{"id":"https://openalex.org/W2097818622","doi":"https://doi.org/10.1109/iscas.2006.1693334","title":"A Universal Common-Source and Common-Drain Model for 1-20GHz Frequency Range","display_name":"A Universal Common-Source and Common-Drain Model for 1-20GHz Frequency Range","publication_year":2006,"publication_date":"2006-09-22","ids":{"openalex":"https://openalex.org/W2097818622","doi":"https://doi.org/10.1109/iscas.2006.1693334","mag":"2097818622"},"language":"en","primary_location":{"id":"doi:10.1109/iscas.2006.1693334","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas.2006.1693334","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2006 IEEE International Symposium on Circuits and Systems","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5065161750","display_name":"S. Sridharan","orcid":null},"institutions":[{"id":"https://openalex.org/I155173764","display_name":"Rochester Institute of Technology","ror":"https://ror.org/00v4yb702","country_code":"US","type":"education","lineage":["https://openalex.org/I155173764"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"S. Sridharan","raw_affiliation_strings":["Rochester Institute of Technology, Rochester, NY, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Rochester Institute of Technology, Rochester, NY, USA","institution_ids":["https://openalex.org/I155173764"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5036009499","display_name":"Sirisha Bandi","orcid":"https://orcid.org/0000-0002-7542-9480"},"institutions":[{"id":"https://openalex.org/I155173764","display_name":"Rochester Institute of Technology","ror":"https://ror.org/00v4yb702","country_code":"US","type":"education","lineage":["https://openalex.org/I155173764"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"S.R. Bandi","raw_affiliation_strings":["Rochester Institute of Technology, Rochester, NY, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Rochester Institute of Technology, Rochester, NY, USA","institution_ids":["https://openalex.org/I155173764"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5043516864","display_name":"C. Washburn","orcid":null},"institutions":[{"id":"https://openalex.org/I155173764","display_name":"Rochester Institute of Technology","ror":"https://ror.org/00v4yb702","country_code":"US","type":"education","lineage":["https://openalex.org/I155173764"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"C. Washburn","raw_affiliation_strings":["Rochester Institute of Technology, Rochester, NY, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Rochester Institute of Technology, Rochester, NY, USA","institution_ids":["https://openalex.org/I155173764"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109235988","display_name":"P.R. Mukund","orcid":null},"institutions":[{"id":"https://openalex.org/I155173764","display_name":"Rochester Institute of Technology","ror":"https://ror.org/00v4yb702","country_code":"US","type":"education","lineage":["https://openalex.org/I155173764"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"P.R. Mukund","raw_affiliation_strings":["Rochester Institute of Technology, Rochester, NY, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Rochester Institute of Technology, Rochester, NY, USA","institution_ids":["https://openalex.org/I155173764"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5023021851","display_name":"J. Koln\u00edk","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"J. Kolnik","raw_affiliation_strings":["LSI Logic Corporation, Fort Collins, CO, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"LSI Logic Corporation, Fort Collins, CO, USA","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5045531358","display_name":"Ken Paradis","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"K. Paradis","raw_affiliation_strings":["LSI Logic Corporation, Fort Collins, CO, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"LSI Logic Corporation, Fort Collins, CO, USA","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111248004","display_name":"S. Howard","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"S. Howard","raw_affiliation_strings":["LSI Logic Corporation, Fort Collins, CO, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"LSI Logic Corporation, Fort Collins, CO, USA","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5058095368","display_name":"Jeff Burleson","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"J. Burleson","raw_affiliation_strings":["LSI Logic Corporation, Fort Collins, CO, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"LSI Logic Corporation, Fort Collins, CO, USA","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.0453,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.72834465,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"3313","last_page":"3316"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.994700014591217,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11527","display_name":"3D IC and TSV technologies","score":0.994700014591217,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electrical-impedance","display_name":"Electrical impedance","score":0.6600242853164673},{"id":"https://openalex.org/keywords/equivalent-circuit","display_name":"Equivalent circuit","score":0.5996749401092529},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5687325596809387},{"id":"https://openalex.org/keywords/range","display_name":"Range (aeronautics)","score":0.5677508115768433},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4106196463108063},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3758724629878998},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3622191548347473},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.09730833768844604}],"concepts":[{"id":"https://openalex.org/C17829176","wikidata":"https://www.wikidata.org/wiki/Q179043","display_name":"Electrical impedance","level":2,"score":0.6600242853164673},{"id":"https://openalex.org/C23572009","wikidata":"https://www.wikidata.org/wiki/Q964981","display_name":"Equivalent circuit","level":3,"score":0.5996749401092529},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5687325596809387},{"id":"https://openalex.org/C204323151","wikidata":"https://www.wikidata.org/wiki/Q905424","display_name":"Range (aeronautics)","level":2,"score":0.5677508115768433},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4106196463108063},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3758724629878998},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3622191548347473},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.09730833768844604},{"id":"https://openalex.org/C146978453","wikidata":"https://www.wikidata.org/wiki/Q3798668","display_name":"Aerospace engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iscas.2006.1693334","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas.2006.1693334","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2006 IEEE International Symposium on Circuits and Systems","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.4300000071525574}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":4,"referenced_works":["https://openalex.org/W2028701445","https://openalex.org/W2097284200","https://openalex.org/W2140426038","https://openalex.org/W2547318423"],"related_works":["https://openalex.org/W2748952813","https://openalex.org/W2542439796","https://openalex.org/W2356048238","https://openalex.org/W2128309414","https://openalex.org/W4224288062","https://openalex.org/W2040841734","https://openalex.org/W3128753656","https://openalex.org/W2117283676","https://openalex.org/W3202183310","https://openalex.org/W2393144863"],"abstract_inverted_index":{"Extraction":[0],"plays":[1],"an":[2],"important":[3],"role":[4],"in":[5,12,46,49,57,88,110],"the":[6,13,37,61,67,70,83,89,96,105,117,165],"performance":[7,106],"of":[8,60,69,85,92,107],"device":[9,31,77,109],"models":[10,34,71,97,153],"especially":[11],"high":[14],"frequency":[15,90],"regime.":[16],"The":[17,33,137,152],"present":[18],"day":[19],"extraction":[20],"techniques":[21],"mostly":[22],"use":[23],"a":[24,50,108,120],"grounded":[25,38],"source":[26,29,39],"or":[27],"common":[28,111],"(CS)":[30],"configuration.":[32,114],"extracted":[35,72,98],"from":[36,99],"devices":[40,45],"are":[41,158],"then":[42,142],"used":[43],"for":[44,75,127,133,146,154],"other":[47,76],"configurations":[48,132],"circuit":[51,62],"application.":[52],"This":[53,64],"leads":[54],"to":[55,144],"discrepancies":[56],"accurate":[58],"prediction":[59],"performance.":[63],"work":[65],"investigates,":[66],"applicability":[68],"using":[73,160],"CS":[74,100,129,148],"configurations.":[78,151],"It":[79],"was":[80,135,141],"shown":[81],"with":[82,164],"help":[84],"measured":[86,166],"data,":[87],"range":[91],"1-20":[93],"GHz,":[94],"that":[95,125],"configuration":[101],"do":[102],"not":[103],"predict":[104],"drain":[112],"(CD)":[113],"Based":[115],"on":[116],"above":[118],"observation,":[119],"universal":[121],"gate":[122,138],"impedance":[123,139],"model":[124,140],"works":[126],"both":[128,147],"and":[130,149,156,162],"CD":[131,150],"BSIM3v3":[134,155],"developed.":[136],"extended":[143],"BSIM4":[145,157],"verified":[159],"simulations":[161],"compared":[163],"data.":[167]},"counts_by_year":[],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}