{"id":"https://openalex.org/W1872306154","doi":"https://doi.org/10.1109/iscas.2003.1206361","title":"A displacement-to-voltage converter circuit using a switched-capacitor technique","display_name":"A displacement-to-voltage converter circuit using a switched-capacitor technique","publication_year":2003,"publication_date":"2003-11-04","ids":{"openalex":"https://openalex.org/W1872306154","doi":"https://doi.org/10.1109/iscas.2003.1206361","mag":"1872306154"},"language":"en","primary_location":{"id":"doi:10.1109/iscas.2003.1206361","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas.2003.1206361","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 2003 International Symposium on Circuits and Systems, 2003. ISCAS '03.","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5068585058","display_name":"Wei-Hsiang Lien","orcid":null},"institutions":[{"id":"https://openalex.org/I4210090209","display_name":"Institute of Microelectronics","ror":"https://ror.org/009rw8n36","country_code":"SG","type":"facility","lineage":["https://openalex.org/I115228651","https://openalex.org/I4210090209","https://openalex.org/I91275662"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"W.L. Lien","raw_affiliation_strings":["Institute of Microelectronics, Singapore","Institute of Microelectronics, Singapore, SG"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Microelectronics, Singapore","institution_ids":["https://openalex.org/I4210090209"]},{"raw_affiliation_string":"Institute of Microelectronics, Singapore, SG","institution_ids":["https://openalex.org/I4210090209"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5070420712","display_name":"Boon-Seah Quek","orcid":null},"institutions":[{"id":"https://openalex.org/I4210090209","display_name":"Institute of Microelectronics","ror":"https://ror.org/009rw8n36","country_code":"SG","type":"facility","lineage":["https://openalex.org/I115228651","https://openalex.org/I4210090209","https://openalex.org/I91275662"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"B.S. Quek","raw_affiliation_strings":["Institute of Microelectronics, Singapore, SG"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Microelectronics, Singapore, SG","institution_ids":["https://openalex.org/I4210090209"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5006806272","display_name":"R. Walia","orcid":null},"institutions":[{"id":"https://openalex.org/I4210090209","display_name":"Institute of Microelectronics","ror":"https://ror.org/009rw8n36","country_code":"SG","type":"facility","lineage":["https://openalex.org/I115228651","https://openalex.org/I4210090209","https://openalex.org/I91275662"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"R. Walia","raw_affiliation_strings":["Inst. of Microelectron., Singapore, Singapore"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Inst. of Microelectron., Singapore, Singapore","institution_ids":["https://openalex.org/I4210090209"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I4210090209"],"apc_list":null,"apc_paid":null,"fwci":0.1749,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":{"value":0.45513798,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":95},"biblio":{"volume":"4","issue":null,"first_page":"IV","last_page":"880"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10369","display_name":"Advanced MEMS and NEMS Technologies","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9962000250816345,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/switched-capacitor","display_name":"Switched capacitor","score":0.908679187297821},{"id":"https://openalex.org/keywords/capacitor","display_name":"Capacitor","score":0.7838700413703918},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.6131247878074646},{"id":"https://openalex.org/keywords/displacement","display_name":"Displacement (psychology)","score":0.5592905282974243},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.4730333983898163},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.4548722505569458},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.442035436630249},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.40778958797454834},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.3590131402015686},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.25362297892570496}],"concepts":[{"id":"https://openalex.org/C103357873","wikidata":"https://www.wikidata.org/wiki/Q572656","display_name":"Switched capacitor","level":4,"score":0.908679187297821},{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.7838700413703918},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.6131247878074646},{"id":"https://openalex.org/C107551265","wikidata":"https://www.wikidata.org/wiki/Q1458245","display_name":"Displacement (psychology)","level":2,"score":0.5592905282974243},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.4730333983898163},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.4548722505569458},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.442035436630249},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.40778958797454834},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3590131402015686},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.25362297892570496},{"id":"https://openalex.org/C15744967","wikidata":"https://www.wikidata.org/wiki/Q9418","display_name":"Psychology","level":0,"score":0.0},{"id":"https://openalex.org/C542102704","wikidata":"https://www.wikidata.org/wiki/Q183257","display_name":"Psychotherapist","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iscas.2003.1206361","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas.2003.1206361","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 2003 International Symposium on Circuits and Systems, 2003. ISCAS '03.","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.8700000047683716,"display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":10,"referenced_works":["https://openalex.org/W1595396794","https://openalex.org/W1991534425","https://openalex.org/W2088665809","https://openalex.org/W2098340591","https://openalex.org/W2112611349","https://openalex.org/W2122783837","https://openalex.org/W2778645959","https://openalex.org/W4285719527","https://openalex.org/W6635837924","https://openalex.org/W6747433598"],"related_works":["https://openalex.org/W3014521742","https://openalex.org/W2354365353","https://openalex.org/W1988437325","https://openalex.org/W2811287415","https://openalex.org/W2617868873","https://openalex.org/W3204141294","https://openalex.org/W2354835317","https://openalex.org/W2124313625","https://openalex.org/W2389800961","https://openalex.org/W1995389502"],"abstract_inverted_index":{"A":[0],"technique":[1],"for":[2],"precise":[3],"measurement":[4,62],"of":[5,9,61],"changes":[6,26],"in":[7,27,47],"displacement":[8],"capacitor":[10,28],"gap":[11,29],"is":[12],"presented.":[13],"In":[14],"order":[15],"to":[16,67],"obtain":[17],"a":[18,31,35],"linear":[19],"relationship":[20],"between":[21],"the":[22,56],"output":[23],"voltage":[24],"and":[25],"over":[30],"wide":[32],"dynamic":[33],"range,":[34],"novel":[36],"switched-capacitor":[37],"circuit":[38,43],"has":[39,44],"been":[40,45],"applied.":[41],"This":[42],"implemented":[46],"0.8":[48],"/spl":[49],"mu/m":[50],"CMOS":[51],"process.":[52],"Results":[53],"showed":[54],"that":[55,60],"theoretical":[57],"values":[58],"match":[59],"results":[63],"with":[64],"accuracy":[65],"up":[66],"1%.":[68]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2012,"cited_by_count":1}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}