{"id":"https://openalex.org/W2101258169","doi":"https://doi.org/10.1109/iscas.2005.1464543","title":"A Monolithic Isolation Amplifier in Silicon-on-Insulator CMOS","display_name":"A Monolithic Isolation Amplifier in Silicon-on-Insulator CMOS","publication_year":2005,"publication_date":"2005-07-27","ids":{"openalex":"https://openalex.org/W2101258169","doi":"https://doi.org/10.1109/iscas.2005.1464543","mag":"2101258169"},"language":"en","primary_location":{"id":"doi:10.1109/iscas.2005.1464543","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas.2005.1464543","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2005 IEEE International Symposium on Circuits and Systems","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5056573998","display_name":"Eugenio Culurciello","orcid":"https://orcid.org/0000-0002-9918-3956"},"institutions":[{"id":"https://openalex.org/I32971472","display_name":"Yale University","ror":"https://ror.org/03v76x132","country_code":"US","type":"education","lineage":["https://openalex.org/I32971472"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"E. Culurciello","raw_affiliation_strings":["Electrical Engineering, Yale University, New Heaven, CT, USA","[Dept. of Electr. Eng., Yale Univ., New Haven, CT, USA]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electrical Engineering, Yale University, New Heaven, CT, USA","institution_ids":["https://openalex.org/I32971472"]},{"raw_affiliation_string":"[Dept. of Electr. Eng., Yale Univ., New Haven, CT, USA]","institution_ids":["https://openalex.org/I32971472"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110258517","display_name":"Philippe O. Pouliquen","orcid":null},"institutions":[{"id":"https://openalex.org/I145311948","display_name":"Johns Hopkins University","ror":"https://ror.org/00za53h95","country_code":"US","type":"education","lineage":["https://openalex.org/I145311948"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"P. Pouliquen","raw_affiliation_strings":["Electrical & Computer Engineering, Johns Hopkins University, Baltimore, MD, USA","Electrical and Computer Engineering, Johns Hopkins University, Baltimore, MD, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electrical & Computer Engineering, Johns Hopkins University, Baltimore, MD, USA","institution_ids":["https://openalex.org/I145311948"]},{"raw_affiliation_string":"Electrical and Computer Engineering, Johns Hopkins University, Baltimore, MD, USA","institution_ids":["https://openalex.org/I145311948"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5057789499","display_name":"Andreas G. Andreou","orcid":"https://orcid.org/0000-0003-3826-600X"},"institutions":[{"id":"https://openalex.org/I145311948","display_name":"Johns Hopkins University","ror":"https://ror.org/00za53h95","country_code":"US","type":"education","lineage":["https://openalex.org/I145311948"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"A.G. Andreou","raw_affiliation_strings":["Electrical & Computer Engineering, Johns Hopkins University, Baltimore, MD, USA","Electrical and Computer Engineering, Johns Hopkins University, Baltimore, MD, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electrical & Computer Engineering, Johns Hopkins University, Baltimore, MD, USA","institution_ids":["https://openalex.org/I145311948"]},{"raw_affiliation_string":"Electrical and Computer Engineering, Johns Hopkins University, Baltimore, MD, USA","institution_ids":["https://openalex.org/I145311948"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5044660786","display_name":"K. Strohbehn","orcid":null},"institutions":[{"id":"https://openalex.org/I2802946424","display_name":"Johns Hopkins University Applied Physics Laboratory","ror":"https://ror.org/029pp9z10","country_code":"US","type":"facility","lineage":["https://openalex.org/I145311948","https://openalex.org/I2802946424"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"K. Strohbehn","raw_affiliation_strings":["Applied Physics Laboratory, Johns Hopkins University, Laurel, MD, USA","Applied Physics Laboratory, Johns Hopkins University Laurel, Md., USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Applied Physics Laboratory, Johns Hopkins University, Laurel, MD, USA","institution_ids":["https://openalex.org/I2802946424"]},{"raw_affiliation_string":"Applied Physics Laboratory, Johns Hopkins University Laurel, Md., USA","institution_ids":["https://openalex.org/I2802946424"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5035027424","display_name":"S. Jaskulek","orcid":null},"institutions":[{"id":"https://openalex.org/I2802946424","display_name":"Johns Hopkins University Applied Physics Laboratory","ror":"https://ror.org/029pp9z10","country_code":"US","type":"facility","lineage":["https://openalex.org/I145311948","https://openalex.org/I2802946424"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"S. Jaskulek","raw_affiliation_strings":["Applied Physics Laboratory, Johns Hopkins University, Laurel, MD, USA","Applied Physics Laboratory, Johns Hopkins University Laurel, Md., USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Applied Physics Laboratory, Johns Hopkins University, Laurel, MD, USA","institution_ids":["https://openalex.org/I2802946424"]},{"raw_affiliation_string":"Applied Physics Laboratory, Johns Hopkins University Laurel, Md., USA","institution_ids":["https://openalex.org/I2802946424"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.7269,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.74852422,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":95,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"137","last_page":"140"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9890000224113464,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9890000224113464,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9764999747276306,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9764999747276306,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.5777015089988708},{"id":"https://openalex.org/keywords/amplifier","display_name":"Amplifier","score":0.5659032464027405},{"id":"https://openalex.org/keywords/silicon-on-insulator","display_name":"Silicon on insulator","score":0.5486406683921814},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.5452223420143127},{"id":"https://openalex.org/keywords/isolation","display_name":"Isolation (microbiology)","score":0.5252649188041687},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.4761214852333069},{"id":"https://openalex.org/keywords/silicon-on-sapphire","display_name":"Silicon on sapphire","score":0.4702374339103699},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.46686387062072754},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.4575582444667816},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.44864967465400696},{"id":"https://openalex.org/keywords/silicon","display_name":"Silicon","score":0.42030400037765503},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3764881491661072},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3315425515174866},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.2513245642185211},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.14577916264533997}],"concepts":[{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.5777015089988708},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.5659032464027405},{"id":"https://openalex.org/C53143962","wikidata":"https://www.wikidata.org/wiki/Q1478788","display_name":"Silicon on insulator","level":3,"score":0.5486406683921814},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.5452223420143127},{"id":"https://openalex.org/C2775941552","wikidata":"https://www.wikidata.org/wiki/Q25212305","display_name":"Isolation (microbiology)","level":2,"score":0.5252649188041687},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.4761214852333069},{"id":"https://openalex.org/C172905872","wikidata":"https://www.wikidata.org/wiki/Q1622339","display_name":"Silicon on sapphire","level":4,"score":0.4702374339103699},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.46686387062072754},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.4575582444667816},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.44864967465400696},{"id":"https://openalex.org/C544956773","wikidata":"https://www.wikidata.org/wiki/Q670","display_name":"Silicon","level":2,"score":0.42030400037765503},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3764881491661072},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3315425515174866},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.2513245642185211},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.14577916264533997},{"id":"https://openalex.org/C89423630","wikidata":"https://www.wikidata.org/wiki/Q7193","display_name":"Microbiology","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iscas.2005.1464543","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas.2005.1464543","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2005 IEEE International Symposium on Circuits and Systems","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Responsible consumption and production","id":"https://metadata.un.org/sdg/12","score":0.47999998927116394}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":6,"referenced_works":["https://openalex.org/W1827743869","https://openalex.org/W2111323554","https://openalex.org/W2134737856","https://openalex.org/W2138661465","https://openalex.org/W2156732994","https://openalex.org/W2565378567"],"related_works":["https://openalex.org/W2104300577","https://openalex.org/W4206445530","https://openalex.org/W2771786520","https://openalex.org/W2103363493","https://openalex.org/W1990403211","https://openalex.org/W2119459628","https://openalex.org/W2158574352","https://openalex.org/W2183332552","https://openalex.org/W2033294021","https://openalex.org/W2288945810"],"abstract_inverted_index":{"We":[0],"designed":[1],"and":[2,53,76,91,101],"fabricated":[3],"a":[4,10,40,82],"4-channel":[5],"digital":[6],"isolation":[7,22,30],"amplifier":[8],"in":[9,34,87],"0.5":[11],"/spl":[12],"mu/m":[13],"silicon-on-sapphire":[14],"(SOS)":[15],"technology,":[16],"by":[17],"taking":[18],"advantage":[19],"of":[20,24,37,50],"the":[21,25,35,68,72,88],"properties":[23],"SOS":[26],"substrate.":[27],"The":[28,44,58],"individual":[29],"channels":[31],"can":[32,46,78],"operate":[33],"excess":[36],"100Mbps":[38],"using":[39],"differential":[41],"transmission":[42],"scheme.":[43],"device":[45,59],"tolerate":[47],"ground":[48],"bounces":[49],"1V//spl":[51],"mu/s":[52],"isolate":[54],"more":[55],"than":[56],"800V.":[57],"uses":[60],"an":[61],"isolated":[62,73],"charge":[63],"pump":[64],"circuit":[65,70],"to":[66],"power":[67],"input":[69],"from":[71],"output":[74],"side":[75],"thus":[77],"be":[79],"used":[80],"as":[81],"sensing":[83],"device.":[84],"Applications":[85],"are":[86],"industrial,":[89],"medical":[90,100],"military:":[92],"high":[93],"reliability":[94],"systems,":[95],"harsh":[96],"industrial":[97],"environments,":[98],"transportation,":[99],"life":[102],"critical":[103],"systems.":[104]},"counts_by_year":[{"year":2025,"cited_by_count":2}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}