{"id":"https://openalex.org/W2138118082","doi":"https://doi.org/10.1109/iscas.2008.4541546","title":"Device degradation and resilient computing","display_name":"Device degradation and resilient computing","publication_year":2008,"publication_date":"2008-05-01","ids":{"openalex":"https://openalex.org/W2138118082","doi":"https://doi.org/10.1109/iscas.2008.4541546","mag":"2138118082"},"language":"en","primary_location":{"id":"doi:10.1109/iscas.2008.4541546","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas.2008.4541546","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2008 IEEE International Symposium on Circuits and Systems (ISCAS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"http://hdl.handle.net/10183/30284","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5109234958","display_name":"Peter Gl\u00f6sek\u00f6tter","orcid":null},"institutions":[{"id":"https://openalex.org/I63274643","display_name":"FH M\u00fcnster","ror":"https://ror.org/00pv45a02","country_code":"DE","type":"education","lineage":["https://openalex.org/I63274643"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Peter Glosekotter","raw_affiliation_strings":["University of Applied Sciences, Munster, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Applied Sciences, Munster, Germany","institution_ids":["https://openalex.org/I63274643"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5068163784","display_name":"Ulrich Greveler","orcid":null},"institutions":[{"id":"https://openalex.org/I63274643","display_name":"FH M\u00fcnster","ror":"https://ror.org/00pv45a02","country_code":"DE","type":"education","lineage":["https://openalex.org/I63274643"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Ulrich Greveler","raw_affiliation_strings":["University of Applied Sciences, Munster, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Applied Sciences, Munster, Germany","institution_ids":["https://openalex.org/I63274643"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5022015482","display_name":"Gilson Wirth","orcid":"https://orcid.org/0000-0002-4990-5113"},"institutions":[{"id":"https://openalex.org/I130442723","display_name":"Universidade Federal do Rio Grande do Sul","ror":"https://ror.org/041yk2d64","country_code":"BR","type":"education","lineage":["https://openalex.org/I130442723"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"Gilson I. Wirth","raw_affiliation_strings":["Univ. Federal do Rio Grande do Sul, UFRGS, Porto Alegre, Brazil"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Univ. Federal do Rio Grande do Sul, UFRGS, Porto Alegre, Brazil","institution_ids":["https://openalex.org/I130442723"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.15407061,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"828","last_page":"831"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9983000159263611,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7628856897354126},{"id":"https://openalex.org/keywords/degradation","display_name":"Degradation (telecommunications)","score":0.704477071762085},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6009975075721741},{"id":"https://openalex.org/keywords/microarchitecture","display_name":"Microarchitecture","score":0.5464197993278503},{"id":"https://openalex.org/keywords/acceleration","display_name":"Acceleration","score":0.52708899974823},{"id":"https://openalex.org/keywords/duty-cycle","display_name":"Duty cycle","score":0.48959881067276},{"id":"https://openalex.org/keywords/sampling","display_name":"Sampling (signal processing)","score":0.46805471181869507},{"id":"https://openalex.org/keywords/node","display_name":"Node (physics)","score":0.46595579385757446},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.4282170534133911},{"id":"https://openalex.org/keywords/distributed-computing","display_name":"Distributed computing","score":0.34759485721588135},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.3014574646949768},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.15253698825836182},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.13944533467292786},{"id":"https://openalex.org/keywords/detector","display_name":"Detector","score":0.11394786834716797},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.097259521484375}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7628856897354126},{"id":"https://openalex.org/C2779679103","wikidata":"https://www.wikidata.org/wiki/Q5251805","display_name":"Degradation (telecommunications)","level":2,"score":0.704477071762085},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6009975075721741},{"id":"https://openalex.org/C107598950","wikidata":"https://www.wikidata.org/wiki/Q259864","display_name":"Microarchitecture","level":2,"score":0.5464197993278503},{"id":"https://openalex.org/C117896860","wikidata":"https://www.wikidata.org/wiki/Q11376","display_name":"Acceleration","level":2,"score":0.52708899974823},{"id":"https://openalex.org/C199822604","wikidata":"https://www.wikidata.org/wiki/Q557120","display_name":"Duty cycle","level":3,"score":0.48959881067276},{"id":"https://openalex.org/C140779682","wikidata":"https://www.wikidata.org/wiki/Q210868","display_name":"Sampling (signal processing)","level":3,"score":0.46805471181869507},{"id":"https://openalex.org/C62611344","wikidata":"https://www.wikidata.org/wiki/Q1062658","display_name":"Node (physics)","level":2,"score":0.46595579385757446},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.4282170534133911},{"id":"https://openalex.org/C120314980","wikidata":"https://www.wikidata.org/wiki/Q180634","display_name":"Distributed computing","level":1,"score":0.34759485721588135},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.3014574646949768},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.15253698825836182},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.13944533467292786},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.11394786834716797},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.097259521484375},{"id":"https://openalex.org/C66938386","wikidata":"https://www.wikidata.org/wiki/Q633538","display_name":"Structural engineering","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C74650414","wikidata":"https://www.wikidata.org/wiki/Q11397","display_name":"Classical mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/iscas.2008.4541546","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas.2008.4541546","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2008 IEEE International Symposium on Circuits and Systems (ISCAS)","raw_type":"proceedings-article"},{"id":"pmh:oai:lume.ufrgs.br:10183/30284","is_oa":true,"landing_page_url":"http://hdl.handle.net/10183/30284","pdf_url":null,"source":{"id":"https://openalex.org/S4306401468","display_name":"Lume (Universidade Federal do Rio Grande do Sul)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I4210097146","host_organization_name":"Hospital de Cl\u00ednicas de Porto Alegre","host_organization_lineage":["https://openalex.org/I4210097146"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"Trabalho completo publicado em evento"}],"best_oa_location":{"id":"pmh:oai:lume.ufrgs.br:10183/30284","is_oa":true,"landing_page_url":"http://hdl.handle.net/10183/30284","pdf_url":null,"source":{"id":"https://openalex.org/S4306401468","display_name":"Lume (Universidade Federal do Rio Grande do Sul)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I4210097146","host_organization_name":"Hospital de Cl\u00ednicas de Porto Alegre","host_organization_lineage":["https://openalex.org/I4210097146"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"Trabalho completo publicado em evento"},"sustainable_development_goals":[{"score":0.5299999713897705,"display_name":"Responsible consumption and production","id":"https://metadata.un.org/sdg/12"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":16,"referenced_works":["https://openalex.org/W2006223428","https://openalex.org/W2035720033","https://openalex.org/W2085338706","https://openalex.org/W2098695358","https://openalex.org/W2101780399","https://openalex.org/W2122507955","https://openalex.org/W2122757690","https://openalex.org/W2134111163","https://openalex.org/W2134841353","https://openalex.org/W2142290027","https://openalex.org/W2142381056","https://openalex.org/W2142908374","https://openalex.org/W2166632225","https://openalex.org/W2543567411","https://openalex.org/W3147685595","https://openalex.org/W6671763742"],"related_works":["https://openalex.org/W2005635288","https://openalex.org/W1592982659","https://openalex.org/W2138574009","https://openalex.org/W2534461193","https://openalex.org/W2900105712","https://openalex.org/W2909374716","https://openalex.org/W4389500485","https://openalex.org/W4385507351","https://openalex.org/W881306924","https://openalex.org/W2009873484"],"abstract_inverted_index":{"In":[0],"this":[1,89],"paper,":[2],"we":[3],"study":[4],"the":[5,32,36,59],"impact":[6,19],"of":[7,35,41,53,88,91],"recent":[8],"scaling":[9],"trends":[10],"on":[11,20],"device":[12],"degradation":[13,34,92],"effects":[14],"as":[15,17,107],"well":[16],"their":[18,115],"microarchitecture.":[21],"A":[22],"new":[23],"binning":[24],"strategy":[25],"is":[26,45,61,73],"proposed":[27],"that":[28,71],"takes":[29],"into":[30],"account":[31],"individual":[33],"processing":[37,43,80],"nodes.":[38],"The":[39],"vitality":[40],"each":[42],"node":[44],"derived":[46],"from":[47],"its":[48],"duty-":[49],"cycle.":[50],"By":[51],"means":[52],"random":[54],"sampling":[55,85],"and":[56,66,102,117],"statistical":[57],"analysis,":[58],"duty-cycle":[60],"captured":[62],"in":[63],"a":[64,83],"resource":[65],"time":[67],"efficient":[68],"way":[69],"so":[70],"it":[72],"feasible":[74],"to":[75,114],"observe":[76],"more":[77],"than":[78],"100":[79],"nodes":[81],"with":[82],"single":[84],"unit.":[86],"Applications":[87],"kind":[90],"handling":[93],"can":[94],"primarily":[95],"be":[96,110],"found":[97],"where":[98],"conventional":[99],"reliability":[100],"verification":[101],"life-test":[103],"acceleration":[104],"techniques":[105],"such":[106],"burn-in":[108],"cannot":[109],"used":[111],"anymore":[112],"due":[113],"complexity":[116],"inherent":[118],"constraints.":[119]},"counts_by_year":[],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}