{"id":"https://openalex.org/W2124330187","doi":"https://doi.org/10.1109/iscas.2008.4541786","title":"Modeling dynamic stability of SRAMS in the presence of single event upsets (SEUs)","display_name":"Modeling dynamic stability of SRAMS in the presence of single event upsets (SEUs)","publication_year":2008,"publication_date":"2008-05-01","ids":{"openalex":"https://openalex.org/W2124330187","doi":"https://doi.org/10.1109/iscas.2008.4541786","mag":"2124330187"},"language":"en","primary_location":{"id":"doi:10.1109/iscas.2008.4541786","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas.2008.4541786","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2008 IEEE International Symposium on Circuits and Systems","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5102793889","display_name":"Rajesh Garg","orcid":null},"institutions":[{"id":"https://openalex.org/I91045830","display_name":"Texas A&M University","ror":"https://ror.org/01f5ytq51","country_code":"US","type":"education","lineage":["https://openalex.org/I91045830"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Rajesh Garg","raw_affiliation_strings":["Department of Electrical & Computer Engineering, Texas A and M University, College Station, TX, USA","Dept. of Electr. & Comput. Eng, Texas A&M Univ., College Station, TX#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical & Computer Engineering, Texas A and M University, College Station, TX, USA","institution_ids":["https://openalex.org/I91045830"]},{"raw_affiliation_string":"Dept. of Electr. & Comput. Eng, Texas A&M Univ., College Station, TX#TAB#","institution_ids":["https://openalex.org/I91045830"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100432692","display_name":"Peng Li","orcid":"https://orcid.org/0000-0002-3434-6339"},"institutions":[{"id":"https://openalex.org/I91045830","display_name":"Texas A&M University","ror":"https://ror.org/01f5ytq51","country_code":"US","type":"education","lineage":["https://openalex.org/I91045830"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Peng Li","raw_affiliation_strings":["Department of Electrical & Computer Engineering, Texas A and M University, College Station, TX, USA","Dept. of Electr. & Comput. Eng, Texas A&M Univ., College Station, TX#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical & Computer Engineering, Texas A and M University, College Station, TX, USA","institution_ids":["https://openalex.org/I91045830"]},{"raw_affiliation_string":"Dept. of Electr. & Comput. Eng, Texas A&M Univ., College Station, TX#TAB#","institution_ids":["https://openalex.org/I91045830"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5021685706","display_name":"Sunil P. Khatri","orcid":"https://orcid.org/0000-0001-7134-9929"},"institutions":[{"id":"https://openalex.org/I91045830","display_name":"Texas A&M University","ror":"https://ror.org/01f5ytq51","country_code":"US","type":"education","lineage":["https://openalex.org/I91045830"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Sunil P. Khatri","raw_affiliation_strings":["Department of Electrical & Computer Engineering, Texas A and M University, College Station, TX, USA","Dept. of Electr. & Comput. Eng, Texas A&M Univ., College Station, TX#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical & Computer Engineering, Texas A and M University, College Station, TX, USA","institution_ids":["https://openalex.org/I91045830"]},{"raw_affiliation_string":"Dept. of Electr. & Comput. Eng, Texas A&M Univ., College Station, TX#TAB#","institution_ids":["https://openalex.org/I91045830"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I91045830"],"apc_list":null,"apc_paid":null,"fwci":2.3722,"has_fulltext":false,"cited_by_count":11,"citation_normalized_percentile":{"value":0.88047695,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"1788","last_page":"1791"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.9318263530731201},{"id":"https://openalex.org/keywords/stability","display_name":"Stability (learning theory)","score":0.6691180467605591},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5529159903526306},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.5182914137840271},{"id":"https://openalex.org/keywords/transient","display_name":"Transient (computer programming)","score":0.4858857989311218},{"id":"https://openalex.org/keywords/dynamic-demand","display_name":"Dynamic demand","score":0.41345125436782837},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4050278663635254},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3223218023777008},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.32025325298309326},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.26755452156066895},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.13783499598503113},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.12801101803779602}],"concepts":[{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.9318263530731201},{"id":"https://openalex.org/C112972136","wikidata":"https://www.wikidata.org/wiki/Q7595718","display_name":"Stability (learning theory)","level":2,"score":0.6691180467605591},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5529159903526306},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.5182914137840271},{"id":"https://openalex.org/C2780799671","wikidata":"https://www.wikidata.org/wiki/Q17087362","display_name":"Transient (computer programming)","level":2,"score":0.4858857989311218},{"id":"https://openalex.org/C45872418","wikidata":"https://www.wikidata.org/wiki/Q5318966","display_name":"Dynamic demand","level":3,"score":0.41345125436782837},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4050278663635254},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3223218023777008},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.32025325298309326},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.26755452156066895},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.13783499598503113},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.12801101803779602},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iscas.2008.4541786","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas.2008.4541786","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2008 IEEE International Symposium on Circuits and Systems","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":21,"referenced_works":["https://openalex.org/W1497430048","https://openalex.org/W1823013456","https://openalex.org/W1945306823","https://openalex.org/W2002612140","https://openalex.org/W2023856022","https://openalex.org/W2039996722","https://openalex.org/W2075966063","https://openalex.org/W2087114849","https://openalex.org/W2106507957","https://openalex.org/W2109694817","https://openalex.org/W2131833150","https://openalex.org/W2140687305","https://openalex.org/W2157024459","https://openalex.org/W2162827367","https://openalex.org/W2172020468","https://openalex.org/W2397682474","https://openalex.org/W3103339143","https://openalex.org/W3149105465","https://openalex.org/W4254168948","https://openalex.org/W6640706313","https://openalex.org/W6683178885"],"related_works":["https://openalex.org/W4392590355","https://openalex.org/W3151633427","https://openalex.org/W2212894501","https://openalex.org/W2793465010","https://openalex.org/W3024050170","https://openalex.org/W1976168335","https://openalex.org/W2662219006","https://openalex.org/W2519754576","https://openalex.org/W3022464115","https://openalex.org/W3092470009"],"abstract_inverted_index":{"SRAM":[0,22,29,74,124],"yield":[1],"is":[2,60,90,109],"very":[3,91],"important":[4],"from":[5],"an":[6,73,80],"economics":[7],"viewpoint,":[8],"because":[9,43],"of":[10,14,50,72,79,99,106],"the":[11,47,51,77,116,123,133],"extensive":[12],"use":[13],"memory":[15],"in":[16,40,65,76],"modern":[17],"processors":[18],"and":[19,128],"SOCs.":[20],"Therefore,":[21,53],"stability":[23,30,58,70,131],"analysis":[24,31,59,71],"tools":[25],"have":[26],"become":[27],"essential.":[28],"based":[32],"on":[33],"static":[34],"noise":[35],"margin":[36],"(SNM)":[37],"often":[38],"results":[39,85],"pessimistic":[41],"designs":[42],"SNM":[44],"cannot":[45],"capture":[46],"transient":[48],"behavior":[49],"noise.":[52],"to":[54,102,126],"improve":[55],"accuracy,":[56],"dynamic":[57,69],"required.":[61],"The":[62,83,104],"model":[63,89,108,121],"presented":[64],"this":[66],"paper":[67],"performs":[68],"cell":[75],"presence":[78],"SEU":[81],"event.":[82],"experimental":[84],"demonstrate":[86],"that":[87],"our":[88,107,120],"accurate,":[92],"with":[93],"a":[94],"critical":[95],"charge":[96],"estimation":[97],"error":[98],"2.5%":[100],"compared":[101],"HSPICE.":[103],"run-time":[105],"also":[110],"significantly":[111],"lower":[112],"(1200\u00d7":[113],"lower)":[114],"than":[115],"HSPICE":[117],"run-time.":[118],"Thus,":[119],"enables":[122],"designer":[125],"quickly":[127],"accurately":[129],"analyze":[130],"during":[132],"design":[134],"phase.":[135]},"counts_by_year":[{"year":2019,"cited_by_count":1},{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":2},{"year":2013,"cited_by_count":1},{"year":2012,"cited_by_count":1}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}