{"id":"https://openalex.org/W2167637523","doi":"https://doi.org/10.1109/iscas.2011.5937987","title":"Live demonstration: MWC for real-time application","display_name":"Live demonstration: MWC for real-time application","publication_year":2011,"publication_date":"2011-05-01","ids":{"openalex":"https://openalex.org/W2167637523","doi":"https://doi.org/10.1109/iscas.2011.5937987","mag":"2167637523"},"language":"en","primary_location":{"id":"doi:10.1109/iscas.2011.5937987","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas.2011.5937987","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2011 IEEE International Symposium of Circuits and Systems (ISCAS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5025023555","display_name":"Rolf Hilgendorf","orcid":null},"institutions":[{"id":"https://openalex.org/I174306211","display_name":"Technion \u2013 Israel Institute of Technology","ror":"https://ror.org/03qryx823","country_code":"IL","type":"education","lineage":["https://openalex.org/I174306211"]}],"countries":["IL"],"is_corresponding":true,"raw_author_name":"Rolf Hilgendorf","raw_affiliation_strings":["Department of Electrical Engineering, High Speed Digital Systems Laboratory, Technion-Israel Institute of Technology, Haifa, Israel"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, High Speed Digital Systems Laboratory, Technion-Israel Institute of Technology, Haifa, Israel","institution_ids":["https://openalex.org/I174306211"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5013824899","display_name":"Moshe Mishali","orcid":"https://orcid.org/0000-0001-8735-2129"},"institutions":[{"id":"https://openalex.org/I174306211","display_name":"Technion \u2013 Israel Institute of Technology","ror":"https://ror.org/03qryx823","country_code":"IL","type":"education","lineage":["https://openalex.org/I174306211"]}],"countries":["IL"],"is_corresponding":false,"raw_author_name":"Moshe Mishali","raw_affiliation_strings":["Department of Electrical Engineering, High Speed Digital Systems Laboratory, Technion-Israel Institute of Technology, Haifa, Israel"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, High Speed Digital Systems Laboratory, Technion-Israel Institute of Technology, Haifa, Israel","institution_ids":["https://openalex.org/I174306211"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5005913897","display_name":"Yonina C. Eldar","orcid":"https://orcid.org/0000-0003-4358-5304"},"institutions":[{"id":"https://openalex.org/I174306211","display_name":"Technion \u2013 Israel Institute of Technology","ror":"https://ror.org/03qryx823","country_code":"IL","type":"education","lineage":["https://openalex.org/I174306211"]}],"countries":["IL"],"is_corresponding":false,"raw_author_name":"Yonina C. Eldar","raw_affiliation_strings":["Department of Electrical Engineering, High Speed Digital Systems Laboratory, Technion-Israel Institute of Technology, Haifa, Israel"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, High Speed Digital Systems Laboratory, Technion-Israel Institute of Technology, Haifa, Israel","institution_ids":["https://openalex.org/I174306211"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5083373291","display_name":"Eli Shoshan","orcid":null},"institutions":[{"id":"https://openalex.org/I174306211","display_name":"Technion \u2013 Israel Institute of Technology","ror":"https://ror.org/03qryx823","country_code":"IL","type":"education","lineage":["https://openalex.org/I174306211"]}],"countries":["IL"],"is_corresponding":false,"raw_author_name":"Eli Shoshan","raw_affiliation_strings":["Department of Electrical Engineering, High Speed Digital Systems Laboratory, Technion-Israel Institute of Technology, Haifa, Israel"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, High Speed Digital Systems Laboratory, Technion-Israel Institute of Technology, Haifa, Israel","institution_ids":["https://openalex.org/I174306211"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5007177471","display_name":"Ina Rivkin","orcid":null},"institutions":[{"id":"https://openalex.org/I174306211","display_name":"Technion \u2013 Israel Institute of Technology","ror":"https://ror.org/03qryx823","country_code":"IL","type":"education","lineage":["https://openalex.org/I174306211"]}],"countries":["IL"],"is_corresponding":false,"raw_author_name":"Ina Rivkin","raw_affiliation_strings":["Department of Electrical Engineering, High Speed Digital Systems Laboratory, Technion-Israel Institute of Technology, Haifa, Israel"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, High Speed Digital Systems Laboratory, Technion-Israel Institute of Technology, Haifa, Israel","institution_ids":["https://openalex.org/I174306211"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5025023555"],"corresponding_institution_ids":["https://openalex.org/I174306211"],"apc_list":null,"apc_paid":null,"fwci":0.3445,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.65399324,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"2002","last_page":"2002"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10500","display_name":"Sparse and Compressive Sensing Techniques","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10500","display_name":"Sparse and Compressive Sensing Techniques","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10688","display_name":"Image and Signal Denoising Methods","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10522","display_name":"Medical Imaging Techniques and Applications","score":0.9979000091552734,"subfield":{"id":"https://openalex.org/subfields/2741","display_name":"Radiology, Nuclear Medicine and Imaging"},"field":{"id":"https://openalex.org/fields/27","display_name":"Medicine"},"domain":{"id":"https://openalex.org/domains/4","display_name":"Health Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/field-programmable-gate-array","display_name":"Field-programmable gate array","score":0.7451086640357971},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7087427973747253},{"id":"https://openalex.org/keywords/nyquist\u2013shannon-sampling-theorem","display_name":"Nyquist\u2013Shannon sampling theorem","score":0.5968687534332275},{"id":"https://openalex.org/keywords/sampling","display_name":"Sampling (signal processing)","score":0.5597006678581238},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.4560409188270569},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.42481693625450134},{"id":"https://openalex.org/keywords/real-time-computing","display_name":"Real-time computing","score":0.41457176208496094},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.1381625235080719},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.1265575885772705},{"id":"https://openalex.org/keywords/detector","display_name":"Detector","score":0.06576547026634216}],"concepts":[{"id":"https://openalex.org/C42935608","wikidata":"https://www.wikidata.org/wiki/Q190411","display_name":"Field-programmable gate array","level":2,"score":0.7451086640357971},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7087427973747253},{"id":"https://openalex.org/C288623","wikidata":"https://www.wikidata.org/wiki/Q679800","display_name":"Nyquist\u2013Shannon sampling theorem","level":2,"score":0.5968687534332275},{"id":"https://openalex.org/C140779682","wikidata":"https://www.wikidata.org/wiki/Q210868","display_name":"Sampling (signal processing)","level":3,"score":0.5597006678581238},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.4560409188270569},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.42481693625450134},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.41457176208496094},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.1381625235080719},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.1265575885772705},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.06576547026634216}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iscas.2011.5937987","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas.2011.5937987","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2011 IEEE International Symposium of Circuits and Systems (ISCAS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":2,"referenced_works":["https://openalex.org/W1993784401","https://openalex.org/W2123629701"],"related_works":["https://openalex.org/W2610414734","https://openalex.org/W2111241003","https://openalex.org/W2355315220","https://openalex.org/W4200391368","https://openalex.org/W2210979487","https://openalex.org/W2096844293","https://openalex.org/W2363944576","https://openalex.org/W2351041855","https://openalex.org/W2570254841","https://openalex.org/W2379572111"],"abstract_inverted_index":{"We":[0],"propose":[1],"a":[2],"demonstration":[3],"of":[4],"sub-Nyquist":[5],"sampling":[6],"and":[7,15],"reconstruction":[8],"in":[9],"real-time,":[10],"based":[11],"on":[12],"prototype":[13],"hardware":[14],"embedded":[16],"FPGA.":[17]},"counts_by_year":[{"year":2013,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}