{"id":"https://openalex.org/W2146152074","doi":"https://doi.org/10.1109/iscas.2009.5118011","title":"A digital calibration technique for DAC mismatches in delta-sigma modulators","display_name":"A digital calibration technique for DAC mismatches in delta-sigma modulators","publication_year":2009,"publication_date":"2009-05-01","ids":{"openalex":"https://openalex.org/W2146152074","doi":"https://doi.org/10.1109/iscas.2009.5118011","mag":"2146152074"},"language":"en","primary_location":{"id":"doi:10.1109/iscas.2009.5118011","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas.2009.5118011","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2009 IEEE International Symposium on Circuits and Systems","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5108507450","display_name":"Wenhuan Yu","orcid":null},"institutions":[{"id":"https://openalex.org/I131249849","display_name":"Oregon State University","ror":"https://ror.org/00ysfqy60","country_code":"US","type":"education","lineage":["https://openalex.org/I131249849"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Wenhuan Yu","raw_affiliation_strings":["Department of EECS, Oregon State University, Corvallis, OR, USA","Department of EECS Oregon State University Corvallis, 97331, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of EECS, Oregon State University, Corvallis, OR, USA","institution_ids":["https://openalex.org/I131249849"]},{"raw_affiliation_string":"Department of EECS Oregon State University Corvallis, 97331, USA","institution_ids":["https://openalex.org/I131249849"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5045933551","display_name":"G\u00e1bor C. Temes","orcid":"https://orcid.org/0000-0002-0617-4875"},"institutions":[{"id":"https://openalex.org/I131249849","display_name":"Oregon State University","ror":"https://ror.org/00ysfqy60","country_code":"US","type":"education","lineage":["https://openalex.org/I131249849"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Gabor C. Temes","raw_affiliation_strings":["Department of EECS, Oregon State University, Corvallis, OR, USA","Department of EECS Oregon State University Corvallis, 97331, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of EECS, Oregon State University, Corvallis, OR, USA","institution_ids":["https://openalex.org/I131249849"]},{"raw_affiliation_string":"Department of EECS Oregon State University Corvallis, 97331, USA","institution_ids":["https://openalex.org/I131249849"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I131249849"],"apc_list":null,"apc_paid":null,"fwci":2.027,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":{"value":0.86575647,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"1337","last_page":"1340"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","score":0.9955000281333923,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10369","display_name":"Advanced MEMS and NEMS Technologies","score":0.9922000169754028,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/delta-sigma-modulation","display_name":"Delta-sigma modulation","score":0.9424178004264832},{"id":"https://openalex.org/keywords/calibration","display_name":"Calibration","score":0.7094059586524963},{"id":"https://openalex.org/keywords/sigma","display_name":"Sigma","score":0.6577908992767334},{"id":"https://openalex.org/keywords/sampling","display_name":"Sampling (signal processing)","score":0.5817148089408875},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4530567228794098},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.44973862171173096},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.31553101539611816},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.17622840404510498},{"id":"https://openalex.org/keywords/bandwidth","display_name":"Bandwidth (computing)","score":0.17318615317344666},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.11669692397117615}],"concepts":[{"id":"https://openalex.org/C68754193","wikidata":"https://www.wikidata.org/wiki/Q1184820","display_name":"Delta-sigma modulation","level":3,"score":0.9424178004264832},{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.7094059586524963},{"id":"https://openalex.org/C2778049214","wikidata":"https://www.wikidata.org/wiki/Q7512234","display_name":"Sigma","level":2,"score":0.6577908992767334},{"id":"https://openalex.org/C140779682","wikidata":"https://www.wikidata.org/wiki/Q210868","display_name":"Sampling (signal processing)","level":3,"score":0.5817148089408875},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4530567228794098},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.44973862171173096},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.31553101539611816},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.17622840404510498},{"id":"https://openalex.org/C2776257435","wikidata":"https://www.wikidata.org/wiki/Q1576430","display_name":"Bandwidth (computing)","level":2,"score":0.17318615317344666},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.11669692397117615},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iscas.2009.5118011","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas.2009.5118011","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2009 IEEE International Symposium on Circuits and Systems","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":4,"referenced_works":["https://openalex.org/W1200054615","https://openalex.org/W1509148781","https://openalex.org/W2107683251","https://openalex.org/W2169074882"],"related_works":["https://openalex.org/W2495953643","https://openalex.org/W2538983634","https://openalex.org/W1987658008","https://openalex.org/W2800677388","https://openalex.org/W2099210776","https://openalex.org/W2154555498","https://openalex.org/W3010725604","https://openalex.org/W2040229502","https://openalex.org/W4233608695","https://openalex.org/W1482165582"],"abstract_inverted_index":{"A":[0],"digital":[1],"calibration":[2,23],"technique":[3,39],"is":[4],"proposed":[5],"for":[6],"DAC":[7,26],"mismatches":[8,27],"in":[9,21,43],"delta-sigma":[10,14,45],"(\u0394\u03a3)":[11],"modulators.":[12],"The":[13,25,38],"modulator":[15],"works":[16],"as":[17,47],"an":[18],"incremental":[19],"ADC":[20],"the":[22],"mode.":[24],"are":[28,35],"found":[29],"by":[30],"solving":[31],"linear":[32],"equations":[33],"and":[34],"compensated":[36],"digitally.":[37],"can":[40],"be":[41],"used":[42],"double-sampling":[44],"modulators":[46],"well.":[48]},"counts_by_year":[{"year":2016,"cited_by_count":1},{"year":2014,"cited_by_count":2}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}