{"id":"https://openalex.org/W2098545112","doi":"https://doi.org/10.1109/iscas.2008.4541614","title":"A Low noise CMOS image sensor with an emission filter for fluorescence applications","display_name":"A Low noise CMOS image sensor with an emission filter for fluorescence applications","publication_year":2008,"publication_date":"2008-05-01","ids":{"openalex":"https://openalex.org/W2098545112","doi":"https://doi.org/10.1109/iscas.2008.4541614","mag":"2098545112"},"language":"en","primary_location":{"id":"doi:10.1109/iscas.2008.4541614","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas.2008.4541614","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2008 IEEE International Symposium on Circuits and Systems (ISCAS)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5011529784","display_name":"Marianna Beiderman","orcid":"https://orcid.org/0000-0003-0110-121X"},"institutions":[{"id":"https://openalex.org/I168635309","display_name":"University of Calgary","ror":"https://ror.org/03yjb2x39","country_code":"CA","type":"education","lineage":["https://openalex.org/I168635309"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"Marianna Beiderman","raw_affiliation_strings":["Dept of Electrical and Computer Engineering, University of Calgary, Alberta, Canada","Department of Electrical and Computer Engineering, University of Calgary, AB, Canada"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Dept of Electrical and Computer Engineering, University of Calgary, Alberta, Canada","institution_ids":["https://openalex.org/I168635309"]},{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Calgary, AB, Canada","institution_ids":["https://openalex.org/I168635309"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109213455","display_name":"Terence Tam","orcid":null},"institutions":[{"id":"https://openalex.org/I168635309","display_name":"University of Calgary","ror":"https://ror.org/03yjb2x39","country_code":"CA","type":"education","lineage":["https://openalex.org/I168635309"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"Terence Tam","raw_affiliation_strings":["Dept of Electrical and Computer Engineering, University of Calgary, Alberta, Canada","Department of Electrical and Computer Engineering, University of Calgary, AB, Canada"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Dept of Electrical and Computer Engineering, University of Calgary, Alberta, Canada","institution_ids":["https://openalex.org/I168635309"]},{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Calgary, AB, Canada","institution_ids":["https://openalex.org/I168635309"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5065902823","display_name":"Alexander Fish","orcid":"https://orcid.org/0000-0002-4994-1536"},"institutions":[{"id":"https://openalex.org/I168635309","display_name":"University of Calgary","ror":"https://ror.org/03yjb2x39","country_code":"CA","type":"education","lineage":["https://openalex.org/I168635309"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"Alexander Fish","raw_affiliation_strings":["Dept of Electrical and Computer Engineering, University of Calgary, Alberta, Canada","Department of Electrical and Computer Engineering, University of Calgary, AB, Canada"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Dept of Electrical and Computer Engineering, University of Calgary, Alberta, Canada","institution_ids":["https://openalex.org/I168635309"]},{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Calgary, AB, Canada","institution_ids":["https://openalex.org/I168635309"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5007393900","display_name":"G.A. Jullien","orcid":"https://orcid.org/0009-0009-0911-2926"},"institutions":[{"id":"https://openalex.org/I168635309","display_name":"University of Calgary","ror":"https://ror.org/03yjb2x39","country_code":"CA","type":"education","lineage":["https://openalex.org/I168635309"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"Graham. A. Jullien","raw_affiliation_strings":["Dept of Electrical and Computer Engineering, University of Calgary, Alberta, Canada","Department of Electrical and Computer Engineering, University of Calgary, AB, Canada"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Dept of Electrical and Computer Engineering, University of Calgary, Alberta, Canada","institution_ids":["https://openalex.org/I168635309"]},{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Calgary, AB, Canada","institution_ids":["https://openalex.org/I168635309"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5108639797","display_name":"Orly Yadid-Pecht","orcid":null},"institutions":[{"id":"https://openalex.org/I124227911","display_name":"Ben-Gurion University of the Negev","ror":"https://ror.org/05tkyf982","country_code":"IL","type":"education","lineage":["https://openalex.org/I124227911"]},{"id":"https://openalex.org/I168635309","display_name":"University of Calgary","ror":"https://ror.org/03yjb2x39","country_code":"CA","type":"education","lineage":["https://openalex.org/I168635309"]}],"countries":["CA","IL"],"is_corresponding":false,"raw_author_name":"Orly Yadid-Pecht","raw_affiliation_strings":["Dept of Electrical and Computer Engineering, University of Calgary, Alberta, Canada","Department of Electrical and Computer Engineering, University of Calgary, AB, Canada","The VLSI Systems Center, Ben-Gurion University of the Negev, Beersheba, Israel"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Dept of Electrical and Computer Engineering, University of Calgary, Alberta, Canada","institution_ids":["https://openalex.org/I168635309"]},{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Calgary, AB, Canada","institution_ids":["https://openalex.org/I168635309"]},{"raw_affiliation_string":"The VLSI Systems Center, Ben-Gurion University of the Negev, Beersheba, Israel","institution_ids":["https://openalex.org/I124227911"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1100","last_page":"1103"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11472","display_name":"Analytical Chemistry and Sensors","score":0.9965000152587891,"subfield":{"id":"https://openalex.org/subfields/1502","display_name":"Bioengineering"},"field":{"id":"https://openalex.org/fields/15","display_name":"Chemical Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10623","display_name":"Thin-Film Transistor Technologies","score":0.9937999844551086,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.6725978255271912},{"id":"https://openalex.org/keywords/filter","display_name":"Filter (signal processing)","score":0.6353050470352173},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.5598574280738831},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.5462294816970825},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.5406062602996826},{"id":"https://openalex.org/keywords/image-sensor","display_name":"Image sensor","score":0.5397030711174011},{"id":"https://openalex.org/keywords/optical-filter","display_name":"Optical filter","score":0.4770887792110443},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.3386480510234833},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.1814945936203003},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.15911352634429932},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.15348201990127563},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.10125967860221863},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.08523103594779968}],"concepts":[{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.6725978255271912},{"id":"https://openalex.org/C106131492","wikidata":"https://www.wikidata.org/wiki/Q3072260","display_name":"Filter (signal processing)","level":2,"score":0.6353050470352173},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.5598574280738831},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.5462294816970825},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.5406062602996826},{"id":"https://openalex.org/C76935873","wikidata":"https://www.wikidata.org/wiki/Q209121","display_name":"Image sensor","level":2,"score":0.5397030711174011},{"id":"https://openalex.org/C45613198","wikidata":"https://www.wikidata.org/wiki/Q1134091","display_name":"Optical filter","level":2,"score":0.4770887792110443},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.3386480510234833},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.1814945936203003},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.15911352634429932},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.15348201990127563},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.10125967860221863},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.08523103594779968},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iscas.2008.4541614","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas.2008.4541614","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2008 IEEE International Symposium on Circuits and Systems (ISCAS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9","score":0.44999998807907104}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":15,"referenced_works":["https://openalex.org/W110547204","https://openalex.org/W1558634733","https://openalex.org/W1975921377","https://openalex.org/W2008760422","https://openalex.org/W2017865355","https://openalex.org/W2053822256","https://openalex.org/W2063736128","https://openalex.org/W2084121057","https://openalex.org/W2117435310","https://openalex.org/W2119745832","https://openalex.org/W2120250680","https://openalex.org/W2138485117","https://openalex.org/W2146825720","https://openalex.org/W2155382019","https://openalex.org/W4240199760"],"related_works":["https://openalex.org/W2349576212","https://openalex.org/W1981776476","https://openalex.org/W2352535872","https://openalex.org/W1590693222","https://openalex.org/W2382967348","https://openalex.org/W2334823507","https://openalex.org/W2107073676","https://openalex.org/W2565551736","https://openalex.org/W2542675020","https://openalex.org/W2093855153"],"abstract_inverted_index":{"This":[0],"paper":[1],"presents":[2],"a":[3],"128x128":[4],"low":[5],"noise":[6,26],"CMOS":[7,22],"image":[8],"sensor":[9,40],"with":[10,94],"emission":[11,45,79],"filter":[12,46,68],"for":[13,71],"fluorescence":[14],"detection.":[15],"The":[16,44,66],"imager,":[17],"fabricated":[18,48,96],"in":[19,60],"0.18":[20],"mum":[21],"technology,":[23],"provides":[24],"low-":[25],"operation":[27],"by":[28],"employing":[29],"both":[30],"the":[31,37,61,95,103],"active":[32,38],"reset":[33],"(AR)":[34],"technique":[35],"and":[36,51,58,78,82,90],"column":[39],"(ACS)":[41],"readout":[42],"method.":[43],"was":[47],"using":[49,105],"PDMS":[50],"Sudan":[52],"II":[53],"Blue":[54],"dye":[55],"mixed,":[56],"spin-coated":[57],"deposited":[59],"class":[62],"1000":[63],"clean":[64],"room.":[65],"designed":[67],"is":[69],"suitable":[70],"excitation":[72],"at":[73,80],"wavelengths":[74],"below":[75],"340":[76],"nm":[77],"450nm":[81],"above.":[83],"Filter":[84],"properties,":[85],"such":[86],"as":[87],"thickness,":[88],"transmission":[89],"efficiency":[91],"of":[92,102],"utilization":[93],"imager":[97],"are":[98,107],"discussed.":[99],"Preliminary":[100],"measurements":[101],"system":[104],"microbeads":[106],"also":[108],"presented.":[109]},"counts_by_year":[],"updated_date":"2026-07-28T07:46:37.118299","created_date":"2025-10-10T00:00:00"}