{"id":"https://openalex.org/W2172045998","doi":"https://doi.org/10.1109/iscas.2011.5938002","title":"A Hilbert curve-based delay fault characterization method for FPGAs","display_name":"A Hilbert curve-based delay fault characterization method for FPGAs","publication_year":2011,"publication_date":"2011-05-01","ids":{"openalex":"https://openalex.org/W2172045998","doi":"https://doi.org/10.1109/iscas.2011.5938002","mag":"2172045998"},"language":"en","primary_location":{"id":"doi:10.1109/iscas.2011.5938002","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas.2011.5938002","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2011 IEEE International Symposium of Circuits and Systems (ISCAS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100454485","display_name":"Wenjuan Zhang","orcid":"https://orcid.org/0000-0002-0534-0974"},"institutions":[{"id":"https://openalex.org/I165932596","display_name":"National University of Singapore","ror":"https://ror.org/01tgyzw49","country_code":"SG","type":"education","lineage":["https://openalex.org/I165932596"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Wenjuan Zhang","raw_affiliation_strings":["Department of Electrical and Computer Engineering, National University of Singapore, Singapore"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, National University of Singapore, Singapore","institution_ids":["https://openalex.org/I165932596"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5084305618","display_name":"Yajun Ha","orcid":"https://orcid.org/0000-0003-4244-5916"},"institutions":[{"id":"https://openalex.org/I165932596","display_name":"National University of Singapore","ror":"https://ror.org/01tgyzw49","country_code":"SG","type":"education","lineage":["https://openalex.org/I165932596"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Yajun Ha","raw_affiliation_strings":["Department of Electrical and Computer Engineering, National University of Singapore, Singapore"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, National University of Singapore, Singapore","institution_ids":["https://openalex.org/I165932596"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.18639543,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"4","issue":null,"first_page":"2059","last_page":"2062"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11522","display_name":"VLSI and FPGA Design Techniques","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/hilbert-curve","display_name":"Hilbert curve","score":0.8772846460342407},{"id":"https://openalex.org/keywords/field-programmable-gate-array","display_name":"Field-programmable gate array","score":0.6397022008895874},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6344714164733887},{"id":"https://openalex.org/keywords/locality","display_name":"Locality","score":0.5594270825386047},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.5549097657203674},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.5446471571922302},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5162913203239441},{"id":"https://openalex.org/keywords/process-variation","display_name":"Process variation","score":0.44841068983078003},{"id":"https://openalex.org/keywords/limit","display_name":"Limit (mathematics)","score":0.44260498881340027},{"id":"https://openalex.org/keywords/feature","display_name":"Feature (linguistics)","score":0.4340142607688904},{"id":"https://openalex.org/keywords/group-delay-and-phase-delay","display_name":"Group delay and phase delay","score":0.4295504093170166},{"id":"https://openalex.org/keywords/characterization","display_name":"Characterization (materials science)","score":0.4169042110443115},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.22763007879257202},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.22225654125213623},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.18606126308441162}],"concepts":[{"id":"https://openalex.org/C2781142347","wikidata":"https://www.wikidata.org/wiki/Q1366592","display_name":"Hilbert curve","level":2,"score":0.8772846460342407},{"id":"https://openalex.org/C42935608","wikidata":"https://www.wikidata.org/wiki/Q190411","display_name":"Field-programmable gate array","level":2,"score":0.6397022008895874},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6344714164733887},{"id":"https://openalex.org/C2779808786","wikidata":"https://www.wikidata.org/wiki/Q6664603","display_name":"Locality","level":2,"score":0.5594270825386047},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.5549097657203674},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.5446471571922302},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5162913203239441},{"id":"https://openalex.org/C93389723","wikidata":"https://www.wikidata.org/wiki/Q7247313","display_name":"Process variation","level":3,"score":0.44841068983078003},{"id":"https://openalex.org/C151201525","wikidata":"https://www.wikidata.org/wiki/Q177239","display_name":"Limit (mathematics)","level":2,"score":0.44260498881340027},{"id":"https://openalex.org/C2776401178","wikidata":"https://www.wikidata.org/wiki/Q12050496","display_name":"Feature (linguistics)","level":2,"score":0.4340142607688904},{"id":"https://openalex.org/C123792056","wikidata":"https://www.wikidata.org/wiki/Q365988","display_name":"Group delay and phase delay","level":3,"score":0.4295504093170166},{"id":"https://openalex.org/C2780841128","wikidata":"https://www.wikidata.org/wiki/Q5073781","display_name":"Characterization (materials science)","level":2,"score":0.4169042110443115},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.22763007879257202},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.22225654125213623},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.18606126308441162},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0},{"id":"https://openalex.org/C106131492","wikidata":"https://www.wikidata.org/wiki/Q3072260","display_name":"Filter (signal processing)","level":2,"score":0.0},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/iscas.2011.5938002","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas.2011.5938002","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2011 IEEE International Symposium of Circuits and Systems (ISCAS)","raw_type":"proceedings-article"},{"id":"pmh:oai:scholarbank.nus.edu.sg:10635/68833","is_oa":false,"landing_page_url":"http://scholarbank.nus.edu.sg/handle/10635/68833","pdf_url":null,"source":{"id":"https://openalex.org/S7407052290","display_name":"National University of Singapore","issn_l":null,"issn":[],"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Scopus","raw_type":"Conference Paper"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":13,"referenced_works":["https://openalex.org/W1967709031","https://openalex.org/W2029966641","https://openalex.org/W2069896270","https://openalex.org/W2087773252","https://openalex.org/W2121319341","https://openalex.org/W2141682861","https://openalex.org/W2151271718","https://openalex.org/W2161556552","https://openalex.org/W2169164501","https://openalex.org/W2170735577","https://openalex.org/W4240732800","https://openalex.org/W6672556086","https://openalex.org/W6677953918"],"related_works":["https://openalex.org/W1556451512","https://openalex.org/W1555349535","https://openalex.org/W2158321991","https://openalex.org/W2111241003","https://openalex.org/W1979605853","https://openalex.org/W2064992562","https://openalex.org/W4234091740","https://openalex.org/W2757949947","https://openalex.org/W2097212553","https://openalex.org/W4313055205"],"abstract_inverted_index":{"With":[0],"the":[1,27,40,53,63,91,98,105],"increasing":[2],"process":[3,44],"variations":[4],"in":[5,14,79,125],"advanced":[6],"technologies,":[7],"delay":[8,28,32,47,54,77,126],"faults":[9,78,127],"pose":[10],"a":[11,57,73,86],"significant":[12],"issue":[13],"FPGAs.":[15,95],"In":[16],"manufacturing":[17],"testing,":[18],"it":[19],"becomes":[20],"important":[21],"to":[22,56,75,89,104],"quickly":[23],"and":[24],"accurately":[25,51],"locate":[26,76],"defect":[29],"area.":[30,60],"Conventional":[31],"testing":[33],"methods":[34],"do":[35],"not":[36],"take":[37],"into":[38],"account":[39],"spatial":[41],"information":[42],"of":[43,68,94,100,109],"variation":[45],"induced":[46],"faults,":[48],"thus":[49],"cannot":[50],"limit":[52],"defects":[55],"well":[58],"restricted":[59],"Based":[61],"on":[62,97],"superb":[64],"locality":[65],"preserving":[66],"feature":[67],"space-filling":[69],"curves,":[70,118],"we":[71],"develop":[72],"method":[74,84,120],"much":[80],"finer":[81],"resolution.":[82,129],"The":[83],"uses":[85],"Hilbert":[87],"curve":[88],"guide":[90],"test":[92],"configuration":[93],"Depending":[96],"number":[99],"observation":[101],"points":[102],"inserted":[103],"curve,":[106],"different":[107],"levels":[108],"locating":[110,128],"resolution":[111],"can":[112],"be":[113],"achieved.":[114],"Compared":[115],"with":[116],"normal":[117],"our":[119],"obtained":[121],"around":[122],"60%":[123],"increase":[124]},"counts_by_year":[],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}