{"id":"https://openalex.org/W2165844520","doi":"https://doi.org/10.1109/iscas.2008.4542084","title":"A fast band matching technique for impedance extraction","display_name":"A fast band matching technique for impedance extraction","publication_year":2008,"publication_date":"2008-05-01","ids":{"openalex":"https://openalex.org/W2165844520","doi":"https://doi.org/10.1109/iscas.2008.4542084","mag":"2165844520"},"language":"en","primary_location":{"id":"doi:10.1109/iscas.2008.4542084","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas.2008.4542084","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2008 IEEE International Symposium on Circuits and Systems (ISCAS)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101535316","display_name":"Jitesh Jain","orcid":"https://orcid.org/0000-0003-0638-0633"},"institutions":[{"id":"https://openalex.org/I1343180700","display_name":"Intel (United States)","ror":"https://ror.org/01ek73717","country_code":"US","type":"company","lineage":["https://openalex.org/I1343180700"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jitesh Jain","raw_affiliation_strings":["Intel Corporation, Hillsboro, OR 97124, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Intel Corporation, Hillsboro, OR 97124, USA","institution_ids":["https://openalex.org/I1343180700"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103002350","display_name":"Hong Li","orcid":"https://orcid.org/0000-0001-6819-3038"},"institutions":[{"id":"https://openalex.org/I4210088951","display_name":"Synopsys (United States)","ror":"https://ror.org/013by2m91","country_code":"US","type":"company","lineage":["https://openalex.org/I4210088951"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Hong Li","raw_affiliation_strings":["Synopsys Inc., Mountain View, CA 94043, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Synopsys Inc., Mountain View, CA 94043, USA","institution_ids":["https://openalex.org/I4210088951"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110204557","display_name":"Cheng\u2010Kok Koh","orcid":null},"institutions":[{"id":"https://openalex.org/I219193219","display_name":"Purdue University West Lafayette","ror":"https://ror.org/02dqehb95","country_code":"US","type":"education","lineage":["https://openalex.org/I219193219"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Cheng-Kok Koh","raw_affiliation_strings":["School Of Electrical and Computer Engineering, Purdue University, West Lafayette, IN 47907-1285, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School Of Electrical and Computer Engineering, Purdue University, West Lafayette, IN 47907-1285, USA","institution_ids":["https://openalex.org/I219193219"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5022664058","display_name":"V. Balakrishnan","orcid":"https://orcid.org/0000-0001-9284-2202"},"institutions":[{"id":"https://openalex.org/I219193219","display_name":"Purdue University West Lafayette","ror":"https://ror.org/02dqehb95","country_code":"US","type":"education","lineage":["https://openalex.org/I219193219"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Venkataramanan Balakrishnan","raw_affiliation_strings":["School Of Electrical and Computer Engineering, Purdue University, West Lafayette, IN 47907-1285, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School Of Electrical and Computer Engineering, Purdue University, West Lafayette, IN 47907-1285, USA","institution_ids":["https://openalex.org/I219193219"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"2981","last_page":"2984"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10739","display_name":"Electromagnetic Scattering and Analysis","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10739","display_name":"Electromagnetic Scattering and Analysis","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10792","display_name":"Matrix Theory and Algorithms","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/1703","display_name":"Computational Theory and Mathematics"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.9986000061035156,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/matching","display_name":"Matching (statistics)","score":0.6520064473152161},{"id":"https://openalex.org/keywords/computation","display_name":"Computation","score":0.5933135747909546},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5552042126655579},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.4356895387172699},{"id":"https://openalex.org/keywords/impedance-matching","display_name":"Impedance matching","score":0.4151577055454254},{"id":"https://openalex.org/keywords/electrical-impedance","display_name":"Electrical impedance","score":0.3894188702106476},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.2306409478187561},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.12022781372070312},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.11417171359062195}],"concepts":[{"id":"https://openalex.org/C165064840","wikidata":"https://www.wikidata.org/wiki/Q1321061","display_name":"Matching (statistics)","level":2,"score":0.6520064473152161},{"id":"https://openalex.org/C45374587","wikidata":"https://www.wikidata.org/wiki/Q12525525","display_name":"Computation","level":2,"score":0.5933135747909546},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5552042126655579},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.4356895387172699},{"id":"https://openalex.org/C612350","wikidata":"https://www.wikidata.org/wiki/Q1761108","display_name":"Impedance matching","level":3,"score":0.4151577055454254},{"id":"https://openalex.org/C17829176","wikidata":"https://www.wikidata.org/wiki/Q179043","display_name":"Electrical impedance","level":2,"score":0.3894188702106476},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.2306409478187561},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.12022781372070312},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.11417171359062195},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/iscas.2008.4542084","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas.2008.4542084","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2008 IEEE International Symposium on Circuits and Systems (ISCAS)","raw_type":"proceedings-article"},{"id":"pmh:oai:CiteSeerX.psu:10.1.1.151.3993","is_oa":false,"landing_page_url":"http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.151.3993","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://dynamo.ecn.purdue.edu/~chengkok/papers/2008/impedance.pdf","raw_type":"text"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320306076","display_name":"National Science Foundation","ror":"https://ror.org/021nxhr62"},{"id":"https://openalex.org/F4320306101","display_name":"National Aeronautics and Space Administration","ror":"https://ror.org/027ka1x80"},{"id":"https://openalex.org/F4320309036","display_name":"Purdue University","ror":"https://ror.org/02dqehb95"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":26,"referenced_works":["https://openalex.org/W1516563022","https://openalex.org/W1523318296","https://openalex.org/W1594585037","https://openalex.org/W2007638909","https://openalex.org/W2038535655","https://openalex.org/W2075891646","https://openalex.org/W2079059444","https://openalex.org/W2110731077","https://openalex.org/W2128004834","https://openalex.org/W2132311203","https://openalex.org/W2132934800","https://openalex.org/W2140153041","https://openalex.org/W2154941678","https://openalex.org/W2157763958","https://openalex.org/W2164105348","https://openalex.org/W2166800872","https://openalex.org/W2724336187","https://openalex.org/W4231340762","https://openalex.org/W4238115498","https://openalex.org/W4243257095","https://openalex.org/W4245113108","https://openalex.org/W4251012772","https://openalex.org/W4255696733","https://openalex.org/W4256402224","https://openalex.org/W6630846059","https://openalex.org/W6679847984"],"related_works":["https://openalex.org/W2051487156","https://openalex.org/W2073681303","https://openalex.org/W2087608731","https://openalex.org/W2145437567","https://openalex.org/W1486956228","https://openalex.org/W4232032649","https://openalex.org/W1976570901","https://openalex.org/W1976577895","https://openalex.org/W2136855998","https://openalex.org/W2020934979"],"abstract_inverted_index":{"We":[0,42,51],"present":[1],"an":[2,53],"efficient":[3,54,75],"technique":[4,35,46,55,68],"for":[5,38,47,77],"the":[6,21,44,58],"fast":[7],"and":[8,27,74],"accurate":[9,90],"extraction":[10,49],"of":[11,13,23,40,79],"inductance":[12,48],"large-scale":[14],"on-chip":[15],"interconnects.":[16],"Several":[17],"simulation":[18],"techniques":[19],"exploit":[20],"sparsity":[22],"L\u22121for":[24],"reducing":[25],"storage":[26],"computational":[28],"costs":[29],"during":[30],"computation.":[31],"Recently,":[32],"band":[33],"matching":[34],"was":[36],"introduced":[37],"sparsification":[39],"L\u22121.":[41],"extend":[43],"band-matching":[45],"problems.":[50],"introduce":[52],"to":[56],"invert":[57],"approximate":[59],"band-matched":[60],"impedance":[61],"matrix":[62],"R\u0192":[63],"+":[64],"j\u03c9\u0303L\u0192.":[65],"The":[66],"new":[67],"relies":[69],"on":[70],"a":[71],"numerically":[72],"stable":[73],"representation":[76],"inverses":[78],"banded":[80],"matrices.":[81],"Numerical":[82],"results":[83],"show":[84],"that":[85],"our":[86],"approach":[87],"is":[88],"both":[89],"as":[91,93],"well":[92],"computationally":[94],"efficient,":[95],"with":[96],"orders-of-magnitude":[97],"improvement":[98],"over":[99],"traditional":[100],"techniques.":[101]},"counts_by_year":[],"updated_date":"2026-07-29T09:40:50.615796","created_date":"2025-10-10T00:00:00"}