{"id":"https://openalex.org/W1610153840","doi":"https://doi.org/10.1109/iscas.2006.1692710","title":"Sub-faults identification for collapsing in diagnosis","display_name":"Sub-faults identification for collapsing in diagnosis","publication_year":2006,"publication_date":"2006-09-22","ids":{"openalex":"https://openalex.org/W1610153840","doi":"https://doi.org/10.1109/iscas.2006.1692710","mag":"1610153840"},"language":"en","primary_location":{"id":"doi:10.1109/iscas.2006.1692710","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas.2006.1692710","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2006 IEEE International Symposium on Circuits and Systems","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5053924751","display_name":"Rajsekhar Adapa","orcid":null},"institutions":[{"id":"https://openalex.org/I110378019","display_name":"Southern Illinois University Carbondale","ror":"https://ror.org/049kefs16","country_code":"US","type":"education","lineage":["https://openalex.org/I110378019","https://openalex.org/I2801502357"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"R. Adapa","raw_affiliation_strings":["Department of ECE, Southem Illinois University, Carbondale, USA","Department of ECE, Southern Illinois University, Carbondale, IL, USA"],"affiliations":[{"raw_affiliation_string":"Department of ECE, Southem Illinois University, Carbondale, USA","institution_ids":["https://openalex.org/I110378019"]},{"raw_affiliation_string":"Department of ECE, Southern Illinois University, Carbondale, IL, USA","institution_ids":["https://openalex.org/I110378019"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5083284025","display_name":"Spyros Tragoudas","orcid":"https://orcid.org/0009-0006-2575-3588"},"institutions":[{"id":"https://openalex.org/I110378019","display_name":"Southern Illinois University Carbondale","ror":"https://ror.org/049kefs16","country_code":"US","type":"education","lineage":["https://openalex.org/I110378019","https://openalex.org/I2801502357"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"S. Tragoudas","raw_affiliation_strings":["Department of ECE, Southem Illinois University, Carbondale, USA","Department of ECE, Southern Illinois University, Carbondale, IL, USA"],"affiliations":[{"raw_affiliation_string":"Department of ECE, Southem Illinois University, Carbondale, USA","institution_ids":["https://openalex.org/I110378019"]},{"raw_affiliation_string":"Department of ECE, Southern Illinois University, Carbondale, IL, USA","institution_ids":["https://openalex.org/I110378019"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5045911880","display_name":"M.K. Michael","orcid":null},"institutions":[{"id":"https://openalex.org/I34771391","display_name":"University of Cyprus","ror":"https://ror.org/02qjrjx09","country_code":"CY","type":"education","lineage":["https://openalex.org/I34771391"]}],"countries":["CY"],"is_corresponding":false,"raw_author_name":"M.K. Michael","raw_affiliation_strings":["Department of ECE, University of Cyprus, Cyprus","[Department of ECE, University of Cyprus, Cyprus]"],"affiliations":[{"raw_affiliation_string":"Department of ECE, University of Cyprus, Cyprus","institution_ids":["https://openalex.org/I34771391"]},{"raw_affiliation_string":"[Department of ECE, University of Cyprus, Cyprus]","institution_ids":["https://openalex.org/I34771391"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5053924751"],"corresponding_institution_ids":["https://openalex.org/I110378019"],"apc_list":null,"apc_paid":null,"fwci":0.2787,"has_fulltext":false,"cited_by_count":7,"citation_normalized_percentile":{"value":0.52430887,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"4","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9937000274658203,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9801999926567078,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5967680215835571},{"id":"https://openalex.org/keywords/identification","display_name":"Identification (biology)","score":0.5623745918273926},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5433509945869446},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.40277883410453796},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.23281344771385193},{"id":"https://openalex.org/keywords/geology","display_name":"Geology","score":0.1605866253376007},{"id":"https://openalex.org/keywords/seismology","display_name":"Seismology","score":0.08472555875778198}],"concepts":[{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5967680215835571},{"id":"https://openalex.org/C116834253","wikidata":"https://www.wikidata.org/wiki/Q2039217","display_name":"Identification (biology)","level":2,"score":0.5623745918273926},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5433509945869446},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.40277883410453796},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.23281344771385193},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.1605866253376007},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.08472555875778198},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C59822182","wikidata":"https://www.wikidata.org/wiki/Q441","display_name":"Botany","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iscas.2006.1692710","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas.2006.1692710","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2006 IEEE International Symposium on Circuits and Systems","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Climate action","score":0.44999998807907104,"id":"https://metadata.un.org/sdg/13"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":7,"referenced_works":["https://openalex.org/W1595368737","https://openalex.org/W1964866107","https://openalex.org/W2080267935","https://openalex.org/W2109508018","https://openalex.org/W2118354996","https://openalex.org/W2160444875","https://openalex.org/W4302458519"],"related_works":["https://openalex.org/W4391375266","https://openalex.org/W2748952813","https://openalex.org/W2390279801","https://openalex.org/W2358668433","https://openalex.org/W4396701345","https://openalex.org/W2376932109","https://openalex.org/W2001405890","https://openalex.org/W4396696052","https://openalex.org/W4402327032","https://openalex.org/W2382290278"],"abstract_inverted_index":{"This":[0],"paper":[1],"presents":[2],"a":[3,25],"new":[4],"way":[5],"of":[6,20,36],"fault":[7,43],"collapsing":[8,44],"called":[9],"dominance":[10],"with":[11],"sub-faults(DSF)":[12],"collapsing.":[13],"The":[14],"proposed":[15,38],"approach":[16],"reduces":[17],"the":[18,30,34,37,41],"number":[19],"tests":[21],"required":[22],"to":[23],"diagnose":[24],"fault.":[26],"Experimental":[27],"results":[28],"on":[29],"ISCAS'85":[31],"benchmarks":[32],"demonstrate":[33],"impact":[35],"method":[39,45],"over":[40],"traditional":[42]},"counts_by_year":[{"year":2018,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}