{"id":"https://openalex.org/W1542096220","doi":"https://doi.org/10.1109/iscas.2005.1465923","title":"Validation Analysis and Test Flow Optimization of VLSI Chip","display_name":"Validation Analysis and Test Flow Optimization of VLSI Chip","publication_year":2005,"publication_date":"2005-07-27","ids":{"openalex":"https://openalex.org/W1542096220","doi":"https://doi.org/10.1109/iscas.2005.1465923","mag":"1542096220"},"language":"en","primary_location":{"id":"doi:10.1109/iscas.2005.1465923","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas.2005.1465923","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2005 IEEE International Symposium on Circuits and Systems","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5110126172","display_name":"Yanzhuo Tan","orcid":null},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"funder","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210090176","display_name":"Institute of Computing Technology","ror":"https://ror.org/0090r4d87","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210090176"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Yanzhuo Tan","raw_affiliation_strings":["Graduate School of Chinese Academy of Sciences, Beijing, China","Institute of Computing Technology, Chinese Academy and Sciences, Beijing, China","Institute of Computing Technology, Chinese Academy of Sciences, Beijing"],"affiliations":[{"raw_affiliation_string":"Graduate School of Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I19820366"]},{"raw_affiliation_string":"Institute of Computing Technology, Chinese Academy and Sciences, Beijing, China","institution_ids":["https://openalex.org/I4210090176"]},{"raw_affiliation_string":"Institute of Computing Technology, Chinese Academy of Sciences, Beijing","institution_ids":["https://openalex.org/I4210090176","https://openalex.org/I19820366"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101129828","display_name":"Yinhe Han","orcid":"https://orcid.org/0009-0009-8044-6611"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"funder","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210090176","display_name":"Institute of Computing Technology","ror":"https://ror.org/0090r4d87","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210090176"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yinhe Han","raw_affiliation_strings":["Graduate School of Chinese Academy of Sciences, Beijing, China","Institute of Computing Technology, Chinese Academy and Sciences, Beijing, China","Institute of Computing Technology, Chinese Academy of Sciences, Beijing"],"affiliations":[{"raw_affiliation_string":"Graduate School of Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I19820366"]},{"raw_affiliation_string":"Institute of Computing Technology, Chinese Academy and Sciences, Beijing, China","institution_ids":["https://openalex.org/I4210090176"]},{"raw_affiliation_string":"Institute of Computing Technology, Chinese Academy of Sciences, Beijing","institution_ids":["https://openalex.org/I4210090176","https://openalex.org/I19820366"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5023380073","display_name":"Xiaowei Li","orcid":"https://orcid.org/0000-0002-0874-814X"},"institutions":[{"id":"https://openalex.org/I4210090176","display_name":"Institute of Computing Technology","ror":"https://ror.org/0090r4d87","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210090176"]},{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"funder","lineage":["https://openalex.org/I19820366"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiaowei Li","raw_affiliation_strings":["Graduate School of Chinese Academy of Sciences, Beijing, China","Institute of Computing Technology, Chinese Academy and Sciences, Beijing, China","Institute of Computing Technology, Chinese Academy of Sciences, Beijing"],"affiliations":[{"raw_affiliation_string":"Graduate School of Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I19820366"]},{"raw_affiliation_string":"Institute of Computing Technology, Chinese Academy and Sciences, Beijing, China","institution_ids":["https://openalex.org/I4210090176"]},{"raw_affiliation_string":"Institute of Computing Technology, Chinese Academy of Sciences, Beijing","institution_ids":["https://openalex.org/I4210090176","https://openalex.org/I19820366"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100809355","display_name":"Feiyin Luo","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Feiyin Luo","raw_affiliation_strings":[],"affiliations":[]},{"author_position":"last","author":{"id":"https://openalex.org/A5033786949","display_name":"Yu-Chuan Chen","orcid":"https://orcid.org/0000-0001-6977-546X"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Yuchuan Chen","raw_affiliation_strings":["Teradyne Inc., Shanghai, China"],"affiliations":[{"raw_affiliation_string":"Teradyne Inc., Shanghai, China","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5110126172"],"corresponding_institution_ids":["https://openalex.org/I19820366","https://openalex.org/I4210090176"],"apc_list":null,"apc_paid":null,"fwci":0.5156,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.65880102,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"5666","last_page":"5669"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9968000054359436,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9968000054359436,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10551","display_name":"Scheduling and Optimization Algorithms","score":0.9958999752998352,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11522","display_name":"VLSI and FPGA Design Techniques","score":0.9936000108718872,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6846460700035095},{"id":"https://openalex.org/keywords/very-large-scale-integration","display_name":"Very-large-scale integration","score":0.641891598701477},{"id":"https://openalex.org/keywords/heuristic","display_name":"Heuristic","score":0.596123456954956},{"id":"https://openalex.org/keywords/table","display_name":"Table (database)","score":0.5031740069389343},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.5011134147644043},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.49607691168785095},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.4812869429588318},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.4800785183906555},{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.45695212483406067},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.4300428628921509},{"id":"https://openalex.org/keywords/test-compression","display_name":"Test compression","score":0.4178513288497925},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.4101518988609314},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.17534726858139038},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.17106008529663086},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.16096973419189453},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.14767420291900635},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.10243329405784607},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.09768304228782654}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6846460700035095},{"id":"https://openalex.org/C14580979","wikidata":"https://www.wikidata.org/wiki/Q876049","display_name":"Very-large-scale integration","level":2,"score":0.641891598701477},{"id":"https://openalex.org/C173801870","wikidata":"https://www.wikidata.org/wiki/Q201413","display_name":"Heuristic","level":2,"score":0.596123456954956},{"id":"https://openalex.org/C45235069","wikidata":"https://www.wikidata.org/wiki/Q278425","display_name":"Table (database)","level":2,"score":0.5031740069389343},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.5011134147644043},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.49607691168785095},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.4812869429588318},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.4800785183906555},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.45695212483406067},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.4300428628921509},{"id":"https://openalex.org/C29652920","wikidata":"https://www.wikidata.org/wiki/Q7705757","display_name":"Test compression","level":4,"score":0.4178513288497925},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.4101518988609314},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.17534726858139038},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.17106008529663086},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.16096973419189453},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.14767420291900635},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.10243329405784607},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.09768304228782654},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iscas.2005.1465923","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas.2005.1465923","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2005 IEEE International Symposium on Circuits and Systems","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":5,"referenced_works":["https://openalex.org/W2104972179","https://openalex.org/W2109087211","https://openalex.org/W2111089645","https://openalex.org/W2133229660","https://openalex.org/W2147378778"],"related_works":["https://openalex.org/W2786111245","https://openalex.org/W3009953521","https://openalex.org/W4285708951","https://openalex.org/W1991935474","https://openalex.org/W2021253405","https://openalex.org/W2091533492","https://openalex.org/W2323083271","https://openalex.org/W2802691720","https://openalex.org/W2940545572","https://openalex.org/W2098752843"],"abstract_inverted_index":{"This":[0],"paper":[1],"gives":[2],"a":[3,7,22,49,58],"validation":[4,42],"analysis":[5,21],"on":[6,19,55],"high-performance":[8],"general-purpose":[9],"processor,":[10],"using":[11],"the":[12,41,70,89,93],"0.18":[13],"/spl":[14],"mu/m":[15],"process,":[16],"and":[17,64],"based":[18],"this":[20,56,115],"test":[23,35,50,61,65,76,82],"flow":[24],"optimization":[25],"algorithm":[26,99,116],"is":[27,37,67,117],"presented.":[28],"The":[29],"fault":[30],"detection":[31],"capacity":[32],"of":[33,84,95],"different":[34],"items":[36],"first":[38],"analyzed.":[39],"Then":[40],"information":[43],"can":[44,79],"be":[45],"reused":[46],"to":[47,88,106],"generate":[48],"item":[51,62],"efficiency":[52,63],"table.":[53],"Based":[54],"table,":[57],"tradeoff":[59],"between":[60],"time":[66,83],"achieved":[68],"as":[69],"heuristic":[71,97],"object":[72],"for":[73],"optimizing":[74],"our":[75,96],"flow,":[77],"which":[78],"save":[80],"much":[81],"faulty":[85],"chips.":[86],"Compared":[87],"dynamic":[90],"programming":[91],"algorithm,":[92],"complexity":[94],"ordering":[98],"has":[100],"been":[101],"decreased":[102],"from":[103],"O(dn2/sup":[104],"n/)":[105],"O(dn/sup":[107],"3/).":[108],"Several":[109],"experimental":[110],"results":[111],"have":[112],"shown":[113],"that":[114],"efficient.":[118]},"counts_by_year":[{"year":2023,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}