{"id":"https://openalex.org/W2007246491","doi":"https://doi.org/10.1109/iscas.2010.5537646","title":"A 10-bit 300MSample/s pipelined ADC using time-interleaved SAR ADC for front-end stages","display_name":"A 10-bit 300MSample/s pipelined ADC using time-interleaved SAR ADC for front-end stages","publication_year":2010,"publication_date":"2010-05-01","ids":{"openalex":"https://openalex.org/W2007246491","doi":"https://doi.org/10.1109/iscas.2010.5537646","mag":"2007246491"},"language":"en","primary_location":{"id":"doi:10.1109/iscas.2010.5537646","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas.2010.5537646","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of 2010 IEEE International Symposium on Circuits and Systems","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5119929924","display_name":"Young-Hwa Kim","orcid":"https://orcid.org/0000-0003-1283-6756"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Young-Hwa Kim","raw_affiliation_strings":["Department of Electrical Engineering, Korea Advanced Institute of Science and Technology, Daejeon, South Korea","Department of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, Republic of Korea#TAB#"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Korea Advanced Institute of Science and Technology, Daejeon, South Korea","institution_ids":["https://openalex.org/I157485424"]},{"raw_affiliation_string":"Department of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, Republic of Korea#TAB#","institution_ids":["https://openalex.org/I157485424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100329188","display_name":"Jaewon Lee","orcid":"https://orcid.org/0000-0001-5900-0441"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jaewon Lee","raw_affiliation_strings":["Department of Electrical Engineering, Korea Advanced Institute of Science and Technology, Daejeon, South Korea","Department of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, Republic of Korea#TAB#"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Korea Advanced Institute of Science and Technology, Daejeon, South Korea","institution_ids":["https://openalex.org/I157485424"]},{"raw_affiliation_string":"Department of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, Republic of Korea#TAB#","institution_ids":["https://openalex.org/I157485424"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5040917581","display_name":"SeongHwan Cho","orcid":"https://orcid.org/0000-0001-7938-2694"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"SeongHwan Cho","raw_affiliation_strings":["Department of Electrical Engineering, Korea Advanced Institute of Science and Technology, Daejeon, South Korea","Department of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, Republic of Korea#TAB#"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Korea Advanced Institute of Science and Technology, Daejeon, South Korea","institution_ids":["https://openalex.org/I157485424"]},{"raw_affiliation_string":"Department of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, Republic of Korea#TAB#","institution_ids":["https://openalex.org/I157485424"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5119929924"],"corresponding_institution_ids":["https://openalex.org/I157485424"],"apc_list":null,"apc_paid":null,"fwci":1.0557,"has_fulltext":false,"cited_by_count":11,"citation_normalized_percentile":{"value":0.76879806,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"4041","last_page":"4044"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9976000189781189,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9952999949455261,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/successive-approximation-adc","display_name":"Successive approximation ADC","score":0.8302337527275085},{"id":"https://openalex.org/keywords/effective-number-of-bits","display_name":"Effective number of bits","score":0.7037932276725769},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.6756373047828674},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6039689779281616},{"id":"https://openalex.org/keywords/figure-of-merit","display_name":"Figure of merit","score":0.4722138047218323},{"id":"https://openalex.org/keywords/sampling","display_name":"Sampling (signal processing)","score":0.4703051447868347},{"id":"https://openalex.org/keywords/bit","display_name":"Bit (key)","score":0.4692789316177368},{"id":"https://openalex.org/keywords/shaping","display_name":"Shaping","score":0.4510402977466583},{"id":"https://openalex.org/keywords/operational-amplifier","display_name":"Operational amplifier","score":0.4455106854438782},{"id":"https://openalex.org/keywords/amplifier","display_name":"Amplifier","score":0.43727290630340576},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.41836294531822205},{"id":"https://openalex.org/keywords/sampling-time","display_name":"Sampling time","score":0.4162408709526062},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.369745671749115},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.3081837594509125},{"id":"https://openalex.org/keywords/capacitor","display_name":"Capacitor","score":0.286670982837677},{"id":"https://openalex.org/keywords/detector","display_name":"Detector","score":0.2016504406929016},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1608698070049286},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.13085517287254333},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.12119460105895996}],"concepts":[{"id":"https://openalex.org/C60154766","wikidata":"https://www.wikidata.org/wiki/Q2650458","display_name":"Successive approximation ADC","level":4,"score":0.8302337527275085},{"id":"https://openalex.org/C16671190","wikidata":"https://www.wikidata.org/wiki/Q505579","display_name":"Effective number of bits","level":3,"score":0.7037932276725769},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.6756373047828674},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6039689779281616},{"id":"https://openalex.org/C130277099","wikidata":"https://www.wikidata.org/wiki/Q3676605","display_name":"Figure of merit","level":2,"score":0.4722138047218323},{"id":"https://openalex.org/C140779682","wikidata":"https://www.wikidata.org/wiki/Q210868","display_name":"Sampling (signal processing)","level":3,"score":0.4703051447868347},{"id":"https://openalex.org/C117011727","wikidata":"https://www.wikidata.org/wiki/Q1278488","display_name":"Bit (key)","level":2,"score":0.4692789316177368},{"id":"https://openalex.org/C142311740","wikidata":"https://www.wikidata.org/wiki/Q1066177","display_name":"Shaping","level":2,"score":0.4510402977466583},{"id":"https://openalex.org/C145366948","wikidata":"https://www.wikidata.org/wiki/Q178947","display_name":"Operational amplifier","level":4,"score":0.4455106854438782},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.43727290630340576},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.41836294531822205},{"id":"https://openalex.org/C2987691683","wikidata":"https://www.wikidata.org/wiki/Q210868","display_name":"Sampling time","level":2,"score":0.4162408709526062},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.369745671749115},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.3081837594509125},{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.286670982837677},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.2016504406929016},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1608698070049286},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.13085517287254333},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.12119460105895996},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.0},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.0},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iscas.2010.5537646","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas.2010.5537646","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of 2010 IEEE International Symposium on Circuits and Systems","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.9100000262260437}],"awards":[],"funders":[{"id":"https://openalex.org/F4320322093","display_name":"Electronics and Telecommunications Research Institute","ror":"https://ror.org/03ysstz10"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":8,"referenced_works":["https://openalex.org/W1978246915","https://openalex.org/W2009915056","https://openalex.org/W2070653196","https://openalex.org/W2082979872","https://openalex.org/W2106500178","https://openalex.org/W2108909198","https://openalex.org/W2138609039","https://openalex.org/W6676124150"],"related_works":["https://openalex.org/W2896514336","https://openalex.org/W3216962587","https://openalex.org/W2003734039","https://openalex.org/W4292071990","https://openalex.org/W2905521207","https://openalex.org/W2548554782","https://openalex.org/W340251908","https://openalex.org/W1997284295","https://openalex.org/W2511822798","https://openalex.org/W4392033636"],"abstract_inverted_index":{"A":[0],"10-bit":[1,112],"300":[2,79],"MSample/s":[3],"pipelined":[4,27],"analog":[5],"to":[6],"digital":[7],"converter":[8],"(ADC)":[9],"using":[10],"time-interleaved":[11],"successive":[12],"approximation":[13],"register":[14],"(SAR)":[15],"ADC":[16,96],"in":[17,68],"the":[18,25,50,59,63,94,103,106],"first":[19,51,64],"stage":[20],"is":[21,97,100],"presented.":[22],"By":[23],"replacing":[24],"front-end":[26],"stages":[28],"with":[29,114],"energy-efficient":[30],"SAR-ADC,":[31],"power":[32,60],"hungry":[33],"sample-and-hold":[34],"amplifier":[35],"can":[36,42,53,83],"be":[37,43,54,84],"removed":[38],"and":[39],"rail-to-rail":[40],"input":[41],"used.":[44],"In":[45],"addition,":[46],"feedback":[47],"factor":[48],"of":[49,62,76,93,102,117,119],"MDAC":[52],"increased,":[55],"which":[56,99],"significantly":[57],"reduces":[58],"consumption":[61],"opamp.":[65],"Simulation":[66],"results":[67],"90":[69],"nm":[70],"CMOS":[71],"show":[72],"that":[73,110],"8.88":[74],"bits":[75],"effective-number-of-bits":[77],"at":[78,89],"MHz":[80],"sampling":[81,115],"rate":[82],"achieved":[85],"while":[86],"consuming":[87],"77mW":[88],"1.2V":[90],"supply.":[91],"Figure-of-merit":[92],"proposed":[95],"545fJ/Conv,":[98],"one":[101],"lowest":[104],"among":[105],"recently":[107],"reported":[108],"ADCs":[109],"achieve":[111],"resolution":[113],"rates":[116],"hundreds":[118],"mega-hertz.":[120]},"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2014,"cited_by_count":3},{"year":2013,"cited_by_count":2},{"year":2012,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}