{"id":"https://openalex.org/W2154108113","doi":"https://doi.org/10.1109/iscas.2005.1465255","title":"On the Fault Diagnosis in the Presence of Unknown Fault Models Using Pass/Fail Information","display_name":"On the Fault Diagnosis in the Presence of Unknown Fault Models Using Pass/Fail Information","publication_year":2005,"publication_date":"2005-07-27","ids":{"openalex":"https://openalex.org/W2154108113","doi":"https://doi.org/10.1109/iscas.2005.1465255","mag":"2154108113"},"language":"en","primary_location":{"id":"doi:10.1109/iscas.2005.1465255","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas.2005.1465255","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2005 IEEE International Symposium on Circuits and Systems","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5110073346","display_name":"Yuzo Takamatsu","orcid":null},"institutions":[{"id":"https://openalex.org/I43545212","display_name":"Ehime University","ror":"https://ror.org/017hkng22","country_code":"JP","type":"education","lineage":["https://openalex.org/I43545212"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Y. Takamatsu","raw_affiliation_strings":["Ehime University, Matsuyama, Ehime, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Ehime University, Matsuyama, Ehime, Japan","institution_ids":["https://openalex.org/I43545212"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5085990188","display_name":"Tetsuya Seiyama","orcid":null},"institutions":[{"id":"https://openalex.org/I43545212","display_name":"Ehime University","ror":"https://ror.org/017hkng22","country_code":"JP","type":"education","lineage":["https://openalex.org/I43545212"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"T. Seiyama","raw_affiliation_strings":["Ehime University, Matsuyama, Ehime, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Ehime University, Matsuyama, Ehime, Japan","institution_ids":["https://openalex.org/I43545212"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101529866","display_name":"Hiroshi Takahashi","orcid":"https://orcid.org/0000-0002-3654-6457"},"institutions":[{"id":"https://openalex.org/I43545212","display_name":"Ehime University","ror":"https://ror.org/017hkng22","country_code":"JP","type":"education","lineage":["https://openalex.org/I43545212"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"H. Takahashi","raw_affiliation_strings":["Ehime University, Matsuyama, Ehime, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Ehime University, Matsuyama, Ehime, Japan","institution_ids":["https://openalex.org/I43545212"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5080764382","display_name":"Yoshinobu Higami","orcid":"https://orcid.org/0000-0002-2909-6777"},"institutions":[{"id":"https://openalex.org/I43545212","display_name":"Ehime University","ror":"https://ror.org/017hkng22","country_code":"JP","type":"education","lineage":["https://openalex.org/I43545212"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Y. Higami","raw_affiliation_strings":["Ehime University, Matsuyama, Ehime, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Ehime University, Matsuyama, Ehime, Japan","institution_ids":["https://openalex.org/I43545212"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5009084626","display_name":"Koji Yamazaki","orcid":"https://orcid.org/0000-0003-2025-6268"},"institutions":[{"id":"https://openalex.org/I16656306","display_name":"Meiji University","ror":"https://ror.org/02rqvrp93","country_code":"JP","type":"education","lineage":["https://openalex.org/I16656306"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"K. Yamazaki","raw_affiliation_strings":["Meiji University, Kawasaki, Kanagawa, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Meiji University, Kawasaki, Kanagawa, Japan","institution_ids":["https://openalex.org/I16656306"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.221,"has_fulltext":false,"cited_by_count":7,"citation_normalized_percentile":{"value":0.50661531,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"2987","last_page":"2990"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9976999759674072,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.7952979803085327},{"id":"https://openalex.org/keywords/stuck-at-fault","display_name":"Stuck-at fault","score":0.7374841570854187},{"id":"https://openalex.org/keywords/fault-model","display_name":"Fault model","score":0.6555498838424683},{"id":"https://openalex.org/keywords/fault-indicator","display_name":"Fault indicator","score":0.6210712790489197},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6111218333244324},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.5696163177490234},{"id":"https://openalex.org/keywords/line","display_name":"Line (geometry)","score":0.4731924533843994},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.46241211891174316},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.4504373073577881},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.44769373536109924},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.4146578907966614},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.3647693991661072},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.23979759216308594},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.13123422861099243},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.11840584874153137},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.05319890379905701}],"concepts":[{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.7952979803085327},{"id":"https://openalex.org/C13625343","wikidata":"https://www.wikidata.org/wiki/Q7627418","display_name":"Stuck-at fault","level":4,"score":0.7374841570854187},{"id":"https://openalex.org/C167391956","wikidata":"https://www.wikidata.org/wiki/Q1401211","display_name":"Fault model","level":3,"score":0.6555498838424683},{"id":"https://openalex.org/C21267803","wikidata":"https://www.wikidata.org/wiki/Q5438159","display_name":"Fault indicator","level":4,"score":0.6210712790489197},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6111218333244324},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.5696163177490234},{"id":"https://openalex.org/C198352243","wikidata":"https://www.wikidata.org/wiki/Q37105","display_name":"Line (geometry)","level":2,"score":0.4731924533843994},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.46241211891174316},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.4504373073577881},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.44769373536109924},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.4146578907966614},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.3647693991661072},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.23979759216308594},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.13123422861099243},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.11840584874153137},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.05319890379905701},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iscas.2005.1465255","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas.2005.1465255","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2005 IEEE International Symposium on Circuits and Systems","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":7,"referenced_works":["https://openalex.org/W1951780703","https://openalex.org/W2110977962","https://openalex.org/W2113399863","https://openalex.org/W2118910735","https://openalex.org/W2138223068","https://openalex.org/W2139971665","https://openalex.org/W2155086537"],"related_works":["https://openalex.org/W2147400189","https://openalex.org/W2340957901","https://openalex.org/W2051500795","https://openalex.org/W3147038789","https://openalex.org/W1555400249","https://openalex.org/W2568949342","https://openalex.org/W2031110496","https://openalex.org/W3148663848","https://openalex.org/W2157154381","https://openalex.org/W2024194466"],"abstract_inverted_index":{"In":[0],"this":[1],"paper,":[2],"we":[3,78],"propose":[4],"an":[5,13],"effective":[6],"diagnostic":[7],"method":[8,28,96,127],"in":[9,42],"the":[10,23,37,40,43,51,56,85,90,98,104,107,111,131,141],"presence":[11],"of":[12,39,53,92,101,136],"unknown":[14],"fault":[15,59,67,82,93,132],"model,":[16],"based":[17,49],"on":[18,22,50],"only":[19],"pass/fail":[20],"information":[21],"applied":[24],"tests.":[25,74,121],"The":[26],"proposed":[27],"deduces":[29],"faulty":[30,47,86,137,142],"conditions":[31],"that":[32,125,140],"are":[33,113,144],"able":[34],"to":[35],"explain":[36],"behavior":[38],"defect":[41],"circuit":[44],"and":[45,72,103,119,139],"locates":[46],"sites,":[48],"number":[52],"detections":[54],"for":[55,134,150],"single":[57,65],"stuck-at":[58,66,108,154],"at":[60,110],"each":[61],"line,":[62],"by":[63,117],"performing":[64],"simulation":[68],"with":[69,152],"both":[70],"passing":[71,118],"failing":[73,120],"As":[75],"a":[76,81],"result,":[77],"can":[79,128],"derive":[80],"model":[83],"from":[84],"condition.":[87],"To":[88],"improve":[89],"ability":[91],"diagnosis,":[94],"our":[95,126],"uses":[97],"logic":[99],"values":[100],"lines":[102,112],"condition":[105],"whether":[106],"faults":[109],"detected":[114],"or":[115],"not":[116],"Experimental":[122],"results":[123],"show":[124],"accurately":[129],"identify":[130],"models":[133],"93%":[135],"circuits":[138,151],"sites":[143],"located":[145],"within":[146],"several":[147],"candidates":[148],"except":[149],"multiple":[153],"faults.":[155]},"counts_by_year":[{"year":2020,"cited_by_count":2},{"year":2012,"cited_by_count":2}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}