{"id":"https://openalex.org/W2038126028","doi":"https://doi.org/10.1109/iscas.2012.6272020","title":"Identification of soft error glitch-propagation paths: Leveraging SAT solvers","display_name":"Identification of soft error glitch-propagation paths: Leveraging SAT solvers","publication_year":2012,"publication_date":"2012-05-01","ids":{"openalex":"https://openalex.org/W2038126028","doi":"https://doi.org/10.1109/iscas.2012.6272020","mag":"2038126028"},"language":"en","primary_location":{"id":"doi:10.1109/iscas.2012.6272020","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas.2012.6272020","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2012 IEEE International Symposium on Circuits and Systems","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5071065752","display_name":"Ghaith Bany Hamad","orcid":"https://orcid.org/0000-0002-4354-2710"},"institutions":[{"id":"https://openalex.org/I60158472","display_name":"Concordia University","ror":"https://ror.org/0420zvk78","country_code":"CA","type":"education","lineage":["https://openalex.org/I60158472"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"Ghaith Bany Hamad","raw_affiliation_strings":["Dept. of Electrical & Computer Engineering, Concordia University, Montreal, Canada","[Department of Electrical and Computer Engineering, Concordia University, Montr\u00e9al, Canada]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Dept. of Electrical & Computer Engineering, Concordia University, Montreal, Canada","institution_ids":["https://openalex.org/I60158472"]},{"raw_affiliation_string":"[Department of Electrical and Computer Engineering, Concordia University, Montr\u00e9al, Canada]","institution_ids":["https://openalex.org/I60158472"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5032928854","display_name":"Otmane A\u0131\u0308t Mohamed","orcid":"https://orcid.org/0000-0003-1378-1443"},"institutions":[{"id":"https://openalex.org/I60158472","display_name":"Concordia University","ror":"https://ror.org/0420zvk78","country_code":"CA","type":"education","lineage":["https://openalex.org/I60158472"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"Otmane Ait Mohamed","raw_affiliation_strings":["Dept. of Electrical & Computer Engineering, Concordia University, Montreal, Canada","[Department of Electrical and Computer Engineering, Concordia University, Montr\u00e9al, Canada]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Dept. of Electrical & Computer Engineering, Concordia University, Montreal, Canada","institution_ids":["https://openalex.org/I60158472"]},{"raw_affiliation_string":"[Department of Electrical and Computer Engineering, Concordia University, Montr\u00e9al, Canada]","institution_ids":["https://openalex.org/I60158472"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5034599612","display_name":"Syed Rafay Hasan","orcid":"https://orcid.org/0000-0003-0183-8086"},"institutions":[{"id":"https://openalex.org/I63920570","display_name":"Tennessee Technological University","ror":"https://ror.org/05drmrq39","country_code":"US","type":"education","lineage":["https://openalex.org/I63920570"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Syed Rafay Hasan","raw_affiliation_strings":["Dept. of Electrical & Computer Engineering, Tennessee Technological University, Cookeville, TN","[Department of Electrical and Computer Engineering, Tennessee Technological University, Cookeville, USA]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Dept. of Electrical & Computer Engineering, Tennessee Technological University, Cookeville, TN","institution_ids":["https://openalex.org/I63920570"]},{"raw_affiliation_string":"[Department of Electrical and Computer Engineering, Tennessee Technological University, Cookeville, USA]","institution_ids":["https://openalex.org/I63920570"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5038488044","display_name":"Yvon Savaria","orcid":"https://orcid.org/0000-0002-3404-9959"},"institutions":[{"id":"https://openalex.org/I45683168","display_name":"Polytechnique Montr\u00e9al","ror":"https://ror.org/05f8d4e86","country_code":"CA","type":"education","lineage":["https://openalex.org/I45683168"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"Yvon Savaria","raw_affiliation_strings":["Groupe de Recherche en Microelectronique, et Microsyst\u00e8mes Ecole Polytechnique de Montr\u00e9al, Montr\u00e9al, QC, Canada","Groupe de Recherche en Micro\u00e9lectronique et Microsyst\u00e8mes, Ecole Polytechnique de Montr\u00e9al, QC, Canada"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Groupe de Recherche en Microelectronique, et Microsyst\u00e8mes Ecole Polytechnique de Montr\u00e9al, Montr\u00e9al, QC, Canada","institution_ids":["https://openalex.org/I45683168"]},{"raw_affiliation_string":"Groupe de Recherche en Micro\u00e9lectronique et Microsyst\u00e8mes, Ecole Polytechnique de Montr\u00e9al, QC, Canada","institution_ids":["https://openalex.org/I45683168"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.14918197,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"3258","last_page":"3261"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/glitch","display_name":"Glitch","score":0.8575761318206787},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7549587488174438},{"id":"https://openalex.org/keywords/soft-error","display_name":"Soft error","score":0.7122619152069092},{"id":"https://openalex.org/keywords/asynchronous-communication","display_name":"Asynchronous communication","score":0.633863627910614},{"id":"https://openalex.org/keywords/benchmark","display_name":"Benchmark (surveying)","score":0.5868262648582458},{"id":"https://openalex.org/keywords/pipeline","display_name":"Pipeline (software)","score":0.5671536326408386},{"id":"https://openalex.org/keywords/propagation-of-uncertainty","display_name":"Propagation of uncertainty","score":0.514013409614563},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.469315767288208},{"id":"https://openalex.org/keywords/boolean-satisfiability-problem","display_name":"Boolean satisfiability problem","score":0.46529707312583923},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.4482000768184662},{"id":"https://openalex.org/keywords/propagation-delay","display_name":"Propagation delay","score":0.4449314475059509},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.41966307163238525},{"id":"https://openalex.org/keywords/error-detection-and-correction","display_name":"Error detection and correction","score":0.41486966609954834},{"id":"https://openalex.org/keywords/computer-engineering","display_name":"Computer engineering","score":0.3736805319786072},{"id":"https://openalex.org/keywords/theoretical-computer-science","display_name":"Theoretical computer science","score":0.35927194356918335},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.2902219891548157},{"id":"https://openalex.org/keywords/detector","display_name":"Detector","score":0.14197692275047302},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.0973040759563446}],"concepts":[{"id":"https://openalex.org/C191287063","wikidata":"https://www.wikidata.org/wiki/Q543281","display_name":"Glitch","level":3,"score":0.8575761318206787},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7549587488174438},{"id":"https://openalex.org/C154474529","wikidata":"https://www.wikidata.org/wiki/Q1658917","display_name":"Soft error","level":2,"score":0.7122619152069092},{"id":"https://openalex.org/C151319957","wikidata":"https://www.wikidata.org/wiki/Q752739","display_name":"Asynchronous communication","level":2,"score":0.633863627910614},{"id":"https://openalex.org/C185798385","wikidata":"https://www.wikidata.org/wiki/Q1161707","display_name":"Benchmark (surveying)","level":2,"score":0.5868262648582458},{"id":"https://openalex.org/C43521106","wikidata":"https://www.wikidata.org/wiki/Q2165493","display_name":"Pipeline (software)","level":2,"score":0.5671536326408386},{"id":"https://openalex.org/C123614077","wikidata":"https://www.wikidata.org/wiki/Q1364905","display_name":"Propagation of uncertainty","level":2,"score":0.514013409614563},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.469315767288208},{"id":"https://openalex.org/C6943359","wikidata":"https://www.wikidata.org/wiki/Q875276","display_name":"Boolean satisfiability problem","level":2,"score":0.46529707312583923},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.4482000768184662},{"id":"https://openalex.org/C90806461","wikidata":"https://www.wikidata.org/wiki/Q1144416","display_name":"Propagation delay","level":2,"score":0.4449314475059509},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.41966307163238525},{"id":"https://openalex.org/C103088060","wikidata":"https://www.wikidata.org/wiki/Q1062839","display_name":"Error detection and correction","level":2,"score":0.41486966609954834},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.3736805319786072},{"id":"https://openalex.org/C80444323","wikidata":"https://www.wikidata.org/wiki/Q2878974","display_name":"Theoretical computer science","level":1,"score":0.35927194356918335},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.2902219891548157},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.14197692275047302},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0973040759563446},{"id":"https://openalex.org/C205649164","wikidata":"https://www.wikidata.org/wiki/Q1071","display_name":"Geography","level":0,"score":0.0},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C13280743","wikidata":"https://www.wikidata.org/wiki/Q131089","display_name":"Geodesy","level":1,"score":0.0},{"id":"https://openalex.org/C31258907","wikidata":"https://www.wikidata.org/wiki/Q1301371","display_name":"Computer network","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/iscas.2012.6272020","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas.2012.6272020","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2012 IEEE International Symposium on Circuits and Systems","raw_type":"proceedings-article"},{"id":"pmh:oai:publications.polymtl.ca:15839","is_oa":false,"landing_page_url":"https://publications.polymtl.ca/15839/","pdf_url":null,"source":{"id":"https://openalex.org/S4306401013","display_name":"PolyPublie (\u00c9cole Polytechnique de Montr\u00e9al)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I45683168","host_organization_name":"Polytechnique Montr\u00e9al","host_organization_lineage":["https://openalex.org/I45683168"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"Communication de conf\u00e9rence"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.699999988079071,"id":"https://metadata.un.org/sdg/16","display_name":"Peace, Justice and strong institutions"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320332162","display_name":"Centers for Disease Control and Prevention","ror":"https://ror.org/042twtr12"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":9,"referenced_works":["https://openalex.org/W160422864","https://openalex.org/W1577504746","https://openalex.org/W1989992186","https://openalex.org/W2001575960","https://openalex.org/W2010966375","https://openalex.org/W2139882509","https://openalex.org/W2162318113","https://openalex.org/W2170528556","https://openalex.org/W3146941683"],"related_works":["https://openalex.org/W2140328632","https://openalex.org/W2541225405","https://openalex.org/W2149184458","https://openalex.org/W4316660008","https://openalex.org/W2373956461","https://openalex.org/W2807772537","https://openalex.org/W2061475263","https://openalex.org/W2957045826","https://openalex.org/W2018064886","https://openalex.org/W2024522858"],"abstract_inverted_index":{"Increase":[0],"in":[1,17,23,43,60,82],"vulnerability":[2],"to":[3,31,53],"soft":[4,34,55,134],"errors":[5],"has":[6],"affected":[7],"the":[8,33,44,92,107,126],"reliability":[9],"of":[10,91],"both":[11],"synchronous":[12,64],"and":[13,65,75,106],"asynchronous":[14,111],"circuits":[15],"implemented":[16],"modern":[18],"deep":[19],"sub-micron":[20],"technologies.":[21],"Hence":[22],"such":[24],"circuits,":[25,102],"there":[26],"is":[27,95,119],"a":[28,50],"growing":[29],"need":[30],"identify":[32],"error":[35,56,135],"glitch":[36,57],"propagation":[37,58],"possibility":[38],"at":[39],"an":[40],"early":[41],"stage":[42],"design":[45],"flow.":[46],"This":[47],"paper":[48],"proposes":[49],"new":[51],"methodology":[52,118],"obtain":[54],"paths":[59],"digital":[61],"designs":[62],"(both":[63],"asynchronous).":[66],"To":[67],"compute":[68],"these":[69],"paths,":[70],"Multiway":[71],"Decision":[72],"Graphs":[73],"(MDGs)":[74],"glitch-propagation":[76,136],"sets":[77],"(GP":[78],"sets)":[79],"are":[80],"utilized":[81],"conjunction":[83],"with":[84],"Boolean":[85],"Satisfiability":[86],"solvers":[87],"(MiniSat).":[88],"The":[89,114],"applicability":[90],"proposed":[93,115],"method":[94],"illustrated":[96],"by":[97],"implementing":[98],"ISCAS89":[99],"benchmark":[100],"sequential":[101],"8-bit":[103],"adders,":[104],"multipliers,":[105],"Self-timed":[108],"multiple-group":[109],"pipeline":[110],"handshake":[112],"circuits.":[113],"SAT":[116],"based":[117],"on":[120],"average":[121],"13":[122],"times":[123],"faster":[124],"than":[125],"best":[127],"contemporary":[128],"state-of-the-art":[129],"techniques":[130],"exhaustively":[131],"analyze":[132],"possible":[133],"paths.":[137]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2016,"cited_by_count":1}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2016-06-24T00:00:00"}