{"id":"https://openalex.org/W2130132420","doi":"https://doi.org/10.1109/iscas.2011.5937595","title":"A high speed transceiver front-end design with fault detection for FlexRay-based automotive communication systems","display_name":"A high speed transceiver front-end design with fault detection for FlexRay-based automotive communication systems","publication_year":2011,"publication_date":"2011-05-01","ids":{"openalex":"https://openalex.org/W2130132420","doi":"https://doi.org/10.1109/iscas.2011.5937595","mag":"2130132420"},"language":"en","primary_location":{"id":"doi:10.1109/iscas.2011.5937595","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas.2011.5937595","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2011 IEEE International Symposium of Circuits and Systems (ISCAS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5077220045","display_name":"Chua\u2010Chin Wang","orcid":"https://orcid.org/0000-0002-2426-2879"},"institutions":[{"id":"https://openalex.org/I142974352","display_name":"National Sun Yat-sen University","ror":"https://ror.org/00mjawt10","country_code":"TW","type":"education","lineage":["https://openalex.org/I142974352"]}],"countries":["TW"],"is_corresponding":true,"raw_author_name":"Chua-Chin Wang","raw_affiliation_strings":["Department of Electrical Engineering, National Sun Yat-Sen University, Kaohsiung, Taiwan","Department of Electrical Engineering National Sun Yat-Sen University Kaohsiung, Taiwan 80424"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, National Sun Yat-Sen University, Kaohsiung, Taiwan","institution_ids":["https://openalex.org/I142974352"]},{"raw_affiliation_string":"Department of Electrical Engineering National Sun Yat-Sen University Kaohsiung, Taiwan 80424","institution_ids":["https://openalex.org/I142974352"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5032088383","display_name":"Chih-Lin Chen","orcid":"https://orcid.org/0000-0003-3924-2835"},"institutions":[{"id":"https://openalex.org/I142974352","display_name":"National Sun Yat-sen University","ror":"https://ror.org/00mjawt10","country_code":"TW","type":"education","lineage":["https://openalex.org/I142974352"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Chih-Lin Chen","raw_affiliation_strings":["Department of Electrical Engineering, National Sun Yat-Sen University, Kaohsiung, Taiwan","Department of Electrical Engineering National Sun Yat-Sen University Kaohsiung, Taiwan 80424"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, National Sun Yat-Sen University, Kaohsiung, Taiwan","institution_ids":["https://openalex.org/I142974352"]},{"raw_affiliation_string":"Department of Electrical Engineering National Sun Yat-Sen University Kaohsiung, Taiwan 80424","institution_ids":["https://openalex.org/I142974352"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5015556246","display_name":"Tai-Hao Yeh","orcid":null},"institutions":[{"id":"https://openalex.org/I142974352","display_name":"National Sun Yat-sen University","ror":"https://ror.org/00mjawt10","country_code":"TW","type":"education","lineage":["https://openalex.org/I142974352"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Tai-Hao Yeh","raw_affiliation_strings":["Department of Electrical Engineering, National Sun Yat-Sen University, Kaohsiung, Taiwan","Department of Electrical Engineering National Sun Yat-Sen University Kaohsiung, Taiwan 80424"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, National Sun Yat-Sen University, Kaohsiung, Taiwan","institution_ids":["https://openalex.org/I142974352"]},{"raw_affiliation_string":"Department of Electrical Engineering National Sun Yat-Sen University Kaohsiung, Taiwan 80424","institution_ids":["https://openalex.org/I142974352"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109125924","display_name":"Yi Hu","orcid":"https://orcid.org/0000-0003-3317-4771"},"institutions":[{"id":"https://openalex.org/I142974352","display_name":"National Sun Yat-sen University","ror":"https://ror.org/00mjawt10","country_code":"TW","type":"education","lineage":["https://openalex.org/I142974352"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Yi Hu","raw_affiliation_strings":["Department of Electrical Engineering, National Sun Yat-Sen University, Kaohsiung, Taiwan","Department of Electrical Engineering National Sun Yat-Sen University Kaohsiung, Taiwan 80424"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, National Sun Yat-Sen University, Kaohsiung, Taiwan","institution_ids":["https://openalex.org/I142974352"]},{"raw_affiliation_string":"Department of Electrical Engineering National Sun Yat-Sen University Kaohsiung, Taiwan 80424","institution_ids":["https://openalex.org/I142974352"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5032533948","display_name":"Gang-Neng Sung","orcid":null},"institutions":[{"id":"https://openalex.org/I4210166867","display_name":"National Applied Research Laboratories","ror":"https://ror.org/05wcstg80","country_code":"TW","type":"funder","lineage":["https://openalex.org/I4210128167","https://openalex.org/I4210166867"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Gang-Neng Sung","raw_affiliation_strings":["Design Servise Department, National Chip Implementation Center, National Applied Research Laboratories, Hsinchu, Taiwan","Design Servise Department, National Chip Implementation Center, National Applied Research Laboratories, Hsinchu, Taiwan 30078"],"affiliations":[{"raw_affiliation_string":"Design Servise Department, National Chip Implementation Center, National Applied Research Laboratories, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I4210166867"]},{"raw_affiliation_string":"Design Servise Department, National Chip Implementation Center, National Applied Research Laboratories, Hsinchu, Taiwan 30078","institution_ids":["https://openalex.org/I4210166867"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5077220045"],"corresponding_institution_ids":["https://openalex.org/I142974352"],"apc_list":null,"apc_paid":null,"fwci":0.5299,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.71718843,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"2","issue":null,"first_page":"434","last_page":"437"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9983999729156494,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10904","display_name":"Embedded Systems Design Techniques","score":0.998199999332428,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/transceiver","display_name":"Transceiver","score":0.8915129899978638},{"id":"https://openalex.org/keywords/flexray","display_name":"FlexRay","score":0.8293185234069824},{"id":"https://openalex.org/keywords/transmitter","display_name":"Transmitter","score":0.6150318384170532},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.5429382920265198},{"id":"https://openalex.org/keywords/detector","display_name":"Detector","score":0.5308552384376526},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5152597427368164},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.479274719953537},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4640905261039734},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.43996870517730713},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.434533953666687},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3570472002029419},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.3522781729698181},{"id":"https://openalex.org/keywords/automotive-industry","display_name":"Automotive industry","score":0.3462802469730377},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.10786131024360657}],"concepts":[{"id":"https://openalex.org/C7720470","wikidata":"https://www.wikidata.org/wiki/Q954187","display_name":"Transceiver","level":3,"score":0.8915129899978638},{"id":"https://openalex.org/C2777648190","wikidata":"https://www.wikidata.org/wiki/Q571846","display_name":"FlexRay","level":3,"score":0.8293185234069824},{"id":"https://openalex.org/C47798520","wikidata":"https://www.wikidata.org/wiki/Q190157","display_name":"Transmitter","level":3,"score":0.6150318384170532},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.5429382920265198},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.5308552384376526},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5152597427368164},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.479274719953537},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4640905261039734},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.43996870517730713},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.434533953666687},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3570472002029419},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.3522781729698181},{"id":"https://openalex.org/C526921623","wikidata":"https://www.wikidata.org/wiki/Q190117","display_name":"Automotive industry","level":2,"score":0.3462802469730377},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.10786131024360657},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C127162648","wikidata":"https://www.wikidata.org/wiki/Q16858953","display_name":"Channel (broadcasting)","level":2,"score":0.0},{"id":"https://openalex.org/C146978453","wikidata":"https://www.wikidata.org/wiki/Q3798668","display_name":"Aerospace engineering","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iscas.2011.5937595","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas.2011.5937595","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2011 IEEE International Symposium of Circuits and Systems (ISCAS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.6800000071525574,"id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":3,"referenced_works":["https://openalex.org/W1572125760","https://openalex.org/W2116641826","https://openalex.org/W2127665801"],"related_works":["https://openalex.org/W1973607654","https://openalex.org/W2072436685","https://openalex.org/W4249165909","https://openalex.org/W2117255793","https://openalex.org/W2113805088","https://openalex.org/W3188388194","https://openalex.org/W4244023365","https://openalex.org/W2311873786","https://openalex.org/W4311591647","https://openalex.org/W4390195751"],"abstract_inverted_index":{"This":[0],"paper":[1],"presents":[2],"a":[3,51],"high":[4],"speed":[5],"transceiver":[6,37],"design":[7],"with":[8,13],"fault":[9],"detection":[10],"circuit":[11],"compliant":[12],"FlexRay":[14],"standards":[15],"V2.1.":[16],"An":[17],"LVDS-like":[18],"transmitter":[19],"is":[20,33,54,76],"utilized":[21],"to":[22,38,45,56],"drive":[23],"the":[24,28,36,40,59,66,69,80],"twisted":[25],"pair":[26],"of":[27,68],"bus.":[29,70],"A":[30,71],"current":[31,42],"detector":[32,75],"included":[34,78],"in":[35,65,79],"detect":[39],"operating":[41],"so":[43],"as":[44],"prevent":[46],"over-current":[47],"hazard.":[48],"By":[49],"contrast,":[50],"3-comparator":[52],"scheme":[53],"used":[55],"carry":[57],"out":[58],"required":[60],"bit-slicing":[61],"and":[62],"state":[63],"recognition":[64],"receiver":[67,82],"bus":[72],"line":[73],"short-circuit":[74],"also":[77],"proposed":[81],"design.":[83]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2013,"cited_by_count":1},{"year":2012,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}