{"id":"https://openalex.org/W2103633531","doi":"https://doi.org/10.1109/iscas.2005.1465968","title":"Reconfigurable Multiple Scan-Chains for Reducing Test Application Time of SOCs","display_name":"Reconfigurable Multiple Scan-Chains for Reducing Test Application Time of SOCs","publication_year":2005,"publication_date":"2005-07-27","ids":{"openalex":"https://openalex.org/W2103633531","doi":"https://doi.org/10.1109/iscas.2005.1465968","mag":"2103633531"},"language":"en","primary_location":{"id":"doi:10.1109/iscas.2005.1465968","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas.2005.1465968","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2005 IEEE International Symposium on Circuits and Systems","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5053876090","display_name":"Jiann-Chyi Rau","orcid":null},"institutions":[{"id":"https://openalex.org/I107470533","display_name":"Tamkang University","ror":"https://ror.org/04tft4718","country_code":"TW","type":"education","lineage":["https://openalex.org/I107470533"]}],"countries":["TW"],"is_corresponding":true,"raw_author_name":"J.-C. Rau","raw_affiliation_strings":["Department of Electrical Engineering, Tamkang University, Taipei, Hsien, China","Dept. of Electr. Eng., TamKang Univ., Taipei Hsien, Taiwan"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Tamkang University, Taipei, Hsien, China","institution_ids":[]},{"raw_affiliation_string":"Dept. of Electr. Eng., TamKang Univ., Taipei Hsien, Taiwan","institution_ids":["https://openalex.org/I107470533"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5012381288","display_name":"Chih-Lung Chien","orcid":null},"institutions":[{"id":"https://openalex.org/I107470533","display_name":"Tamkang University","ror":"https://ror.org/04tft4718","country_code":"TW","type":"education","lineage":["https://openalex.org/I107470533"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Chih-Lung Chien","raw_affiliation_strings":["Department of Electrical Engineering, Tamkang University, Taipei, Hsien, China","Dept. of Electr. Eng., TamKang Univ., Taipei Hsien, Taiwan"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Tamkang University, Taipei, Hsien, China","institution_ids":[]},{"raw_affiliation_string":"Dept. of Electr. Eng., TamKang Univ., Taipei Hsien, Taiwan","institution_ids":["https://openalex.org/I107470533"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5078049325","display_name":"Jia-Shing Ma","orcid":null},"institutions":[{"id":"https://openalex.org/I107470533","display_name":"Tamkang University","ror":"https://ror.org/04tft4718","country_code":"TW","type":"education","lineage":["https://openalex.org/I107470533"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Jia-Shing Ma","raw_affiliation_strings":["Department of Electrical Engineering, Tamkang University, Taipei, Hsien, China","Dept. of Electr. Eng., TamKang Univ., Taipei Hsien, Taiwan"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Tamkang University, Taipei, Hsien, China","institution_ids":[]},{"raw_affiliation_string":"Dept. of Electr. Eng., TamKang Univ., Taipei Hsien, Taiwan","institution_ids":["https://openalex.org/I107470533"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5053876090"],"corresponding_institution_ids":["https://openalex.org/I107470533"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.17227456,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"5846","last_page":"5849"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13293","display_name":"Engineering and Test Systems","score":0.9934999942779541,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.5701504349708557},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5693008899688721},{"id":"https://openalex.org/keywords/scan-chain","display_name":"Scan chain","score":0.5637891292572021},{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.4785531163215637},{"id":"https://openalex.org/keywords/system-on-a-chip","display_name":"System on a chip","score":0.4405190944671631},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.09894499182701111},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.09500998258590698}],"concepts":[{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.5701504349708557},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5693008899688721},{"id":"https://openalex.org/C150012182","wikidata":"https://www.wikidata.org/wiki/Q225990","display_name":"Scan chain","level":3,"score":0.5637891292572021},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.4785531163215637},{"id":"https://openalex.org/C118021083","wikidata":"https://www.wikidata.org/wiki/Q610398","display_name":"System on a chip","level":2,"score":0.4405190944671631},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.09894499182701111},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.09500998258590698},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/iscas.2005.1465968","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas.2005.1465968","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2005 IEEE International Symposium on Circuits and Systems","raw_type":"proceedings-article"},{"id":"pmh:oai:tkuir.lib.tku.edu.tw:987654321/39042","is_oa":false,"landing_page_url":"https://tkuir.lib.tku.edu.tw/dspace/handle/987654321/39042","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":null}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W1915384728","https://openalex.org/W1965261507","https://openalex.org/W2109600608","https://openalex.org/W2110129459","https://openalex.org/W2121076138","https://openalex.org/W2125474840","https://openalex.org/W2162086806","https://openalex.org/W2165642910","https://openalex.org/W2503952136","https://openalex.org/W3015661493","https://openalex.org/W4242912069","https://openalex.org/W4252472882"],"related_works":["https://openalex.org/W2002703587","https://openalex.org/W2374512474","https://openalex.org/W79379040","https://openalex.org/W2144331304","https://openalex.org/W2380242202","https://openalex.org/W2354955167","https://openalex.org/W2002185056","https://openalex.org/W2136004720","https://openalex.org/W2166065438","https://openalex.org/W2084373512"],"abstract_inverted_index":{"We":[0,49],"propose":[1,37],"an":[2],"algorithm,":[3],"based":[4],"on":[5],"a":[6,13,39],"framework":[7],"of":[8],"reconfigurable":[9],"multiple":[10,65],"scan-chains":[11],"for":[12],"system-on-chip,":[14],"to":[15,31,45,61],"minimize":[16,51],"test":[17,53,73],"application":[18,54,74],"time.":[19],"For":[20],"the":[21,23,28,52,58],"framework,":[22],"control":[24,41],"signal":[25,42],"combination":[26],"causes":[27],"computing":[29,77],"time":[30,55],"increase":[32],"exponentially.":[33],"The":[34],"algorithm":[35],"we":[36],"introduces":[38],"heuristic":[40],"selection":[43],"method":[44,60],"solve":[46],"this":[47],"problem.":[48],"also":[50],"by":[56],"using":[57],"balancing":[59],"assign":[62],"registers":[63],"into":[64],"scan-chains.":[66],"It":[67],"could":[68],"show":[69],"significant":[70],"reductions":[71],"in":[72],"times":[75],"and":[76],"times.":[78]},"counts_by_year":[{"year":2015,"cited_by_count":1},{"year":2013,"cited_by_count":1}],"updated_date":"2026-03-17T09:09:15.849793","created_date":"2025-10-10T00:00:00"}