{"id":"https://openalex.org/W1549897608","doi":"https://doi.org/10.1109/iscas.2003.1205046","title":"Classification of power system faults using wavelet transforms and probabilistic neural networks","display_name":"Classification of power system faults using wavelet transforms and probabilistic neural networks","publication_year":2003,"publication_date":"2003-11-21","ids":{"openalex":"https://openalex.org/W1549897608","doi":"https://doi.org/10.1109/iscas.2003.1205046","mag":"1549897608"},"language":"en","primary_location":{"id":"doi:10.1109/iscas.2003.1205046","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas.2003.1205046","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 2003 International Symposium on Circuits and Systems, 2003. ISCAS '03.","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5029747066","display_name":"K.H. Kashyap","orcid":"https://orcid.org/0009-0004-3158-6865"},"institutions":[],"countries":[],"is_corresponding":true,"raw_author_name":"K.H. Kashyap","raw_affiliation_strings":["National Institute of Engineering, Mysore, India"],"affiliations":[{"raw_affiliation_string":"National Institute of Engineering, Mysore, India","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5111983228","display_name":"U. Jayachandra Shenoy","orcid":null},"institutions":[{"id":"https://openalex.org/I59270414","display_name":"Indian Institute of Science Bangalore","ror":"https://ror.org/04dese585","country_code":"IN","type":"education","lineage":["https://openalex.org/I59270414"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"U.J. Shenoy","raw_affiliation_strings":["Department of Electrical Engineering, Indian Institute of Science, Bangalore, India","Department of Electrical Engineering, Indian Institute of Science,  Bangalore, India"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Indian Institute of Science, Bangalore, India","institution_ids":["https://openalex.org/I59270414"]},{"raw_affiliation_string":"Department of Electrical Engineering, Indian Institute of Science,  Bangalore, India","institution_ids":["https://openalex.org/I59270414"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5029747066"],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.7386,"has_fulltext":false,"cited_by_count":62,"citation_normalized_percentile":{"value":0.83625632,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":"3","issue":null,"first_page":"III","last_page":"423"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11343","display_name":"Power Transformer Diagnostics and Insulation","score":0.9952999949455261,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11343","display_name":"Power Transformer Diagnostics and Insulation","score":0.9952999949455261,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.9933000206947327,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10972","display_name":"Power Systems Fault Detection","score":0.9901000261306763,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.7190142273902893},{"id":"https://openalex.org/keywords/wavelet-transform","display_name":"Wavelet transform","score":0.7069597244262695},{"id":"https://openalex.org/keywords/wavelet","display_name":"Wavelet","score":0.6440151929855347},{"id":"https://openalex.org/keywords/probabilistic-neural-network","display_name":"Probabilistic neural network","score":0.6413556337356567},{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.6108853816986084},{"id":"https://openalex.org/keywords/electric-power-system","display_name":"Electric power system","score":0.5917564034461975},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5690356492996216},{"id":"https://openalex.org/keywords/probabilistic-logic","display_name":"Probabilistic logic","score":0.5413380265235901},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.5079687237739563},{"id":"https://openalex.org/keywords/discrete-wavelet-transform","display_name":"Discrete wavelet transform","score":0.49011358618736267},{"id":"https://openalex.org/keywords/automation","display_name":"Automation","score":0.4406159520149231},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.4356074929237366},{"id":"https://openalex.org/keywords/identification","display_name":"Identification (biology)","score":0.42578035593032837},{"id":"https://openalex.org/keywords/fault-indicator","display_name":"Fault indicator","score":0.422995001077652},{"id":"https://openalex.org/keywords/transient","display_name":"Transient (computer programming)","score":0.4217541515827179},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.40984809398651123},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.3580838441848755},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.28370967507362366},{"id":"https://openalex.org/keywords/time-delay-neural-network","display_name":"Time delay neural network","score":0.1528128683567047}],"concepts":[{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.7190142273902893},{"id":"https://openalex.org/C196216189","wikidata":"https://www.wikidata.org/wiki/Q2867","display_name":"Wavelet transform","level":3,"score":0.7069597244262695},{"id":"https://openalex.org/C47432892","wikidata":"https://www.wikidata.org/wiki/Q831390","display_name":"Wavelet","level":2,"score":0.6440151929855347},{"id":"https://openalex.org/C134342201","wikidata":"https://www.wikidata.org/wiki/Q7246859","display_name":"Probabilistic neural network","level":4,"score":0.6413556337356567},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.6108853816986084},{"id":"https://openalex.org/C89227174","wikidata":"https://www.wikidata.org/wiki/Q2388981","display_name":"Electric power system","level":3,"score":0.5917564034461975},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5690356492996216},{"id":"https://openalex.org/C49937458","wikidata":"https://www.wikidata.org/wiki/Q2599292","display_name":"Probabilistic logic","level":2,"score":0.5413380265235901},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.5079687237739563},{"id":"https://openalex.org/C46286280","wikidata":"https://www.wikidata.org/wiki/Q2414958","display_name":"Discrete wavelet transform","level":4,"score":0.49011358618736267},{"id":"https://openalex.org/C115901376","wikidata":"https://www.wikidata.org/wiki/Q184199","display_name":"Automation","level":2,"score":0.4406159520149231},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.4356074929237366},{"id":"https://openalex.org/C116834253","wikidata":"https://www.wikidata.org/wiki/Q2039217","display_name":"Identification (biology)","level":2,"score":0.42578035593032837},{"id":"https://openalex.org/C21267803","wikidata":"https://www.wikidata.org/wiki/Q5438159","display_name":"Fault indicator","level":4,"score":0.422995001077652},{"id":"https://openalex.org/C2780799671","wikidata":"https://www.wikidata.org/wiki/Q17087362","display_name":"Transient (computer programming)","level":2,"score":0.4217541515827179},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.40984809398651123},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.3580838441848755},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.28370967507362366},{"id":"https://openalex.org/C175202392","wikidata":"https://www.wikidata.org/wiki/Q2434543","display_name":"Time delay neural network","level":3,"score":0.1528128683567047},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C59822182","wikidata":"https://www.wikidata.org/wiki/Q441","display_name":"Botany","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iscas.2003.1205046","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas.2003.1205046","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 2003 International Symposium on Circuits and Systems, 2003. ISCAS '03.","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":6,"referenced_works":["https://openalex.org/W1498954346","https://openalex.org/W2149599685","https://openalex.org/W2167148419","https://openalex.org/W3165001235","https://openalex.org/W6629857075","https://openalex.org/W6795798984"],"related_works":["https://openalex.org/W2381770184","https://openalex.org/W2355754418","https://openalex.org/W1577789985","https://openalex.org/W2174290408","https://openalex.org/W2792520941","https://openalex.org/W2047056993","https://openalex.org/W2112061901","https://openalex.org/W2390482320","https://openalex.org/W4387011695","https://openalex.org/W1516178834"],"abstract_inverted_index":{"Automation":[0],"of":[1,13,28,42,50,58,61,72],"power":[2,14,44],"system":[3,15,45],"fault":[4,29,63,74],"identification":[5,41],"using":[6],"information":[7],"conveyed":[8],"by":[9],"the":[10,26,51,59,84,89],"wavelet":[11],"analysis":[12],"transients":[16],"is":[17,30,38,64,75,80],"proposed.":[18],"The":[19,32,66],"Probabilistic":[20],"Neural":[21],"Network":[22],"(PNN)":[23],"for":[24,69,82],"detecting":[25],"type":[27,71],"used.":[31],"work":[33],"presented":[34],"in":[35,77],"this":[36],"paper":[37],"focused":[39],"on":[40],"simple":[43,73],"faults.":[46,90],"Wavelet":[47],"Transform":[48],"(WT)":[49],"transient":[52],"disturbance":[53],"caused":[54],"as":[55],"a":[56,62],"result":[57],"occurrence":[60],"performed.":[65],"detail":[67,85],"coefficient":[68],"each":[70],"characteristic":[76],"nature.":[78],"PNN":[79],"used":[81],"distinguishing":[83],"coefficients":[86],"and":[87],"hence":[88]},"counts_by_year":[{"year":2025,"cited_by_count":3},{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":5},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":3},{"year":2020,"cited_by_count":8},{"year":2019,"cited_by_count":3},{"year":2018,"cited_by_count":2},{"year":2017,"cited_by_count":2},{"year":2016,"cited_by_count":3},{"year":2015,"cited_by_count":3},{"year":2014,"cited_by_count":3},{"year":2013,"cited_by_count":3},{"year":2012,"cited_by_count":3}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}