{"id":"https://openalex.org/W2097329713","doi":"https://doi.org/10.1109/iscas.2011.5937994","title":"High voltage protection for USB transceivers in 45nm CMOS","display_name":"High voltage protection for USB transceivers in 45nm CMOS","publication_year":2011,"publication_date":"2011-05-01","ids":{"openalex":"https://openalex.org/W2097329713","doi":"https://doi.org/10.1109/iscas.2011.5937994","mag":"2097329713"},"language":"en","primary_location":{"id":"doi:10.1109/iscas.2011.5937994","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas.2011.5937994","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2011 IEEE International Symposium of Circuits and Systems (ISCAS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5103084438","display_name":"Jagdish Chand","orcid":null},"institutions":[{"id":"https://openalex.org/I74760111","display_name":"Texas Instruments (United States)","ror":"https://ror.org/03vsmv677","country_code":"US","type":"company","lineage":["https://openalex.org/I74760111"]},{"id":"https://openalex.org/I4210109535","display_name":"Texas Instruments (India)","ror":"https://ror.org/01t305n31","country_code":"IN","type":"company","lineage":["https://openalex.org/I4210109535","https://openalex.org/I74760111"]}],"countries":["IN","US"],"is_corresponding":true,"raw_author_name":"Jagdish Chand","raw_affiliation_strings":["Texas Instruments, Inc., Bangalore, India","Texas Instrum., Bangalore, India"],"affiliations":[{"raw_affiliation_string":"Texas Instruments, Inc., Bangalore, India","institution_ids":["https://openalex.org/I4210109535"]},{"raw_affiliation_string":"Texas Instrum., Bangalore, India","institution_ids":["https://openalex.org/I74760111"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5034093202","display_name":"Ravi Mehta","orcid":null},"institutions":[{"id":"https://openalex.org/I74760111","display_name":"Texas Instruments (United States)","ror":"https://ror.org/03vsmv677","country_code":"US","type":"company","lineage":["https://openalex.org/I74760111"]},{"id":"https://openalex.org/I4210109535","display_name":"Texas Instruments (India)","ror":"https://ror.org/01t305n31","country_code":"IN","type":"company","lineage":["https://openalex.org/I4210109535","https://openalex.org/I74760111"]}],"countries":["IN","US"],"is_corresponding":false,"raw_author_name":"Ravi Mehta","raw_affiliation_strings":["Texas Instruments, Inc., Bangalore, India","Texas Instrum., Bangalore, India"],"affiliations":[{"raw_affiliation_string":"Texas Instruments, Inc., Bangalore, India","institution_ids":["https://openalex.org/I4210109535"]},{"raw_affiliation_string":"Texas Instrum., Bangalore, India","institution_ids":["https://openalex.org/I74760111"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5072459071","display_name":"Sumantra Seth","orcid":null},"institutions":[{"id":"https://openalex.org/I4210109535","display_name":"Texas Instruments (India)","ror":"https://ror.org/01t305n31","country_code":"IN","type":"company","lineage":["https://openalex.org/I4210109535","https://openalex.org/I74760111"]},{"id":"https://openalex.org/I74760111","display_name":"Texas Instruments (United States)","ror":"https://ror.org/03vsmv677","country_code":"US","type":"company","lineage":["https://openalex.org/I74760111"]}],"countries":["IN","US"],"is_corresponding":false,"raw_author_name":"Sumantra Seth","raw_affiliation_strings":["Texas Instruments, Inc., Bangalore, India","Texas Instrum., Bangalore, India"],"affiliations":[{"raw_affiliation_string":"Texas Instruments, Inc., Bangalore, India","institution_ids":["https://openalex.org/I4210109535"]},{"raw_affiliation_string":"Texas Instrum., Bangalore, India","institution_ids":["https://openalex.org/I74760111"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5074889556","display_name":"Sujoy Chakravarty","orcid":null},"institutions":[{"id":"https://openalex.org/I4210109535","display_name":"Texas Instruments (India)","ror":"https://ror.org/01t305n31","country_code":"IN","type":"company","lineage":["https://openalex.org/I4210109535","https://openalex.org/I74760111"]},{"id":"https://openalex.org/I74760111","display_name":"Texas Instruments (United States)","ror":"https://ror.org/03vsmv677","country_code":"US","type":"company","lineage":["https://openalex.org/I74760111"]}],"countries":["IN","US"],"is_corresponding":false,"raw_author_name":"Sujoy Chakravarty","raw_affiliation_strings":["Texas Instruments, Inc., Bangalore, India","Texas Instrum., Bangalore, India"],"affiliations":[{"raw_affiliation_string":"Texas Instruments, Inc., Bangalore, India","institution_ids":["https://openalex.org/I4210109535"]},{"raw_affiliation_string":"Texas Instrum., Bangalore, India","institution_ids":["https://openalex.org/I74760111"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5103084438"],"corresponding_institution_ids":["https://openalex.org/I4210109535","https://openalex.org/I74760111"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.13583262,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"2027","last_page":"2030"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.7985473871231079},{"id":"https://openalex.org/keywords/usb","display_name":"USB","score":0.7689311504364014},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.6713443398475647},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5656900405883789},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.519474446773529},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.492378830909729},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.4399567246437073},{"id":"https://openalex.org/keywords/transceiver","display_name":"Transceiver","score":0.4192884564399719},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.41425561904907227},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.33436423540115356},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3292725086212158},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.11775565147399902}],"concepts":[{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.7985473871231079},{"id":"https://openalex.org/C507366226","wikidata":"https://www.wikidata.org/wiki/Q42378","display_name":"USB","level":3,"score":0.7689311504364014},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.6713443398475647},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5656900405883789},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.519474446773529},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.492378830909729},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.4399567246437073},{"id":"https://openalex.org/C7720470","wikidata":"https://www.wikidata.org/wiki/Q954187","display_name":"Transceiver","level":3,"score":0.4192884564399719},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.41425561904907227},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.33436423540115356},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3292725086212158},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.11775565147399902},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iscas.2011.5937994","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas.2011.5937994","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2011 IEEE International Symposium of Circuits and Systems (ISCAS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.8700000047683716,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":4,"referenced_works":["https://openalex.org/W1972150182","https://openalex.org/W2094840473","https://openalex.org/W2144725761","https://openalex.org/W6674293753"],"related_works":["https://openalex.org/W2360288732","https://openalex.org/W2379137242","https://openalex.org/W2758694247","https://openalex.org/W2356928735","https://openalex.org/W2367116219","https://openalex.org/W2115569193","https://openalex.org/W2161127017","https://openalex.org/W2170979950","https://openalex.org/W2039299085","https://openalex.org/W2588941787"],"abstract_inverted_index":{"Many":[0],"present":[1],"day":[2],"IO":[3],"specifications":[4],"require":[5],"over-voltage":[6],"protection.":[7],"USB2.0,":[8],"a":[9,14,25,71],"popular":[10],"serial":[11],"interface,":[12],"requires":[13],"5.25V":[15],"short":[16],"circuit":[17,58,76,110,127,139],"protection":[18,57,109],"for":[19,81],"the":[20,41,82,90],"signal":[21],"pins.":[22],"This":[23,126],"becomes":[24],"challenging":[26],"requirement":[27],"to":[28,70,96],"meet":[29],"in":[30,39,48,61,112,117],"Ultra":[31],"Deep":[32],"Sub-micron":[33],"(UDSM)":[34],"technologies.":[35],"The":[36,74,108,135],"challenge":[37],"lies":[38],"protecting":[40],"low-voltage":[42],"gate":[43],"oxides":[44],"from":[45,67,130],"higher":[46],"voltage":[47,92],"different":[49],"modes":[50],"of":[51,137],"operation":[52],"including":[53],"power":[54,99,106],"down.":[55],"A":[56],"is":[59,115,140],"proposed":[60,75],"this":[62,113,138],"paper":[63,114],"that":[64,79],"also":[65,77],"protects":[66],"overshoots":[68],"due":[69],"mismatched":[72],"cable.":[73],"ensures":[78],"supply":[80],"output":[83],"pad":[84],"driver":[85],"doesn't":[86],"get":[87],"charged":[88],"during":[89,98,132],"high":[91],"event.":[93],"It":[94],"continues":[95],"protect":[97],"down":[100],"drawing":[101],"\u223c12\u00b5A":[102],"current":[103],"ensuring":[104],"low":[105],"operation.":[107],"presented":[111],"implemented":[116],"45nm":[118],"CMOS,":[119],"without":[120],"using":[121],"any":[122],"3.3V":[123,131],"gate-oxide":[124],"transistors.":[125],"consumes":[128],"300\u00b5A":[129],"functional":[133],"mode.":[134],"area":[136],"90\u00d7320\u00b5m":[141],"<sup":[142],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[143],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">2</sup>":[144],".":[145]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}