{"id":"https://openalex.org/W1965167434","doi":"https://doi.org/10.1109/iscas.2012.6271556","title":"Modeling and characterization of CNT-based TSV for high frequency applications","display_name":"Modeling and characterization of CNT-based TSV for high frequency applications","publication_year":2012,"publication_date":"2012-05-01","ids":{"openalex":"https://openalex.org/W1965167434","doi":"https://doi.org/10.1109/iscas.2012.6271556","mag":"1965167434"},"language":"en","primary_location":{"id":"doi:10.1109/iscas.2012.6271556","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas.2012.6271556","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2012 IEEE International Symposium on Circuits and Systems","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5016961561","display_name":"Sukeshwar Kannan","orcid":"https://orcid.org/0000-0003-4107-2126"},"institutions":[{"id":"https://openalex.org/I17301866","display_name":"University of Alabama","ror":"https://ror.org/03xrrjk67","country_code":"US","type":"education","lineage":["https://openalex.org/I17301866"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Sukeshwar Kannan","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of Alabama, Tuscaloosa, USA","Dept. of Electrical and Computer Engineering, The University of Alabama, Tuscaloosa, USA#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Alabama, Tuscaloosa, USA","institution_ids":["https://openalex.org/I17301866"]},{"raw_affiliation_string":"Dept. of Electrical and Computer Engineering, The University of Alabama, Tuscaloosa, USA#TAB#","institution_ids":["https://openalex.org/I17301866"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5038200638","display_name":"Bruce Kim","orcid":null},"institutions":[{"id":"https://openalex.org/I17301866","display_name":"University of Alabama","ror":"https://ror.org/03xrrjk67","country_code":"US","type":"education","lineage":["https://openalex.org/I17301866"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Bruce Kim","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of Alabama, Tuscaloosa, USA","Dept. of Electrical and Computer Engineering, The University of Alabama, Tuscaloosa, USA#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Alabama, Tuscaloosa, USA","institution_ids":["https://openalex.org/I17301866"]},{"raw_affiliation_string":"Dept. of Electrical and Computer Engineering, The University of Alabama, Tuscaloosa, USA#TAB#","institution_ids":["https://openalex.org/I17301866"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103583159","display_name":"Anurag Gupta","orcid":null},"institutions":[{"id":"https://openalex.org/I17301866","display_name":"University of Alabama","ror":"https://ror.org/03xrrjk67","country_code":"US","type":"education","lineage":["https://openalex.org/I17301866"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Anurag Gupta","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of Alabama, Tuscaloosa, USA","Dept. of Electrical and Computer Engineering, The University of Alabama, Tuscaloosa, USA#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Alabama, Tuscaloosa, USA","institution_ids":["https://openalex.org/I17301866"]},{"raw_affiliation_string":"Dept. of Electrical and Computer Engineering, The University of Alabama, Tuscaloosa, USA#TAB#","institution_ids":["https://openalex.org/I17301866"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101510505","display_name":"Seok-Ho Noh","orcid":"https://orcid.org/0000-0001-5494-9076"},"institutions":[{"id":"https://openalex.org/I113018520","display_name":"Gyeongguk National University","ror":"https://ror.org/04wd10e19","country_code":"KR","type":"education","lineage":["https://openalex.org/I113018520"]},{"id":"https://openalex.org/I135428043","display_name":"Cisco Systems (United States)","ror":"https://ror.org/03yt1ez60","country_code":"US","type":"company","lineage":["https://openalex.org/I135428043"]}],"countries":["KR","US"],"is_corresponding":false,"raw_author_name":"Seok-Ho Noh","raw_affiliation_strings":["Cisco Systems, Inc., San Jose, USA","Electronic Engineering Department, Andong National University, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Cisco Systems, Inc., San Jose, USA","institution_ids":["https://openalex.org/I135428043"]},{"raw_affiliation_string":"Electronic Engineering Department, Andong National University, South Korea","institution_ids":["https://openalex.org/I113018520"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100361096","display_name":"Li Li","orcid":"https://orcid.org/0000-0002-1047-6067"},"institutions":[{"id":"https://openalex.org/I113018520","display_name":"Gyeongguk National University","ror":"https://ror.org/04wd10e19","country_code":"KR","type":"education","lineage":["https://openalex.org/I113018520"]},{"id":"https://openalex.org/I135428043","display_name":"Cisco Systems (United States)","ror":"https://ror.org/03yt1ez60","country_code":"US","type":"company","lineage":["https://openalex.org/I135428043"]}],"countries":["KR","US"],"is_corresponding":false,"raw_author_name":"Li Li","raw_affiliation_strings":["Electronic Engineering Department, Andong National University, Andong, South Korea","Cisco System Inc.,San Jose,USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electronic Engineering Department, Andong National University, Andong, South Korea","institution_ids":["https://openalex.org/I113018520"]},{"raw_affiliation_string":"Cisco System Inc.,San Jose,USA","institution_ids":["https://openalex.org/I135428043"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5023071963","display_name":"Sang\u2010Bock Cho","orcid":null},"institutions":[{"id":"https://openalex.org/I40542001","display_name":"University of Ulsan","ror":"https://ror.org/02c2f8975","country_code":"KR","type":"education","lineage":["https://openalex.org/I40542001"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Sang-Bock Cho","raw_affiliation_strings":["School of Electrical Engineering, University of Ulsan, Ulsan, South Korea","School of Electrical Engineering, University of Ulsan,,South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, University of Ulsan, Ulsan, South Korea","institution_ids":["https://openalex.org/I40542001"]},{"raw_affiliation_string":"School of Electrical Engineering, University of Ulsan,,South Korea","institution_ids":["https://openalex.org/I40542001"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":"5","issue":null,"first_page":"1584","last_page":"1589"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11527","display_name":"3D IC and TSV technologies","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11527","display_name":"3D IC and TSV technologies","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11661","display_name":"Copper Interconnects and Reliability","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/parasitic-extraction","display_name":"Parasitic extraction","score":0.6614803075790405},{"id":"https://openalex.org/keywords/kinetic-inductance","display_name":"Kinetic inductance","score":0.6493881940841675},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.6392281651496887},{"id":"https://openalex.org/keywords/parametric-statistics","display_name":"Parametric statistics","score":0.5791066288948059},{"id":"https://openalex.org/keywords/signal-integrity","display_name":"Signal integrity","score":0.5780856013298035},{"id":"https://openalex.org/keywords/inductance","display_name":"Inductance","score":0.5691907405853271},{"id":"https://openalex.org/keywords/microwave","display_name":"Microwave","score":0.5480138063430786},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5187630653381348},{"id":"https://openalex.org/keywords/substrate","display_name":"Substrate (aquarium)","score":0.423373281955719},{"id":"https://openalex.org/keywords/capacitor","display_name":"Capacitor","score":0.4165405035018921},{"id":"https://openalex.org/keywords/electrical-conductor","display_name":"Electrical conductor","score":0.413364052772522},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.38839101791381836},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.27957236766815186},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.25511181354522705},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2532538175582886},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.17590704560279846},{"id":"https://openalex.org/keywords/printed-circuit-board","display_name":"Printed circuit board","score":0.1329914927482605},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.11565837264060974}],"concepts":[{"id":"https://openalex.org/C159818811","wikidata":"https://www.wikidata.org/wiki/Q7135947","display_name":"Parasitic extraction","level":2,"score":0.6614803075790405},{"id":"https://openalex.org/C107923615","wikidata":"https://www.wikidata.org/wiki/Q6410784","display_name":"Kinetic inductance","level":4,"score":0.6493881940841675},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.6392281651496887},{"id":"https://openalex.org/C117251300","wikidata":"https://www.wikidata.org/wiki/Q1849855","display_name":"Parametric statistics","level":2,"score":0.5791066288948059},{"id":"https://openalex.org/C44938667","wikidata":"https://www.wikidata.org/wiki/Q4503810","display_name":"Signal integrity","level":3,"score":0.5780856013298035},{"id":"https://openalex.org/C29210110","wikidata":"https://www.wikidata.org/wiki/Q177897","display_name":"Inductance","level":3,"score":0.5691907405853271},{"id":"https://openalex.org/C44838205","wikidata":"https://www.wikidata.org/wiki/Q127995","display_name":"Microwave","level":2,"score":0.5480138063430786},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5187630653381348},{"id":"https://openalex.org/C2777289219","wikidata":"https://www.wikidata.org/wiki/Q7632154","display_name":"Substrate (aquarium)","level":2,"score":0.423373281955719},{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.4165405035018921},{"id":"https://openalex.org/C202374169","wikidata":"https://www.wikidata.org/wiki/Q124291","display_name":"Electrical conductor","level":2,"score":0.413364052772522},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.38839101791381836},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.27957236766815186},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.25511181354522705},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2532538175582886},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.17590704560279846},{"id":"https://openalex.org/C120793396","wikidata":"https://www.wikidata.org/wiki/Q173350","display_name":"Printed circuit board","level":2,"score":0.1329914927482605},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.11565837264060974},{"id":"https://openalex.org/C111368507","wikidata":"https://www.wikidata.org/wiki/Q43518","display_name":"Oceanography","level":1,"score":0.0},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iscas.2012.6271556","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas.2012.6271556","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2012 IEEE International Symposium on Circuits and Systems","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.5600000023841858,"display_name":"Affordable and clean energy"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320321640","display_name":"Ministry of Knowledge Economy","ror":"https://ror.org/008nkqk13"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":19,"referenced_works":["https://openalex.org/W1987770341","https://openalex.org/W1994559632","https://openalex.org/W2018008910","https://openalex.org/W2034089924","https://openalex.org/W2066353179","https://openalex.org/W2070495467","https://openalex.org/W2085611203","https://openalex.org/W2102326526","https://openalex.org/W2123852118","https://openalex.org/W2134394637","https://openalex.org/W2151341137","https://openalex.org/W2153602935","https://openalex.org/W2154634977","https://openalex.org/W2170273436","https://openalex.org/W2170890186","https://openalex.org/W2214547131","https://openalex.org/W3102061041","https://openalex.org/W3147650139","https://openalex.org/W6649195942"],"related_works":["https://openalex.org/W2016926573","https://openalex.org/W2014825114","https://openalex.org/W2007859523","https://openalex.org/W2135409213","https://openalex.org/W399364667","https://openalex.org/W2382135869","https://openalex.org/W2155698516","https://openalex.org/W2146610797","https://openalex.org/W2106197351","https://openalex.org/W1994468122"],"abstract_inverted_index":{"This":[0],"paper":[1],"presents":[2],"modeling":[3],"and":[4,70],"characterization":[5],"of":[6,19,27],"CNT-based":[7,20],"TSVs":[8,21],"for":[9,84,87],"high":[10,35],"frequency":[11],"applications.":[12,89],"We":[13],"have":[14,39,61,77],"developed":[15],"an":[16],"integrated":[17],"model":[18,60],"by":[22,47],"incorporating":[23],"quantum":[24],"confinement":[25],"effects":[26],"CNTs":[28,86],"along":[29],"with":[30],"kinetic":[31],"inductance":[32],"phenomenon":[33],"at":[34],"frequencies.":[36],"Substrate":[37],"parasitics":[38],"been":[40,62,78],"appropriately":[41],"modeled":[42],"as":[43,64],"monolithic":[44],"microwave":[45],"capacitor":[46],"resonant":[48],"line":[49],"technique":[50],"using":[51],"a":[52],"two-polynomial":[53],"equation.":[54],"Different":[55],"parametric":[56],"variations":[57],"in":[58],"the":[59],"outlined":[63],"case":[65],"studies.":[66],"Furthermore,":[67],"electrical":[68],"performance":[69],"signal":[71],"integrity":[72],"analysis":[73],"on":[74],"different":[75],"cases":[76],"used":[79],"to":[80],"determine":[81],"optimized":[82],"configuration":[83],"TSV-based":[85],"radar":[88]},"counts_by_year":[{"year":2016,"cited_by_count":1}],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}