{"id":"https://openalex.org/W2166969024","doi":"https://doi.org/10.1109/iscas.2008.4541596","title":"Image sensor with focal plane polarization sensitivity","display_name":"Image sensor with focal plane polarization sensitivity","publication_year":2008,"publication_date":"2008-05-01","ids":{"openalex":"https://openalex.org/W2166969024","doi":"https://doi.org/10.1109/iscas.2008.4541596","mag":"2166969024"},"language":"en","primary_location":{"id":"doi:10.1109/iscas.2008.4541596","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas.2008.4541596","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2008 IEEE International Symposium on Circuits and Systems (ISCAS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5036171336","display_name":"Viktor Gruev","orcid":"https://orcid.org/0000-0003-1280-7971"},"institutions":[{"id":"https://openalex.org/I79576946","display_name":"University of Pennsylvania","ror":"https://ror.org/00b30xv10","country_code":"US","type":"education","lineage":["https://openalex.org/I79576946"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Viktor Gruev","raw_affiliation_strings":["Electrical and Systems Engineering Department, University of Pennsylvania, Philadelphia, USA","Electrical and Systems Engineering Department, University of Pennsylvania, Philadelphia, PA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electrical and Systems Engineering Department, University of Pennsylvania, Philadelphia, USA","institution_ids":["https://openalex.org/I79576946"]},{"raw_affiliation_string":"Electrical and Systems Engineering Department, University of Pennsylvania, Philadelphia, PA, USA","institution_ids":["https://openalex.org/I79576946"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5040819167","display_name":"Jan Van der Spiegel","orcid":"https://orcid.org/0000-0002-6070-0717"},"institutions":[{"id":"https://openalex.org/I79576946","display_name":"University of Pennsylvania","ror":"https://ror.org/00b30xv10","country_code":"US","type":"education","lineage":["https://openalex.org/I79576946"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jan Van der Spiegel","raw_affiliation_strings":["Electrical and Systems Engineering Department, University of Pennsylvania, Philadelphia, USA","Electrical and Systems Engineering Department, University of Pennsylvania, Philadelphia, PA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electrical and Systems Engineering Department, University of Pennsylvania, Philadelphia, USA","institution_ids":["https://openalex.org/I79576946"]},{"raw_affiliation_string":"Electrical and Systems Engineering Department, University of Pennsylvania, Philadelphia, PA, USA","institution_ids":["https://openalex.org/I79576946"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5022669149","display_name":"Nader Engheta","orcid":"https://orcid.org/0000-0003-3219-9520"},"institutions":[{"id":"https://openalex.org/I79576946","display_name":"University of Pennsylvania","ror":"https://ror.org/00b30xv10","country_code":"US","type":"education","lineage":["https://openalex.org/I79576946"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Nader Engheta","raw_affiliation_strings":["Electrical and Systems Engineering Department, University of Pennsylvania, Philadelphia, USA","Electrical and Systems Engineering Department, University of Pennsylvania, Philadelphia, PA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electrical and Systems Engineering Department, University of Pennsylvania, Philadelphia, USA","institution_ids":["https://openalex.org/I79576946"]},{"raw_affiliation_string":"Electrical and Systems Engineering Department, University of Pennsylvania, Philadelphia, PA, USA","institution_ids":["https://openalex.org/I79576946"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":2.7134,"has_fulltext":false,"cited_by_count":19,"citation_normalized_percentile":{"value":0.90537556,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"1028","last_page":"1031"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12050","display_name":"Optical Polarization and Ellipsometry","score":0.9976999759674072,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12389","display_name":"Infrared Target Detection Methodologies","score":0.9965999722480774,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/pixel","display_name":"Pixel","score":0.7281544208526611},{"id":"https://openalex.org/keywords/polarization","display_name":"Polarization (electrochemistry)","score":0.723517656326294},{"id":"https://openalex.org/keywords/polarimetry","display_name":"Polarimetry","score":0.722252368927002},{"id":"https://openalex.org/keywords/image-sensor","display_name":"Image sensor","score":0.700950562953949},{"id":"https://openalex.org/keywords/cardinal-point","display_name":"Cardinal point","score":0.6510197520256042},{"id":"https://openalex.org/keywords/stokes-parameters","display_name":"Stokes parameters","score":0.6151849031448364},{"id":"https://openalex.org/keywords/microfabrication","display_name":"Microfabrication","score":0.5962274074554443},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.5109955072402954},{"id":"https://openalex.org/keywords/polarizing-filter","display_name":"Polarizing filter","score":0.4598601162433624},{"id":"https://openalex.org/keywords/image-plane","display_name":"Image plane","score":0.4588393270969391},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.4344406723976135},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3677278161048889},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.34072208404541016},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.3373502194881439},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.2807307839393616},{"id":"https://openalex.org/keywords/optical-filter","display_name":"Optical filter","score":0.2421090006828308},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.17087236046791077}],"concepts":[{"id":"https://openalex.org/C160633673","wikidata":"https://www.wikidata.org/wiki/Q355198","display_name":"Pixel","level":2,"score":0.7281544208526611},{"id":"https://openalex.org/C205049153","wikidata":"https://www.wikidata.org/wiki/Q2698605","display_name":"Polarization (electrochemistry)","level":2,"score":0.723517656326294},{"id":"https://openalex.org/C28493345","wikidata":"https://www.wikidata.org/wiki/Q899381","display_name":"Polarimetry","level":3,"score":0.722252368927002},{"id":"https://openalex.org/C76935873","wikidata":"https://www.wikidata.org/wiki/Q209121","display_name":"Image sensor","level":2,"score":0.700950562953949},{"id":"https://openalex.org/C138395690","wikidata":"https://www.wikidata.org/wiki/Q376733","display_name":"Cardinal point","level":2,"score":0.6510197520256042},{"id":"https://openalex.org/C188141570","wikidata":"https://www.wikidata.org/wiki/Q1192058","display_name":"Stokes parameters","level":3,"score":0.6151849031448364},{"id":"https://openalex.org/C527607","wikidata":"https://www.wikidata.org/wiki/Q175538","display_name":"Microfabrication","level":4,"score":0.5962274074554443},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.5109955072402954},{"id":"https://openalex.org/C14860423","wikidata":"https://www.wikidata.org/wiki/Q868354","display_name":"Polarizing filter","level":3,"score":0.4598601162433624},{"id":"https://openalex.org/C120515352","wikidata":"https://www.wikidata.org/wiki/Q2564580","display_name":"Image plane","level":3,"score":0.4588393270969391},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.4344406723976135},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3677278161048889},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.34072208404541016},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.3373502194881439},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.2807307839393616},{"id":"https://openalex.org/C45613198","wikidata":"https://www.wikidata.org/wiki/Q1134091","display_name":"Optical filter","level":2,"score":0.2421090006828308},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.17087236046791077},{"id":"https://openalex.org/C147789679","wikidata":"https://www.wikidata.org/wiki/Q11372","display_name":"Physical chemistry","level":1,"score":0.0},{"id":"https://openalex.org/C136525101","wikidata":"https://www.wikidata.org/wiki/Q5428139","display_name":"Fabrication","level":3,"score":0.0},{"id":"https://openalex.org/C191486275","wikidata":"https://www.wikidata.org/wiki/Q210028","display_name":"Scattering","level":2,"score":0.0},{"id":"https://openalex.org/C204787440","wikidata":"https://www.wikidata.org/wiki/Q188504","display_name":"Alternative medicine","level":2,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C71924100","wikidata":"https://www.wikidata.org/wiki/Q11190","display_name":"Medicine","level":0,"score":0.0},{"id":"https://openalex.org/C142724271","wikidata":"https://www.wikidata.org/wiki/Q7208","display_name":"Pathology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iscas.2008.4541596","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas.2008.4541596","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2008 IEEE International Symposium on Circuits and Systems (ISCAS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.7400000095367432,"display_name":"Reduced inequalities","id":"https://metadata.un.org/sdg/10"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":7,"referenced_works":["https://openalex.org/W2011765331","https://openalex.org/W2070269852","https://openalex.org/W2100396334","https://openalex.org/W2131417626","https://openalex.org/W2140253811","https://openalex.org/W2499898469","https://openalex.org/W2566161284"],"related_works":["https://openalex.org/W2081033496","https://openalex.org/W2389986430","https://openalex.org/W2375155165","https://openalex.org/W4292197645","https://openalex.org/W2137488636","https://openalex.org/W2024268519","https://openalex.org/W2076215981","https://openalex.org/W2159788906","https://openalex.org/W2616028510","https://openalex.org/W1559344277"],"abstract_inverted_index":{"A":[0,68],"novel":[1],"low":[2],"power":[3],"polarization":[4,15,44,73],"image":[5,10,20,74],"sensor":[6,11,21,75],"is":[7,46,56],"presented.":[8],"This":[9],"synergistically":[12],"combines":[13],"polymer":[14,43],"filters":[16,45],"with":[17],"a":[18],"CMOS":[19],"in":[22,48,50],"order":[23],"to":[24,79],"compute":[25],"the":[26,32,41,71],"first":[27],"three":[28],"Stokes":[29],"parameters":[30],"at":[31,66],"focal":[33],"plane.":[34],"The":[35,53],"carefully":[36],"optimized":[37],"microfabrication":[38],"procedure":[39],"for":[40],"pixel-pitch":[42],"described":[47],"detail":[49],"this":[51],"paper.":[52],"imaging":[54],"array":[55],"composed":[57],"of":[58,70,83],"60":[59],"by":[60],"20":[61],"pixels":[62],"and":[63],"consumes":[64],"15mW":[65],"30fps.":[67],"demo":[69],"completed":[72],"will":[76],"be":[77,87],"given":[78],"illustrate":[80],"how":[81],"objects":[82],"similar":[84],"luminescence":[85],"can":[86],"discriminated":[88],"based":[89],"on":[90],"their":[91],"polarimetric":[92],"properties.":[93]},"counts_by_year":[{"year":2024,"cited_by_count":2},{"year":2021,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":2},{"year":2016,"cited_by_count":1},{"year":2014,"cited_by_count":2},{"year":2012,"cited_by_count":2}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}
