{"id":"https://openalex.org/W1499800512","doi":"https://doi.org/10.1109/iscas.2002.1010541","title":"A zone-programmed EEPROM with real-time write monitoring for analog data storage","display_name":"A zone-programmed EEPROM with real-time write monitoring for analog data storage","publication_year":2003,"publication_date":"2003-06-25","ids":{"openalex":"https://openalex.org/W1499800512","doi":"https://doi.org/10.1109/iscas.2002.1010541","mag":"1499800512"},"language":"en","primary_location":{"id":"doi:10.1109/iscas.2002.1010541","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas.2002.1010541","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2002 IEEE International Symposium on Circuits and Systems. Proceedings (Cat. No.02CH37353)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5103506398","display_name":"Keng Hoong Wee","orcid":null},"institutions":[{"id":"https://openalex.org/I201537933","display_name":"Tohoku University","ror":"https://ror.org/01dq60k83","country_code":"JP","type":"education","lineage":["https://openalex.org/I201537933"]},{"id":"https://openalex.org/I28490864","display_name":"DSO National Laboratories","ror":"https://ror.org/03e05fb06","country_code":"SG","type":"nonprofit","lineage":["https://openalex.org/I28490864"]}],"countries":["JP","SG"],"is_corresponding":false,"raw_author_name":"Keng Hoong Wee","raw_affiliation_strings":["DSO National Laboratories, Singapore","Department of Electronic Engineering, Graduate School of Engineering Tohoku University, Sendai, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"DSO National Laboratories, Singapore","institution_ids":["https://openalex.org/I28490864"]},{"raw_affiliation_string":"Department of Electronic Engineering, Graduate School of Engineering Tohoku University, Sendai, Japan","institution_ids":["https://openalex.org/I201537933"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108353821","display_name":"T. Yonezawa","orcid":null},"institutions":[{"id":"https://openalex.org/I201537933","display_name":"Tohoku University","ror":"https://ror.org/01dq60k83","country_code":"JP","type":"education","lineage":["https://openalex.org/I201537933"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"T. Yonezawa","raw_affiliation_strings":["Department of Electronic Engineering, Graduate School of Engineering Tohoku University, Sendai, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electronic Engineering, Graduate School of Engineering Tohoku University, Sendai, Japan","institution_ids":["https://openalex.org/I201537933"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108386458","display_name":"T. Nozawa","orcid":null},"institutions":[{"id":"https://openalex.org/I201537933","display_name":"Tohoku University","ror":"https://ror.org/01dq60k83","country_code":"JP","type":"education","lineage":["https://openalex.org/I201537933"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"T. Nozawa","raw_affiliation_strings":["Department of Electronic Engineering, Graduate School of Engineering Tohoku University, Sendai, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electronic Engineering, Graduate School of Engineering Tohoku University, Sendai, Japan","institution_ids":["https://openalex.org/I201537933"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111934278","display_name":"T. Shibata","orcid":null},"institutions":[{"id":"https://openalex.org/I74801974","display_name":"The University of Tokyo","ror":"https://ror.org/057zh3y96","country_code":"JP","type":"education","lineage":["https://openalex.org/I74801974"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"T. Shibata","raw_affiliation_strings":["Department of Frontier Informatics, The University of Tokyo, Bunkyo-ku, Tokyo, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Frontier Informatics, The University of Tokyo, Bunkyo-ku, Tokyo, Japan","institution_ids":["https://openalex.org/I74801974"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5110826182","display_name":"T. Ohmi","orcid":null},"institutions":[{"id":"https://openalex.org/I201537933","display_name":"Tohoku University","ror":"https://ror.org/01dq60k83","country_code":"JP","type":"education","lineage":["https://openalex.org/I201537933"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"T. Ohmi","raw_affiliation_strings":["New Industry Hatchery Centre, Tohoku University, Sendai, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"New Industry Hatchery Centre, Tohoku University, Sendai, Japan","institution_ids":["https://openalex.org/I201537933"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.01972082,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"4","issue":null,"first_page":"IV","last_page":"655"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/eeprom","display_name":"EEPROM","score":0.9876550436019897},{"id":"https://openalex.org/keywords/eprom","display_name":"EPROM","score":0.8085039258003235},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6738920211791992},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.5840031504631042},{"id":"https://openalex.org/keywords/non-volatile-memory","display_name":"Non-volatile memory","score":0.5474371314048767},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.4744126498699188},{"id":"https://openalex.org/keywords/read-write-memory","display_name":"Read-write memory","score":0.4728275239467621},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.4709145724773407},{"id":"https://openalex.org/keywords/scheme","display_name":"Scheme (mathematics)","score":0.4264027774333954},{"id":"https://openalex.org/keywords/error-detection-and-correction","display_name":"Error detection and correction","score":0.42162948846817017},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.4137972891330719},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.30358564853668213},{"id":"https://openalex.org/keywords/random-access-memory","display_name":"Random access memory","score":0.13974499702453613},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.13548409938812256},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.1150009036064148}],"concepts":[{"id":"https://openalex.org/C27699510","wikidata":"https://www.wikidata.org/wiki/Q205908","display_name":"EEPROM","level":2,"score":0.9876550436019897},{"id":"https://openalex.org/C163980746","wikidata":"https://www.wikidata.org/wiki/Q378210","display_name":"EPROM","level":2,"score":0.8085039258003235},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6738920211791992},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.5840031504631042},{"id":"https://openalex.org/C177950962","wikidata":"https://www.wikidata.org/wiki/Q10997658","display_name":"Non-volatile memory","level":2,"score":0.5474371314048767},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.4744126498699188},{"id":"https://openalex.org/C2776321774","wikidata":"https://www.wikidata.org/wiki/Q891131","display_name":"Read-write memory","level":3,"score":0.4728275239467621},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.4709145724773407},{"id":"https://openalex.org/C77618280","wikidata":"https://www.wikidata.org/wiki/Q1155772","display_name":"Scheme (mathematics)","level":2,"score":0.4264027774333954},{"id":"https://openalex.org/C103088060","wikidata":"https://www.wikidata.org/wiki/Q1062839","display_name":"Error detection and correction","level":2,"score":0.42162948846817017},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.4137972891330719},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.30358564853668213},{"id":"https://openalex.org/C2994168587","wikidata":"https://www.wikidata.org/wiki/Q5295","display_name":"Random access memory","level":2,"score":0.13974499702453613},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.13548409938812256},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.1150009036064148},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iscas.2002.1010541","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas.2002.1010541","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2002 IEEE International Symposium on Circuits and Systems. Proceedings (Cat. No.02CH37353)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Quality Education","id":"https://metadata.un.org/sdg/4","score":0.6700000166893005}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":7,"referenced_works":["https://openalex.org/W1560415898","https://openalex.org/W1643556803","https://openalex.org/W1909033994","https://openalex.org/W2127799993","https://openalex.org/W2158715319","https://openalex.org/W2293161514","https://openalex.org/W6636833000"],"related_works":["https://openalex.org/W2083975737","https://openalex.org/W2053931924","https://openalex.org/W1853632475","https://openalex.org/W2142133575","https://openalex.org/W2028906339","https://openalex.org/W1870416553","https://openalex.org/W2134529477","https://openalex.org/W2510382096","https://openalex.org/W2032705268","https://openalex.org/W2036350002"],"abstract_inverted_index":{"A":[0,37],"non-volatile":[1],"high-precision":[2],"zone-programmed":[3],"EEPROM":[4],"comprising":[5],"two":[6],"transistors":[7],"per":[8],"cell":[9,26,62],"is":[10,48],"proposed.":[11,50],"The":[12,51],"newly":[13],"developed":[14],"memory":[15],"employs":[16],"channel":[17],"hot":[18],"electron":[19],"injection":[20],"and":[21,90],"real-time":[22],"write":[23,31,107],"monitoring":[24],"during":[25],"programming":[27,39,57,71],"to":[28,46,67,87],"achieve":[29],"automatic":[30],"termination":[32],"without":[33],"conventional":[34,68],"write-verify":[35],"cycles.":[36],"zone":[38],"scheme":[40,53],"that":[41],"effectively":[42],"suppresses":[43],"error":[44],"due":[45],"over-writing":[47],"also":[49,60],"new":[52],"not":[54],"only":[55],"enhances":[56],"precision":[58],"but":[59],"improves":[61],"writing":[63],"speed":[64],"when":[65],"compared":[66],"single":[69],"voltage":[70],"schemes.":[72],"Experimental":[73],"analyses":[74],"show":[75],"that,":[76],"with":[77],"the":[78],"incorporation":[79],"of":[80,99,109],"this":[81],"scheme,":[82],"overwrite":[83],"errors":[84],"are":[85],"reduced":[86],"0.5":[88],"mV":[89],"8/spl":[91],"sim/10":[92],"bit":[93],"accuracy":[94],"for":[95],"a":[96,106],"dynamic":[97],"range":[98],"2.5":[100],"V":[101],"can":[102],"be":[103],"obtained":[104],"within":[105],"time":[108],"100":[110],"/spl":[111],"mu/s.":[112]},"counts_by_year":[],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}