{"id":"https://openalex.org/W1851571574","doi":"https://doi.org/10.1109/iscas.2002.1010229","title":"A matrix transform imager allowing high-fill factor","display_name":"A matrix transform imager allowing high-fill factor","publication_year":2003,"publication_date":"2003-06-25","ids":{"openalex":"https://openalex.org/W1851571574","doi":"https://doi.org/10.1109/iscas.2002.1010229","mag":"1851571574"},"language":"en","primary_location":{"id":"doi:10.1109/iscas.2002.1010229","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas.2002.1010229","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2002 IEEE International Symposium on Circuits and Systems. Proceedings (Cat. No.02CH37353)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5105781337","display_name":"P. Hasler","orcid":null},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"P. Hasler","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, GA, USA","[Dept. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, GA, USA","institution_ids":["https://openalex.org/I130701444"]},{"raw_affiliation_string":"[Dept. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA]","institution_ids":["https://openalex.org/I130701444"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5063095825","display_name":"Abhishek Bandyopadhyay","orcid":"https://orcid.org/0000-0001-7062-4343"},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"A. Bandyopadhyay","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, GA, USA","[Dept. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, GA, USA","institution_ids":["https://openalex.org/I130701444"]},{"raw_affiliation_string":"[Dept. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA]","institution_ids":["https://openalex.org/I130701444"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5022872868","display_name":"P.D. Smith","orcid":"https://orcid.org/0000-0001-6635-3878"},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"P. Smith","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, GA, USA","[Dept. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, GA, USA","institution_ids":["https://openalex.org/I130701444"]},{"raw_affiliation_string":"[Dept. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA]","institution_ids":["https://openalex.org/I130701444"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":2.8341,"has_fulltext":false,"cited_by_count":13,"citation_normalized_percentile":{"value":0.89994966,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":"3","issue":null,"first_page":"III","last_page":"337"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12389","display_name":"Infrared Target Detection Methodologies","score":0.9972000122070312,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11128","display_name":"Transition Metal Oxide Nanomaterials","score":0.9807000160217285,"subfield":{"id":"https://openalex.org/subfields/2507","display_name":"Polymers and Plastics"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/pixel","display_name":"Pixel","score":0.7328439950942993},{"id":"https://openalex.org/keywords/computation","display_name":"Computation","score":0.645149827003479},{"id":"https://openalex.org/keywords/discrete-cosine-transform","display_name":"Discrete cosine transform","score":0.6101744771003723},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5959466099739075},{"id":"https://openalex.org/keywords/matrix","display_name":"Matrix (chemical analysis)","score":0.47861093282699585},{"id":"https://openalex.org/keywords/multiplier","display_name":"Multiplier (economics)","score":0.4779258370399475},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.42493438720703125},{"id":"https://openalex.org/keywords/block","display_name":"Block (permutation group theory)","score":0.41589587926864624},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.41156256198883057},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.39965832233428955},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.29790422320365906},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.20334714651107788}],"concepts":[{"id":"https://openalex.org/C160633673","wikidata":"https://www.wikidata.org/wiki/Q355198","display_name":"Pixel","level":2,"score":0.7328439950942993},{"id":"https://openalex.org/C45374587","wikidata":"https://www.wikidata.org/wiki/Q12525525","display_name":"Computation","level":2,"score":0.645149827003479},{"id":"https://openalex.org/C2221639","wikidata":"https://www.wikidata.org/wiki/Q2877","display_name":"Discrete cosine transform","level":3,"score":0.6101744771003723},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5959466099739075},{"id":"https://openalex.org/C106487976","wikidata":"https://www.wikidata.org/wiki/Q685816","display_name":"Matrix (chemical analysis)","level":2,"score":0.47861093282699585},{"id":"https://openalex.org/C124584101","wikidata":"https://www.wikidata.org/wiki/Q1053266","display_name":"Multiplier (economics)","level":2,"score":0.4779258370399475},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.42493438720703125},{"id":"https://openalex.org/C2777210771","wikidata":"https://www.wikidata.org/wiki/Q4927124","display_name":"Block (permutation group theory)","level":2,"score":0.41589587926864624},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.41156256198883057},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.39965832233428955},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.29790422320365906},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.20334714651107788},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C139719470","wikidata":"https://www.wikidata.org/wiki/Q39680","display_name":"Macroeconomics","level":1,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iscas.2002.1010229","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas.2002.1010229","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2002 IEEE International Symposium on Circuits and Systems. Proceedings (Cat. No.02CH37353)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320306076","display_name":"National Science Foundation","ror":"https://ror.org/021nxhr62"},{"id":"https://openalex.org/F4320309321","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":21,"referenced_works":["https://openalex.org/W1503043051","https://openalex.org/W1526976398","https://openalex.org/W1577600997","https://openalex.org/W1578671836","https://openalex.org/W1972356477","https://openalex.org/W1978569156","https://openalex.org/W2051385641","https://openalex.org/W2087201812","https://openalex.org/W2095691584","https://openalex.org/W2104561942","https://openalex.org/W2105254225","https://openalex.org/W2106952819","https://openalex.org/W2113745629","https://openalex.org/W2119440457","https://openalex.org/W2124704320","https://openalex.org/W2127068852","https://openalex.org/W2137609251","https://openalex.org/W2143935935","https://openalex.org/W2566161284","https://openalex.org/W6680302763","https://openalex.org/W6681405906"],"related_works":["https://openalex.org/W2055682261","https://openalex.org/W1916685473","https://openalex.org/W1993363272","https://openalex.org/W2174937762","https://openalex.org/W2186390138","https://openalex.org/W2790129917","https://openalex.org/W2060035984","https://openalex.org/W2992856432","https://openalex.org/W2054459866","https://openalex.org/W2212883587"],"abstract_inverted_index":{"We":[0,62,84],"present":[1,63,85],"a":[2,16,42,55,60,69,90],"transform":[3],"imager":[4,24],"that":[5],"performs":[6],"computation":[7],"at":[8],"the":[9,32,38,72,86],"pixel":[10,51],"plane,":[11],"but":[12],"still":[13],"holds":[14],"to":[15,100],"fill":[17],"factor":[18],"greater":[19],"than":[20],"40":[21],"percent.":[22],"This":[23],"is":[25,52],"capable":[26],"of":[27,54,77,88],"programmable":[28],"matrix":[29,44,48],"operations":[30],"on":[31],"image,":[33],"where":[34],"we":[35],"can":[36],"represent":[37],"image":[39],"as":[40,93,95],"either":[41],"full":[43],"or":[45],"using":[46],"block":[47],"operations.":[49],"Each":[50],"composed":[53],"photodiode":[56],"sensor":[57],"element":[58],"and":[59,66,75,79],"multiplier.":[61],"experimental":[64],"data":[65],"results":[67,87],"from":[68],"signal":[70],"pixel,":[71],"resulting":[73],"computation,":[74],"effect":[76],"mismatch":[78],"offsets":[80],"through":[81],"this":[82],"circuit.":[83],"computing":[89],"DCT/DST":[91],"transform,":[92],"well":[94],"frequency":[96],"response":[97],"characterizations":[98],"related":[99],"these":[101],"results.":[102]},"counts_by_year":[{"year":2014,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}