{"id":"https://openalex.org/W2146235148","doi":"https://doi.org/10.1109/iscas.2011.5937938","title":"Noise analysis of a current-mode read circuit for sensing magnetic tunnel junction resistance","display_name":"Noise analysis of a current-mode read circuit for sensing magnetic tunnel junction resistance","publication_year":2011,"publication_date":"2011-05-01","ids":{"openalex":"https://openalex.org/W2146235148","doi":"https://doi.org/10.1109/iscas.2011.5937938","mag":"2146235148"},"language":"en","primary_location":{"id":"doi:10.1109/iscas.2011.5937938","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas.2011.5937938","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2011 IEEE International Symposium of Circuits and Systems (ISCAS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5088626634","display_name":"Michael J. Hall","orcid":"https://orcid.org/0000-0002-5823-6580"},"institutions":[{"id":"https://openalex.org/I204465549","display_name":"Washington University in St. Louis","ror":"https://ror.org/01yc7t268","country_code":"US","type":"education","lineage":["https://openalex.org/I204465549"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Michael J. Hall","raw_affiliation_strings":["Department of Computer Science & Engineering, Washington University of Saint Louis, USA","[Department of Computer Science and Engineering, Washington University in St. Louis, USA]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Computer Science & Engineering, Washington University of Saint Louis, USA","institution_ids":["https://openalex.org/I204465549"]},{"raw_affiliation_string":"[Department of Computer Science and Engineering, Washington University in St. Louis, USA]","institution_ids":["https://openalex.org/I204465549"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5107412730","display_name":"Viktor Gruev","orcid":null},"institutions":[{"id":"https://openalex.org/I204465549","display_name":"Washington University in St. Louis","ror":"https://ror.org/01yc7t268","country_code":"US","type":"education","lineage":["https://openalex.org/I204465549"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Viktor Gruev","raw_affiliation_strings":["Department of Computer Science & Engineering, Washington University of Saint Louis, USA","[Department of Computer Science and Engineering, Washington University in St. Louis, USA]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Computer Science & Engineering, Washington University of Saint Louis, USA","institution_ids":["https://openalex.org/I204465549"]},{"raw_affiliation_string":"[Department of Computer Science and Engineering, Washington University in St. Louis, USA]","institution_ids":["https://openalex.org/I204465549"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5006814645","display_name":"Roger D. Chamberlain","orcid":"https://orcid.org/0000-0002-7207-6106"},"institutions":[{"id":"https://openalex.org/I204465549","display_name":"Washington University in St. Louis","ror":"https://ror.org/01yc7t268","country_code":"US","type":"education","lineage":["https://openalex.org/I204465549"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Roger D. Chamberlain","raw_affiliation_strings":["Department of Computer Science & Engineering, Washington University of Saint Louis, USA","[Department of Computer Science and Engineering, Washington University in St. Louis, USA]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Computer Science & Engineering, Washington University of Saint Louis, USA","institution_ids":["https://openalex.org/I204465549"]},{"raw_affiliation_string":"[Department of Computer Science and Engineering, Washington University in St. Louis, USA]","institution_ids":["https://openalex.org/I204465549"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.2703,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.64709319,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"1816","last_page":"1819"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12692","display_name":"Magnetic Field Sensors Techniques","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12692","display_name":"Magnetic Field Sensors Techniques","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10049","display_name":"Magnetic properties of thin films","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.9980000257492065,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.7262513637542725},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.6763041019439697},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.57477867603302},{"id":"https://openalex.org/keywords/current","display_name":"Current (fluid)","score":0.5738675594329834},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.522742748260498},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.49009859561920166},{"id":"https://openalex.org/keywords/digital-electronics","display_name":"Digital electronics","score":0.4794308543205261},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4793420732021332},{"id":"https://openalex.org/keywords/mode","display_name":"Mode (computer interface)","score":0.46609818935394287},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3281891345977783}],"concepts":[{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.7262513637542725},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.6763041019439697},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.57477867603302},{"id":"https://openalex.org/C148043351","wikidata":"https://www.wikidata.org/wiki/Q4456944","display_name":"Current (fluid)","level":2,"score":0.5738675594329834},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.522742748260498},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.49009859561920166},{"id":"https://openalex.org/C81843906","wikidata":"https://www.wikidata.org/wiki/Q173156","display_name":"Digital electronics","level":3,"score":0.4794308543205261},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4793420732021332},{"id":"https://openalex.org/C48677424","wikidata":"https://www.wikidata.org/wiki/Q6888088","display_name":"Mode (computer interface)","level":2,"score":0.46609818935394287},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3281891345977783},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iscas.2011.5937938","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas.2011.5937938","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2011 IEEE International Symposium of Circuits and Systems (ISCAS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.6700000166893005}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":7,"referenced_works":["https://openalex.org/W118813204","https://openalex.org/W1566916904","https://openalex.org/W1987636781","https://openalex.org/W2017569700","https://openalex.org/W2112670920","https://openalex.org/W2145758218","https://openalex.org/W2171051477"],"related_works":["https://openalex.org/W2796521923","https://openalex.org/W1980349267","https://openalex.org/W95651076","https://openalex.org/W2098419840","https://openalex.org/W2140610743","https://openalex.org/W2116326546","https://openalex.org/W2770163697","https://openalex.org/W2110521006","https://openalex.org/W2097637358","https://openalex.org/W2151104031"],"abstract_inverted_index":{"Magnetologic":[0],"circuits":[1,5,36,42],"are":[2,15,32],"digital":[3],"logic":[4,70],"constructed":[6],"using":[7],"magnetic":[8],"tunnel":[9],"junction":[10],"(MTJ)":[11],"devices.":[12],"These":[13],"devices":[14],"non-volatile,":[16],"robust,":[17],"and":[18,48,96],"scale":[19],"favorably":[20],"with":[21],"process":[22],"dimensions.":[23],"Several":[24],"approaches":[25],"exist":[26],"for":[27],"building":[28],"magnetologic":[29,35],"circuits.":[30],"We":[31,91],"investigating":[33],"current-mode":[34,60,85],"as":[37],"a":[38,54,59,80,84],"viable":[39],"option.":[40],"Current-mode":[41],"avoid":[43],"charging/":[44],"discharging":[45],"load":[46],"capacitances":[47],"can":[49,63],"be":[50],"used":[51],"to":[52,67],"program":[53],"downstream":[55],"device.":[56],"Noise":[57],"in":[58,72],"read":[61,86],"circuit":[62,87],"affect":[64],"the":[65],"ability":[66],"correctly":[68],"distinguish":[69],"states":[71],"an":[73],"MTJ.":[74],"In":[75],"this":[76],"paper,":[77],"we":[78],"present":[79],"noise":[81,94],"analysis":[82],"of":[83],"or":[88],"current":[89],"conveyor.":[90],"derive":[92],"analytical":[93],"equations":[95],"verify":[97],"them":[98],"via":[99],"simulation.":[100]},"counts_by_year":[{"year":2017,"cited_by_count":2},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":1},{"year":2012,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}