{"id":"https://openalex.org/W2120294448","doi":"https://doi.org/10.1109/iscas.2005.1465254","title":"An Embedded Processor Based SOC Test Platform","display_name":"An Embedded Processor Based SOC Test Platform","publication_year":2005,"publication_date":"2005-07-27","ids":{"openalex":"https://openalex.org/W2120294448","doi":"https://doi.org/10.1109/iscas.2005.1465254","mag":"2120294448"},"language":"en","primary_location":{"id":"doi:10.1109/iscas.2005.1465254","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas.2005.1465254","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2005 IEEE International Symposium on Circuits and Systems","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5079657769","display_name":"Kuen-Jong Lee","orcid":"https://orcid.org/0000-0002-6690-0074"},"institutions":[{"id":"https://openalex.org/I91807558","display_name":"National Cheng Kung University","ror":"https://ror.org/01b8kcc49","country_code":"TW","type":"education","lineage":["https://openalex.org/I91807558"]}],"countries":["TW"],"is_corresponding":true,"raw_author_name":"Kuen-Jong Lee","raw_affiliation_strings":["Department of Electrical Engineering, National Cheng Kung University, Tainan, Taiwan","[Dept. of Electr. Eng., Nat. Cheng-Kung Univ., Tainan, Taiwan]"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, National Cheng Kung University, Tainan, Taiwan","institution_ids":["https://openalex.org/I91807558"]},{"raw_affiliation_string":"[Dept. of Electr. Eng., Nat. Cheng-Kung Univ., Tainan, Taiwan]","institution_ids":["https://openalex.org/I91807558"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110525042","display_name":"Chia-Yi Chu","orcid":null},"institutions":[{"id":"https://openalex.org/I91807558","display_name":"National Cheng Kung University","ror":"https://ror.org/01b8kcc49","country_code":"TW","type":"education","lineage":["https://openalex.org/I91807558"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Chia-Yi Chu","raw_affiliation_strings":["Department of Electrical Engineering, National Cheng Kung University, Tainan, Taiwan","[Dept. of Electr. Eng., Nat. Cheng-Kung Univ., Tainan, Taiwan]"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, National Cheng Kung University, Tainan, Taiwan","institution_ids":["https://openalex.org/I91807558"]},{"raw_affiliation_string":"[Dept. of Electr. Eng., Nat. Cheng-Kung Univ., Tainan, Taiwan]","institution_ids":["https://openalex.org/I91807558"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5033104994","display_name":"Yu-Ting Hong","orcid":null},"institutions":[{"id":"https://openalex.org/I91807558","display_name":"National Cheng Kung University","ror":"https://ror.org/01b8kcc49","country_code":"TW","type":"education","lineage":["https://openalex.org/I91807558"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Yu-Ting Hong","raw_affiliation_strings":["Department of Electrical Engineering, National Cheng Kung University, Tainan, Taiwan","[Dept. of Electr. Eng., Nat. Cheng-Kung Univ., Tainan, Taiwan]"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, National Cheng Kung University, Tainan, Taiwan","institution_ids":["https://openalex.org/I91807558"]},{"raw_affiliation_string":"[Dept. of Electr. Eng., Nat. Cheng-Kung Univ., Tainan, Taiwan]","institution_ids":["https://openalex.org/I91807558"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5079657769"],"corresponding_institution_ids":["https://openalex.org/I91807558"],"apc_list":null,"apc_paid":null,"fwci":2.3203,"has_fulltext":false,"cited_by_count":25,"citation_normalized_percentile":{"value":0.88690476,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"2983","last_page":"2986"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13293","display_name":"Engineering and Test Systems","score":0.9977999925613403,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.780100405216217},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6538633108139038},{"id":"https://openalex.org/keywords/system-on-a-chip","display_name":"System on a chip","score":0.6231112480163574},{"id":"https://openalex.org/keywords/automatic-test-equipment","display_name":"Automatic test equipment","score":0.5589665770530701},{"id":"https://openalex.org/keywords/kernel","display_name":"Kernel (algebra)","score":0.5167738199234009},{"id":"https://openalex.org/keywords/built-in-self-test","display_name":"Built-in self-test","score":0.4943506717681885},{"id":"https://openalex.org/keywords/controller","display_name":"Controller (irrigation)","score":0.48139169812202454},{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.45115625858306885},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.43491384387016296},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.23017942905426025},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.11602136492729187}],"concepts":[{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.780100405216217},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6538633108139038},{"id":"https://openalex.org/C118021083","wikidata":"https://www.wikidata.org/wiki/Q610398","display_name":"System on a chip","level":2,"score":0.6231112480163574},{"id":"https://openalex.org/C141842801","wikidata":"https://www.wikidata.org/wiki/Q363815","display_name":"Automatic test equipment","level":3,"score":0.5589665770530701},{"id":"https://openalex.org/C74193536","wikidata":"https://www.wikidata.org/wiki/Q574844","display_name":"Kernel (algebra)","level":2,"score":0.5167738199234009},{"id":"https://openalex.org/C2780980493","wikidata":"https://www.wikidata.org/wiki/Q181142","display_name":"Built-in self-test","level":2,"score":0.4943506717681885},{"id":"https://openalex.org/C203479927","wikidata":"https://www.wikidata.org/wiki/Q5165939","display_name":"Controller (irrigation)","level":2,"score":0.48139169812202454},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.45115625858306885},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.43491384387016296},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.23017942905426025},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.11602136492729187},{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.0},{"id":"https://openalex.org/C114614502","wikidata":"https://www.wikidata.org/wiki/Q76592","display_name":"Combinatorics","level":1,"score":0.0},{"id":"https://openalex.org/C6557445","wikidata":"https://www.wikidata.org/wiki/Q173113","display_name":"Agronomy","level":1,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iscas.2005.1465254","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas.2005.1465254","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2005 IEEE International Symposium on Circuits and Systems","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":14,"referenced_works":["https://openalex.org/W1614172680","https://openalex.org/W1777381481","https://openalex.org/W1904830904","https://openalex.org/W1983320508","https://openalex.org/W2026037646","https://openalex.org/W2092629642","https://openalex.org/W2114156871","https://openalex.org/W2116973616","https://openalex.org/W2161365607","https://openalex.org/W4239296208","https://openalex.org/W4243745062","https://openalex.org/W6637979017","https://openalex.org/W6673751135","https://openalex.org/W6683606522"],"related_works":["https://openalex.org/W51919102","https://openalex.org/W2108140302","https://openalex.org/W1527836777","https://openalex.org/W2121694292","https://openalex.org/W1814605437","https://openalex.org/W2116424179","https://openalex.org/W2105657695","https://openalex.org/W2099176192","https://openalex.org/W1982569681","https://openalex.org/W2108395592"],"abstract_inverted_index":{"In":[0],"this":[1],"paper,":[2],"we":[3],"present":[4],"a":[5,21],"novel":[6],"test":[7,27,38,49,70,84,112,122,132],"platform":[8,82],"for":[9,29,51,61],"embedded":[10,16],"processor":[11,17],"based":[12],"system-on-a-chip":[13],"(SoC).":[14],"The":[15,64,81],"is":[18,43,59],"employed":[19],"as":[20,97,99],"control":[22],"kernel":[23],"to":[24],"execute":[25,73],"the":[26,31,34,47,69,88,93,107,120,127,130],"programs":[28,71],"all":[30],"cores":[32,85],"in":[33],"SoC.":[35],"A":[36],"dedicated":[37],"access":[39],"mechanism":[40],"(TAM)":[41],"controller":[42,66],"developed":[44],"which":[45],"controls":[46],"actual":[48],"procedure":[50],"each":[52],"core":[53],"such":[54],"that":[55],"no":[56],"extra":[57],"buffer":[58],"needed":[60],"individual":[62],"cores.":[63,103],"TAM":[65],"together":[67],"with":[68],"can":[72,83,117],"scan-based":[74],"testing,":[75],"memory":[76],"BIST":[77],"and":[78,92,101,115],"mixed-signal":[79,102],"BIST.":[80],"wrapped":[86],"by":[87],"standard":[89],"boundary":[90],"scan":[91],"IEEE":[94],"P1500":[95],"wrappers,":[96],"well":[98],"hierarchical":[100],"Our":[104],"methodology":[105],"alleviates":[106],"need":[108],"of":[109,129],"expensive":[110],"automatic":[111],"equipment":[113],"(ATE),":[114],"hence":[116],"greatly":[118],"reduce":[119],"total":[121],"cost.":[123],"Experimental":[124],"results":[125],"show":[126],"effectiveness":[128],"proposed":[131],"platform.":[133]},"counts_by_year":[{"year":2017,"cited_by_count":2},{"year":2016,"cited_by_count":3},{"year":2012,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}