{"id":"https://openalex.org/W2023592314","doi":"https://doi.org/10.1109/iscas.2008.4542131","title":"A novel hybrid active-passive pixel with correlated double sampling CMOS readout circuit for medical x-ray imaging","display_name":"A novel hybrid active-passive pixel with correlated double sampling CMOS readout circuit for medical x-ray imaging","publication_year":2008,"publication_date":"2008-05-01","ids":{"openalex":"https://openalex.org/W2023592314","doi":"https://doi.org/10.1109/iscas.2008.4542131","mag":"2023592314"},"language":"en","primary_location":{"id":"doi:10.1109/iscas.2008.4542131","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas.2008.4542131","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2008 IEEE International Symposium on Circuits and Systems","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5027524865","display_name":"N. Safavian","orcid":null},"institutions":[{"id":"https://openalex.org/I151746483","display_name":"University of Waterloo","ror":"https://ror.org/01aff2v68","country_code":"CA","type":"education","lineage":["https://openalex.org/I151746483"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"N. Safavian","raw_affiliation_strings":["Electrical and Computer Engineering Department, University of Waterloo, Waterloo, ONT, Canada","Electr. & Comput. Eng. Dept., Univ. of Waterloo, Toronto, ON"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electrical and Computer Engineering Department, University of Waterloo, Waterloo, ONT, Canada","institution_ids":["https://openalex.org/I151746483"]},{"raw_affiliation_string":"Electr. & Comput. Eng. Dept., Univ. of Waterloo, Toronto, ON","institution_ids":["https://openalex.org/I151746483"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111946804","display_name":"G. Reza Chaji","orcid":null},"institutions":[{"id":"https://openalex.org/I151746483","display_name":"University of Waterloo","ror":"https://ror.org/01aff2v68","country_code":"CA","type":"education","lineage":["https://openalex.org/I151746483"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"G. R. Chaji","raw_affiliation_strings":["Electrical and Computer Engineering Department, University of Waterloo, Waterloo, ONT, Canada","Electr. & Comput. Eng. Dept., Univ. of Waterloo, Toronto, ON"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electrical and Computer Engineering Department, University of Waterloo, Waterloo, ONT, Canada","institution_ids":["https://openalex.org/I151746483"]},{"raw_affiliation_string":"Electr. & Comput. Eng. Dept., Univ. of Waterloo, Toronto, ON","institution_ids":["https://openalex.org/I151746483"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5104213072","display_name":"K. S. Karim","orcid":null},"institutions":[{"id":"https://openalex.org/I151746483","display_name":"University of Waterloo","ror":"https://ror.org/01aff2v68","country_code":"CA","type":"education","lineage":["https://openalex.org/I151746483"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"K.S. Karim","raw_affiliation_strings":["Electrical and Computer Engineering Department, University of Waterloo, Waterloo, ONT, Canada","Electr. & Comput. Eng. Dept., Univ. of Waterloo, Toronto, ON"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electrical and Computer Engineering Department, University of Waterloo, Waterloo, ONT, Canada","institution_ids":["https://openalex.org/I151746483"]},{"raw_affiliation_string":"Electr. & Comput. Eng. Dept., Univ. of Waterloo, Toronto, ON","institution_ids":["https://openalex.org/I151746483"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5111680435","display_name":"J. A. Rowlands","orcid":null},"institutions":[{"id":"https://openalex.org/I1323843004","display_name":"Sunnybrook Health Science Centre","ror":"https://ror.org/03wefcv03","country_code":"CA","type":"healthcare","lineage":["https://openalex.org/I1323843004"]},{"id":"https://openalex.org/I185261750","display_name":"University of Toronto","ror":"https://ror.org/03dbr7087","country_code":"CA","type":"education","lineage":["https://openalex.org/I185261750"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"J. A. Rowlands","raw_affiliation_strings":["Sunnybrook Health Science Centre, University of Toronto, Toronto, ONT, Canada","Sunnybrook Health Science Centre, University of Toronto, Ontario, M4N3M5, Canada"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Sunnybrook Health Science Centre, University of Toronto, Toronto, ONT, Canada","institution_ids":["https://openalex.org/I1323843004","https://openalex.org/I185261750"]},{"raw_affiliation_string":"Sunnybrook Health Science Centre, University of Toronto, Ontario, M4N3M5, Canada","institution_ids":["https://openalex.org/I1323843004"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.3392,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.6306223,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"3170","last_page":"3173"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10623","display_name":"Thin-Film Transistor Technologies","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11169","display_name":"Silicon Nanostructures and Photoluminescence","score":0.9937000274658203,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.723213791847229},{"id":"https://openalex.org/keywords/thin-film-transistor","display_name":"Thin-film transistor","score":0.6675926446914673},{"id":"https://openalex.org/keywords/correlated-double-sampling","display_name":"Correlated double sampling","score":0.6659702062606812},{"id":"https://openalex.org/keywords/pixel","display_name":"Pixel","score":0.5790199041366577},{"id":"https://openalex.org/keywords/threshold-voltage","display_name":"Threshold voltage","score":0.5562145709991455},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.53465735912323},{"id":"https://openalex.org/keywords/offset","display_name":"Offset (computer science)","score":0.4897785186767578},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.4862474203109741},{"id":"https://openalex.org/keywords/cmos-sensor","display_name":"CMOS sensor","score":0.4485741853713989},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.44355639815330505},{"id":"https://openalex.org/keywords/image-sensor","display_name":"Image sensor","score":0.4316099286079407},{"id":"https://openalex.org/keywords/biasing","display_name":"Biasing","score":0.41958966851234436},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4179309010505676},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.41782882809638977},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.400293231010437},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3540460467338562},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3137410283088684},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1591123640537262},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.09434875845909119},{"id":"https://openalex.org/keywords/nanotechnology","display_name":"Nanotechnology","score":0.07827115058898926}],"concepts":[{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.723213791847229},{"id":"https://openalex.org/C87359718","wikidata":"https://www.wikidata.org/wiki/Q1271916","display_name":"Thin-film transistor","level":3,"score":0.6675926446914673},{"id":"https://openalex.org/C118277053","wikidata":"https://www.wikidata.org/wiki/Q5172837","display_name":"Correlated double sampling","level":4,"score":0.6659702062606812},{"id":"https://openalex.org/C160633673","wikidata":"https://www.wikidata.org/wiki/Q355198","display_name":"Pixel","level":2,"score":0.5790199041366577},{"id":"https://openalex.org/C195370968","wikidata":"https://www.wikidata.org/wiki/Q1754002","display_name":"Threshold voltage","level":4,"score":0.5562145709991455},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.53465735912323},{"id":"https://openalex.org/C175291020","wikidata":"https://www.wikidata.org/wiki/Q1156822","display_name":"Offset (computer science)","level":2,"score":0.4897785186767578},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.4862474203109741},{"id":"https://openalex.org/C155512908","wikidata":"https://www.wikidata.org/wiki/Q210745","display_name":"CMOS sensor","level":3,"score":0.4485741853713989},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.44355639815330505},{"id":"https://openalex.org/C76935873","wikidata":"https://www.wikidata.org/wiki/Q209121","display_name":"Image sensor","level":2,"score":0.4316099286079407},{"id":"https://openalex.org/C20254490","wikidata":"https://www.wikidata.org/wiki/Q719550","display_name":"Biasing","level":3,"score":0.41958966851234436},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4179309010505676},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.41782882809638977},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.400293231010437},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3540460467338562},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3137410283088684},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1591123640537262},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.09434875845909119},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.07827115058898926},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.0},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iscas.2008.4542131","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas.2008.4542131","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2008 IEEE International Symposium on Circuits and Systems","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.7400000095367432}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":6,"referenced_works":["https://openalex.org/W1991567111","https://openalex.org/W2079223904","https://openalex.org/W2107985063","https://openalex.org/W2112611349","https://openalex.org/W2132293560","https://openalex.org/W2147592928"],"related_works":["https://openalex.org/W1963996011","https://openalex.org/W2331709517","https://openalex.org/W2156731538","https://openalex.org/W1990138130","https://openalex.org/W2054060211","https://openalex.org/W2108529245","https://openalex.org/W810815649","https://openalex.org/W2124575821","https://openalex.org/W2565585210","https://openalex.org/W1937830528"],"abstract_inverted_index":{"This":[0],"paper":[1],"presents":[2],"a":[3],"new":[4],"hybrid":[5],"current-programmed,":[6],"current-output":[7],"active":[8],"pixel":[9,26,55],"sensor":[10],"(APS)":[11],"suitable":[12],"for":[13,60],"real":[14],"time":[15],"x-ray":[16],"imaging":[17],"(fluoroscopy)":[18],"and":[19,65,94],"an":[20],"off-panel":[21],"CMOS":[22],"readout":[23,78],"circuit.":[24],"The":[25,40,77],"circuit":[27,56,79],"is":[28],"designed":[29],"using":[30],"hydrogenated":[31],"amorphous":[32],"silicon":[33],"(a-Si:H)":[34],"thin":[35],"film":[36],"transistor":[37],"(TFT)":[38],"technology.":[39],"simulation":[41],"results":[42],"based":[43],"on":[44,98],"the":[45,53,88,99],"measured":[46],"characteristics":[47],"of":[48],"a-Si:H":[49,70],"TFTs":[50,71],"show":[51],"that":[52],"proposed":[54],"can":[57],"successfully":[58],"compensate":[59],"characteristic":[61],"variations":[62],"(e.g.":[63],"mobility":[64],"threshold":[66],"voltage":[67,75],"shift)":[68],"in":[69],"under":[72],"prolonged":[73],"gate":[74],"stress.":[76],"exploits":[80],"correlated":[81],"double":[82],"sampling":[83],"(CDS)":[84],"technique":[85],"to":[86],"reduce":[87],"offset":[89],"current,":[90],"low":[91],"frequency":[92],"noise":[93,96],"fixed-pattern":[95],"(FPN)":[97],"array":[100],"operation.":[101]},"counts_by_year":[],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}