{"id":"https://openalex.org/W2131140718","doi":"https://doi.org/10.1109/iscas.2002.1009951","title":"A new approach to modeling statistical variations in MOS transistors","display_name":"A new approach to modeling statistical variations in MOS transistors","publication_year":2003,"publication_date":"2003-06-25","ids":{"openalex":"https://openalex.org/W2131140718","doi":"https://doi.org/10.1109/iscas.2002.1009951","mag":"2131140718"},"language":"en","primary_location":{"id":"doi:10.1109/iscas.2002.1009951","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas.2002.1009951","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2002 IEEE International Symposium on Circuits and Systems. Proceedings (Cat. No.02CH37353)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5041711279","display_name":"G. Tulunay","orcid":null},"institutions":[{"id":"https://openalex.org/I114395901","display_name":"University of Nebraska\u2013Lincoln","ror":"https://ror.org/043mer456","country_code":"US","type":"education","lineage":["https://openalex.org/I114395901"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"G. Tulunay","raw_affiliation_strings":["Department of Electrical Enginnering, University of Nebraska, Lincoln, Lincolnshire, NE, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Enginnering, University of Nebraska, Lincoln, Lincolnshire, NE, USA","institution_ids":["https://openalex.org/I114395901"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5052669741","display_name":"G\u00fcnhan D\u00fcndar","orcid":"https://orcid.org/0000-0003-2044-2706"},"institutions":[{"id":"https://openalex.org/I4405392","display_name":"Bo\u011fazi\u00e7i University","ror":"https://ror.org/03z9tma90","country_code":"TR","type":"education","lineage":["https://openalex.org/I4405392"]}],"countries":["TR"],"is_corresponding":false,"raw_author_name":"G. Dundar","raw_affiliation_strings":["Department of Electrical Engineering, Bogazici University, Istanbul, Turkey"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Bogazici University, Istanbul, Turkey","institution_ids":["https://openalex.org/I4405392"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5113248072","display_name":"A. Ataman","orcid":"https://orcid.org/0000-0001-9443-9038"},"institutions":[{"id":"https://openalex.org/I4101805","display_name":"Y\u0131ld\u0131z Technical University","ror":"https://ror.org/0547yzj13","country_code":"TR","type":"education","lineage":["https://openalex.org/I4101805"]}],"countries":["TR"],"is_corresponding":false,"raw_author_name":"A. Ataman","raw_affiliation_strings":["Department of Electronics Engineering, Yildiz Technical University, Istanbul, Turkey"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electronics Engineering, Yildiz Technical University, Istanbul, Turkey","institution_ids":["https://openalex.org/I4101805"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":7,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":"1","issue":null,"first_page":"I","last_page":"757"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.6575019359588623},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5642496943473816},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.5190640091896057},{"id":"https://openalex.org/keywords/transistor-model","display_name":"Transistor model","score":0.5102212429046631},{"id":"https://openalex.org/keywords/statistical-model","display_name":"Statistical model","score":0.4968014061450958},{"id":"https://openalex.org/keywords/semiconductor-device-modeling","display_name":"Semiconductor device modeling","score":0.46548736095428467},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4170764982700348},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2068062424659729},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.15349167585372925},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.15000450611114502},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.10535433888435364},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.09975367784500122}],"concepts":[{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.6575019359588623},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5642496943473816},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.5190640091896057},{"id":"https://openalex.org/C150169584","wikidata":"https://www.wikidata.org/wiki/Q7834319","display_name":"Transistor model","level":4,"score":0.5102212429046631},{"id":"https://openalex.org/C114289077","wikidata":"https://www.wikidata.org/wiki/Q3284399","display_name":"Statistical model","level":2,"score":0.4968014061450958},{"id":"https://openalex.org/C4775677","wikidata":"https://www.wikidata.org/wiki/Q7449393","display_name":"Semiconductor device modeling","level":3,"score":0.46548736095428467},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4170764982700348},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2068062424659729},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.15349167585372925},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.15000450611114502},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.10535433888435364},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.09975367784500122},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iscas.2002.1009951","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas.2002.1009951","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2002 IEEE International Symposium on Circuits and Systems. Proceedings (Cat. No.02CH37353)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":6,"referenced_works":["https://openalex.org/W1511447140","https://openalex.org/W1998168457","https://openalex.org/W2036488048","https://openalex.org/W2110033475","https://openalex.org/W2140823559","https://openalex.org/W4301253858"],"related_works":["https://openalex.org/W2901469270","https://openalex.org/W2027806590","https://openalex.org/W2097265805","https://openalex.org/W2953198199","https://openalex.org/W4289106041","https://openalex.org/W2119901732","https://openalex.org/W2111702626","https://openalex.org/W2103773526","https://openalex.org/W3173836265","https://openalex.org/W2161299897"],"abstract_inverted_index":{"In":[0],"this":[1],"paper,":[2],"a":[3,60],"new":[4],"methodology":[5,31],"for":[6],"modeling":[7],"transistor":[8],"mismatch":[9],"in":[10,26,46],"terms":[11],"of":[12,36,42,56],"systematic":[13],"and":[14,59,66],"random":[15],"variations":[16,25],"is":[17,21,32],"proposed.":[18],"The":[19],"model":[20,48,65,70],"based":[22],"on":[23],"the":[24,30,33,37,40,43,47,53,57,63,67],"physical":[27],"parameters.":[28],"Although":[29],"same,":[34],"regardless":[35],"technology":[38],"used,":[39],"coefficients":[41],"equations":[44],"used":[45],"will":[49],"vary":[50],"due":[51],"to":[52],"process.":[54],"Results":[55],"model,":[58],"comparison":[61],"between":[62],"proposed":[64],"well-known":[68],"Pelgrom":[69],"are":[71],"presented.":[72]},"counts_by_year":[{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2014,"cited_by_count":2},{"year":2013,"cited_by_count":1}],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}