposium on Circuits and Systems (ISCAS2013)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.6000000238418579,"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":17,"referenced_works":["https://openalex.org/W1795666209","https://openalex.org/W1922913096","https://openalex.org/W1983721954","https://openalex.org/W1988912621","https://openalex.org/W2008904077","https://openalex.org/W2023605844","https://openalex.org/W2040775856","https://openalex.org/W2073646325","https://openalex.org/W2073801038","https://openalex.org/W2085442213","https://openalex.org/W2089301809","https://openalex.org/W2104500100","https://openalex.org/W2110276925","https://openalex.org/W2120699192","https://openalex.org/W2122455065","https://openalex.org/W2162020806","https://openalex.org/W6656151921"],"related_works":["https://openalex.org/W2204879205","https://openalex.org/W2096437374","https://openalex.org/W1943174035","https://openalex.org/W2262031297","https://openalex.org/W2733322820","https://openalex.org/W2482318635","https://openalex.org/W2020161494","https://openalex.org/W2045056374","https://openalex.org/W2298981088","https://openalex.org/W2163601309"],"abstract_inverted_index":{"In":[0],"this":[1],"paper,":[2],"we":[3],"categorize":[4],"STT-MTJ":[5],"based":[6,95],"non-volatile":[7],"flip-flops":[8],"(NV-FF)":[9],"into":[10],"two":[11,33,99,108],"basic":[12],"structures:":[13],"merged":[14],"latch":[15,23],"and":[16,21,24,40,64,80,101,117],"sensing":[17,25,39,65,82,89,96,105,115],"circuit":[18,26,97,106],"(MLS)":[19],"structure":[20,55,70,74],"separated":[22],"(SLS)":[27],"structure.":[28],"We":[29],"also":[30],"analyze":[31],"the":[32,47,53,68,72,77,81,91,102],"structures":[34],"with":[35],"various":[36,86],"types":[37,87],"of":[38,88],"write":[41],"circuits.":[42],"HSPICE":[43],"simulation":[44],"results":[45],"using":[46],"industry-compatible":[48],"45-nm":[49],"model":[50],"parameter":[51],"shows":[52],"SLS":[54,73],"has":[56],"better":[57,111],"performance":[58],"according":[59],"to":[60],"D-Q":[61],"delay,":[62],"PDP,":[63],"current":[66,116],"than":[67],"MLS":[69],"because":[71],"can":[75],"optimize":[76],"FF":[78],"operation":[79,83],"independently.":[84],"Among":[85],"circuit,":[90],"cross":[92],"coupled":[93],"inverter":[94],"including":[98,107],"MTJs":[100,109],"single":[103],"ended":[104],"show":[110],"performances":[112],"on":[113],"low":[114],"high":[118],"yield.":[119]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":3},{"year":2020,"cited_by_count":5},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":3},{"year":2016,"cited_by_count":3},{"year":2015,"cited_by_count":2},{"year":2014,"cited_by_count":2}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}