{"id":"https://openalex.org/W2121468258","doi":"https://doi.org/10.1109/iscas.2005.1465924","title":"Deterministic and Low Power BIST Based on Scan Slice Overlapping","display_name":"Deterministic and Low Power BIST Based on Scan Slice Overlapping","publication_year":2005,"publication_date":"2005-07-27","ids":{"openalex":"https://openalex.org/W2121468258","doi":"https://doi.org/10.1109/iscas.2005.1465924","mag":"2121468258"},"language":"en","primary_location":{"id":"doi:10.1109/iscas.2005.1465924","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas.2005.1465924","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2005 IEEE International Symposium on Circuits and Systems","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5108076509","display_name":"Ji Li","orcid":"https://orcid.org/0000-0003-2813-1558"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"funder","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210090176","display_name":"Institute of Computing Technology","ror":"https://ror.org/0090r4d87","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210090176"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Ji Li","raw_affiliation_strings":["Graduate School of Chinese Academy of Sciences, Beijing, China","Institute of Computing Technology, Chinese Academy and Sciences, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Graduate School of Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I19820366"]},{"raw_affiliation_string":"Institute of Computing Technology, Chinese Academy and Sciences, Beijing, China","institution_ids":["https://openalex.org/I4210090176"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5016864694","display_name":"Yinhe Han","orcid":"https://orcid.org/0000-0003-0904-6681"},"institutions":[{"id":"https://openalex.org/I4210090176","display_name":"Institute of Computing Technology","ror":"https://ror.org/0090r4d87","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210090176"]},{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"funder","lineage":["https://openalex.org/I19820366"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yinhe Han","raw_affiliation_strings":["Graduate School of Chinese Academy of Sciences, Beijing, China","Institute of Computing Technology, Chinese Academy and Sciences, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Graduate School of Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I19820366"]},{"raw_affiliation_string":"Institute of Computing Technology, Chinese Academy and Sciences, Beijing, China","institution_ids":["https://openalex.org/I4210090176"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5023380073","display_name":"Xiaowei Li","orcid":"https://orcid.org/0000-0002-0874-814X"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"funder","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210090176","display_name":"Institute of Computing Technology","ror":"https://ror.org/0090r4d87","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210090176"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiaowei Li","raw_affiliation_strings":["Graduate School of Chinese Academy of Sciences, Beijing, China","Institute of Computing Technology, Chinese Academy and Sciences, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Graduate School of Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I19820366"]},{"raw_affiliation_string":"Institute of Computing Technology, Chinese Academy and Sciences, Beijing, China","institution_ids":["https://openalex.org/I4210090176"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5108076509"],"corresponding_institution_ids":["https://openalex.org/I19820366","https://openalex.org/I4210090176"],"apc_list":null,"apc_paid":null,"fwci":0.7734,"has_fulltext":false,"cited_by_count":17,"citation_normalized_percentile":{"value":0.74553571,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"5670","last_page":"5673"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11338","display_name":"Advancements in Photolithography Techniques","score":0.9836999773979187,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/scheme","display_name":"Scheme (mathematics)","score":0.6948474645614624},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6325588226318359},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.5849170684814453},{"id":"https://openalex.org/keywords/linear-feedback-shift-register","display_name":"Linear feedback shift register","score":0.5687648057937622},{"id":"https://openalex.org/keywords/built-in-self-test","display_name":"Built-in self-test","score":0.5403220653533936},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.4237365126609802},{"id":"https://openalex.org/keywords/wafer","display_name":"Wafer","score":0.41407281160354614},{"id":"https://openalex.org/keywords/shift-register","display_name":"Shift register","score":0.40943869948387146},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3375169336795807},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.20376908779144287},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.19351547956466675},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.17819824814796448},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.09585800766944885}],"concepts":[{"id":"https://openalex.org/C77618280","wikidata":"https://www.wikidata.org/wiki/Q1155772","display_name":"Scheme (mathematics)","level":2,"score":0.6948474645614624},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6325588226318359},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.5849170684814453},{"id":"https://openalex.org/C159862308","wikidata":"https://www.wikidata.org/wiki/Q681101","display_name":"Linear feedback shift register","level":4,"score":0.5687648057937622},{"id":"https://openalex.org/C2780980493","wikidata":"https://www.wikidata.org/wiki/Q181142","display_name":"Built-in self-test","level":2,"score":0.5403220653533936},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.4237365126609802},{"id":"https://openalex.org/C160671074","wikidata":"https://www.wikidata.org/wiki/Q267131","display_name":"Wafer","level":2,"score":0.41407281160354614},{"id":"https://openalex.org/C49654631","wikidata":"https://www.wikidata.org/wiki/Q746165","display_name":"Shift register","level":3,"score":0.40943869948387146},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3375169336795807},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.20376908779144287},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.19351547956466675},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.17819824814796448},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.09585800766944885},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iscas.2005.1465924","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas.2005.1465924","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2005 IEEE International Symposium on Circuits and Systems","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.8199999928474426}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":20,"referenced_works":["https://openalex.org/W1934808766","https://openalex.org/W1994927490","https://openalex.org/W2099814124","https://openalex.org/W2104107023","https://openalex.org/W2105028194","https://openalex.org/W2105282021","https://openalex.org/W2109043970","https://openalex.org/W2122955150","https://openalex.org/W2123887421","https://openalex.org/W2128921091","https://openalex.org/W2134998505","https://openalex.org/W2138530143","https://openalex.org/W2144033909","https://openalex.org/W2146594632","https://openalex.org/W2148218783","https://openalex.org/W2160621850","https://openalex.org/W4254056430","https://openalex.org/W4254102020","https://openalex.org/W6681008240","https://openalex.org/W6681969564"],"related_works":["https://openalex.org/W2119351822","https://openalex.org/W2104563825","https://openalex.org/W2761125259","https://openalex.org/W2184933991","https://openalex.org/W2152745368","https://openalex.org/W4288754393","https://openalex.org/W2766924081","https://openalex.org/W2188176208","https://openalex.org/W2761883387","https://openalex.org/W2133482355"],"abstract_inverted_index":{"This":[0],"paper":[1],"presents":[2],"a":[3],"new":[4],"deterministic":[5],"pattern":[6],"generation":[7],"structure":[8],"that":[9,57],"can":[10,45],"be":[11],"used":[12],"in":[13],"conjunction":[14],"with":[15],"any":[16],"LFSR":[17],"reseeding":[18],"scheme.":[19],"The":[20],"proposed":[21,59],"scheme":[22],"utilizes":[23],"scan":[24],"slice":[25],"overlapping":[26],"to":[27],"reduce":[28,47],"the":[29,35,40,58,63],"number":[30,36],"of":[31,37],"specified":[32],"bits":[33],"and":[34,50,68],"transitions":[38],"at":[39],"same":[41],"time.":[42],"Thus,":[43],"it":[44],"significantly":[46,61],"test":[48,73],"power":[49],"evens":[51],"control":[52],"signals.":[53],"Experimental":[54],"results":[55],"indicate":[56],"method":[60],"reduces":[62],"switching":[64],"activity":[65],"by":[66],"80%":[67],"only":[69],"needs":[70],"relatively":[71],"small":[72],"data":[74],"storage.":[75]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2014,"cited_by_count":2},{"year":2012,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}