{"id":"https://openalex.org/W2040880793","doi":"https://doi.org/10.1109/iscas.2012.6272049","title":"Error control coding and signal processing for flash memories","display_name":"Error control coding and signal processing for flash memories","publication_year":2012,"publication_date":"2012-05-01","ids":{"openalex":"https://openalex.org/W2040880793","doi":"https://doi.org/10.1109/iscas.2012.6272049","mag":"2040880793"},"language":"en","primary_location":{"id":"doi:10.1109/iscas.2012.6272049","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas.2012.6272049","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2012 IEEE International Symposium on Circuits and Systems","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5081371165","display_name":"Beomkyu Shin","orcid":null},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Beomkyu Shin","raw_affiliation_strings":["Memory Business, Samsung Electronics Limited, Hwaseong, South Korea","Memory Business, Samsung Electronics, Hwaseong, Korea"],"affiliations":[{"raw_affiliation_string":"Memory Business, Samsung Electronics Limited, Hwaseong, South Korea","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":"Memory Business, Samsung Electronics, Hwaseong, Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5051903994","display_name":"Changkyu Seol","orcid":null},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Changkyu Seol","raw_affiliation_strings":["Memory Business, Samsung Electronics Limited, Hwaseong, South Korea","Memory Business, Samsung Electronics, Hwaseong, Korea"],"affiliations":[{"raw_affiliation_string":"Memory Business, Samsung Electronics Limited, Hwaseong, South Korea","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":"Memory Business, Samsung Electronics, Hwaseong, Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5066464833","display_name":"Jung-Soo Chung","orcid":null},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jung-Soo Chung","raw_affiliation_strings":["Memory Business, Samsung Electronics Limited, Hwaseong, South Korea","Memory Business, Samsung Electronics, Hwaseong, Korea"],"affiliations":[{"raw_affiliation_string":"Memory Business, Samsung Electronics Limited, Hwaseong, South Korea","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":"Memory Business, Samsung Electronics, Hwaseong, Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5056935303","display_name":"Jun Jin Kong","orcid":null},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jun Jin Kong","raw_affiliation_strings":["Memory Business, Samsung Electronics Limited, Hwaseong, South Korea","Memory Business, Samsung Electronics, Hwaseong, Korea"],"affiliations":[{"raw_affiliation_string":"Memory Business, Samsung Electronics Limited, Hwaseong, South Korea","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":"Memory Business, Samsung Electronics, Hwaseong, Korea","institution_ids":["https://openalex.org/I2250650973"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5081371165"],"corresponding_institution_ids":["https://openalex.org/I2250650973"],"apc_list":null,"apc_paid":null,"fwci":3.1914,"has_fulltext":false,"cited_by_count":19,"citation_normalized_percentile":{"value":0.92215651,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":"5","issue":null,"first_page":"409","last_page":"412"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11181","display_name":"Advanced Data Storage Technologies","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11181","display_name":"Advanced Data Storage Technologies","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12162","display_name":"Cellular Automata and Applications","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/1703","display_name":"Computational Theory and Mathematics"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9962000250816345,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/flash-memory","display_name":"Flash memory","score":0.7738586664199829},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7144774794578552},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6328353881835938},{"id":"https://openalex.org/keywords/flash","display_name":"Flash (photography)","score":0.5795488953590393},{"id":"https://openalex.org/keywords/semiconductor-memory","display_name":"Semiconductor memory","score":0.5104681253433228},{"id":"https://openalex.org/keywords/flash-memory-emulator","display_name":"Flash memory emulator","score":0.4941854774951935},{"id":"https://openalex.org/keywords/non-volatile-memory","display_name":"Non-volatile memory","score":0.4763108491897583},{"id":"https://openalex.org/keywords/flash-file-system","display_name":"Flash file system","score":0.44608041644096375},{"id":"https://openalex.org/keywords/coding","display_name":"Coding (social sciences)","score":0.4443516731262207},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.43085697293281555},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.42490991950035095},{"id":"https://openalex.org/keywords/computer-memory","display_name":"Computer memory","score":0.4037470817565918},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3910777270793915},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1273496150970459}],"concepts":[{"id":"https://openalex.org/C2776531357","wikidata":"https://www.wikidata.org/wiki/Q174077","display_name":"Flash memory","level":2,"score":0.7738586664199829},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7144774794578552},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6328353881835938},{"id":"https://openalex.org/C2777526259","wikidata":"https://www.wikidata.org/wiki/Q221836","display_name":"Flash (photography)","level":2,"score":0.5795488953590393},{"id":"https://openalex.org/C98986596","wikidata":"https://www.wikidata.org/wiki/Q1143031","display_name":"Semiconductor memory","level":2,"score":0.5104681253433228},{"id":"https://openalex.org/C96535780","wikidata":"https://www.wikidata.org/wiki/Q5457561","display_name":"Flash memory emulator","level":5,"score":0.4941854774951935},{"id":"https://openalex.org/C177950962","wikidata":"https://www.wikidata.org/wiki/Q10997658","display_name":"Non-volatile memory","level":2,"score":0.4763108491897583},{"id":"https://openalex.org/C27670709","wikidata":"https://www.wikidata.org/wiki/Q5457555","display_name":"Flash file system","level":4,"score":0.44608041644096375},{"id":"https://openalex.org/C179518139","wikidata":"https://www.wikidata.org/wiki/Q5140297","display_name":"Coding (social sciences)","level":2,"score":0.4443516731262207},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.43085697293281555},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.42490991950035095},{"id":"https://openalex.org/C92855701","wikidata":"https://www.wikidata.org/wiki/Q5830907","display_name":"Computer memory","level":3,"score":0.4037470817565918},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3910777270793915},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1273496150970459},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C142362112","wikidata":"https://www.wikidata.org/wiki/Q735","display_name":"Art","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C153349607","wikidata":"https://www.wikidata.org/wiki/Q36649","display_name":"Visual arts","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iscas.2012.6272049","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas.2012.6272049","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2012 IEEE International Symposium on Circuits and Systems","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.4699999988079071,"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":17,"referenced_works":["https://openalex.org/W1970857699","https://openalex.org/W2006021232","https://openalex.org/W2080477504","https://openalex.org/W2098796122","https://openalex.org/W2102837996","https://openalex.org/W2102843694","https://openalex.org/W2112994980","https://openalex.org/W2114408138","https://openalex.org/W2121402134","https://openalex.org/W2123798696","https://openalex.org/W2128268788","https://openalex.org/W2131611350","https://openalex.org/W2144220072","https://openalex.org/W2155622784","https://openalex.org/W2163734065","https://openalex.org/W3150062873","https://openalex.org/W6675635200"],"related_works":["https://openalex.org/W1937038249","https://openalex.org/W2085734125","https://openalex.org/W1993260518","https://openalex.org/W2104094101","https://openalex.org/W2534239836","https://openalex.org/W2331762408","https://openalex.org/W4312127475","https://openalex.org/W4253688525","https://openalex.org/W2128607743","https://openalex.org/W2382502424"],"abstract_inverted_index":{"With":[0],"the":[1,5,23,37,42,57,70,79],"rapid":[2],"advances":[3],"in":[4,35,91],"area":[6],"of":[7,44,59],"memory":[8,30,45,81,93,105],"product,":[9],"it":[10],"has":[11,75],"become":[12],"more":[13,15,64],"and":[14,25,72],"important":[16],"to":[17,41,78,100],"maintain":[18],"its":[19],"reliability":[20,47],"while":[21],"increasing":[22],"density":[24,61],"speed":[26],"performance.":[27],"Particularly,":[28],"flash":[29,62,80,104],"products":[31],"have":[32,95],"inherent":[33],"difficulties":[34],"lengthening":[36],"limited":[38],"lifetime":[39],"due":[40],"degradation":[43],"cell":[46,71],"caused":[48],"by":[49],"repeated":[50],"read":[51],"and/or":[52],"write":[53],"operations.":[54],"To":[55],"increase":[56],"benefits":[58],"high":[60],"memory,":[63],"advanced":[65],"techniques":[66],"such":[67],"as":[68],"multi-leveling":[69],"signal":[73],"processing":[74],"been":[76],"adopted":[77],"products.":[82,106],"In":[83],"this":[84],"paper,":[85],"arising":[86],"challenges":[87],"that":[88],"leading":[89],"engineers":[90],"semiconductor":[92],"industries":[94],"confronted":[96],"will":[97],"be":[98],"shared":[99],"further":[101],"develop":[102],"cutting-edge":[103]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":3},{"year":2016,"cited_by_count":2},{"year":2015,"cited_by_count":4},{"year":2014,"cited_by_count":3},{"year":2013,"cited_by_count":1},{"year":2012,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}